Patents by Inventor Pieter Bakker

Pieter Bakker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080278727
    Abstract: The invention relates to a device for imaging an interior of a turbid medium. Said device (1) comprises a measurement volume (15) for accommodating the turbid medium. Said measurement volume (15) comprises a number of sources capable of communicating light, said sources comprising a preferred source, capable of communicating preferred light and a further source, capable of communicating further light. Said device (1) further comprises a detection unit capable of detecting composed light comprising a preferred component comprising at least a part of the preferred light and a further component comprising at least a part of the further light. The device is adapted such that the negative effect said further component in the composed light may have on detecting the preferred component also present in the composed light is counteracted.
    Type: Application
    Filed: November 2, 2006
    Publication date: November 13, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Michael Cornelis Van Beek, Martinus Bernardus Van Der Mark, Levinus Pieter Bakker
  • Publication number: 20080267022
    Abstract: The invention relates to a method and system for reading data on a data layer (105) of an information carrier (101) comprising one or more servo marks (108, 109) positioned relative to said data layer (105), the system comprising: probe array generation means (104, 102) for generating a probe array comprising an array of light spots (103) intended to be applied to said information carrier (101) so as to generate output beams representative of said one or more servo marks (108, 109) and said data, wherein the distance between the focal point of one or more light spots of a portion of said probe array and a respective portion of said information carrier corresponding to at least one servo mark is different to the distance between the focal points of the light spots of the rest of the probe array and the rest of said information carrier; an image sensor (106) for receiving said output beams and generating a corresponding image; means (116) for deriving a contrast value in respect of at least of a portion of said
    Type: Application
    Filed: November 7, 2006
    Publication date: October 30, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventor: Levinus Pieter Bakker
  • Publication number: 20080265175
    Abstract: The invention relates to a device (1) for detection of excitation (110) using a multiple spot arrangement (60), in which a multiple spot generator (50) is matched to the multiple spot arrangement (60) in such a way that light (100) entering the multiple spot generator (50) will be guided to defined areas on the multiple spot arrangement (60).
    Type: Application
    Filed: July 17, 2006
    Publication date: October 30, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Derk Jan Wilfred Klunder, Levinus Pieter Bakker, Sjoerd Stallinga
  • Publication number: 20080254211
    Abstract: A filter window manufacturing method includes fabricating a structure of wires on a substrate, depositing a lacquer over the wires and the substrate, depositing a first layer that includes a material selected from the group consisting of AlN, Ru, Ir, Au, SiN, Rh, C and combinations thereof, removing the lacquer, removing the substrate, and baking the first layer.
    Type: Application
    Filed: July 30, 2007
    Publication date: October 16, 2008
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Ralph Kurt, Levinus Pieter Bakker
  • Publication number: 20080212430
    Abstract: A system for reading an information carrier having a data layer (101) on which is stored a data set. A probe array generating means (104) generates an array of light spots (102) which is applied to the data layer (101). The resultant output light beams are representative of the binary value of data stored in the data layer (101). Macro-cell scanning is effected in a single dimension by moving the array of light spots (102) relative to the data layer (101) along a path (A,B) which is non-parallel to the axes of the matrix defining the probe array. One-dimensional scanning results in a less complex system.
    Type: Application
    Filed: October 11, 2006
    Publication date: September 4, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Levinus Pieter Bakker, R.F.M. Hendriks
  • Publication number: 20080212053
    Abstract: A device manufacturing method is disclosed. The method includes patterning a beam of radiation, projecting the patterned beam of radiation onto a plurality of outer target portions of a substrate in a sequence in which each subsequent outer target portion is spaced-apart from a preceding outer target portion, and subsequent to projecting the patterned beam of radiation on the plurality of outer target portions, projecting the patterned beam of radiation onto an inner target portion of the substrate.
    Type: Application
    Filed: October 13, 2004
    Publication date: September 4, 2008
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Joost Jeroen Ottens, Levinus Pieter Bakker, Wilhelmus Josephus Box, Jan Van Elp, Frank Jeroen Pieter Schuurmans, Jan Evert Van Der Werf
  • Patent number: 7414251
    Abstract: A method for providing an operable filter system for filtering particles out of a beam of radiation in lithography is disclosed. The method includes providing a slack foil or wire for intercepting the particles, mounting at least a first point or side of the foil or wire to a first position of a mounting assembly, and substantially stretching the slack foil or wire at least within the beam of radiation, substantially parallel to a direction in which the radiation propagates.
    Type: Grant
    Filed: December 27, 2005
    Date of Patent: August 19, 2008
    Assignee: ASML Netherlands B.V.
    Inventor: Levinus Pieter Bakker
  • Publication number: 20080180800
    Abstract: The invention relates to a device for generating a periodical array of light spots from an input light beam, said device comprising—a periodical array of apertures (202) forming a plurality of interlaced sub-arrays of apertures,—phase shifter elements (PSi) placed in front of said apertures for imposing a phase shift to said input light beam so that each light spot is constructed as the superposition of a plurality of light spots generated by said plurality of interlaced sub-arrays of apertures. Use: Light spot generation.
    Type: Application
    Filed: September 28, 2005
    Publication date: July 31, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventor: Levinus Pieter Bakker
  • Patent number: 7405825
    Abstract: The optical analysis system (20) for determining an amplitude of a principal component of an optical signal comprises a multivariate optical element (10) for reflecting the optical signal and thereby weighing the optical signal by a spectral weighing function, and a detector (9, 9P, 9N) for detecting the weighed optical signal. The optical analysis system (20) may further comprise a dispersive element (2) for spectrally dispersing the optical signal, the multivariate optical element being arranged to receive the dispersed optical signal. The blood analysis system (40) comprises the optical analysis system (20) according to the invention.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: July 29, 2008
    Assignee: Koninklijke Philiips Electronics N. V.
    Inventors: Frank Jeroen Pieter Schuurmans, Michael Cornelis Van Beek, Levinus Pieter Bakker, Wouter Harry Jacinth Rensen, Bernardus Hendrikus Wilhelmus Hendriks, Robert Frans Maria Hendriks, Thomas Steffen
  • Patent number: 7405804
    Abstract: A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support configured to support a patterning device, the patterning device being configured to impart the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table configured to hold a substrate; and a projection system configured to project the patterned radiation beam onto a target portion of the substrate, wherein the radiation beam is reflected from at least one grazing incidence mirror that enhances the spectral purity of the radiation beam.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: July 29, 2008
    Assignee: ASML Netherlands B.V.
    Inventor: Levinus Pieter Bakker
  • Patent number: 7382436
    Abstract: A mirror has a mirror surface, wherein the mirror surface includes a protrusion including a material selected from at least one of Be, B, C, P, S, K, Ca, Sc, Br, Rb, Sr, Y, Zr, Nb, Mo, Ba, La, Ce, Pr, Pa and U, or a first protrusion including a first material selected from at least one of Be, B, C, P, S, K, Ca, Sc, Br, Rb, Sr, Y, Zr, Nb, Mo, Ba, La, Ce, Pr, Pa and U, and a second protrusion including a second material selected from at least one of Be, B, C, Si, P, S, K, Ca, Sc, Br, Rb, Sr, Y, Zr, Nb, Mo, Ba, La, Ce, Pr, Pa and U, and the first and second materials are not the same. A lithographic projection apparatus includes such a mirror. A device manufacturing method includes reflecting a beam of radiation by use of such a mirror. A device is manufactured according to the method.
    Type: Grant
    Filed: July 9, 2004
    Date of Patent: June 3, 2008
    Assignee: ASML Netherlands B.V.
    Inventor: Levinus Pieter Bakker
  • Publication number: 20080100892
    Abstract: The invention relates to an information carrier (801) comprising: a data layer (802) intended to store a set of elementary data, a layer (803) comprising an array of apertures (804) placed parallel to said data layer (802) for generating an array of light spots intended to be applied to said data layer (802). The invention also relates to a system and apparatus for reading such an information carrier.
    Type: Application
    Filed: July 12, 2005
    Publication date: May 1, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Robert Frans Maria Hendriks, Levinus Pieter Bakker
  • Patent number: 7352434
    Abstract: In a lithographic apparatus, a localized area of the substrate surface under a projection system is immersed in liquid. The height of a liquid supply system above the surface of the substrate can be varied using actuators. A control system uses feedforward or feedback control with input of the surface height of the substrate to maintain the liquid supply system at a predetermined height above the surface of the substrate.
    Type: Grant
    Filed: May 13, 2004
    Date of Patent: April 1, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Bob Streefkerk, Levinus Pieter Bakker, Johannes Jacobus Matheus Baselmans, Henrikus Herman Marie Cox, Antonius Theodorus Anna Maria Derksen, Sjoerd Nicolaas Lambertus Donders, Christiaan Alexander Hoogendam, Joeri Lof, Erik Roelof Loopstra, Jeroen Johannes Sophia Maria Mertens, Frits Van Der Meulen, Johannes Catharinus Hubertus Mulkens, Gerardus Petrus Matthijs Van Nunen, Klaus Simon, Bernardus Antonius Slaghekke, Alexander Straaijer, Jan-Gerard Cornelis Van Der Toorn, Martijn Houkes
  • Publication number: 20080054189
    Abstract: A lithographic apparatus includes a radiation source configured to emit radiation to form a radiation beam, the radiation being of a type which can create plasma in a low pressure environment in the apparatus, and an optical component configured to condition the radiation beam, impart the conditioned radiation beam with a pattern in its cross-section to form a patterned radiation beam, project the patterned radiation beam onto a target portion of a substrate, and/or to detect radiation. The optical component is provided with a plasma quenching structure, the plasma quenching structure being configured to provide electron-ion recombination in, on and/or near the optical component.
    Type: Application
    Filed: August 30, 2006
    Publication date: March 6, 2008
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Johannes Hubertus Josephina Moors, Levinus Pieter Bakker, Frank Jeroen Pieter Schuurmans
  • Patent number: 7336416
    Abstract: A multi-layer mirror includes on top of the multi-layer mirror a spectral purity enhancement layer, for example for application in an EUV lithographic apparatus. This spectral purity enhancement layer includes a first spectral purity enhancement layer, but between the multi-layer mirror and first spectral purity enhancement layer there may optionally be an intermediate layer or a second spectral purity enhancement layer and intermediate layer. Hence, multi-layer mirrors with the following configurations are possible: multi-layer mirror/first spectral purity enhancement layer; multi-layer mirror/intermediate layer/first spectral purity enhancement layer; and multi-layer mirror/second spectral purity enhancement layer/intermediate layer/first spectral purity enhancement layer. The spectral purity of normal incidence radiation may be enhanced, such that DUV radiation is diminished relatively stronger than EUV radiation.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: February 26, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Maarten Marinus Johannes W Van Herpen, Levinus Pieter Bakker, Vadim Yevgenyevich Banine, Derk Jan Wilfred Klunder
  • Patent number: 7315346
    Abstract: A lithographic projection apparatus is disclosed. The apparatus includes a support structure constructed to support a patterning structure. The patterning structure is adapted to pattern a beam of radiation according to a desired pattern. The apparatus also includes a substrate holder that is constructed to hold a substrate, a projection system that is constructed and arranged to project the patterned beam onto a target portion of the substrate, and a downstream radical source that is connected to a gas supply and is configured to provide a beam of radicals onto a surface to be cleaned.
    Type: Grant
    Filed: December 12, 2003
    Date of Patent: January 1, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Michael Cornelis Van Beek, Levinus Pieter Bakker, Theodorus Hubertus Josephus Bisschops, Jeroen Jonkers, Mark Kroon, Robertus Adrianus Maria Wolters, Adrianus Johannes Henricus Maas
  • Patent number: 7309869
    Abstract: A lithographic projection apparatus includes an illumination system configured to provide a beam of radiation; a support configured to support a patterning device, the patterning device configured to impart the beam of radiation with a pattern in its cross section; a substrate table configured to hold a substrate, and a projection system configured to project the patterned beam of radiation onto a target portion of the substrate, wherein the illumination system has a radiation source and at least one mirror configured to enhance an output of the source. The illumination system may include a second radiation source and at least one mirror positioned between the radiation sources to image the output of the second source onto the first source, thereby enhancing the output of the source. The radiation sources may be operable to emit radiation in the EUV wavelength range.
    Type: Grant
    Filed: May 12, 2005
    Date of Patent: December 18, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Ralph Kurt, Levinus Pieter Bakker, Frank Jeroen Pieter Schuurmans, Jan Evert Van Der Werf
  • Patent number: 7307263
    Abstract: A lithographic apparatus includes a radiation system that includes a source for producing a radiation beam, a contaminant trap arranged in a path of the radiation beam, and an illumination system configured to condition the radiation beam produced by the source, and a support for supporting a patterning device. The patterning device serves to impart the conditioned radiation beam with a pattern in its cross-section. The apparatus also includes a substrate table for holding a substrate, and a projection system for projecting the patterned radiation beam onto a target portion of the substrate. The contaminant trap includes a plurality of foils that define channels that are arranged substantially parallel to the direction of propagation of the radiation beam. The trap is provided with a gas supply system that is arranged to inject gas into at least one of the channels of the trap.
    Type: Grant
    Filed: July 14, 2004
    Date of Patent: December 11, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Levinus Pieter Bakker, Vadim Yevgenyevich Banine, Cornelis Petrus Andreas Maria Luijkx, Frank Jeroen Pieter Schuurmans
  • Patent number: 7279690
    Abstract: A lithographic apparatus is arranged to project a beam from a radiation source onto a substrate. The apparatus includes an optical element in a path of the beam, a gas inlet for introducing a gas into the path of the beam so that the gas will be ionized by the beam to create electric fields toward the optical element, and a gas source coupled to the gas inlet for supplying the gas. The gas has a threshold of kinetic energy for sputtering the optical element that is greater than the kinetic energy developed by ions of the gas in the electric fields.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: October 9, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Levinus Pieter Bakker, Vadim Yevgenyevich Banine, Vladimir Vitalevitch Ivanov, Konstantin Nikolaevitch Koshelev, Bastiaan Matthias Mertens, Johannes Hubertus Josephina Moors, Frank Jeroen Pieter Schuurmans, Givi Georgievitch Zukavishvili, Bastiaan Theodoor Wolschrijn, Marc Hubertus Lorenz Van Der Velden
  • Patent number: 7256407
    Abstract: A lithographic projection apparatus includes reflector assembly, a foil trap, and a housing that is constructed and arranged to contain the reflector assembly and the foil trap. The reflector assembly is connected to the housing via a first wall, and the foil trap is connected to the housing via a second wall. The apparatus also includes a chamber between the foil trap and the reflector assembly. The chamber is defined by the housing, the first wall, and the second wall. The apparatus further includes a pump that is configured to create a vacuum in the chamber.
    Type: Grant
    Filed: September 13, 2005
    Date of Patent: August 14, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Frank Jeroen Pieter Schuurmans, Levinus Pieter Bakker