Patents by Inventor Peter Ehbets

Peter Ehbets has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11719578
    Abstract: A computer-implemented method for identifying an effect pigment, the method comprising executing, on at least one processor of at least one computer, steps of: a) acquiring sample image data describing a digital image of a layer comprising a sample effect pigment b) determining, based on the sample image data, sparkle point data describing a sample distribution of sparkle points defined by the digital image, wherein the sample distribution is defined in an N-dimensional color space, wherein N is an integer value equal to or larger than 3; c) determining, based on the sparkle point data, sparkle point transformation data describing a transformation of the sample distribution into an (N?1)-dimensional color space; d) determining, based on the sparkle point transformation data, sparkle point distribution geometry data describing a geometry of the sample distribution; e) acquiring reference distribution geometry data describing a geometry of a reference distribution of sparkle points in the (N?1)-dimensional colo
    Type: Grant
    Filed: August 25, 2017
    Date of Patent: August 8, 2023
    Assignee: X-RITE EUROPE GMBH
    Inventors: Wilhelm H. Kettler, Milos Sormaz, Peter Ehbets
  • Publication number: 20210310870
    Abstract: A computer-implemented method for identifying an effect pigment, the method comprising executing, on at least one processor of at least one computer, steps of: a) acquiring sample image data describing a digital image of a layer comprising a sample effect pigment b) determining, based on the sample image data, sparkle point data describing a sample distribution of sparkle points defined by the digital image, wherein the sample distribution is defined in an N-dimensional color space, wherein N is an integer value equal to or larger than 3; c) determining, based on the sparkle point data, sparkle point transformation data describing a transformation of the sample distribution into an (N?1)-dimensional color space; d) determining, based on the sparkle point transformation data, sparkle point distribution geometry data describing a geometry of the sample distribution; e) acquiring reference distribution geometry data describing a geometry of a reference distribution of sparkle points in the (N?1)-dimensional colo
    Type: Application
    Filed: August 25, 2017
    Publication date: October 7, 2021
    Inventors: Wilhelm H. Kettler, Milos Sormaz, Peter Ehbets
  • Patent number: 10724901
    Abstract: A colour measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Grant
    Filed: March 4, 2019
    Date of Patent: July 28, 2020
    Assignee: X-Rite Europe GmbH
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Publication number: 20190265102
    Abstract: A colour measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Application
    Filed: March 4, 2019
    Publication date: August 29, 2019
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Patent number: 10386235
    Abstract: A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced by the pick-up array and for providing processed image data. The illumination array exposes a region of the measurement object (O) to illumination light at an illumination angle (?i) and an illumination aperture angle (?i), and the pick-up array captures measurement light, reflected by the measurement object (O), at a pick-up angle (?v) and a pick-up aperture angle (?v) and guides it onto an image sensor exhibiting a pixel structure. The measurement object (O) is gauged multispectrally in multiple wavelength ranges, wherein the image sensor produces multispectral image data. Angular and spatial conditions are indicated which optimize the measurement device (MD) with regard to characterizing sparkles.
    Type: Grant
    Filed: May 22, 2018
    Date of Patent: August 20, 2019
    Assignee: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Guido Niederer
  • Patent number: 10260950
    Abstract: A hand-held measurement device for appearance analyses includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of color in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction.
    Type: Grant
    Filed: October 1, 2018
    Date of Patent: April 16, 2019
    Assignee: X-RITE SWITZERLAND GMBH
    Inventors: Peter Ehbets, Beat Frick, Mark Wegmuller, Jorg Hunkemeier, Guido Niederer
  • Patent number: 10260943
    Abstract: A color measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: April 16, 2019
    Assignee: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Patent number: 10126171
    Abstract: A hand-held measurement device for appearance analyzes includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of color in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: November 13, 2018
    Assignee: X-RITE SWITZERLAND GMBH
    Inventors: Peter Ehbets, Beat Frick, Mark Wegmüller, Jörg Hünkemeier, Guido Niederer
  • Publication number: 20180283945
    Abstract: A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced by the pick-up array and for providing processed image data. The illumination array exposes a region of the measurement object (O) to illumination light at an illumination angle (?i) and an illumination aperture angle (?i), and the pick-up array captures measurement light, reflected by the measurement object (O), at a pick-up angle (?v) and a pick-up aperture angle (?v) and guides it onto an image sensor exhibiting a pixel structure. The measurement object (O) is gauged multispectrally in multiple wavelength ranges, wherein the image sensor produces multispectral image data. Angular and spatial conditions are indicated which optimise the measurement device (MD) with regard to characterising sparkles.
    Type: Application
    Filed: May 22, 2018
    Publication date: October 4, 2018
    Inventors: Peter Ehbets, Guido Niederer
  • Patent number: 10001411
    Abstract: A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced by the pick-up array and for providing processed image data. The illumination array exposes a region of the measurement object (O) to illumination light at an illumination angle (?i) and an illumination aperture angle (?i), and the pick-up array captures measurement light, reflected by the measurement object (O), at a pick-up angle (?v) and a pick-up aperture angle (?v) and guides it onto an image sensor exhibiting a pixel structure. The measurement object (O) is gauged multispectrally in multiple wavelength ranges, wherein the image sensor produces multispectral image data. Angular and spatial conditions are indicated which optimise the measurement device (MD) with regard to characterising sparkles.
    Type: Grant
    Filed: April 18, 2016
    Date of Patent: June 19, 2018
    Assignee: X-Rite Switzerland GMBH
    Inventors: Peter Ehbets, Guido Niederer
  • Patent number: 9772230
    Abstract: A hand-held measurement device for appearance analyses includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of color in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction.
    Type: Grant
    Filed: October 30, 2013
    Date of Patent: September 26, 2017
    Assignee: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Beat Frick, Mark Wegmuller, Jorg Hunkemeier, Guido Niederer
  • Publication number: 20170176254
    Abstract: A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced by the pick-up array and for providing processed image data. The illumination array exposes a region of the measurement object (O) to illumination light at an illumination angle (?i) and an illumination aperture angle (?i), and the pick-up array captures measurement light, reflected by the measurement object (O), at a pick-up angle (?v) and a pick-up aperture angle (?v) and guides it onto an image sensor exhibiting a pixel structure. The measurement object (O) is gauged multispectrally in multiple wavelength ranges, wherein the image sensor produces multispectral image data. Angular and spatial conditions are indicated which optimise the measurement device (MD) with regard to characterising sparkles.
    Type: Application
    Filed: April 18, 2016
    Publication date: June 22, 2017
    Applicant: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Guido Niederer
  • Publication number: 20160327431
    Abstract: A colour measurement device includes a measurement array (MA) which includes: a plurality of illumination arrays (20, 30, 40) for exposing a measurement spot (MS) on a measurement object (MO) to illumination light in an actual illumination direction (2, 3, 4) in each case, and a pick-up array (50) for detecting the measurement light reflected by the measurement spot (MS) in an actual observation direction (5) and for converting it into preferably spectral reflection factors; and a controller for the illumination arrays and the pick-up array and for processing the electrical signals produced by the pick-up array. The controller is embodied to process the measured reflection factors on the basis of a correction model, such that distortions in the measurement values as compared to nominal illumination and/or observation directions, caused by angular errors in the illumination arrays and/or the pick-up array, are corrected.
    Type: Application
    Filed: April 8, 2016
    Publication date: November 10, 2016
    Applicant: X-Rite Switzerland GmbH
    Inventors: Peter Ehbets, Matthias Scheller Lichtenauer
  • Publication number: 20140152990
    Abstract: A hand-held measurement device for appearance analyses includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of colour in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction.
    Type: Application
    Filed: October 30, 2013
    Publication date: June 5, 2014
    Applicant: X-RITE EUROPE GMBH
    Inventors: Peter Ehbets, Beat Frick, Mark Wegmuller, Jorg Hunkemeier, Guido Niederer
  • Patent number: 7894065
    Abstract: A method for the correction of measurement errors caused by surface effects induced by ink splitting during the color measurement of a printed sheet on a running printing device, includes scanning the printed sheet photoelectrically point by point and forming color and/or density measured values from scanning signals from the scanned points. Those scanned points which have a brightness exceeding a limiting value are identified, and the measured values are corrected by using the identified scanned points. In particular, during the formation of the color and/or density measured values, the scanning signals from the identified scanned points are not taken into account.
    Type: Grant
    Filed: January 29, 2008
    Date of Patent: February 22, 2011
    Assignee: Heidelberger Druckmaschinen AG
    Inventors: Adrian Kohlbrenner, Peter Ehbets, Wolfgang Geissler
  • Patent number: 7884941
    Abstract: A measuring system for photoelectrically scanning measurement points of a measurement object includes a lighting channel (21-24) for applying illuminating light to the measurement object (M) disposed in a measurement plane (MP) and a measuring channel (11-13) for capturing and photoelectrically converting the measurement light reflected by the measurement points of the measurement object M. The lighting channel and/or the measuring channel is configured so as to detect the reflection properties of the measurement points in several wavelength bands. The lighting channel (21-24) has a spatial light modulator controlled by an electronic control unit (40) for generating a spatial lighting pattern which causes illuminating light to be selectively applied to measurements points (25) of interest of the measurement object (M).
    Type: Grant
    Filed: September 3, 2008
    Date of Patent: February 8, 2011
    Assignee: X-Rite Europe GmbH
    Inventor: Peter Ehbets
  • Patent number: 7847264
    Abstract: Methods for measuring the colour of printed samples by measuring a first spectral proportion of the total spectral reflection factor of a sample by illuminating the sample with light having no UV element are provided. The methods calculate a spectral correction factor by making allowance for the characterisation data of the brightened substrate and the spectral properties of a selected type of illuminating light, adding the spectral correction factor to the first spectral proportion to obtain the total spectral reflection factor of the measured sample. The methods further evaluate the total spectral reflection factor on the basis of measurements taken with illuminating light with no UV element and with UV light only on a limited set of measurement samples, especially on the non-printed substrate only (paper whiteness).
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: December 7, 2010
    Assignee: X-Rite Europe GmbH
    Inventors: Mark Wegmuller, Peter Ehbets, Beat Frick
  • Patent number: 7821639
    Abstract: A scanner device includes a color measuring, a support surface for a measured object and a drive unit for moving the measuring head across the support surface and for adjusting the height of the measuring head in a direction perpendicular to the support surface. The measuring head is equipped with an illuminating channel and a collection channel. The illuminating channel has a light source and optical means for illuminating the measured object at a measurement site at a mean angle of incidence of 45°. The collection channel has optical means for capturing light emanating from the measured object at the measurement site at a mean collection angle of 0° and coupling it into a light guide, which directs the captured light to a wavelength-selective photoelectric transformer, which resolves it into a number of wavelength ranges and generates an electric measurement signal corresponding to each wavelength range.
    Type: Grant
    Filed: December 20, 2007
    Date of Patent: October 26, 2010
    Assignee: X-Rite Europe GmbH
    Inventors: Peter Ehbets, Adrian Kohlbrenner
  • Patent number: 7755773
    Abstract: A scanner device for measuring the color properties of a measured object pixel by pixel has a support surface for the measured object, a color measuring head, a drive unit for moving the color measuring head above the support surface in at least one dimension thereof and for adjusting the height of the color measuring head in the direction perpendicular to the support surface, as well as a measurement and drive control unit which activates the drive unit and co-operates with the color measuring head. It is also equipped with an electronic distance control system which adjusts the distance of the color measuring head above the measurement point in the direction perpendicular to the support surface to a desired measuring distance for every measurement point by means of the drive unit. The electronic distance control system works with measurement values generated by the color measuring head and distance values computed from them.
    Type: Grant
    Filed: December 20, 2007
    Date of Patent: July 13, 2010
    Assignee: X-Rite Europe GmbH
    Inventors: Peter Ehbets, Adrian Kohlbrenner
  • Patent number: 7679785
    Abstract: Image measurement values of a measurement object, in particular a printed sheet, measured by means of a photoelectric image measuring unit operating on the basis of pixels are corrected with respect to at least one influencing variable which influences the measurement result with a view to at least partially eliminating the effect of this influencing variable on the measuring process. The image measurement values measured by the image measuring unit are converted by correction parameters of a parameter-based correction model into corrected image measurement values which no longer contain the influencing variable affecting the measuring process. The correction parameters used for the parameter-based correction model are automatically calculated using reference measurement values measured at reference measurements points on preferably the same measurement object by means of a reference measuring unit and the image measuring unit.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: March 16, 2010
    Assignee: X-Rite Europe GmbH
    Inventors: Peter Ehbets, Adrian Kohlbrenner, Harald Ammeter