Patents by Inventor Pierre Turpin

Pierre Turpin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11500403
    Abstract: A system-on-a-chip (SoC) is designed to operate within optimal voltage and frequency ranges. If an SoC is provided power outside of the optimal voltage range, the SoC can be placed in a high-stress state, exposing the chip to a security attack. Embodiments of the present systems and method limit the minimum and maximum voltage supplied to an SoC from a power management integrated circuit (PMIC). Embodiments can also track a number of requests to provide power outside of the optimal range and can signal a warning of repeated attempts to take an SoC outside of the SoC's optimal range, which may be indicative of a malicious attack on the system.
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: November 15, 2022
    Assignee: NXP USA, INC.
    Inventors: Jean-Philippe Meunier, Maxime Clairet, Alaa Eldin Y El Sherif, Pierre Turpin
  • Patent number: 11448690
    Abstract: A testing method and apparatus is disclosed for testing an integrated circuit device (100) which has a dedicated ground bias pad (121) connected across a high voltage electrostatic discharge clamp circuit (123) to a well-driving ground pad (122) by applying a first voltage to the dedicated ground bias pad to bias a wafer substrate (101) while simultaneously applying a second voltage to the well-driving ground pad to bias the well region (103), where the first and second voltage create a stressing voltage across a buried insulator layer (102, 105) in the integrated circuit device so that a screening test can be conducted to screen for a defect (106) in the buried insulator layer by measuring a leakage current.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: September 20, 2022
    Assignee: NXP USA, INC.
    Inventors: Laurent Segarra, Maarten Jacobus Swanenberg, Pierre Turpin, Matthew Bacchi, Russell Schaller, Keith Jackoski, Ronghua Zhu
  • Publication number: 20220003812
    Abstract: A testing method and apparatus is disclosed for testing an integrated circuit device (100) which has a dedicated ground bias pad (121) connected across a high voltage electrostatic discharge clamp circuit (123) to a well-driving ground pad (122) by applying a first voltage to the dedicated ground bias pad to bias a wafer substrate (101) while simultaneously applying a second voltage to the well-driving ground pad to bias the well region (103), where the first and second voltage create a stressing voltage across a buried insulator layer (102, 105) in the integrated circuit device so that a screening test can be conducted to screen for a defect (106) in the buried insulator layer by measuring a leakage current.
    Type: Application
    Filed: June 21, 2021
    Publication date: January 6, 2022
    Applicant: NXP USA, Inc.
    Inventors: Laurent Segarra, Maarten Jacobus Swanenberg, Pierre Turpin, Matthew Bacchi, Russell Schaller, Keith Jackoski, Ronghua Zhu
  • Publication number: 20210294363
    Abstract: A system-on-a-chip (SoC) is designed to operate within optimal voltage and frequency ranges. If an SoC is provided power outside of the optimal voltage range, the SoC can be placed in a high-stress state, exposing the chip to a security attack. Embodiments of the present systems and method limit the minimum and maximum voltage supplied to an SoC from a power management integrated circuit (PMIC). Embodiments can also track a number of requests to provide power outside of the optimal range and can signal a warning of repeated attempts to take an SoC outside of the SoC's optimal range, which may be indicative of a malicious attack on the system.
    Type: Application
    Filed: March 17, 2021
    Publication date: September 23, 2021
    Inventors: Jean-Philippe Meunier, Maxime Clairet, Alaa Eldin Y. El Sherif, Pierre Turpin
  • Patent number: 10742443
    Abstract: A method for transmitting messages in a data bus system, wherein the messages can be transmitted in the form of data frames by a data bus and a data frame that is to be sent by a bus subscriber is checked for a piece of changeover information, which method is furthermore distinguished in that changeover of the rise time and/or edge shape of edges of bit pulses of the data frame that is to be sent is performed on the basis of the presence of a defined value of the piece of changeover information. In addition, a corresponding transceiver and to an electronic control unit is disclosed.
    Type: Grant
    Filed: March 26, 2015
    Date of Patent: August 11, 2020
    Assignees: Continental Teves AG & Co. oHG, NXP USA Inc.
    Inventors: Tobias Beckmann, Ireneusz Janiszewski, Claas Cornelius, Pierre Turpin, Eugeny Alexandrovich Kulkov, Robert Gach, Sergey Sergeevich Ryabchenkov
  • Publication number: 20180069723
    Abstract: A method for transmitting messages in a data bus system, wherein the messages can be transmitted in the form of data frames by a data bus and a data frame that is to be sent by a bus subscriber is checked for a piece of changeover information, which method is furthermore distinguished in that changeover of the rise time and/or edge shape of edges of bit pulses of the data frame that is to be sent is performed on the basis of the presence of a defined value of the piece of changeover information. In addition, a corresponding transceiver and to an electronic control unit is disclosed.
    Type: Application
    Filed: March 26, 2015
    Publication date: March 8, 2018
    Inventors: Tobias BECKMANN, Ireneusz Janiszewski, Claas Cornelius, Pierre Turpin, Eugeny Alexandrovich Kulkov, Robert Gach, Sergey Sergeevich Ryabchenkov
  • Patent number: 9482711
    Abstract: A method of and apparatus for fault detection utilizing a diagnostic procedure by a diagnostic device to detect a short circuit between at least two of a plurality of load electrical connections, the diagnostic procedure comprising applying a test electrical signal to each of the load electrical connections in turn and while applying the test electrical signal to a first one of the load electrical connections, detecting whether an electrical output is present, in response, on any other of the load electrical connections, wherein the detecting by the diagnostic device includes applying the test electrical signal to the first one of the load electrical connections in an operational mode of the apparatus when an electrically controlled switch connected to the first one of the load electrical connections is in an off state.
    Type: Grant
    Filed: December 2, 2013
    Date of Patent: November 1, 2016
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Kamel Abouda, Stephanie Creveau-Boury, Murielle Delage, Pierre Turpin
  • Patent number: 9176179
    Abstract: A method of measuring a capacitor value comprises the steps of loading the capacitor up to a given voltage value; obtaining a first measure of a time for discharging the capacitor by a fixed voltage drop, the discharge of the capacitor being caused by a first current; reloading the capacitor up to the given voltage value; obtaining a second measure of a time for discharging the capacitor by the fixed voltage drop, the discharge of the capacitor being caused by the first current and by a second current of known value added to said first current; and determining the capacitor value from the difference between the first measure and the second measure, based on the given voltage drop or the given time, respectively, and based further on the known value of the given second current.
    Type: Grant
    Filed: April 22, 2011
    Date of Patent: November 3, 2015
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Erwan Hemon, Hamada Ahmed, Pierre Turpin
  • Patent number: 9145104
    Abstract: An airbag apparatus connected with a battery includes activation circuits each of which has a squib and a high-side switching element, a safing switching element connected between the battery and the activation circuits, a safing switch control circuit controlling the safing switching element to provide a target voltage to the activation circuits, a terminal voltage acquiring circuit that acquires a terminal voltage of each squib, and a target voltage setting circuit that sets the target voltage. When a maximum-terminal voltage is lower than a reference voltage, the target voltage setting circuit sets the target voltage to be equal to the reference voltage. When the maximum-terminal voltage is higher than the reference voltage, the target voltage setting circuit sets the target voltage to correspond to the maximum-terminal voltage so that a reverse current is avoided in the high-side switching element.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: September 29, 2015
    Assignees: DENSO CORPORATION, Freescale Semiconductor, Inc.
    Inventors: Masahiko Ito, Pierre Turpin, Erwan Hemon, Ahmed Hamada
  • Publication number: 20150070006
    Abstract: Electric current transducer module comprising a magnetic circuit with a magnetic core and an air gap, the magnetic core having a central passage configured to receive a primary conductor carrying a primary current to be measured. The electric current transducer module further comprises a signal processing circuit including a circuit board and contact terminals for connection to external circuitry, and a magnetic field detector arranged at least partially in the air gap of the magnetic circuit. The electric current transducer module further comprises a magnetic core mounting support comprising a molded support and a grounding and fixing mechanism configured to hold and rigidly fix the magnetic core to the molded base to form a magnetic circuit unit. The magnetic circuit unit is configured to be fixedly assembled to the printed circuit board.
    Type: Application
    Filed: April 17, 2013
    Publication date: March 12, 2015
    Inventors: Pierre Turpin, Philippe Sage, Frédéric Cattaneo
  • Publication number: 20140277949
    Abstract: An airbag apparatus connected with a battery includes activation circuits each of which has a squib and a high-side switching element, a safing switching element connected between the battery and the activation circuits, a safing switch control circuit controlling the safing switching element to provide a target voltage to the activation circuits, a terminal voltage acquiring circuit that acquires a terminal voltage of each squib, and a target voltage setting circuit that sets the target voltage. When a maximum-terminal voltage is lower than a reference voltage, the target voltage setting circuit sets the target voltage to be equal to the reference voltage. When the maximum-terminal voltage is higher than the reference voltage, the target voltage setting circuit sets the target voltage to correspond to the maximum-terminal voltage so that a reverse current is avoided in the high-side switching element.
    Type: Application
    Filed: March 11, 2014
    Publication date: September 18, 2014
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Masahiko Ito, Pierre Turpin, Erwan Hemon, Ahmed Hamada
  • Patent number: 8702034
    Abstract: The disclosure relates to a device for testing means of detecting the loading of the secondary path of a flight control actuator of the type including a primary path and a secondary path able to take up the effort of the primary path in the event of a breakdown of the latter, wherein a tool is able to press against at least one zone of at least one element of the secondary path, as well as a lever arm which by tilting allows the tool to press against the zone so that it exerts a traction and/or compression force on the secondary path, the lever arm being mounted pivotingly on a support able to be fastened on a structure that is mechanically independent of the secondary path.
    Type: Grant
    Filed: December 8, 2010
    Date of Patent: April 22, 2014
    Assignee: Goodrich Actuation Systems SAS
    Inventors: Thomas Moulon, Pierre Turpin
  • Publication number: 20140084940
    Abstract: A method of and apparatus for fault detection utilizing a diagnostic procedure by a diagnostic device to detect a short circuit between at least two of a plurality of load electrical connections, the diagnostic procedure comprising applying a test electrical signal to each of the load electrical connections in turn and whilst applying the test electrical signal to a first one of the load electrical connections, detecting whether an electrical output is present, in response, on any other of the load electrical connections, wherein the detecting by the diagnostic device includes applying the test electrical signal to the first one of the load electrical connections in an operational mode of the apparatus when an electrically controlled switch connected to the first one of the load electrical connections is in an off state.
    Type: Application
    Filed: December 2, 2013
    Publication date: March 27, 2014
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Kamel ABOUDA, Stephanie CREVEAU-BOURY, Murielle DELAGE, Pierre TURPIN
  • Publication number: 20140043034
    Abstract: A method of measuring a capacitor value comprises the steps of loading the capacitor up to a given voltage value; obtaining a first measure of a time for discharging the capacitor by a fixed voltage drop, the discharge of the capacitor being caused by a first current; reloading the capacitor up to the given voltage value; obtaining a second measure of a time for discharging the capacitor by the fixed voltage drop, the discharge of the capacitor being caused by the first current and by a second current of known value added to said first current; and determining the capacitor value from the difference between the first measure and the second measure, based on the given voltage drop or the given time, respectively, and based further on the known value of the given second current.
    Type: Application
    Filed: April 22, 2011
    Publication date: February 13, 2014
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Erwan Hemon, Hamada Ahmed, Pierre Turpin
  • Patent number: 8598886
    Abstract: Apparatus for detecting faults in the delivery of electrical power to electrical loads, includes a plurality of load electrical connections arranged to deliver electrical power from an electrical power source to each of a plurality of electrical loads, a plurality of electrical switches, each connected to an associated one of the load connections, and a diagnostic device operable to detect a short circuit fault in the apparatus, wherein the diagnostic device is operable to apply a diagnostic procedure to detect a short circuit connection between at least two of the load electrical connections and includes a control logic unit operable to apply to each of the electrical switches in turn a test control signal causing operation of the switch to apply a test electrical signal to each of the load electrical connections in turn; and detector means connected to the load electrical connections and operable, while the test electrical signal is applied in turn to each load electrical connection, to detect whether a cor
    Type: Grant
    Filed: March 20, 2008
    Date of Patent: December 3, 2013
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Kamel Abouda, Stephanie Creveau-Boury, Murielle Delage, Pierre Turpin
  • Patent number: 8395872
    Abstract: A current driver circuit comprises circuitry having a current adjustment function and operably coupled to a current driver for providing a current to a current consuming device. The circuitry comprises or is operably coupled to a function arranged to determine a current level being drawn by the current consuming device. The current adjustment function varies an over-load limit applied to the current driver in response to a variation in the determined current level. In this manner, the current level being drawn by a current consuming device, such as a light bulb, is used to continuously or intermittently adjusting the current limit of a current driver circuit, such as a lamp driver, to minimize the energy dissipated in case of an overload condition.
    Type: Grant
    Filed: April 18, 2005
    Date of Patent: March 12, 2013
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Pierre Turpin, Laurent Guillot
  • Patent number: 8384313
    Abstract: A circuit for improving the control of a change in state of a signal in an electronic device between a first state and a second state, wherein a first change in state occurs when the state changes from the second state to the first state and a second change in state occurs when the state changes from the first state to the second state and wherein the first and second changes in state have associated therewith a first and a second time delay over which each change in state occurs, characterized in that said circuit comprises a determining unit for measuring the first time delay and a calculator for calculating a common delay to replace one or more of the first and second delays to thereby improve the control of the change in state of the signal.
    Type: Grant
    Filed: November 13, 2007
    Date of Patent: February 26, 2013
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Kamel Abouda, Murielle Delage, Erwan Hemon, Pierre Turpin
  • Patent number: 8324883
    Abstract: The invention relates to a Rogowski-loop current sensor comprising a winding (4) extending between two ends (14, 16) configured to be provided about a primary conductor in which flows a current to be measured by moving said ends away from or towards each other. The sensor further includes a closing mechanism (18) provided at the ends of the winding, and including a body (20) having a high magnetic permeability and extending between said ends when the loop is closed.
    Type: Grant
    Filed: June 18, 2008
    Date of Patent: December 4, 2012
    Assignee: Liaisons Electroniques-Mecaniques LEM S.A.
    Inventor: Pierre Turpin
  • Publication number: 20120126789
    Abstract: The invention relates to a Rogowski-loop current sensor comprising a winding (4) extending between two ends (14, 16) configured to be provided about a primary conductor in which flows a current to be measured by moving said ends away from or towards each other. The sensor further includes a closing mechanism (18) provided at the ends of the winding, and including a body (20) having a high magnetic permeability and extending between said ends when the loop is closed.
    Type: Application
    Filed: June 18, 2008
    Publication date: May 24, 2012
    Applicant: Liaisons Electroniques-Mecaniques LEM S.A.
    Inventor: Pierre Turpin
  • Patent number: 8040643
    Abstract: Power supply switching apparatus comprising an output switch for supplying power from a power supply to a load connected to an output terminal, a driver for controlling turn-on of said output switch, and a control signal generator for controlling said driver to produce a desired progressive turn-on characteristic. The apparatus also includes overload detection means responsive to a parameter of the load relative to a reference signal to provide a fault signal in case of detection of an overload condition after a turn-on phase of said output switch. The control signal generator is responsive to the reference signal to activate said overload detection means to provide a fault signal during the turn-on phase of the output switch even in presence of a severe overload condition at the output terminal.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: October 18, 2011
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Laurent Guillot, Pierre Turpin