Abstract: Subject matter disclosed herein relates to methods and apparatus, such as memory devices and systems including such memory devices. In one apparatus example, a plurality of block configurations may be employed. Block configurations may include an arrangement of similarly doped semiconductor switches. Block configurations may select a respective tile of a memory array, a particular memory cell of the respective tile, and select a memory operation to apply to the particular memory cell. Immediately adjacent block configurations within a particular slice of the memory array may be substantially mirrored and immediately adjacent block configurations in separate immediately adjacent slices of the memory array may be substantially similar. Similarly doped diffusion regions for similarly doped semiconductor switches in substantially mirrored block configurations may be arranged to electrically share a common potential signal value level. Other apparatus and methods are also disclosed.

Abstract: Subject matter disclosed herein relates to methods and apparatus, such as memory devices and systems including such memory devices. In one apparatus example, a plurality of block configurations may be employed. Block configurations may include an arrangement of similarly doped semiconductor switches. Block configurations may select a respective tile of a memory array, a particular memory cell of the respective tile, and select a memory operation to apply to the particular memory cell. Immediately adjacent block configurations within a particular slice of the memory array may be substantially mirrored and immediately adjacent block configurations in separate immediately adjacent slices of the memory array may be substantially similar. Similarly doped diffusion regions for similarly doped semiconductor switches in substantially mirrored block configurations may be arranged to electrically share a common potential signal value level. Other apparatus and methods are also disclosed.

Abstract: Subject matter disclosed herein relates to methods and apparatus, such as memory devices and systems including such memory devices. In one apparatus example, a plurality of block configurations may be employed. Block configurations may include an arrangement of similarly doped semiconductor switches. Block configurations may select a respective tile of a memory array, a particular memory cell of the respective tile, and select a memory operation to apply to the particular memory cell. Immediately adjacent block configurations within a particular slice of the memory array may be substantially mirrored and immediately adjacent block configurations in separate immediately adjacent slices of the memory array may be substantially similar. Similarly doped diffusion regions for similarly doped semiconductor switches in substantially mirrored block configurations may be arranged to electrically share a common potential signal value level. Other apparatus and methods are also disclosed.

Abstract: A device with non volatile memory cells, with optimized programming, of the type comprising a sector of matrix memory cells organized in rows and columns, with the columns organized in a plurality of global bit-lines associated with at least one plurality of local bit-lines and respectively enabled by a first select signal and by at least one second select signal generated by a decoder, these columns being associated with at least one program load PL controlled by a logic circuit and suitable for applying a programming pulse to a plurality of cells belonging to the enabled bit-lines, comprising a plurality of discharge transistors, each associated with a corresponding column controlled by a control signal complementary to the control signal of the adjacent discharge transistor.

Abstract: A device with non volatile memory cells, with optimized programming, of the type comprising a sector of matrix memory cells organized in rows and columns, with the columns organized in a plurality of global bit-lines associated with at least one plurality of local bit-lines and respectively enabled by a first select signal and by at least one second select signal generated by a decoder, these columns being associated with at least one program load PL controlled by a logic circuit and suitable for applying a programming pulse to a plurality of cells belonging to the enabled bit-lines, comprising a plurality of discharge transistors, each associated with a corresponding column controlled by a control signal complementary to the control signal of the adjacent discharge transistor.

Abstract: A memory device having a plurality of memory cells grouped in at least two memory sectors is disclosed. A first decoding circuit operable to receive address codes of the plurality of memory cells and to generate a plurality of decoding and selecting signals in response to the address codes. A plurality of second decoding circuits are coupled to the first decoding circuit and operable to generate driving signals for the memory cell address signal lines based at least in part on the plurality of decoding and selecting signals. A voltage shifting circuit is operable to generate a shift in the voltage of the plurality of decoding and selecting signals for generating a plurality of shifted voltage decoding and selecting signals and to provide the shifted decoding and selecting signals to the plurality of second decoding signals for generating the drive signals.

Abstract: A device with non volatile memory cells, with optimized programming, of the type comprising a sector of matrix memory cells organized in rows and columns, with the columns organized in a plurality of global bit-lines associated with at least one plurality of local bit-lines and respectively enabled by a first select signal and by at least one second select signal generated by a decoder, these columns being associated with at least one program load PL controlled by a logic circuit and suitable for applying a programming pulse to a plurality of cells belonging to the enabled bit-lines, comprising a plurality of discharge transistors, each associated with a corresponding column controlled by a control signal complementary to the control signal of the adjacent discharge transistor.

Abstract: A non volatile memory device architecture, suitable for speeding up and synchronize the programming steps of the cells in particular of the Flash-Nor type, of the type comprising a matrix of memory cells organized into rows and columns, at least one group of these columns being selected by at least one first enable signal by a second enable signal generated by a first decoder; the group of columns being associated with at least one Program Load PL controlled by a logic circuit comprising a first centralized portion and plural second portions associated with a respective program load sequentially updated and driven in a synchronous way to the first centralized portion.

Abstract: A device with non volatile memory cells, with optimized programming, of the type comprising a sector of matrix memory cells organized in rows and columns, with the columns organized in a plurality of global bit-lines associated with at least one plurality of local bit-lines and respectively enabled by a first select signal and by at least one second select signal generated by a decoder, these columns being associated with at least one program load PL controlled by a logic circuit and suitable for applying a programming pulse to a plurality of cells belonging to the enabled bit-lines, comprising a plurality of discharge transistors, each associated with a corresponding column controlled by a control signal complementary to the control signal of the adjacent discharge transistor.

Abstract: A device with non volatile memory cells, with optimized programming, of the type comprising a sector of matrix memory cells organized in rows and columns, with the columns organized in a plurality of global bit-lines associated with at least one plurality of local bit-lines and respectively enabled by a first select signal and by at least one second select signal generated by a decoder, these columns being associated with at least one Program Load PL controlled by a logic circuit and suitable for applying a programming pulse to a plurality of cells belonging to the enabled bit lines, comprising a plurality of discharge transistors, each associated with a corresponding column controlled by a control signal complementary to the control signal of the adjacent discharge transistor.

Abstract: A device with non volatile memory cells, with optimized programming, of the type comprising a sector of matrix memory cells organized in rows and columns, with the columns organized in a plurality of global bit-lines associated with at least one plurality of local bit-lines and respectively enabled by a first select signal and by at least one second select signal generated by a decoder, these columns being associated with at least one Program Load PL controlled by a logic circuit and suitable for applying a programming pulse to a plurality of cells belonging to the enabled bit lines, comprising a plurality of discharge transistors, each associated with a corresponding column controlled by a control signal complementary to the control signal of the adjacent discharge transistor.

Abstract: A non volatile memory device architecture, suitable for speeding up and synchronize the programming steps of the cells in particular of the Flash-Nor type, of the type comprising a matrix of memory cells organized into rows and columns, at least one group of these columns being selected by at least one first enable signal by a second enable signal generated by a first decoder; the group of columns being associated with at least one Program Load PL controlled by a logic circuit comprising a first centralized portion and plural second portions associated with a respective program load sequentially updated and driven in a synchronous way to the first centralized portion.

Abstract: Local suppression of a disturbance of a reference line is accomplished by supplying, on an internal node, a Band Gap voltage signal that is stable in temperature and power supply; driving a controlled current generator generating a controlled current signal by means of the Band Gap voltage signal; locally suppressing a disturbance of the reference line by means of a disturbance suppression circuit connected to the internal node acting on the Band Gap voltage signal; and mirroring a current signal generated on the reference line which is an output terminal of the Band Gap circuitry.

Abstract: A memory device including a plurality of memory cells, said memory cells being grouped in at least two memory sectors. In each memory sector the memory cells are arranged according to a plurality of alignments of memory cells. A respective memory cell access signal line is associated with each alignment. A first decoding circuit is adapted to receive an address code of the memory cells and in response thereto asserts a plurality of decoding and selecting signals common to said at least two memory sectors. A respective second decoding circuit, associated with each one of the at least two memory sectors, is operatively coupled to the first decoding circuit and adapted to generate driving signals for said memory cell access signal lines depending at least in part on said decoding and selecting signals.