Abstract: The invention discloses a toe corrector comprising a corrector base with a toe bandage and a sole bandage provided thereon to cooperate with said corrector base; the toe corrector also includes an adjusting rope on the corrector base and an angle adjusting mechanism is provided to connect with the adjusting rope; said angle adjusting mechanism includes a rack belt and a latch adjusting component; one end of the rack belt is connected with the adjusting rope while the other end thereof passes the latch adjusting component; the position of the rack belt is adjusted through latch adjusting component. The invention adopts latch mechanism component to realize adjustment of the position of the rack belt, which can save more labor and avoid short rack broken or rack skipping effectively.

Abstract: A power supply control circuit for a switch mode power supply converter, and a power supply control method using the control circuit. The control circuit includes an auxiliary boosting unit, a main control unit and an auxiliary winding unit. The main control unit is configured to control the power switch in a power stage circuit to turn on or to be off, and to supply power to the auxiliary boosting unit. The auxiliary boosting unit is configured to provide auxiliary power for the main control unit, and to self-adaptively adjust the auxiliary boosting unit's own average switching frequency based on a load state of the main control unit. The auxiliary winding unit is configured to couple energy by means of a magnetic element in the power stage circuit, to generate an output voltage.

Abstract: A circuit for controlling a switching power supply and a method for controlling a switching power supply by using the circuit for controlling the switching power supply, the circuit for controlling a switching power supply is configured to control a power stage circuit of a converter of the switching power supply. The circuit for controlling the switching power supply includes an external magnetic field direct detection unit, a current limit threshold unit, an operating frequency unit, a pulse width unit and a logic unit. The external magnetic field direct detection unit includes a Hall device and a Hall detection component. In accordance with the circuit for controlling the switching power supply of the present disclosure, the intensity of the external magnetic field can be detected directly at the chip level, and the operating mode of the switching power supply system can be adjusted timely.

Abstract: A power supply control circuit for a switch mode power supply converter, and a power supply control method using the control circuit. The control circuit includes an auxiliary boosting unit, a main control unit and an auxiliary winding unit. The main control unit is configured to control the power switch in a power stage circuit to turn on or to be off, and to supply power to the auxiliary boosting unit. The auxiliary boosting unit is configured to provide auxiliary power for the main control unit, and to self-adaptively adjust the auxiliary boosting unit's own average switching frequency based on a load state of the main control unit. The auxiliary winding unit is configured to couple energy by means of a magnetic element in the power stage circuit, to generate an output voltage.

Abstract: A circuit for controlling a switching power supply and a method for controlling a switching power supply by using the circuit for controlling the switching power supply, the circuit for controlling a switching power supply is configured to control a power stage circuit of a converter of the switching power supply. The circuit for controlling the switching power supply includes an external magnetic field direct detection unit, a current limit threshold unit, an operating frequency unit, a pulse width unit and a logic unit. The external magnetic field direct detection unit includes a Hall device and a Hall detection component. In accordance with the circuit for controlling the switching power supply of the present disclosure, the intensity of the external magnetic field can be detected directly at the chip level, and the operating mode of the switching power supply system can be adjusted timely.

Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.

Abstract: A system and method for an aircraft includes a probe, first and second current sensors, and a control circuit. The probe includes a heater that includes a resistive heating element routed through the probe, wherein an operational current is provided to the resistive heating element to provide heating for the probe. The first current sensor is configured to sense a first current through the resistive heating element, and the second current sensor is configured to sense a second current through the resistive heating element. The control circuit is configured to determine a leakage current based on the first and second currents and determine a remaining useful life the probe based on the leakage current over time.

Abstract: Disclosed is a thin-film micro-fuse assembly having: a substrate; an insulating layer disposed on the substrate, the insulating layer comprising silicon dioxide; a conductor disposed on the insulating layer, the conductor forming: an inlet terminal, an outlet terminal and a fuse element between the inlet terminal and the outlet terminal, the inlet terminal and the outlet terminal widthwise converging toward the fuse element, and the fuse element having a first thickness and a first width that is between 1 and 5 times the first thickness.

Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine a remaining useful life of the probe system based on the capacitance.

Abstract: A probe system is configured to receive thermal images of the probe system from a thermal imager and includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide the operational voltage and receive the thermal images from the thermal imager. The control circuit is further configured to monitor the thermal images over time and determine a remaining useful life of the probe system based upon the thermal images over time.

Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational current is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to monitor the operational current over time and determine a half-life estimate of the resistive heating element based upon an exponential function of the operational current over time.

Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe system. An operational voltage is provided to the resistive heating element to provide heating for the probe system. The control circuit is configured to provide the operational voltage and monitor a circuit frequency based on an element capacitance between the resistive heating element and a metallic sheath of the heater over time. The control circuit is further configured to determine remaining useful life of the probe system based on the circuit frequency.

Abstract: A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.