Abstract: A method is disclosed including: generating a scanning interferometry signal at each of multiple wavelengths for each of at least one location on a test object; obtaining the scanning interferometry signals at each of the multiple wavelengths for each of at least one location on the test object; analyzing the scanning interferometry signals to determine information about the test object; and outputting the information about the test object. Each scanning interferometry signal corresponds to interference between test light and reference light as an optical path length difference between the test and reference light is varied. The test and reference light are derived from a common source, and the test light emerges from the test object over a range of angles corresponding to a numerical aperture of greater than 0.7.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: Methods and systems are disclosed for analyzing a scanning interferometry signal. A scanning interferometry signal is provided that is produced by a scanning interferometer for a first location of a test object (e.g., a sample having a thin film). A model function of the scanning interferometry signal is provided which is produced by the scanning interferometer. The model function is parametrized by one or more parameter values. The model function is fit to the scanning interferometry signal for each of a series of shifts in scan position between the model function and the scanning interferometry signal by varying the parameter values. Information is determined about the test object (e.g., a surface height or height profile, and/or a thickness or thickness profile for a thin film in the test object) at the first location based on the fitting.

Abstract: A method including: imaging test light emerging from a test object over a range of angles to interfere with reference light on a detector, wherein the test and reference light are derived from a common source; for each of the angles, simultaneously varying an optical path length difference from the source to the detector between interfering portions of the test and reference light at a rate that depends on the angle at which the test light emerges from the test object; and determining an angle-dependence of an optical property of the test object based on the interference between the test and reference light as the optical path length difference is varied for each of the angles.

Abstract: A conveyor system includes a plurality of produce clamps that rotate around a clamp conveyor assembly. On a field side of the conveyor system, a synchronous conveyor belt provides a support for the butt or stem of a plant placed thereon, in between clamps. As the clamp conveyor turns away from the field side, the clamps close and fully support the plants. The conveyor assembly carries the clamps, and the clamped plants, through a series of coring and trimming blades. The clamps then open to release the cored and trimmed product onto a collection conveyor, and the clamps continue to the field side to receive further plants for processing.

Abstract: An interferometer system is disclosed which is configured to combine measurement light with reference light to form an optical interference pattern, where the interferometer system includes a modulator configured to repetitively introduce a sequence of phase shifts between the measurement and reference light; and a camera system positioned to measure the optical interference pattern, where the camera system is configured to separately accumulate time-integrated images of the optical interference pattern corresponding to the different phase shifts in the sequence during the repetitions of the sequence.

Abstract: An apparatus including a camera which includes a plurality of light-sensitive pixels each capable of accumulating electronic data in response to an incident light signal. Each light-sensitive pixel is electrically coupled to two or more storage cells in the camera to define a coupled set of elements, where the elements include the light-sensitive pixel and the storage cells. Each element in each set is capable of storing electronic data related to light incident on the light-sensitive pixel. For each set of elements, the camera further includes a switch between the light sensitive pixel and at least one of the storage cells and a switch between at least one pair of the storage cells. Each switch is configured to selectively transfer electronic data between the elements connected by the switch.

Abstract: In general, in one aspect, the invention features a system that includes a first object mounted relative to a second object, the first object being moveable with respect to the second object. The system includes a plurality of interferometers each configured to derive a first wavefront and a second wavefront from input radiation and to combine the first and second wavefronts to provide output radiation including information about an optical path length difference between the paths of the first and second wavefronts, each interferometer including a reflective element positioned in the path of the first wavefront, and at least one of the interferometer's reflective element is mounted on the first object. The system also includes a plurality of fiber waveguides and an electronic controller. Each fiber waveguide is configured to deliver the input radiation to a corresponding interferometer or deliver the output radiation from the corresponding interferometer to a corresponding detector.

Abstract: Apparatus and methods for picking and coring produce heads. A righting mechanism receives and orients planted produce heads, and when a planted head is in a position to be severed, a lift arm and clamp wheel are controlled to position a clamp proximal to the planted head, wherein the planted head is clamped and a severing mechanism severs the planted head from the soil bed. The lift arm and clamp wheel operate to automatically re-position the clamped and severed head proximal to a coring mechanism, and the coring mechanism automatically removes the core of the clamped and severed head.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.

Abstract: In general, in one aspect, the disclosure features a method that includes directing measurement light to reflect from a measurement surface and combining the reflected measurement light with reference light, where the measurement light and reference light are derived from a common source, and there is a non-zero optical path length difference between the measurement light and reference light that is greater than a coherence length of the measurement light. The method further includes spectrally dispersing the combined light onto a multi-element detector to detect a spatially-varying intensity pattern, determining spatial information about the measurement surface based on the spatially-varying intensity pattern, and outputting the spatial information.

Abstract: A method including: imaging test light emerging from a test object over a range of angles to interfere with reference light on a detector, wherein the test and reference light are derived from a common source; for each of the angles, simultaneously varying an optical path length difference from the source to the detector between interfering portions of the test and reference light at a rate that depends on the angle at which the test light emerges from the test object; and determining an angle-dependence of an optical property of the test object based on the interference between the test and reference light as the optical path length difference is varied for each of the angles.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: Methods and systems are disclosed for analyzing a scanning interferometry signal. Steps include: providing a scanning interferometry signal produced by a scanning interferometer for a first location of a test object (e.g., a sample having a thin film); providing a model function of the scanning interferometry signal produced by the scanning interferometer, wherein the model function is parametrized by one or more parameter values; fitting the model function to the scanning interferometry signal for each of a series of shifts in scan position between the model function and the scanning interferometry signal by varying the parameter values; and determining information about the test object (e.g., a surface height or height profile, and/or a thickness or thickness profile for a thin film in the test object) at the first location based on the fitting.

Abstract: Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector; (iii) one or more optics configured to image the interference pattern onto the detector so that different elements of the detector correspond to different illumination angles of the test surface by the test electromagnetic radiation; and (iv) an electronic processor coupled to the detector, wherein the electronic processor is configured to process information measured by the detector to determine information about a test object having the test surface. The measurements made by the detector elements provide ellipsometry/reflectometry data for the test surface.

Abstract: Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector; and (iii) one or more optics configured to image the interference pattern onto the detector so that different elements of the detector correspond to different illumination angles of the test surface by the test electromagnetic radiation.

Abstract: Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector; and (iii) one or more optics configured to image the interference pattern onto the detector so that different elements of the detector correspond to different illumination angles of the test surface by the test electromagnetic radiation.

Abstract: Conical surfaces (and other complex surface shapes) can be interferometrically characterized using a locally spherical measurement wavefront (e.g., spherical and aspherical wavefronts). In particular, complex surface shapes are measured relative to a measurement point datum. This is achieved by varying the radius of curvature of a virtual surface corresponding to a theoretical test surface that would reflect a measurement wavefront to produce a constant optical path length difference (e.g., zero OPD) between the measurement and reference wavefronts.

Abstract: The invention is a harvester particularly suited for harvesting baby greens. The harvester generally comprises a chassis with wheels that travel in the furrows between raised beds, a sorting belt assembly, and an articulated connection to a cutting assembly on a floating header. The floating header rides on the top surface of a raised bed and is articulated so that the floating header can move independently of the chassis to follow the contours of the top of the raised bed so that the cutting assembly can cut at a uniform height. The sorting belt assembly includes a series of belts for collecting and sorting the cut baby greens at the easiest and most effective time to do so, immediately after the baby greens are cut and before the baby greens are clumped in storage bins or in other storage container. The invention further includes a method of using the harvester of the invention in which the forward momentum of harvester and the density of the crop are used to assist the cut product onto the collection belt.

Abstract: The invention is a harvester particularly suited for harvesting baby greens. The harvester generally comprises a chassis with wheels that travel in the furrows between raised beds, a sorting belt assembly, and an articulated connection to a cutting assembly on a floating header. The floating header rides on the top surface of a raised bed and is articulated so that the floating header can move independently of the chassis to follow the contours of the top of the raised bed so that the cutting assembly can cut at a uniform height. The sorting belt assembly includes a series of belts for collecting and sorting the cut baby greens at the easiest and most effective time to do so, immediately after the baby greens are cut and before the baby greens are clumped in storage bins or in other storage container. The invention further includes a method of using the harvester of the invention in which the forward momentum of harvester and the density of the crop are used to assist the cut product onto the collection belt.