Patents by Inventor Pranav Ashar
Pranav Ashar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20050149301Abstract: A method for derivation and abstraction of test models for validation of industrial designs using guided simulation is described. The method employs automatic abstractions for the test model which reduce its complexity while preserving the class of errors that can be detected by a transition tour. A method for design validation comprising generating a state-based test model of the design, abstracting said test model by retiming and latch removal; and applying validation technique on the abstracted test model. First, the number of internal (non-peripheral) latches in a design is minimized via retiming using a method of Maximal Peripheral Retiming (MPR). According to the MPR method, internal latches are retimed to the periphery of the circuit. Subsequently, all latches that can be retimed to the periphery are automatically abstracted in the test model. The validation technique may comprise of model checking, invariant checking or guided simulation using test sequences generated from the abstracted test model.Type: ApplicationFiled: February 10, 2005Publication date: July 7, 2005Inventors: Aarti Gupta, Pranav Ashar, Sharad Malik
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Patent number: 6874135Abstract: A method for derivation and abstraction of test models for validation of industrial designs using guided simulation is described. The method employs automatic abstractions for the test model which reduce its complexity while preserving the class of errors that can be detected by a transition tour. A method for design validation comprising generating a state-based test model of the design. The test model is abstracted by retiming and latch removal. Finally, a validation technique is applied on the abstracted test model. First, the number of internal (non-peripheral) latches in a design is minimized via retiming using a method of Maximal Peripheral Retiming (MPR). According to the MPR method, internal latches are retimed to the periphery of the circuit. Subsequently, all latches that can be retimed to the periphery are automatically abstracted in the test model.Type: GrantFiled: September 24, 1999Date of Patent: March 29, 2005Assignee: NEC CorporationInventors: Aarti Gupta, Pranav Ashar, Sharad Malik
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Publication number: 20040230407Abstract: A method of obtaining a resolution-based proof of unsatisfiability using a SAT procedure for a hybrid Boolean constraint problem comprising representing constraints as a combination of clauses and interconnected gates. The proof is obtained as a combination of clauses, circuit gates and gate connectivity constraints sufficient for unsatisfiability.Type: ApplicationFiled: January 23, 2004Publication date: November 18, 2004Applicant: NEC LABORATORIES AMERICA, INCInventors: Aarti Gupta, Malay Ganai, Zijiang Yang, Pranav Ashar
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Patent number: 6816825Abstract: A method of automatically generating vector sequences for an observability based coverage metric supports design validation. A design validation method for Register Transfer Level (RTL) circuits includes the generation of a tag list. Each tag in the tag list models an error at a location in HDL code at which a variable is assigned a value. Interacting linear and Boolean constraints are generated for the tag, and the set of constraints is solved using an HSAT solver to provide a vector that covers the tag. For each generated vector, tag simulation is performed to determine which others of the tags in the tag list are also covered by that vector. Vectors are generated until all tags have been covered, if possible within predetermined time constraints, thus automatically providing a set of vectors which will propagate errors in the HDL code to an observable output. Performance of the design validation method is enhanced through various heuristics involving path selection and tag magnitude maximization.Type: GrantFiled: June 18, 1999Date of Patent: November 9, 2004Assignees: NEC Corporation, Massachusetts Institute of TechnologyInventors: Pranav Ashar, Srinivas Devadas, Farzan Fallah
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Publication number: 20040210860Abstract: There is provided a method of solving a SAT problem comprising partitioning SAT-formula clauses in the SAT problem into a plurality of partitions. Each of said plurality of partitions is solved as a separate process each, thereby constituting a plurality of processes where each of said process communicates only with a subset of the plurality of processes.Type: ApplicationFiled: March 9, 2004Publication date: October 21, 2004Applicant: NEC LABORATORIES AMERICA, INCInventors: Malay Ganai, Aarti Gupta, Zijiang Yang, Pranav Ashar
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Publication number: 20040148150Abstract: A method of checking correctness of scheduling of a circuit where a schedule for the circuit is obtained from a behavioral description. The method comprising extracting loop invariants to determine a sufficient set of acyclic threads when loops are present, performing symbolic simulation to extract the above loop invariants, and proving equivalence of the acyclic threads. Systems, computer systems and computer program products that incorporate the techniques of verification and correctness checking according to the present invention have also been disclosed.Type: ApplicationFiled: January 14, 2004Publication date: July 29, 2004Applicant: NEC CORPORATIONInventors: Pranav Ashar, Anand Raghunathan, Subhrajit Bhattacharya, Aarti Gupta
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Patent number: 6745160Abstract: A method of checking correctness of scheduling of a circuit where a schedule for the circuit is obtained from a behavioral description. The method comprising extracting loop invariants to determine a sufficient set of acyclic threads when loops are present, performing symbolic simulation to extract the above loop invariants, and proving equivalence of the acyclic threads. Systems, computer systems and computer program products that incorporate the techniques of verification and correctness checking according to the present invention have also been disclosed.Type: GrantFiled: October 8, 1999Date of Patent: June 1, 2004Assignee: NEC CorporationInventors: Pranav Ashar, Anand Raghunathan, Subhrajit Bhattacharya, Aarti Gupta
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Patent number: 6728665Abstract: A method of performing image or pre-image computation for a system is disclosed. The method comprises representing the system by a finite state model; representing state sets using Binary Decision Diagrams (BDDs); performing a satisfiabilty checking (SAT) based backtrack search algorithm, wherein, the SAT decomposes the search over an entire solution space into multiple sub-problems, and wherein a BDD-based image computation is used to solve each sub-problem by enumerating multiple solutions from the solution space. Further, a method for pruning a search space in a SAT procedure is disclosed. The method comprises using BDD Bounding against an implicit disjunction or conjunction of a given set of BDDs; continuing search if a partial assignment of variables satisfies the implicit disjunction or conjunction, and backtracking if a partial assignment of variables does not satisfy the implicit disjunction or conjunction.Type: GrantFiled: October 23, 2000Date of Patent: April 27, 2004Assignee: NEC CorporationInventors: Aarti Gupta, Zijiang Yang, Pranav Ashar
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Patent number: 6662323Abstract: A fast error diagnosis system and process for combinational verification is described. The system and process localizes error sites in a combinational circuit implementation that has been shown to be inequivalent to its specification. In the typical case, it is not possible to identify the error location exactly. The invention uses a diagnosis strategy of gradually increasing the level of detail in the analysis algorithm to ultimately derive a small list of potential error sites in a short time. The invention combines the use of simulation, Binary Decision Diagrams, and Boolean satisfiability in a novel way to achieve the goal. The previous approaches have been limited in that they have either been constrained to a specific error model unlike the present invention, or they are inefficient in comparison to the present invention. The present invention allows for the final set of error sites derived to be small, where that set contains the actual error sites, and is derived in a reasonable amount of time.Type: GrantFiled: October 25, 1999Date of Patent: December 9, 2003Assignee: NEC CorporationInventors: Pranav Ashar, Aarti Gupta
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Publication number: 20030225552Abstract: A method for bounded model checking of arbitrary Linear Time Logic temporal properties. The method comprises translating properties associated with temporal operators F(p), G(p), U(p, q) and X(p) into property checking schemas comprising Boolean satisfiability checks, wherein F represents an eventuality operator, G represents a globally operator, U represents an until operator and X represents a next-time operator. The overall property is checked in a customized manner by repeated invocations of the property checking schemas for F(p), G(p), U(p, q), X(p) operators and standard handling of atomic propositions and Boolean operators.Type: ApplicationFiled: May 30, 2002Publication date: December 4, 2003Applicant: NEC CORPORATIONInventors: Malay Ganai, Lintao Zhang, Aarti Gupta, Zijiang Yang, Pranav Ashar
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Patent number: 6651234Abstract: A method for Boolean Satisfiability (SAT). The method comprises using a variable decision heuristic in a SAT algorithm and pruning the search space of SAT using said decision heuristic. The decision heuristic is based on partitioning a conjunctive normal form (CNF) of a Boolean formula corresponding to the SAT and the partitioning is induced by a separator set. An image computaion method that uses the disclosed method for solving the SAT.Type: GrantFiled: November 1, 2001Date of Patent: November 18, 2003Assignee: NEC CorporationInventors: Aarti Gupta, Zijiang Yang, Pranav Ashar, Sharad Malik
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Publication number: 20030182638Abstract: A method for derivation and abstraction of test models for validation of industrial designs using guided simulation is described. The method employs automatic abstractions for the test model which reduce its complexity while preserving the class of errors that can be detected by a transition tour. A method for design validation comprising generating a state-based test model of the design, abstracting said test model by retiming and latch removal; and applying validation technique on the abstracted test model. First, the number of internal (non-peripheral) latches in a design is minimized via retiming using a method of Maximal Peripheral Retiming (MPR). According to the MPR method, internal latches are retimed to the periphery of the circuit. Subsequently, all latches that can be retimed to the periphery are automatically abstracted in the test model. The validation technique may comprise of model checking, invariant checking or guided simulation using test sequences generated from the abstracted test model.Type: ApplicationFiled: September 24, 1999Publication date: September 25, 2003Inventors: AARTI GUPTA, PRANAV ASHAR, SHARAD MALIK
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Publication number: 20030105617Abstract: A hardware acceleration system for functional simulation comprising a generic circuit board including logic chips, and memory. The circuit board is capable of plugging onto a computing device. The system is adapted to allow the computing device to direct DMA transfers between the circuit board and a memory associated with the computing device. The circuit board is further capable of being configured with a simulation processor. The simulation processor is capable of being programmed for at least one circuit design.Type: ApplicationFiled: March 22, 2002Publication date: June 5, 2003Applicant: NEC USA, INC.Inventors: Srihari Cadambi, Pranav Ashar
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Patent number: 6496961Abstract: This disclosure teaches a method of Boolean satisfiability checking (SAT) for a circuit. The method comprises identifying inactive clauses in the conjunctive normal form (CNF) of the circuit and removing the inactive clauses from the CNF.Type: GrantFiled: June 15, 2001Date of Patent: December 17, 2002Assignee: NEC USA, Inc.Inventors: Aarti Gupta, Zijiang Yang, Anubhav Gupta, Pranav Ashar
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Publication number: 20020178424Abstract: A method for Boolean Satisfiability (SAT). The method comprises using a variable decision heuristic in a SAT algorithm and pruning the search space of SAT using said decision heuristic. The decision heuristic is based on partitioning a conjunctive normal form (CNF) of a Boolean formula corresponding to the SAT and the partitioning is induced by a separator set. An image computaion method that uses the disclosed method for solving the SAT.Type: ApplicationFiled: November 1, 2001Publication date: November 28, 2002Applicant: NEC USA, INC.Inventors: Aarti Gupta, Zijiang Yang, Pranav Ashar, Sharad Malik
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Patent number: 6415430Abstract: A method and apparatus for implementing communication between literals and clauses of a Boolean SAT problem through use of a time-multiplexed pipelined bus architecture rather than hardwiring it using on-FPGA routing resources. This technique allows the circuits for different instances of the Boolean SAT problem to be identical except for small local differences. Incremental synthesis and place-and-route effort required for each instance of the Boolean SAT problem becomes negligible compared to the time to actually solve the SAT problem. The time-multiplexing feature allows dynamic addition of clauses into the SAT solver algorithm. The pipeline architecture is highly pipelined with very few long wires and no wires crossing FPGA boundaries, thereby providing high clock speeds.Type: GrantFiled: December 8, 1999Date of Patent: July 2, 2002Assignee: NEC USA, Inc.Inventors: Pranav Ashar, Peixin Zhong, Margaret Martonosi
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Publication number: 20020053064Abstract: This disclosure teaches a method of Boolean satisfiability checking (SAT) for a circuit. The method comprises identifying inactive clauses in the conjunctive normal (CNF) of the circuit and removing the inactive clauses from the CNF.Type: ApplicationFiled: June 15, 2001Publication date: May 2, 2002Applicant: NEC USA, INC.Inventors: Aarti Gupta, Zijiang Yang, Anubhav Gupta, Pranav Ashar
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Patent number: 6324673Abstract: The method and apparatus for performing design rule checking on Manhattan structures in VLSI circuit layouts. The method and apparatus provides an edge-endpoint-based technique for checking the geometry and spacing of the VLSI circuit layout. The edge-endpoint-based technique uses a scanline algorithm that detects errors between adjacent structures that do not simultaneously intersect the scanline. The method also provides efficient error compilation. The apparatus allows for the design rules to be changed as the VLSI circuit layout evolves. The apparatus can process the VLSI circuit layout with a single processor, and the apparatus provides for multiple processors to process slices of the VLSI circuit layout, thereby enhancing the speed of the design rule checking over traditional software-only techniques.Type: GrantFiled: May 28, 1999Date of Patent: November 27, 2001Assignees: Princeton University, NEC USA, Inc.Inventors: Zhen Luo, Margaret Martonosi, Pranav Ashar
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Patent number: 6247164Abstract: Disclosed is a configurable hardware system and method for implementing instance-specific (per-formula) SAT-solver circuits. A template design is provided for producing these circuits on a per-formula basis. The typical hardware requirements for implementing the invention makes the design amenable to current or next-generation FPGA implementation. Hardware simulations indicate that for many difficult SAT problems, the system according to the invention can offer one to three orders of magnitude speedup over prior art software implementations.Type: GrantFiled: August 28, 1997Date of Patent: June 12, 2001Assignees: NEC USA, Inc., Princeton UniversityInventors: Pranav Ashar, Sharad Malik, Margaret Martonosi, Peixin Zhong
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Patent number: 6223141Abstract: Delay-independent cycle-based logic simulation of synchronous digital circuits with levelized compiled code simulation has substantially increased speed. Sweep, eliminate, and factor reduce the number of literals. The use of cofactoring, a register allocation and spill scheme, an inverter minimization scheme, and retiming further reduce the simulation time for two and four valued simulation. A shift minimization scheme reduces time in four-valued simulation. The faster simulation is embodied in a method, a computer system, and a computer program product.Type: GrantFiled: July 14, 1998Date of Patent: April 24, 2001Assignee: NEC USA, Inc.Inventor: Pranav Ashar