Abstract: Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. More specifically, the invention employs electronic frequency processing to provide measurements of dispersion of the refractive index, the dispersion being substantially proportional to the density of the gas, and/or measurements of dispersion of the optical path length, the dispersion of the optical path length being related to the dispersion of the refractive index and the physical length of the measurement path.

Abstract: The invention features methods and systems for interferometrically profiling a measurement object having multiple reflective surfaces, e.g., to profile a selected one of the multiple reflective surfaces. The methods and systems involve: positioning the measurement object within an unequal path length interferometer (e.g., a Fizeau interferometer) employing a tunable coherent light source; recording an optical interference image for each of multiple wavelengths of the light source, each image including a superposition of multiple interference patterns produced by pairs of wavefronts reflected from the multiple surfaces of the measurement object and a reference surface; and extracting phases of a selected one of the interference patterns from the recorded images by using a phase-shifting algorithm that is more sensitive (e.g.

Abstract: The invention features a surface profiling method including: collecting interferometric data related to a surface profile of a measurement object; and calculating the surface profile based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. The invention also features a surface profiling system including: an interferometry system which during operation provides interferometric data related to a surface profile of a measurement object; and an electronic processor coupled the interferometry system, wherein during operation the electronic processor calculates the surface profile based on the interferometric data and at least one parameter indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object.

Abstract: Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. More specifically, the invention employs electronic frequency processing to provide measurements of dispersion of the refractive index, the dispersion being substantially proportional to the density of the gas, and/or measurements of dispersion of the optical path length, the dispersion of the optical path length being related to the dispersion of the refractive index and the physical length of the measurement path.

Abstract: The invention features a method for determining a geometric property of a test object, the method including: interferometrically profiling a first surface of the test object in a first coordinate system; interferometrically profiling a second surface of the test object in a second coordinate system different from the first coordinate system; providing a relationship between the first and second coordinate system; and calculating the geometric property based on the interferometrically profiled surfaces and the relationship between the first and second coordinate system. In some embodiments, the relationship may be determined by using calibrated gage blocks or by using a displacement measuring interferometer. Corresponding system are also described.

Abstract: The invention features an interferometry system which includes at least one dynamic beam steering assembly for redirecting one or more beams within the interferometry system in response to changes in the angular orientation or position of the measurement object. A control circuit controls the beam steering assembly based on a signal derived from one or more beams within the interferometry system. The dynamic beam steering assembly can be incorporated into interferometry systems that measure displacement, angle, and/or dispersion. The interferometry systems can be advantageously incorporated into lithography systems used to fabricate integrated circuits and other semiconducting devices and beam writing systems used to fabricate lithography masks.

Abstract: The invention features systems and methods for generating optical beams having substantially orthogonal polarizations for use in distance measuring interferometry. In one embodiment, the invention features a system including a source which during operation generates two nonparallel propagating source beams; and a retarder element positioned to receive the two nonparallel propagating source beams and convert them into two nonparallel propagating output beams that are polarized substantially orthogonal to one another. The system can further include a birefringent prism positioned to receive the two nonparallel propagating output beams and produce two parallel output beams.

Abstract: The invention features an interferometry system which includes at least one dynamic beam steering assembly for redirecting one or more beams within the interferometry system in response to changes in the angular orientation or position of the measurement object. A control circuit controls the beam steering assembly based on a signal derived from one or more beams within the interferometry system. For example, the control circuit can cause the beam steering assembly to redirect a measurement beam within the system such that exit measurement and reference beams used to generate an interferometric signal remain substantially parallel to one another over a range of angular orientations or translations of the measurement object. The interferometry systems can be advantageously incorporated into lithography systems used to fabricate integrated circuits and other semiconducting devices and beam writing systems used to fabricate lithography masks.

Abstract: A two-beam interferometer illuminates a sample surface with light at grazing incidence angles for the purpose of analyzing a surface characteristic such as surface topography. The interferometer includes a diffractive-optic beam splitter, which separates an incoming light beam into measurement and reference beams and a diffractive-optic beam combiner, which produces an output beam by interfering portions of the reference beam with reflected portions of the measurement beam. Those portions of the reference wavefront and the measurement wavefront that interfere originate from substantially the same portion of the initial illumination wavefront.

Abstract: The invention features systems and methods for generating optical beams having substantially orthogonal polarizations for use in distance measuring interferometry. In one embodiment, the invention features a system including a source which during operation generates two nonparallel propagating source beams; and a retarder element positioned to receive the two nonparallel propagating source beams and convert them into two nonparallel propagating output beams that are polarized substantially orthogonal to one another. The system can further include a birefringent prism positioned to receive the two nonparallel propagating output beams and produce two parallel output beams.

Abstract: Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in at least one measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. More specifically, the invention employs multiple pass interferometry to provide measurements of dispersion of the refractive index, the dispersion being substantially proportional to the density of the gas, and/or measurements of dispersion of the optical path length, the dispersion of the optical path length being related to the dispersion of the refractive index and the physical length of the measurement path.

Abstract: The invention features an interferometry system for a measuring a surface profile or thickness of a measurement object.

Abstract: A geometrically-desensitized interferometer (GDI) instrument incorporates a light generator, an optical assembly, an imaging device, and an adjustable mechanism for selectively altering the transmission of light through or the reception of light from the optical grating assembly so as to alter the operation of the GDI instrument. The adjustable mechanism may be disposed between the light generator and the optical assembly so as to at least selectively alter the effective lateral length of the light generator and hence selectively adjust the range of measurement depths of the instrument. The instrument therefore is selectively capable of operating in a high coherence mode, a low coherence mode, or in between. Instead of or in addition to a light generator adjustment mechanism, the adjustable mechanism could comprise an aperture which shapes light entering the imaging device so as to enhance the instrument's ability to profile objects with rough surfaces.

Abstract: Interference data is acquired as a sequence of pairs of adjacent acquisition intervals in relative quadrature separated by non-acquisition intervals of known, typically constant, phase. The interval pairs in quadrature straddle interline transfer events of the imaging device, such that the two intervals of a given pair are separated only by the very short time interval of an interline transfer event. As a result, the two intervals are acquired serially but almost simultaneously. Preferably four quadpairs are acquired in a measurement, with the phase separation between the pairs being nominally an odd multiple of .pi./2. Because the intervals of each pair are acquired nearly simultaneously and in quadrature, the interference data exhibits similar favorable characteristics exhibited by simultaneous phase quadrature interference data. Namely, when phase calculations are performed using the interference data, ripple error associated with vibrational disturbances tends to cancel out.

Abstract: A full-field, geometrically-desensitized interferometer (GDI) instrument incorporates a combination of diffractive optics and conventional optics to perform beam splitting and recombining operations during a surface profilometry operation. Symmetrically-positioned inbound and outbound optical subassemblies typically are arranged to direct an inbound collimated beam from a light generator to the profiled surface of a test object and to direct outbound reflected beams to an imaging device as a single recombined outbound interference beam. The optical path difference between the two inbound beams or between the two reflected outbound beams can be substantially independent of field position on a perfectly flat sampled surface adjusted for null fringes--hence producing the desired full-field effect.

Abstract: Polarization interferometric method and apparatus for high-speed measurement of the distance between two surfaces, the first of which is part of a substantially transparent element and the second of which is part of a test object. In a first step, a lens (2) directs a light beam (3) through a polarizing component (4) towards the first surface at an oblique angle of incidence. The measurement beam may be positioned on the surface under test (35, 35a) with an in-line optical system or a normal incidence one. In a next step, the polarized light beam (5) reflects back through the transparent element by means of the combined effect of reflections from the first surface of the transparent element and from the surface of the test object (30). In a further step, a polarization-sensitive intensity detector (12) and a phase detector (13) measure the strength and relative phase of the polarization components defined by the plane of incidence.

Abstract: A method and apparatus for measuring fluctuations in the refractive index of a gas, such as air, in a measurement path (66) may be used to measure displacement of an object (67) independent of these fluctuations. A coherent source of light (1,4) provides two source light beams (11, 12) having source wavelengths (.lambda..sub.1, .lambda..sub.2) along the measurement path (66) which are substantially harmonically related to each other. The beams (11, 12) are electronically processed (98, 981, 982, 983, 984, 985) to provide modified heterodyne phase shifts based on the provided source wavelengths which are similarly harmonically related to the harmonically related source wavelengths for providing a superheterodyne modulation phase substantially insensitive to motion along the measurement path (66).

Abstract: An apparatus and methods for measuring and compensating for birefringence in a rotating ground glass disk (20) such as are employed in polarization based optical flying height testers. The polarized light (1, 3) impinges on the top surface (24) of the disk (20) and is refracted through the disk to a measurement point (90) on the opposite surface (25) from which it is reflected back through the disk (20) and refracted before it exits the disk (20) in a beam (9) containing both s .alpha.and p polarizations which are detected by a phase detector (13) which measures any difference in phase between the s and p polarizations. Any variation of the phase .theta..sub.G with respect to the position defined by the measurement point provides the birefringence parameters b.sub..parallel.,b.sub..perp. for the positions on the disk (20). The phase detector (13) measures the phase .theta..sub.G at a skew angle .zeta.

Abstract: Optical method and means for high-speed measurement of the distance between two surfaces, the first of which (25, 25a) is part of a substantially transparent element (20, 20a) and the second of which (35, 35a) is part of a test object (30, 30a). In a first step, a lens (3) directs a light beam (2) through a polarizing component (4) towards the first surface at an oblique angle of incidence. The measurement beam may be positioned on the surface under test (35, 35a) with an in-line optical system or a normal incidence one. In a next step, the polarized light beam (5) reflects back through the transparent element by means of the combined effect of reflections from the first surface of the transparent element and from the surface of the test object (30). In a further step, a polarization-sensitive intensity detector (12) and a phase detector (13) measure the strength and relative phase of the polarization components defined by the plane of incidence.

Abstract: Apparatus and means for calibrating optical gap-measuring instruments, including a preferred calibration standard (100) comprised of a substantially flat, transparent element (10) held in contact with the convex spherical surface (25) of a substantially opaque element (20) to provide an obvious and unambiguous region over which the gap is zero. The optical gap measuring tool that is to be calibrated is oriented so as to illuminate the interface. The calibration standard (100) is translated in position with respect the gap measuring tool in such a way as to vary the measured gap, while at the same time data storage means record the gap measurement as a function of relative position. This data is then compared to the predicted variation from the geometry of the calibration standard (100). Provided that the elements (10, 20) are of high optical quality, deviations of the measured data from an ideal parabolic curve are indicative of calibration errors.