Abstract: In a method of controlling computer-readable memory that includes a plurality of memory locations, a usage frequency of a plurality of data units is determined. Upon each occurrence of a predefined event, a memory latency for each of the plurality of memory locations is determined. After the predefined event, a data unit with a high usage frequency is stored in a memory location with a low latency.

Abstract: An integrated circuit assembly and associated method of detecting microchip tampering may include multiple connections in electrical communication with a conductive layer. Defensive circuitry may inhibit analysis of the microchip where a connection no longer connects to the conductive layer. The defensive circuitry may similarly be initiated where a connection unintended to be in electrical communication with the conductive layer is nonetheless connected.

Abstract: A circuit assembly includes a functional chip and a first capacitor. The functional chip includes a first logic island and a second logic island. The first capacitor is configured to be selectively coupled (e.g., at different times) to a first power supply terminal of the first logic island and a second power supply terminal of the second logic island.

Abstract: An integrated circuit assembly and associated method of detecting microchip tampering may include multiple connections in electrical communication with a conductive layer. Defensive circuitry may inhibit analysis of the microchip where a connection no longer connects to the conductive layer. The defensive circuitry may similarly be initiated where a connection unintended to be in electrical communication with the conductive layer is nonetheless connected.

Abstract: Apparatus, method and program product may detect an attempt to tamper with a microchip by detecting an unacceptable alteration in a measured capacitance associated with capacitance structures proximate the backside of a microchip. The capacitance structures typically comprise metallic shapes and may connect using through-silicon vias to active sensing circuitry within the microchip. In response to the sensed change, a shutdown, spoofing, self-destruct or other defensive action may be initiated to protect security sensitive circuitry of the microchip.

Abstract: A method and apparatus include conductive material doped within a microchip that accumulates a detectable charge in the presence of ions. Such ions may result from a focused ion beam or other unwelcome technology exploitation effort. Circuitry sensing the charge buildup in the embedded, doped material may initiate a defensive action intended to defeat the tampering operation.

Abstract: Apparatus, method and program product detect an attempt to tamper with a microchip by determining that an electrical path comprising one or more connections and a metal plate attached to the backside of a microchip has become disconnected or otherwise altered. A tampering attempt may also be detected in response to the presence of an electrical path that should not be present, as may result from the microchip being incorrectly reconstituted. Actual and/or deceptive paths may be automatically selected and monitored to further confound a reverse engineering attempt.

Abstract: An integrated circuit assembly comprising a microchip that shares an interdependent function with a second, stacked microchip. Alternation of the physical arrangement or functionality of the microchips may initiate a defense action intended to protect security sensitive circuitry associated with one of the microchips. The microchips may communicate using through-silicon vias or other interconnects.

Abstract: An apparatus and method detect microchip tampering by including a capacitance circuit that comprises a protective cover. Dielectric material may be sandwiched between the cover and a backside metal layer, which may be proximate a protected surface of the microchip. Changes in the capacitance of the above circuit caused by alteration of the cover or other component of the capacitance circuit may be sensed and prompt defensive action.

Abstract: Method and apparatus and associated method of detecting microchip tampering may include a conductive element in electrical communication with multiple sensors for verifying that signal degradation occurs at an expected region of the conductive element. A detected variance from the expected region may automatically trigger an action for impeding an integrated circuit exploitation process.

Abstract: A wirebond interconnect structure, having ground pads and signal pads, to which wirebonds are electrically coupled, disposed on a component, is provided and includes a first coating to insulate at least the wirebonds and the signal pads with at least the ground pads exposed, and a second coating, surrounding the first coating, in electrical communication with the ground pads. The first coating is sufficiently thick to achieve a consistent characteristic impedance when the second coating is applied.

Abstract: A method, program product and apparatus include resistance structures positioned proximate security sensitive microchip circuitry. Alteration in the position, makeup or arrangement of the resistance structures may be detected and initiate an action for defending against a reverse engineering or other exploitation effort. The resistance structures may be automatically and selectively designated for monitoring. Some of the resistance structures may have different resistivities. The sensed resistance may be compared to an expected resistance, ratio or other resistance-related value. The structures may be intermingled with false structures, and may be overlapped or otherwise arranged relative to one another to further complicate unwelcome analysis.

Abstract: A data communications apparatus includes a central device and a plurality of communication devices. The central device includes a plurality of central port pairs, in which each central port pair includes an input port and an output port. The plurality of communication devices is arranged in a spoke and ring configuration, in which each communication device is part of a communication spoke. Each communication spoke is in communication with a different central port pair. Each communication device is also a part of a communication ring, so that each communication device in a selected communication ring belongs to a different communication spoke.

Abstract: A method for thermal optimization comprising the steps of stacking a first chip layer and a second chip layer wherein the second chip layer is rotated in relation to the first chip layer wherein a first hot spot on the first chip layer and a second hot spot on the second chip layer are not spatially aligned; routing a signal input through the first chip layer from a first chip pad on the first chip layer to a first silicon via so as to form a physical input to output twist and a first signal output; and routing the first signal output from the first chip layer through a second chip layer from a second chip pad on the second chip layer to a second silicon via so as to form a second signal output.

Abstract: A design structure embodied in a machine readable medium used in a design process includes random access memory device having an array of individual memory cells arranged into rows and columns, each memory cell having an access device associated therewith. Each row of the array further includes a plurality of N word lines associated therewith, with a wherein N corresponds to a number of independently accessible partitions of the array, wherein each access device in a given row is coupled to only one of the N word lines of the row. Logic in signal communication with the array receives a plurality of row address bits and determine, for a requested row identified by the row address bits, which of the N partitions within the requested row are to be accessed, such that access devices within a selected row, but not within a partition to be accessed, are not activated.

Abstract: A method of serially connecting devices utilizing flexible circuits in a semi-stacking configuration includes positioning a first flexible circuit on a carrier, the first flexible circuit includes a bottom surface and a top surface, a portion of the bottom surface is mounted to the carrier while another portion of the bottom surface is elevated at a first angle with respect to the carrier; coupling a first device on a portion of the top surface of the first flexible circuit, the first device being elevated at the first angle; positioning a second flexible circuit on the carrier, the second flexible circuit having an upper surface and a lower surface, a portion of the lower surface is mounted to the carrier while another portion of the lower surface is elevated at a second angle with respect to the carrier and overlapped over a top surface portion of the first device; and coupling a second device on a portion of the upper surface of the second flexible circuit, the second device being elevated at the second an

Abstract: A circuit assembly includes a functional chip and a first capacitor. The functional chip includes a first logic island and a second logic island. The first capacitor is configured to be selectively coupled (e.g., at different times) to a first power supply terminal of the first logic island and a second power supply terminal of the second logic island.

Abstract: A method of making an integrated circuit package includes forming a through hole in an integrated circuit and assembling a die containing the integrated circuit on a carrier so that the die is mechanically and electrically connected to the carrier. Thereafter, an underfill material is dispensed between the die and the carrier via the through hole.

Abstract: A cooling apparatus, includes: one or more bimetallic deflectors attached to a mounting post, the mounting post configured for mating engagement with a protrusion of a heat sink, such that the one or more bimetallic deflectors are in thermal contact with the protrusion when the mounting post is engaged therewith; wherein the bimetallic deflectors are configured to deflect in response to thermal energy conducted from the protrusions so as to change a direction of airflow incident thereupon.

Abstract: An apparatus for testing electrical continuity of a surface mounted (SMT) electrical board includes: a printed wiring board having a first surface and an opposite second surface; a conductive signal line disposed on each of the first and second surfaces of the printed wiring board; an electrical component disposed on and electrically connected to the conductive signal line on the first surface; and a through hole extending through the printed wiring board and the conductive signal line on the second surface of the printed wiring board exposing a surface side of the conductive signal line facing the first surface of the printed wiring board. The through hole is unplated in an inside bore defining the through hole and the through hole allows direct access to the conductive signal line on the first surface to test continuity of the conductive signal line on the first surface connected to the electrical component from the second surface of the printed wiring board.