Abstract: Embodiments are disclosed for managing voltage droop. The techniques include performing a first determination that a timing margin is less than a first threshold. The techniques also include performing a second determination that an increase in processor activity exceeds a second threshold. Additionally, the techniques include determining that a voltage droop is indicated based on the first determination and the second determination. Further, the techniques include signaling a plurality of throttling circuits for a corresponding plurality of cores of a computer processor to actuate.

Abstract: An aspect includes a plurality of throttle controllers having a modular hierarchy comprising a plurality of levels within each of a plurality of processor cores that control a plurality of throttling actions. The throttling actions include dynamic adjustment of execution suspension within the processor cores. A plurality of input throttle events at each of the processor cores is resolved based on the modular hierarchy. A chip controller coupled to the processor cores can synchronize the throttling actions between the processor cores.

Abstract: A semiconductor circuit including a first subcircuit, at least a second subcircuit, and power management circuitry. The power management circuitry is operable for estimating a metric indicative of a momentary supply voltage present at the first subcircuit based on a power supply current of the first subcircuit and a cross current flowing between the first subcircuit and the second subcircuit.

Abstract: Embodiments of the present disclosure relate to managing power provided to a semiconductor circuit to prevent undervoltage conditions. A measured voltage value describing a measured supply voltage at a first subcircuit of a semiconductor circuit can be received, the measured voltage value having a first resolution. A selected metric indicative of a supply voltage present at the first subcircuit can be received, the selected metric having a second resolution higher than the first resolution. The selected metric is calibrated to obtain a calibrated metric when a transition of the measured voltage value occurs.

Abstract: Embodiments of the present disclosure relate to detecting undervoltage conditions at a subcircuit. A power supply current of a first subcircuit is determined over a first number of previous clock cycles. A cross current flowing between the first subcircuit and a second subcircuit is determined over the first number of previous clock cycles. An estimated momentary supply voltage present at the first subcircuit is then determined based on the power supply current of the first subcircuit over the first number of previous clock cycles and the cross current flowing between the first subcircuit and the second subcircuit over the first number of previous clock cycles.

Abstract: Examples of techniques for speculation throttling for reliability management are described herein. An aspect includes determining that a power state of a processor is above a speculation throttling threshold. Another aspect includes, based on determining that the power state of the processor is above the speculation throttling threshold, throttling speculation in the processor. Another aspect includes determining that the power state of the processor is above a power proxy threshold, wherein the power proxy threshold is higher than the speculation throttling threshold. Another aspect includes, based on determining that the power state of the processor is above the power proxy threshold, enabling a performance throttle unit of the processor.

Abstract: Techniques facilitating voltage droop reduction and/or mitigation in a processor core are provided. In one example, a system can comprise a memory that stores, and a processor that executes, computer executable components. The computer executable components can comprise an observation component that detects one or more events at a first stage of a processor pipeline. An event of the one or more events can be a defined event determined to increase a level of power consumed during a second stage of the processor pipeline. The computer executable components can also comprise an instruction component that applies a voltage droop mitigation countermeasure prior to the increase of the level of power consumed during the second stage of the processor pipeline and a feedback component that provides a notification to the instruction component that indicates a success or a failure of a result of the voltage droop mitigation countermeasure.

Abstract: Embodiments include methods, and computer system, and computer program products for performing test and calibration of integrated sensors on a processor chip. Aspects include: initializing, by a tester program, an on-chip service engine of processor chip, performing and completing, by on-chip service engine, test and calibration of integrated sensors. The method may also include: loading and decoding tester program into an on-chip service engine memory, testing and calibrating each integrated sensor, which may include: selecting an integrated sensor for test and calibration, loading sensor test and calibration patterns and parameters, and sensor test code, and executing the sensor test code to test and calibrate integrated sensors, writing results of the test and calibration to a predetermined location of the on-chip service engine memory, and writing a return code of test and calibration to another predetermined location of on-chip service engine memory, when every integrated sensor is tested and calibrated.

Abstract: Embodiments include methods, and computer system, and computer program products for performing system functional test on a chip having partial-good portions. Aspects include: initializing, by system functional test software, a service engine of the chip, performing, by service engine, system functional test, and completing system functional test of chip. The chip may include service engine, a service engine memory and one or more “partial-good” portions. The initializing may include: loading system functional test software into the service engine memory, identifying each “partial-good” portion of the chip, writing a “partial-good” parameter for each “partial-good” portion of the chip identified to service engine memory, and triggering execution of system functional test. Method may include: decoding system functional test software, retrieving “partial-good” parameters, initializing “partial-good” portions of chip, and performing system functional test on “partial-good” portions of chip.

Abstract: Techniques facilitating voltage droop reduction and/or mitigation in a processor core are provided. In one example, a system can comprise a memory that stores, and a processor that executes, computer executable components. The computer executable components can comprise an observation component that detects one or more events at a first stage of a processor pipeline. An event of the one or more events can be a defined event determined to increase a level of power consumed during a second stage of the processor pipeline. The computer executable components can also comprise an instruction component that applies a voltage droop mitigation countermeasure prior to the increase of the level of power consumed during the second stage of the processor pipeline and a feedback component that provides a notification to the instruction component that indicates a success or a failure of a result of the voltage droop mitigation countermeasure.

Abstract: A semiconductor circuit including a first subcircuit, at least a second subcircuit, and power management circuitry. The power management circuitry is operable for estimating a metric indicative of a momentary supply voltage present at the first subcircuit based on a power supply current of the first subcircuit and a cross current flowing between the first subcircuit and the second subcircuit.

Abstract: A semiconductor circuit including a first subcircuit, at least a second subcircuit, and power management circuitry. The power management circuitry is operable for estimating a metric indicative of a momentary supply voltage present at the first subcircuit based on a power supply current of the first subcircuit and a cross current flowing between the first subcircuit and the second subcircuit.

Abstract: Embodiments include methods, and computer system, and computer program products for performing test and calibration of integrated sensors on a processor chip. Aspects include: initializing, by a tester program, an on-chip service engine of processor chip, performing and completing, by on-chip service engine, test and calibration of integrated sensors. The method may also include: loading and decoding tester program into an on-chip service engine memory, testing and calibrating each integrated sensor, which may include: selecting an integrated sensor for test and calibration, loading sensor test and calibration patterns and parameters, and sensor test code, and executing the sensor test code to test and calibrate integrated sensors, writing results of the test and calibration to a predetermined location of the on-chip service engine memory, and writing a return code of test and calibration to another predetermined location of on-chip service engine memory, when every integrated sensor is tested and calibrated.

Abstract: Techniques facilitating voltage droop reduction and/or mitigation in a processor core are provided. In one example, a system can comprise a memory that stores, and a processor that executes, computer executable components. The computer executable components can comprise an observation component that detects one or more events at a first stage of a processor pipeline. An event of the one or more events can be a defined event determined to increase a level of power consumed during a second stage of the processor pipeline. The computer executable components can also comprise an instruction component that applies a voltage droop mitigation countermeasure prior to the increase of the level of power consumed during the second stage of the processor pipeline and a feedback component that provides a notification to the instruction component that indicates a success or a failure of a result of the voltage droop mitigation countermeasure.

Abstract: Embodiments include methods, and computer system, and computer program products for performing test and calibration of integrated sensors on a processor chip. Aspects include: initializing, by a tester program, an on-chip service engine of processor chip, performing and completing, by on-chip service engine, test and calibration of integrated sensors. The method may also include: loading and decoding tester program into an on-chip service engine memory, testing and calibrating each integrated sensor, which may include: selecting an integrated sensor for test and calibration, loading sensor test and calibration patterns and parameters, and sensor test code, and executing the sensor test code to test and calibrate integrated sensors, writing results of the test and calibration to a predetermined location of the on-chip service engine memory, and writing a return code of test and calibration to another predetermined location of on-chip service engine memory, when every integrated sensor is tested and calibrated.

Abstract: Adaptive power capping in a chip that includes a plurality of cores in a processing system is provided. An active power demand for the chip is dynamically determined based on observed events of the cores. An average temperature of the chip is computed using one or more on-chip thermal sensors in the cores to estimate leakage power of the chip. A power capping threshold that incorporates the estimate of leakage power is determined based on the average temperature of the chip. Power capping is performed by throttling the cores based on determining that the active power demand for the chip exceeds the power capping threshold.

Abstract: A semiconductor circuit including a first subcircuit, at least a second subcircuit, and power management circuitry. The power management circuitry is operable for estimating a metric indicative of a momentary supply voltage present at the first subcircuit based on a power supply current of the first subcircuit and a cross current flowing between the first subcircuit and the second subcircuit.

Abstract: Adaptive power capping in a chip that includes a plurality of cores in a processing system is provided. An active power demand for the chip is dynamically determined based on observed events of the cores. An average temperature of the chip is computed using one or more on-chip thermal sensors in the cores to estimate leakage power of the chip. A power capping threshold that incorporates the estimate of leakage power is determined based on the average temperature of the chip. Power capping is performed by throttling the cores based on determining that the active power demand for the chip exceeds the power capping threshold.

Abstract: Adaptive power capping in a chip that includes a plurality of cores in a processing system is provided. An active power demand for the chip is dynamically determined based on observed events of the cores. An average temperature of the chip is computed using one or more on-chip thermal sensors in the cores to estimate leakage power of the chip. A power capping threshold that incorporates the estimate of leakage power is determined based on the average temperature of the chip. Power capping is performed by throttling the cores based on determining that the active power demand for the chip exceeds the power capping threshold.

Abstract: Embodiments include methods, and computer system, and computer program products for performing system functional test on a chip having partial-good portions. Aspects include: initializing, by system functional test software, a service engine of the chip, performing, by service engine, system functional test, and completing system functional test of chip. The chip may include service engine, a service engine memory and one or more “partial-good” portions. The initializing may include: loading system functional test software into the service engine memory, identifying each “partial-good” portion of the chip, writing a “partial-good” parameter for each “partial-good” portion of the chip identified to service engine memory, and triggering execution of system functional test. Method may include: decoding system functional test software, retrieving “partial-good” parameters, initializing “partial-good” portions of chip, and performing system functional test on “partial-good” portions of chip.