Abstract: A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.

Abstract: Example implementations relate to a parallel backup power supply. For example, a parallel backup power supply system can include a plurality of backup power supply cells that support a plurality of loads. Each of the backup power supply cells can include a charging module to charge an associated backup power supply cell among the plurality of backup power supply cells and a cell controller. The cell controller is to can be configured to control the charging module and communicate with a management module. The parallel backup power supply system can also include the management module to activate each of the plurality of backup power supply cells to provide backup power in parallel to the plurality of loads as each of the plurality of backup power supply cells is fully charged.

Abstract: Examples herein disclose receiving a communication indicating a number of loads supported by multiple nodes and determining an amount of power available at a backup power source. Based on the determination of the amount of power, the examples disclose delivering power to the multiple nodes from the backup power source.

Abstract: Example implementations relate to combined backup power. For example, a system for combined backup power can include a combined backup power supply (CBPS) coupled to a node and a plurality of loads supported by the node. The CBPS can include an uninterruptible power supply (UPS) and a backup power supply coupled to the UPS to act as redundancy for the UPS.

Abstract: An example system includes a memory controller; a memory bus coupled to the memory controller; and a dual inline memory module (DIMM) coupled to the memory controller through the memory bus. The DIMM includes a dynamic random access memory (DRAM) portion; a storage portion; and a gate array portion coupled to the memory bus to detect memory access signals and to store information related to the memory access signals on the storage portion.

Abstract: Example implementations relate to placing loads in a self-refresh mode using a shared backup power supply. For example, a shared backup power supply system can include a node coupled to a shared backup power supply. The node can include a plurality of loads that include volatile memory and a processing resource to place the plurality of loads in a self-refresh mode in response to a failure of a primary power supply. A shared backup power supply system can also include the shared backup power supply to provide backup power to the plurality of loads in the self-refresh mode in response to the failure of the primary power supply.

Abstract: A Next Generation Form Factor (NGFF) carrier includes a flat component perpendicularly connected to two flat side components to receive an NGFF module, a bar rotatably connected to the two flat side components, and a number of holds along an interior of the flat component to receive a fastener. The NGFF module is insertable in relation to the flat component when the bar is rotated to a first position and fixed on the flat component when the bar is rotated to a second position.

Abstract: Examples herein disclose determining when a battery module is below a full charge and selecting a subset of loads based on a prioritization among multiple loads. The selected subset of loads is to receive power from the battery module. The examples herein deliver power to the selected subset of loads.

Abstract: A technique includes jointly encrypting and error encoding plain text data. The joint encryption and error encoding includes processing plain text data in an encryption cipher comprising a plurality of successive rounds to generate cipher text data; and embedding error correction encoding in the encryption cipher to error correction encode the cipher text data.

Abstract: Processing data in a distributed data storage system generates a sparse check matrix correlating data elements to data syndromes. The system receives notification of a failed node in the distributed data storage system, accesses the sparse check matrix, and determines from the sparse check matrix a correlation between a data element and a syndrome. The system processes a logical operation on the data element and the syndrome and recovers the failed node.

Abstract: A Next Generation Form Factor (NGFF) connector apparatus can include a plurality of upper signal pins and an upper ground (GND) pin that is longer than other upper pins. The NGFF connector apparatus can also include a plurality of lower signal pins and a lower power (PWR) pin that is longer than other lower pins.

Abstract: Example implementations relate to partitioning memory modules into volatile and non-volatile portions. For example, a system includes a memory controller to partition a memory module into a non-volatile portion and a volatile portion and to identify persistent data to be backed up during a power loss condition. The memory controller is further to transfer the persistent data from the volatile portion of the memory module to the non-volatile portion of the memory module, in response to the power loss condition.

Abstract: Example implementations relate to a parallel backup power supply. For example, a parallel backup power supply system can include a plurality of backup power supply cells that support a plurality of loads. Each of the backup power supply cells can include a charging module to charge an associated backup power supply cell among the plurality of backup power supply cells and a cell controller. The cell controller is to can be configured to control the charging module and communicate with a management module. The parallel backup power supply system can also include the management module to activate each of the plurality of backup power supply cells to provide backup power in parallel to the plurality of loads as each of the plurality of backup power supply cells is fully charged.

Abstract: Example implementations relate to data backup. For example, a data backup can include tracking a location of a data block on a first node and initiating a transfer, utilizing a backup power supply, of the data block to a non-volatile memory location on a second node in response to an interruption of a primary power supply. In addition, the data block can be restored to the tracked location of the first node responsive to a restoration of the primary power supply.

Abstract: During runtime of a system, a memory controller is caused to relinquish control of a memory module that includes a volatile memory and a non-volatile memory. After the triggering, an indication is activated to the memory module, the indication causing a backup operation in the memory module, the backup operation being controlled by an internal controller in the memory module, and the backup operation involving a transfer of data from the volatile memory to the non-volatile memory in the memory module.

Abstract: A Next Generation Form Factor (NGFF) carrier includes a flat component perpendicularly connected to two flat side components to receive an NGFF module, a bar rotatably connected to the two flat side components, and a number of holds along an interior of the flat component to receive a fastener. The NGFF module is insertable in relation to the flat component when the bar is rotated to a first position and fixed on the flat component when the bar is rotated to a second position.

Abstract: A Next Generation Form Factor (NGFF) connector apparatus can include a plurality of upper signal pins and an upper ground (GND) pin that is longer than other upper pins. The NGFF connector apparatus can also include a plurality of lower signal pins and a lower power (PWR) pin that is longer than other lower pins.

Abstract: An example system includes a memory controller; a memory bus coupled to the memory controller; and a dual inline memory module (DIMM) coupled to the memory controller through the memory bus. The DIMM includes a dynamic random access memory (DRAM) portion; a storage portion; and a gate array portion coupled to the memory bus to detect memory access signals and to store information related to the memory access signals on the storage portion.

Abstract: A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.

Abstract: Example implementations relate to combined backup power. For example, a system for combined backup power can include a combined backup power supply (CBPS) coupled to a node and a plurality of loads supported by the node. The CBPS can include an uninterruptible power supply (UPS) and a backup power supply coupled to the UPS to act as redundancy for the UPS.