Patents by Inventor Pierre Turpin
Pierre Turpin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11500403Abstract: A system-on-a-chip (SoC) is designed to operate within optimal voltage and frequency ranges. If an SoC is provided power outside of the optimal voltage range, the SoC can be placed in a high-stress state, exposing the chip to a security attack. Embodiments of the present systems and method limit the minimum and maximum voltage supplied to an SoC from a power management integrated circuit (PMIC). Embodiments can also track a number of requests to provide power outside of the optimal range and can signal a warning of repeated attempts to take an SoC outside of the SoC's optimal range, which may be indicative of a malicious attack on the system.Type: GrantFiled: March 17, 2021Date of Patent: November 15, 2022Assignee: NXP USA, INC.Inventors: Jean-Philippe Meunier, Maxime Clairet, Alaa Eldin Y El Sherif, Pierre Turpin
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Patent number: 11448690Abstract: A testing method and apparatus is disclosed for testing an integrated circuit device (100) which has a dedicated ground bias pad (121) connected across a high voltage electrostatic discharge clamp circuit (123) to a well-driving ground pad (122) by applying a first voltage to the dedicated ground bias pad to bias a wafer substrate (101) while simultaneously applying a second voltage to the well-driving ground pad to bias the well region (103), where the first and second voltage create a stressing voltage across a buried insulator layer (102, 105) in the integrated circuit device so that a screening test can be conducted to screen for a defect (106) in the buried insulator layer by measuring a leakage current.Type: GrantFiled: June 21, 2021Date of Patent: September 20, 2022Assignee: NXP USA, INC.Inventors: Laurent Segarra, Maarten Jacobus Swanenberg, Pierre Turpin, Matthew Bacchi, Russell Schaller, Keith Jackoski, Ronghua Zhu
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Publication number: 20220003812Abstract: A testing method and apparatus is disclosed for testing an integrated circuit device (100) which has a dedicated ground bias pad (121) connected across a high voltage electrostatic discharge clamp circuit (123) to a well-driving ground pad (122) by applying a first voltage to the dedicated ground bias pad to bias a wafer substrate (101) while simultaneously applying a second voltage to the well-driving ground pad to bias the well region (103), where the first and second voltage create a stressing voltage across a buried insulator layer (102, 105) in the integrated circuit device so that a screening test can be conducted to screen for a defect (106) in the buried insulator layer by measuring a leakage current.Type: ApplicationFiled: June 21, 2021Publication date: January 6, 2022Applicant: NXP USA, Inc.Inventors: Laurent Segarra, Maarten Jacobus Swanenberg, Pierre Turpin, Matthew Bacchi, Russell Schaller, Keith Jackoski, Ronghua Zhu
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Publication number: 20210294363Abstract: A system-on-a-chip (SoC) is designed to operate within optimal voltage and frequency ranges. If an SoC is provided power outside of the optimal voltage range, the SoC can be placed in a high-stress state, exposing the chip to a security attack. Embodiments of the present systems and method limit the minimum and maximum voltage supplied to an SoC from a power management integrated circuit (PMIC). Embodiments can also track a number of requests to provide power outside of the optimal range and can signal a warning of repeated attempts to take an SoC outside of the SoC's optimal range, which may be indicative of a malicious attack on the system.Type: ApplicationFiled: March 17, 2021Publication date: September 23, 2021Inventors: Jean-Philippe Meunier, Maxime Clairet, Alaa Eldin Y. El Sherif, Pierre Turpin
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Patent number: 10742443Abstract: A method for transmitting messages in a data bus system, wherein the messages can be transmitted in the form of data frames by a data bus and a data frame that is to be sent by a bus subscriber is checked for a piece of changeover information, which method is furthermore distinguished in that changeover of the rise time and/or edge shape of edges of bit pulses of the data frame that is to be sent is performed on the basis of the presence of a defined value of the piece of changeover information. In addition, a corresponding transceiver and to an electronic control unit is disclosed.Type: GrantFiled: March 26, 2015Date of Patent: August 11, 2020Assignees: Continental Teves AG & Co. oHG, NXP USA Inc.Inventors: Tobias Beckmann, Ireneusz Janiszewski, Claas Cornelius, Pierre Turpin, Eugeny Alexandrovich Kulkov, Robert Gach, Sergey Sergeevich Ryabchenkov
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Publication number: 20180069723Abstract: A method for transmitting messages in a data bus system, wherein the messages can be transmitted in the form of data frames by a data bus and a data frame that is to be sent by a bus subscriber is checked for a piece of changeover information, which method is furthermore distinguished in that changeover of the rise time and/or edge shape of edges of bit pulses of the data frame that is to be sent is performed on the basis of the presence of a defined value of the piece of changeover information. In addition, a corresponding transceiver and to an electronic control unit is disclosed.Type: ApplicationFiled: March 26, 2015Publication date: March 8, 2018Inventors: Tobias BECKMANN, Ireneusz Janiszewski, Claas Cornelius, Pierre Turpin, Eugeny Alexandrovich Kulkov, Robert Gach, Sergey Sergeevich Ryabchenkov
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Patent number: 9482711Abstract: A method of and apparatus for fault detection utilizing a diagnostic procedure by a diagnostic device to detect a short circuit between at least two of a plurality of load electrical connections, the diagnostic procedure comprising applying a test electrical signal to each of the load electrical connections in turn and while applying the test electrical signal to a first one of the load electrical connections, detecting whether an electrical output is present, in response, on any other of the load electrical connections, wherein the detecting by the diagnostic device includes applying the test electrical signal to the first one of the load electrical connections in an operational mode of the apparatus when an electrically controlled switch connected to the first one of the load electrical connections is in an off state.Type: GrantFiled: December 2, 2013Date of Patent: November 1, 2016Assignee: FREESCALE SEMICONDUCTOR, INC.Inventors: Kamel Abouda, Stephanie Creveau-Boury, Murielle Delage, Pierre Turpin
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Patent number: 9176179Abstract: A method of measuring a capacitor value comprises the steps of loading the capacitor up to a given voltage value; obtaining a first measure of a time for discharging the capacitor by a fixed voltage drop, the discharge of the capacitor being caused by a first current; reloading the capacitor up to the given voltage value; obtaining a second measure of a time for discharging the capacitor by the fixed voltage drop, the discharge of the capacitor being caused by the first current and by a second current of known value added to said first current; and determining the capacitor value from the difference between the first measure and the second measure, based on the given voltage drop or the given time, respectively, and based further on the known value of the given second current.Type: GrantFiled: April 22, 2011Date of Patent: November 3, 2015Assignee: Freescale Semiconductor, Inc.Inventors: Erwan Hemon, Hamada Ahmed, Pierre Turpin
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Patent number: 9145104Abstract: An airbag apparatus connected with a battery includes activation circuits each of which has a squib and a high-side switching element, a safing switching element connected between the battery and the activation circuits, a safing switch control circuit controlling the safing switching element to provide a target voltage to the activation circuits, a terminal voltage acquiring circuit that acquires a terminal voltage of each squib, and a target voltage setting circuit that sets the target voltage. When a maximum-terminal voltage is lower than a reference voltage, the target voltage setting circuit sets the target voltage to be equal to the reference voltage. When the maximum-terminal voltage is higher than the reference voltage, the target voltage setting circuit sets the target voltage to correspond to the maximum-terminal voltage so that a reverse current is avoided in the high-side switching element.Type: GrantFiled: March 11, 2014Date of Patent: September 29, 2015Assignees: DENSO CORPORATION, Freescale Semiconductor, Inc.Inventors: Masahiko Ito, Pierre Turpin, Erwan Hemon, Ahmed Hamada
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Publication number: 20150070006Abstract: Electric current transducer module comprising a magnetic circuit with a magnetic core and an air gap, the magnetic core having a central passage configured to receive a primary conductor carrying a primary current to be measured. The electric current transducer module further comprises a signal processing circuit including a circuit board and contact terminals for connection to external circuitry, and a magnetic field detector arranged at least partially in the air gap of the magnetic circuit. The electric current transducer module further comprises a magnetic core mounting support comprising a molded support and a grounding and fixing mechanism configured to hold and rigidly fix the magnetic core to the molded base to form a magnetic circuit unit. The magnetic circuit unit is configured to be fixedly assembled to the printed circuit board.Type: ApplicationFiled: April 17, 2013Publication date: March 12, 2015Inventors: Pierre Turpin, Philippe Sage, Frédéric Cattaneo
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Publication number: 20140277949Abstract: An airbag apparatus connected with a battery includes activation circuits each of which has a squib and a high-side switching element, a safing switching element connected between the battery and the activation circuits, a safing switch control circuit controlling the safing switching element to provide a target voltage to the activation circuits, a terminal voltage acquiring circuit that acquires a terminal voltage of each squib, and a target voltage setting circuit that sets the target voltage. When a maximum-terminal voltage is lower than a reference voltage, the target voltage setting circuit sets the target voltage to be equal to the reference voltage. When the maximum-terminal voltage is higher than the reference voltage, the target voltage setting circuit sets the target voltage to correspond to the maximum-terminal voltage so that a reverse current is avoided in the high-side switching element.Type: ApplicationFiled: March 11, 2014Publication date: September 18, 2014Applicant: Freescale Semiconductor, Inc.Inventors: Masahiko Ito, Pierre Turpin, Erwan Hemon, Ahmed Hamada
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Patent number: 8702034Abstract: The disclosure relates to a device for testing means of detecting the loading of the secondary path of a flight control actuator of the type including a primary path and a secondary path able to take up the effort of the primary path in the event of a breakdown of the latter, wherein a tool is able to press against at least one zone of at least one element of the secondary path, as well as a lever arm which by tilting allows the tool to press against the zone so that it exerts a traction and/or compression force on the secondary path, the lever arm being mounted pivotingly on a support able to be fastened on a structure that is mechanically independent of the secondary path.Type: GrantFiled: December 8, 2010Date of Patent: April 22, 2014Assignee: Goodrich Actuation Systems SASInventors: Thomas Moulon, Pierre Turpin
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Publication number: 20140084940Abstract: A method of and apparatus for fault detection utilizing a diagnostic procedure by a diagnostic device to detect a short circuit between at least two of a plurality of load electrical connections, the diagnostic procedure comprising applying a test electrical signal to each of the load electrical connections in turn and whilst applying the test electrical signal to a first one of the load electrical connections, detecting whether an electrical output is present, in response, on any other of the load electrical connections, wherein the detecting by the diagnostic device includes applying the test electrical signal to the first one of the load electrical connections in an operational mode of the apparatus when an electrically controlled switch connected to the first one of the load electrical connections is in an off state.Type: ApplicationFiled: December 2, 2013Publication date: March 27, 2014Applicant: FREESCALE SEMICONDUCTOR, INC.Inventors: Kamel ABOUDA, Stephanie CREVEAU-BOURY, Murielle DELAGE, Pierre TURPIN
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Publication number: 20140043034Abstract: A method of measuring a capacitor value comprises the steps of loading the capacitor up to a given voltage value; obtaining a first measure of a time for discharging the capacitor by a fixed voltage drop, the discharge of the capacitor being caused by a first current; reloading the capacitor up to the given voltage value; obtaining a second measure of a time for discharging the capacitor by the fixed voltage drop, the discharge of the capacitor being caused by the first current and by a second current of known value added to said first current; and determining the capacitor value from the difference between the first measure and the second measure, based on the given voltage drop or the given time, respectively, and based further on the known value of the given second current.Type: ApplicationFiled: April 22, 2011Publication date: February 13, 2014Applicant: Freescale Semiconductor, Inc.Inventors: Erwan Hemon, Hamada Ahmed, Pierre Turpin
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Patent number: 8598886Abstract: Apparatus for detecting faults in the delivery of electrical power to electrical loads, includes a plurality of load electrical connections arranged to deliver electrical power from an electrical power source to each of a plurality of electrical loads, a plurality of electrical switches, each connected to an associated one of the load connections, and a diagnostic device operable to detect a short circuit fault in the apparatus, wherein the diagnostic device is operable to apply a diagnostic procedure to detect a short circuit connection between at least two of the load electrical connections and includes a control logic unit operable to apply to each of the electrical switches in turn a test control signal causing operation of the switch to apply a test electrical signal to each of the load electrical connections in turn; and detector means connected to the load electrical connections and operable, while the test electrical signal is applied in turn to each load electrical connection, to detect whether a corType: GrantFiled: March 20, 2008Date of Patent: December 3, 2013Assignee: Freescale Semiconductor, Inc.Inventors: Kamel Abouda, Stephanie Creveau-Boury, Murielle Delage, Pierre Turpin
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Patent number: 8395872Abstract: A current driver circuit comprises circuitry having a current adjustment function and operably coupled to a current driver for providing a current to a current consuming device. The circuitry comprises or is operably coupled to a function arranged to determine a current level being drawn by the current consuming device. The current adjustment function varies an over-load limit applied to the current driver in response to a variation in the determined current level. In this manner, the current level being drawn by a current consuming device, such as a light bulb, is used to continuously or intermittently adjusting the current limit of a current driver circuit, such as a lamp driver, to minimize the energy dissipated in case of an overload condition.Type: GrantFiled: April 18, 2005Date of Patent: March 12, 2013Assignee: Freescale Semiconductor, Inc.Inventors: Pierre Turpin, Laurent Guillot
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Patent number: 8384313Abstract: A circuit for improving the control of a change in state of a signal in an electronic device between a first state and a second state, wherein a first change in state occurs when the state changes from the second state to the first state and a second change in state occurs when the state changes from the first state to the second state and wherein the first and second changes in state have associated therewith a first and a second time delay over which each change in state occurs, characterized in that said circuit comprises a determining unit for measuring the first time delay and a calculator for calculating a common delay to replace one or more of the first and second delays to thereby improve the control of the change in state of the signal.Type: GrantFiled: November 13, 2007Date of Patent: February 26, 2013Assignee: Freescale Semiconductor, Inc.Inventors: Kamel Abouda, Murielle Delage, Erwan Hemon, Pierre Turpin
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Patent number: 8324883Abstract: The invention relates to a Rogowski-loop current sensor comprising a winding (4) extending between two ends (14, 16) configured to be provided about a primary conductor in which flows a current to be measured by moving said ends away from or towards each other. The sensor further includes a closing mechanism (18) provided at the ends of the winding, and including a body (20) having a high magnetic permeability and extending between said ends when the loop is closed.Type: GrantFiled: June 18, 2008Date of Patent: December 4, 2012Assignee: Liaisons Electroniques-Mecaniques LEM S.A.Inventor: Pierre Turpin
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Publication number: 20120126789Abstract: The invention relates to a Rogowski-loop current sensor comprising a winding (4) extending between two ends (14, 16) configured to be provided about a primary conductor in which flows a current to be measured by moving said ends away from or towards each other. The sensor further includes a closing mechanism (18) provided at the ends of the winding, and including a body (20) having a high magnetic permeability and extending between said ends when the loop is closed.Type: ApplicationFiled: June 18, 2008Publication date: May 24, 2012Applicant: Liaisons Electroniques-Mecaniques LEM S.A.Inventor: Pierre Turpin
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Patent number: 8040643Abstract: Power supply switching apparatus comprising an output switch for supplying power from a power supply to a load connected to an output terminal, a driver for controlling turn-on of said output switch, and a control signal generator for controlling said driver to produce a desired progressive turn-on characteristic. The apparatus also includes overload detection means responsive to a parameter of the load relative to a reference signal to provide a fault signal in case of detection of an overload condition after a turn-on phase of said output switch. The control signal generator is responsive to the reference signal to activate said overload detection means to provide a fault signal during the turn-on phase of the output switch even in presence of a severe overload condition at the output terminal.Type: GrantFiled: December 22, 2006Date of Patent: October 18, 2011Assignee: Freescale Semiconductor, Inc.Inventors: Laurent Guillot, Pierre Turpin