Patents by Inventor Ralf Netz

Ralf Netz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11573412
    Abstract: In high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescence radiation in such a way that the illumination radiation is focused at a point in or on the sample to form a diffraction-limited illumination spot. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a structure of the diffraction image. The sample is scanned by means of different scanning positions with an increment of less than half the diameter of the illumination spot. An image of the sample is generated from the data of the surface detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging.
    Type: Grant
    Filed: June 21, 2018
    Date of Patent: February 7, 2023
    Assignee: CARL ZEISS MICROSCOPY GMBH
    Inventors: Ingo Kleppe, Ralf Netz
  • Patent number: 11555991
    Abstract: A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths ?i, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths ?i a target phase function ??i(x, y, ?i) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function ??i(x, y, ?i) is effective only for the corresponding wavelength ?i. The target phase functions ??i are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions ??i(x, y, ?i). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths ?i such that the predefined structure of the illumination light is generated in the region of the sample.
    Type: Grant
    Filed: May 24, 2019
    Date of Patent: January 17, 2023
    Assignee: CARL ZEISS MICROSCOPY GMBH
    Inventors: Joerg Siebenmorgen, Ralf Netz
  • Patent number: 11550135
    Abstract: An optical arrangement for light beam shaping in a light microscope has a first and a second liquid crystal region, each of which has a plurality of independently switchable liquid crystal elements with which a phase of incident light is changeable in a settable manner. A first polarization beam splitter is arranged in such a way that incident light is split in a polarization-dependent manner into reflection light, which is reflected in the direction of the first liquid crystal region, and transmission light, which is transmitted in the direction of the second liquid crystal region. The first or a second polarization beam splitter is arranged such that the reflection light and transmission light are combined onto a common beam path after phase modulation by means of the liquid crystal regions.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: January 10, 2023
    Assignee: CARL ZEISS MICROSCOPY GMBH
    Inventors: Jörg Siebenmorgen, Ingo Kleppe, Ralf Netz
  • Patent number: 11525988
    Abstract: An arrangement for increasing resolution of a laser scanning microscope has a simplified adjustment and lower susceptibility to errors. The pupil beam from the laser scanning microscope is coupled into a shortened common path interferometer, to make wavefronts of a pupil image mirrored at at least one axis and wavefronts of an unchanged pupil image interfere. The area of a pupil from the pupil beam is split into two complementary portions P and Q producing two partial beams separately supplied to at least one beam deflection means by total-internal reflection along the common path interferometer. The light of the interferometer branches from transmitted light of the one interferometer branch and reflected light of the other interferometer branch is made to interfere at a partly transmissive beam splitter layer to cause constructive interference C and destructive interference D of the wavefronts from the two different portions P and Q of the pupil.
    Type: Grant
    Filed: January 25, 2018
    Date of Patent: December 13, 2022
    Assignee: CARL ZEISS MICROSCOPY GMBH
    Inventors: Kai Wicker, Ralf Netz
  • Patent number: 11454792
    Abstract: A light microscope comprises: a structuring optical unit comprising a waveguide chip for providing a structured illumination; an input selection device for variably directing light to one of several inputs of the waveguide chip; the waveguide chip further comprising a light guide path following each of the inputs; each light guide path divides into several path divisions; and each path division leads to one output of the wave-guide chip. The outputs of the waveguide chip can be arranged at a pupil plane of the light microscope, and an exit direction of light from the outputs is transverse to a plane defined by the waveguide chip. A method for providing structured illumination light using the light microscope is also described.
    Type: Grant
    Filed: April 24, 2018
    Date of Patent: September 27, 2022
    Assignees: Carl Zeiss Microscopy GmbH, LioniX International B.V.
    Inventors: Gerhard Krampert, Kai Wicker, Ralf Netz, Ronald Dekker, Edwin Jan Klein, Douwe Harmen Geuzebroek
  • Patent number: 11372223
    Abstract: A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.
    Type: Grant
    Filed: March 19, 2019
    Date of Patent: June 28, 2022
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ingo Kleppe, Yauheni Novikau, Christoph Nieten, Ralf Netz
  • Publication number: 20220137382
    Abstract: In a light sheet microscope, a detection device images a sample volume and an illumination device illuminates the sample with a light sheet. A light sheet plane is arranged substantially perpendicularly to the optical imaging axis and an illumination width extends perpendicular to the light sheet plane. A processing device is provided to control setting of the location of the light sheet plane in the sample volume, and recording a plurality of images of the sample volume with different locations of the light sheet plane. For the plurality of images recorded, a spacing, which is measured along the optical imaging axis, between adjacent locations of the light sheet plane is greater than or equal to half the illumination width, but not greater than the illumination width. Intermediate images for the stack of images in additional locations of the light sheet plane in the sample volume are computed.
    Type: Application
    Filed: October 28, 2021
    Publication date: May 5, 2022
    Inventors: Ralf NETZ, Joerg SIEBENMORGEN
  • Publication number: 20220075175
    Abstract: A method for performing SIM microscopy on a sample, includes: generating n raw images of the sample, in each case by illuminating the sample using the same SIM illumination pattern albeit with an individual positioning for each raw image, wherein p orders of diffraction are assigned to the SIM illumination pattern, and generating an image of the sample from the n raw images. An image reconstruction is carried out using the orders of diffraction, wherein t highest orders of diffraction are suppressed during the image reconstruction and n=p?t applies.
    Type: Application
    Filed: September 9, 2021
    Publication date: March 10, 2022
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Ingo Kleppe, Yauheni Novikau, Ralf Netz
  • Patent number: 11231572
    Abstract: An arrangement for TIRF microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier in a specimen plane via an illumination beam path. An optical axis of the illumination objective includes an illumination angle that differs from zero with the normal of the specimen plane. A detection optical unit with a detection objective in a detection beam path includes a detection angle that differs from zero between an optical axis thereof and the normal of the specimen plane. A transition element between the specimen carrier and both objectives is arranged both in the illumination beam path and in the detection beam path. The transition element corrects aberrations that arise on account of the passage through media with different refractive indices of radiation to be detected and/or radiation for illuminating the specimen.
    Type: Grant
    Filed: February 15, 2018
    Date of Patent: January 25, 2022
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Jörg Siebenmorgen, Ralf Netz
  • Patent number: 11204489
    Abstract: A microscopy high-resolution scanning method, including exciting a sample with illumination radiation focused at a point to form a diffraction-limited illumination spot so as to emit fluorescence radiation. The point is imaged in a diffraction image on a spatially resolving two-dimensional detector. The sample is scanned at scanning positions with increments that are smaller than half the diameter of the spot. An image of the sample with a resolution increased beyond a resolution limit of the image is generated from the data of the two-dimensional detector and the scanning positions. To discriminate between at least two predetermined wavelength ranges in the fluorescence radiation of the sample, Airy disks corresponding to the wavelength ranges are generated on the two-dimensional detector, the Airy disks being offset laterally from one another such that the diffraction image consists of the mutually offset Airy disks. The Airy disks are evaluated when generating the sample image.
    Type: Grant
    Filed: August 5, 2015
    Date of Patent: December 21, 2021
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ingo Kleppe, Ralf Netz, Yauheni Novikau
  • Patent number: 11194144
    Abstract: A microscopy method, and related microscope, including producing illumination radiation and directing it at a focus. The illumination radiation is switched temporally between at least two modes, such that focus modulation is effected at which temporally varying and mutually different mode fields of the illumination radiation are produced in the focus. The focus is guided at least over regions of a sample to be examined, wherein detection radiation in the sample is or may be brought about by the illumination radiation in the focus at least at a point of origin. The detection radiation is captured in a manner assigned to the at least one point of origin. In addition to the illumination radiation, at least one disexcitation beam of rays of disexcitation radiation is directed at the focus. The disexcitation radiation prevents the detection radiation from being brought about in the region that is illuminated by the disexcitation radiation.
    Type: Grant
    Filed: June 21, 2017
    Date of Patent: December 7, 2021
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ralf Netz, Thomas Kalkbrenner, Tiemo Anhut
  • Publication number: 20210247600
    Abstract: An optics arrangement for flexible multi-color illumination for a light microscope comprises an AOTF, which is set up to diffract two light components from incident illumination light into different order-of-diffraction directions, wherein the two light components differ in their wavelengths and polarizations, or an EOM, with which two temporally successive light components of different wavelengths are set to different polarization directions. A polarization beam splitter separates the two light components of different wavelengths and polarizations into reflection light, which is reflected at the polarization beam splitter, and transmission light, which is transmitted at the polarization beam splitter. A light structuring apparatus imprints different structures onto the transmission light and the reflection light. The structured transmission light and the structured reflection light are then recombined by the polarization beam splitter or a further polarization beam splitter onto a common beam path.
    Type: Application
    Filed: April 11, 2019
    Publication date: August 12, 2021
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Jörg SIEBENMORGEN, lngo KLEPPE, Ralf NETZ
  • Publication number: 20210231936
    Abstract: A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface.
    Type: Application
    Filed: April 14, 2021
    Publication date: July 29, 2021
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Thomas Kalkbrenner, Ralf Netz, Helmut Lippert, Joerg Siebenmorgen
  • Publication number: 20210199942
    Abstract: A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths ?i, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths ?i a target phase function ??i(x, y, ?i) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function ??i(x, y, ?i) is effective only for the corresponding wavelength ?i. The target phase functions ??i are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions ??i(x, y, ?i). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths ?i such that the predefined structure of the illumination light is generated in the region of the sample.
    Type: Application
    Filed: May 24, 2019
    Publication date: July 1, 2021
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Joerg SIEBENMORGEN, Ralf NETZ
  • Publication number: 20210191097
    Abstract: An illumination apparatus for illuminating a sample plane and a sample that is optionally arranged therein along an illumination beam path includes: a first light source (for outputting light of at least one first wavelength (?photo), a second light source for outputting light of at least one second wavelength (?exc), and a diffraction grating in the illumination beam path between the first and second light sources and the sample plane. Light of the first wavelength (?photo) is not diffracted by the diffraction grating, and light of the second wavelength (?exc) is diffracted due to the effect of the diffraction grating. The illumination apparatus can be used in a microscope.
    Type: Application
    Filed: December 3, 2020
    Publication date: June 24, 2021
    Inventors: Jörg Siebenmorgen, Ralf Netz
  • Publication number: 20210132354
    Abstract: An optical arrangement for light beam shaping in a light microscope has a first and a second liquid crystal region, each of which has a plurality of independently switchable liquid crystal elements with which a phase of incident light is changeable in a settable manner. A first polarization beam splitter is arranged in such a way that incident light is split in a polarization-dependent manner into reflection light, which is reflected in the direction of the first liquid crystal region, and transmission light, which is transmitted in the direction of the second liquid crystal region. The first or a second polarization beam splitter is arranged such that the reflection light and transmission light are combined onto a common beam path after phase modulation by means of the liquid crystal regions.
    Type: Application
    Filed: April 11, 2019
    Publication date: May 6, 2021
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Jörg SIEBENMORGEN, lngo KLEPPE, Ralf NETZ
  • Patent number: 10983322
    Abstract: A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface.
    Type: Grant
    Filed: October 20, 2017
    Date of Patent: April 20, 2021
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Thomas Kalkbrenner, Ralf Netz, Helmut Lippert, Joerg Siebenmorgen
  • Publication number: 20210096358
    Abstract: An optical arrangement for light beam shaping for a light microscope has a first and a second liquid crystal region or lifting micromirror region, each of which has a plurality of independently switchable liquid crystal elements or mirrors with which a phase of incident light is changeable in a settable manner, an input-/output-coupling polarization beam splitter, a polarization beam splitter arranged between the input-/output-coupling polarization beam splitter and the liquid crystal regions or lifting micromirror regions such that the polarization beam splitter separates the light coming from the input-/output-coupling polarization beam splitter in a polarization-dependent manner into a first partial beam, which is directed to the first liquid crystal region or lifting micromirror region, and into a second partial beam, which is directed to the second liquid crystal region or lifting micromirror region, and that the polarization beam splitter combines the two partial beams returning from the liquid crystal
    Type: Application
    Filed: April 11, 2019
    Publication date: April 1, 2021
    Applicant: Cart Zeiss Microscopy GmbH
    Inventors: Dr. Jörg SIEBENMORGEN, Ingo KLEPPE, Ralf NETZ
  • Publication number: 20200310095
    Abstract: A microscopy method, and related microscope, including producing illumination radiation and directing it at a focus. The illumination radiation is switched temporally between at least two modes, such that focus modulation is effected at which temporally varying and mutually different mode fields of the illumination radiation are produced in the focus. The focus is guided at least over regions of a sample to be examined, wherein detection radiation in the sample is or may be brought about by the illumination radiation in the focus at least at a point of origin. The detection radiation is captured in a manner assigned to the at least one point of origin. In addition to the illumination radiation, at least one disexcitation beam of rays of disexcitation radiation is directed at the focus. The disexcitation radiation prevents the detection radiation from being brought about in the region that is illuminated by the disexcitation radiation.
    Type: Application
    Filed: June 21, 2017
    Publication date: October 1, 2020
    Applicant: CARL ZEISS MICROSOPY GMBH
    Inventors: Ralf Netz, Thomas KALKBRENNER, Tiemo ANHUT
  • Patent number: 10663749
    Abstract: An optical assembly that is designed for positioning in a beam path of a light microscope having means for providing structured illuminating light in a sample plane of the light microscope, so that structured illuminating light can be generated in different orientations. The optical assembly has an adjustable deflector in order to deflect an incident light bundle onto one of several beam paths in a selectable manner. Beam splitting devices are located in the beam paths in order to split the light bundle of the respective beam paths into partial light bundles, which are spatially separated from each other. Beam guides are provided for each of the partial light bundles, and guide the partial light bundles to a pupil plane. The beam guides are arranged in such a way that the partial light bundles that belong to the same beam path form a light spot pattern in the pupil plane; and that the light spot patterns of different beam paths in the pupil plane are different from each other.
    Type: Grant
    Filed: October 9, 2013
    Date of Patent: May 26, 2020
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Daniel Schwedt, Tiemo Anhut, Ralf Netz