Patents by Inventor Ralf Engelmann

Ralf Engelmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230230209
    Abstract: A method can be used for sensing and processing image data for an object to be imaged. The object is scanned incompletely by virtue of regions (eB) of the object being sensed, where the sensed image regions (eB) alternate with non-sensed image regions (neB) of the object. Image data (rBD) of the non-sensed image regions (neB) are reconstructed on the basis of the sensed image data (eBD) of the sensed image regions (eB). A noise signal (N) of the sensed image data (eBD) of the sensed regions (eB) is ascertained and transferred to the reconstructed image data (rBD) of the non-sensed regions (neB), so that a user obtains a homogeneous visual impression in relation to the noise arising in the overall image data of the object visualized in a resultant overall image (rGBInv).
    Type: Application
    Filed: January 17, 2023
    Publication date: July 20, 2023
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Manuel AMTHOR, Daniel Haase, Ralf Engelmann
  • Patent number: 8780443
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the f
    Type: Grant
    Filed: October 13, 2009
    Date of Patent: July 15, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ralf Engelmann, Joerg Michael Funk, Bernhard Zimmerman, Ralph Netz, Frank Hecht
  • Publication number: 20100097694
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the f
    Type: Application
    Filed: October 13, 2009
    Publication date: April 22, 2010
    Inventors: Bernhard Zimmermann, Ralf Netz, Frank Hecht, Joerg-Michael Funk, Ralf Engelmann
  • Patent number: 7649683
    Abstract: Process for observing at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector. At an angle to the plane of the relative movement, a second scanner is moved and an image acquisition takes place by coupling the movement of the first and second scanners and a three-dimensional sampling movement being done by the illumination of the sample. The second scanner is coupled to the movement of the first scanner such that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: January 19, 2010
    Assignee: Carl Zeiss Microimaging GmbH
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Patent number: 7593581
    Abstract: Process for the acquisition of images from a sample with a microscope, wherein detected image data that correspond to three dimensional probe regions are detected and stored to memory, wherein data compression ensues in that the data of images lying next to one another and over one another on the probe are taken into consideration during compression. A stack of images is advantageously recorded and images that are respectively adjacent in the image stack are consulted for the compression of data. Temporally and/or spectrally detected and stored data shall be consulted for the compression of data.
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: September 22, 2009
    Assignee: Carl Zeiss Micro Imaging GmbH
    Inventors: Frank Hecht, Ralf Engelmann, Ralf Wolleschensky
  • Publication number: 20090046360
    Abstract: Raster scanning light microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
    Type: Application
    Filed: November 28, 2007
    Publication date: February 19, 2009
    Inventors: Joerg-Michael Funk, Ralf Wolleschensky, Bernhard Zimmermann, Stefan Wilhelm, Ralf Engelmann
  • Patent number: 7459698
    Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.
    Type: Grant
    Filed: November 1, 2006
    Date of Patent: December 2, 2008
    Assignee: Carl Zeiss MicroImaging GmbH
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Publication number: 20080285123
    Abstract: Raster scanning light microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
    Type: Application
    Filed: November 28, 2007
    Publication date: November 20, 2008
    Inventors: Joerg-Michael Funk, Ralf Wolleschensky, Bernhard Zimmermann, Stefan Wilhelm, Ralf Engelmann
  • Publication number: 20080149818
    Abstract: Procedure for the image acquisition of objects by means of a light raster microscope with line by line scanning, whereas a scanning of the specimen for the creation of a specimen image occurs in scanning steps and the distance between at least two scanning steps is variably adjustable and at least a second scanning of the specimen occurs, during which the position of the scanning steps is shifted with regard to the scanning direction, whereas preferably a line by line scanning of the specimen is carried out.
    Type: Application
    Filed: November 28, 2007
    Publication date: June 26, 2008
    Inventors: Ralf Wolleschensky, Frank Hecht, Ralf Engelmann
  • Publication number: 20080068709
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combination, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for th
    Type: Application
    Filed: April 6, 2007
    Publication date: March 20, 2008
    Inventors: Bernhard Zimmermann, Ralf Netz, Frank Hecht, Joerg-Michael Funk, Ralf Engelmann
  • Publication number: 20080048105
    Abstract: Procedure for the image acquisition of objects by means of a light raster microscope, whereas a scanning of the probe for the creation of a probe image occurs in scanning steps and the distance between at least two scanning steps is variably adjustable and at least a second scanning of the probe occurs, during which the position of the scanning steps is shifted with regard to the scanning direction, whereas preferably a line by line scanning of the probe is carried out.
    Type: Application
    Filed: March 12, 2007
    Publication date: February 28, 2008
    Applicant: CARL ZEISS JENA GMBH
    Inventors: Ralf Wolleschensky, Frank Hecht, Ralf Engelmann
  • Patent number: 7323679
    Abstract: Procedure for the image acquisition of objects by means of a light raster microscope with line by line scanning, whereas a scanning of the probe for the creation of a probe image occurs in scanning steps and the distance between at least two scanning steps is variably adjustable and at least a second scanning of the probe occurs, during which the position of the scanning steps is shifted with regard to the scanning direction, whereas preferably a line by line scanning of the probe is carried out.
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: January 29, 2008
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Ralf Wolleschensky, Frank Hecht, Ralf Engelmann
  • Patent number: 7271382
    Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: September 18, 2007
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Publication number: 20070188754
    Abstract: The invention is directed to a laser scanning microscope with a detector device for spectrally resolving radiation detection. The detector device has at least one dispersive element, on which a beam of the radiation to be detected impinges and which fans out this beam spectrally, and at least two detector line arrays to which the spectrally fanned out radiation is directed and whose sensitivity is only adjustable in a unitary manner. At least two detector line arrays are provided in the detector device, each of them being irradiated by spectrally fanned out radiation of different spectral composition. The respective spectral composition of the radiation and the basic spectral sensitivity of the detector line arrays are taken into account in the sensitivity adjustment of the detector line arrays.
    Type: Application
    Filed: February 8, 2007
    Publication date: August 16, 2007
    Inventors: Gunter Moehler, Ralf Engelmann
  • Publication number: 20070131875
    Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scamming means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.
    Type: Application
    Filed: November 1, 2006
    Publication date: June 14, 2007
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Publication number: 20070053594
    Abstract: Process for the acquisition of images from a probe with a light scanning electron microscope, wherein detected image data that correspond to three dimensional probe regions are detected and stored to memory, wherein data compression ensues in that the data of images lying next to one another and over one another on the probe are taken into consideration during compression. A stack of images is advantageously recorded and images that are respectively adjacent in the image stack are consulted for the compression of data. Temporally and/or spectrally detected and stored data shall be consulted for the compression of data.
    Type: Application
    Filed: October 19, 2004
    Publication date: March 8, 2007
    Inventors: Frank Hecht, Ralf Engelmann, Ralf Wolleschensky
  • Publication number: 20060273261
    Abstract: A Laser Scanning Microscope with an illumination radiation distribution, which is guided over a sample for scanning and in which an image of the sample is taken from the sample radiation generated and detected during the scanning, wherein the sample is sampled with an imaging rate of x images per second, wherein in a mode for the adjustment of the device parameters, the imaging rate is reduced with uniform sampling speed. preferably for sparing the sample the exposure, to a fraction X/Y of X, Y>1.
    Type: Application
    Filed: May 3, 2006
    Publication date: December 7, 2006
    Inventors: Ralf Wolleschensky, Wolfgang Bathe, Frank Hecht, Ralf Engelmann, Joerg Steinert
  • Publication number: 20060011804
    Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of th
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Ralf Engelmann, Joerg-Michael Funk, Joerg Steinert, Bernhard Zimmermann, Stefan Wilhelm, Joerg Engel, Ulrich Meisel
  • Publication number: 20060011861
    Abstract: Procedure for the image acquisition of objects by means of a light raster microscope, whereas a scanning of the probe for the creation of a probe image occurs in scanning steps and the distance between at least two scanning steps is variably adjustable and at least a second scanning of the probe occurs, during which the position of the scanning steps is shifted with regard to the scanning direction, whereas preferably a line by line scanning of the probe is carried out.
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Ralf Wolleschensky, Frank Hecht, Ralf Engelmann
  • Publication number: 20060013492
    Abstract: Process for the acquisition of images from a probe with a light scanning electron microscope with punctiform light source distribution, wherein detected image data that correspond to three dimensional probe regions are detected and stored to memory, wherein data compression ensues in that the data of images lying next to one another and over one another on the probe are taken into consideration during compression. A stack of images is advantageously recorded and images that are respectively adjacent in the image stack are consulted for the compression of data. Temporally and/or spectrally detected and stored data shall be consulted for the compression of data.
    Type: Application
    Filed: October 19, 2004
    Publication date: January 19, 2006
    Inventors: Frank Hecht, Ralf Engelmann, Ralf Wolleschensky