Abstract: A microelectronic device includes a semiconductor base structure, word lines, digit line contacts, digit lines, and storage node contacts. The semiconductor base structure includes pillar structures horizontally separated from one another by filled isolation trenches. The word lines horizontally extend through the pillar structures and the filled isolation trenches in a first direction. The digit line contacts include conductively doped semiconductor material vertically extending into digit line contact sections of the pillar structures. The digit lines are over and in contact with the digit line contacts and horizontally extend in a second direction orthogonal to the first direction. The digit lines have a different material composition than the digit line contacts. The storage node contacts include additional conductively doped semiconductor material vertically extending into storage node contact sections of the pillar structures. Methods, memory devices, and electronic systems are also described.

Abstract: There are provided methods and apparatus for in-loop artifact filtering. An apparatus includes an encoder for encoding an image region. The encoder has at least two filters for successively performing in-loop filtering to respectively reduce at least a first and a second type of quantization artifact.

Abstract: There are provided methods and apparatus for in-loop artifact filtering. An apparatus includes an encoder for encoding an image region. The encoder has at least two filters for successively performing in-loop filtering to respectively reduce at least a first and a second type of quantization artifact.

Abstract: An automatic detection method and an automatic detection system for detecting any crack on wafer edges are provided. The automatic detection method includes the following steps. Several wafer images of several wafers are obtained. The wafer images are integrated to create a templet image. Each of the wafer images is compared with the templet image to obtain a differential image. Each of the differential images is binarized. Each of the differential images which are binarized is de-noised. Whether each of the differential images has an edge crack is detected according to pattern of each of the differential images which are de-noised.

Abstract: An automatic detection method and an automatic detection system for detecting any crack on wafer edges are provided. The automatic detection method includes the following steps. Several wafer images of several wafers are obtained. The wafer images are integrated to create a templet image. Each of the wafer images is compared with the templet image to obtain a differential image. Each of the differential images is binarized. Each of the differential images which are binarized is de-noised. Whether each of the differential images has an edge crack is detected according to pattern of each of the differential images which are de-noised.

Abstract: A resistance supplier for weight training has two switching assemblies, two planetary gear sets, a one-way output bearing, a spindle, and at least one weight. The two switching assemblies respectively control input, output, and fixing of the sun gear, planet carrier, and ring gear in the two planetary gear sets. The output of one of the two planetary gear sets is used as the input of the other planetary gear set. Therefore, the two planetary gear sets provide three reduction ratios and transmit torque to the spindle through the one-way output bearing to drive the weight to rotate. By using reduction ratios of the planetary gear sets to increase the output requirement of the user and switching gears via switching assemblies to change reduction ratios, the resistance supplier can provide sufficient and diverse training resistances with a single weight, thereby reducing the volume.

Abstract: A resistance supplier for weight training has two switching assemblies, two planetary gear sets, a one-way output bearing, a spindle, and at least one weight. The two switching assemblies respectively control input, output, and fixing of the sun gear, planet carrier, and ring gear in the two planetary gear sets. The output of one of the two planetary gear sets is used as the input of the other planetary gear set. Therefore, the two planetary gear sets provide three reduction ratios and transmit torque to the spindle through the one-way output bearing to drive the weight to rotate. By using reduction ratios of the planetary gear sets to increase the output requirement of the user and switching gears via switching assemblies to change reduction ratios, the resistance supplier can provide sufficient and diverse training resistances with a single weight, thereby reducing the volume.

Abstract: A connector includes a connector housing forming a receptacle configured to receive an add-in card. The connector further includes a first connector pin configured to electrically couple to the add-in card responsive to the add-in card being inserted into the receptacle. The first connector pin extends from the connector housing to contact a first solder pad disposed on a printed circuit board (PCB). The connector further includes a second connector pin configured to electrically couple to the add-in card responsive to the add-in card being inserted into the receptacle. The second connector pin extends from the connector housing to contact a second solder pad disposed on the PCB. The first connector pin is oriented toward the second connector pin to couple to the PCB in a toe-routing configuration and the second connector pin is oriented away from the first connector pin to couple to the PCB in the toe-routing configuration.

Abstract: There are provided methods and apparatus for in-loop artifact filtering. An apparatus includes an encoder for encoding an image region. The encoder has at least two filters for successively performing in-loop filtering to respectively reduce at least a first and a second type of quantization artifact.

Abstract: An automatic detecting method and an automatic detecting apparatus using the same are provided. The automatic detecting apparatus includes an inputting unit, a dividing unit, a contouring unit, a range analyzing unit, a boundary analyzing unit, an edge detecting unit, an expanding unit and an overlapping unit. The dividing unit is used for dividing an overlooking image into four clusters via a clustering algorithm. The contouring unit is used for obtaining a contour. The range analyzing unit is used for obtaining a detecting range. The boundary analyzing unit is used for obtaining a circular boundary in the detecting range. The edge detecting unit is used for obtaining a plurality of edges in the circular boundary. The expanding unit is used for expanding the edges to obtain a plurality of expanded edges. The overlapping unit is used for overlapping the expanded edges and the contour to obtain a defect pattern.

Abstract: There are provided methods and apparatus for in-loop artifact filtering. An apparatus includes an encoder for encoding an image region. The encoder has at least two filters for successively performing in-loop filtering to respectively reduce at least a first and a second type of quantization artifact.

Abstract: A connector includes a connector housing forming a receptacle configured to receive an add-in card. The connector further includes a first connector pin configured to electrically couple to the add-in card responsive to the add-in card being inserted into the receptacle. The first connector pin extends from the connector housing to contact a first solder pad disposed on a printed circuit board (PCB). The connector further includes a second connector pin configured to electrically couple to the add-in card responsive to the add-in card being inserted into the receptacle. The second connector pin extends from the connector housing to contact a second solder pad disposed on the PCB. The first connector pin is oriented toward the second connector pin to couple to the PCB in a toe-routing configuration and the second connector pin is oriented away from the first connector pin to couple to the PCB in the toe-routing configuration.

Abstract: An automatic detecting method and an automatic detecting apparatus using the same are provided. The automatic detecting apparatus includes an inputting unit, a dividing unit, a contouring unit, a range analyzing unit, a boundary analyzing unit, an edge detecting unit, an expanding unit and an overlapping unit. The dividing unit is used for dividing an overlooking image into four clusters via a clustering algorithm. The contouring unit is used for obtaining a contour. The range analyzing unit is used for obtaining a detecting range. The boundary analyzing unit is used for obtaining a circular boundary in the detecting range. The edge detecting unit is used for obtaining a plurality of edges in the circular boundary. The expanding unit is used for expanding the edges to obtain a plurality of expanded edges. The overlapping unit is used for overlapping the expanded edges and the contour to obtain a defect pattern.

Abstract: A portable device is provided. A first processor performs an initial procedure according to an operation clock with a first frequency value and an operation voltage with a first voltage value, and performs a calibration procedure according to the operation clock with a second frequency value and the operation voltage with a second voltage value when the initial procedure has been performed and a self-calibration event is present. A second processor detects whether a specific function of the calibration procedure is being performed by the first processor. The second processor stores the second frequency value and the second voltage value into a storage unit after the calibration procedure is performed. The second voltage value is lower than the first voltage value, and the second frequency value is lower than the first frequency value.

Abstract: The present invention provides an integrated circuit. The integrated circuit comprises: a plurality of core power sources; and a plurality of core power domains, coupled to the core power sources, respectively; wherein the core power domains are overlapped with each other.

Abstract: A receptacle connector includes an insulative housing defining a base and a mating tongue extending from the base with a widen and thicken step structure formed around a root of the mating tongue near to the base, two rows of plate contacts disposed in the insulative housing with contacting sections exposed upon the mating tongue and in front of the step structure and categorized with signal contacts, power contacts and grounding contacts, and a metallic shielding plate disposed within a middle level of the mating tongue and occupying most portions of said mating tongue. The shielding plate defines a pair of immoveable and un-deflectable lateral edge sections in front of the step structure, each lateral edge section is configured to be adapted to be locked with a latch of a plug connector in a transverse direction.

Abstract: There are provided methods and apparatus for in-loop artifact filtering. An apparatus includes an encoder for encoding an image region. The encoder has at least two filters for successively performing in-loop filtering to respectively reduce at least a first and a second type of quantization artifact.

Abstract: A dumbbell with detachable weights has a handle assembly, multiple weights, a first end cap assembly, and a second end cap assembly. The handle assembly has a main support with a handle, a first end panel, and a second end panel. The weights are mounted between the first and second end panels of the main support, are arranged around the handle, and are radially detachable from the main support. The first and second end cap assemblies are respectively mounted on the first and second end panels and selectively engage with the weights. By turning a driving cap of the first end cap assembly, the first and second end cap assemblies can disengage from the weights. Since the weights can be radially mounted onto or detached from the main support, an adjusting range of the training weight of the dumbbell can be increased.

Abstract: There are provided methods and apparatus for in-loop artifact filtering. An apparatus includes an encoder for encoding an image region. The encoder has at least two filters for successively performing in-loop filtering to respectively reduce at least a first and a second type of quantization artifact.

Abstract: A dumbbell with detachable weights has a handle assembly, multiple weights, a first end cap assembly, and a second end cap assembly. The handle assembly has a main support with a handle, a first end panel, and a second end panel. The weights are mounted between the first and second end panels of the main support, are arranged around the handle, and are radially detachable from the main support. The first and second end cap assemblies are respectively mounted on the first and second end panels and selectively engage with the weights. By turning a driving cap of the first end cap assembly, the first and second end cap assemblies can disengage from the weights. Since the weights can be radially mounted onto or detached from the main support, an adjusting range of training weight of the dumbbell can be increased.