Patents by Inventor Ralf Netz
Ralf Netz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10048481Abstract: A method for operating a scanning microscope and for determining point spread functions, with which sample images are recorded with the scanning microscope. The method includes scanning a sample with at least one illuminating light beam; recording at least one sample image with a detector device during a scan by the illuminating light beam; and comprising the point spread function, with which a sample image is recorded, from the at least one sample image. A detector device having receiving elements is used, where the distance between the receiving elements is smaller than a diffraction disk that generates a sample point on the detector device. Detector signals, generated by means of the receiving elements, are read out for each of the different positions of the illuminating light beam on the sample, as a result of which the scanning of the sample allows the detector signals, which are read out, to generate a plurality of sample images.Type: GrantFiled: October 10, 2014Date of Patent: August 14, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Ingo Kleppe, Yauheni Novikau, Ralf Netz, Michael Kieweg, Christoph Nieten
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Publication number: 20180196245Abstract: The invention relates to the high-resolution spectrally selective scanning microscopy of a sample. The sample is excited with illumination radiation in order to emit fluorescence radiation such that the illumination radiation is bundled into an illumination spot in or on the sample. The illumination spot is diffraction-limited in at least one spatial direction and has a minimum extension in said spatial direction. Fluorescence radiation emitted from the illumination spot is imaged into a diffraction image lying on an image plane in a diffraction-limited manner and is detected with a spatial resolution which resolves a structure of a diffraction image of the fluorescence radiation emitted from the illumination spot. The illumination spot is moved into different scanning positions relative to the sample in increments which are smaller than half the minimum extension of the illumination spot.Type: ApplicationFiled: July 19, 2016Publication date: July 12, 2018Inventors: Ingo KLEPPE, Ralf WOLLESCHENSKY, Ralf NETZ, Yauheni NOVIKAU
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Patent number: 9989746Abstract: An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.Type: GrantFiled: February 27, 2017Date of Patent: June 5, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Wolfgang Bathe, Ralf Netz
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Patent number: 9864182Abstract: A microscope and method for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions is also provided. An evaluation device for the purpose of evaluating a diffraction structure of the single image for the scan positions is provided. The detector device has a detector array which has pixels and which is larger than the single image.Type: GrantFiled: September 18, 2014Date of Patent: January 9, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Ingo Kleppe, Ralf Netz, Thomas Kalkbrenner, Ralf Wolleschensky, Yauheni Novikau
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Patent number: 9791686Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than tType: GrantFiled: March 13, 2017Date of Patent: October 17, 2017Assignee: Carl Zeiss Microscopy GMBHInventors: Ralf Wolleschensky, Ingo Kleppe, Ralf Netz, Christoph Nieten
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Publication number: 20170227749Abstract: A microscopy high-resolution scanning method, including exciting a sample with illumination radiation focused at a point to form a diffraction-limited illumination spot so as to emit fluorescence radiation. The point is imaged in a diffraction image on a spatially resolving two-dimensional detector. The sample is scanned at scanning positions with increments that are smaller than half the diameter of the spot. An image of the sample with a resolution increased beyond a resolution limit of the image is generated from the data of the two-dimensional detector and the scanning positions. To discriminate between at least two predetermined wavelength ranges in the fluorescence radiation of the sample, Airy disks corresponding to the wavelength ranges are generated on the two-dimensional detector, the Airy disks being offset laterally from one another such that the diffraction image consists of the mutually offset Airy disks. The Airy disks are evaluated when generating the sample image.Type: ApplicationFiled: August 5, 2015Publication date: August 10, 2017Inventors: Ingo KLEPPE, Ralf NETZ, Yauheni NOVIKAU
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Publication number: 20170192216Abstract: An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.Type: ApplicationFiled: February 27, 2017Publication date: July 6, 2017Inventors: Wolfgang BATHE, Ralf Netz
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Publication number: 20170184834Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than tType: ApplicationFiled: March 13, 2017Publication date: June 29, 2017Inventors: Ralf WOLLESCHENSKY, Ingo Kleppe, Ralf Netz, Christoph Nieten
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Patent number: 9671600Abstract: A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.Type: GrantFiled: January 23, 2014Date of Patent: June 6, 2017Assignee: Carl Zeiss Microscopy GmbHInventors: Wolfgang Bathe, Ralf Netz
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Patent number: 9671603Abstract: An optical arrangement for positioning in a beam path of a light microscope, has an optical carrier, on which a first set of optical assemblies for generating structured illumination light of different orientations is arranged. The optical arrangement includes an adjustable deflection device provided for selectably deflecting a light beam to one of the optical assemblies and for deflecting one light beam coming from said optical assembly into the direction of a sample that is to be examined. The invention further relates to a light microscope having an optical arrangement according to the invention.Type: GrantFiled: August 2, 2013Date of Patent: June 6, 2017Assignee: Carl Zeiss Microscopy GmbHInventors: Thomas Kalkbrenner, Ralf Netz, Ingo Kleppe
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Patent number: 9645375Abstract: A light microscope having a specimen plane, in which a specimen to be examined is positioned, having a light source to emit illuminating light, having optical imaging means to convey the illuminating light into the specimen plane, having a first scanning means, with which an optical path of the illuminating light and the specimen can be moved relative to each other to produce an illumination scanning movement of the illuminating light relative to the specimen, having a detector means to detect specimen light coming from the specimen and having electronic means to produce an image of the specimen based on the specimen light detected by the detector means at different specimen regions. A second scanning means is present, with which it can be adjusted which specimen region can be imaged on a determined detector element.Type: GrantFiled: November 7, 2013Date of Patent: May 9, 2017Assignee: Carl Zeiss Microscopy GmbHInventors: Ingo Kleppe, Christoph Nieten, Yauheni Novikau, Ralf Netz
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Patent number: 9632296Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than tType: GrantFiled: February 27, 2013Date of Patent: April 25, 2017Assignee: Carl Zeiss Microscopy GmbHInventors: Ralf Wolleschensky, Ingo Kleppe, Ralf Netz, Christoph Nieten
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Patent number: 9507137Abstract: A microscope and a method of microscopy use structured illumination, involving imaging a grid structure or periodic light distribution on a sample. By displacing the image of the grid structure, imaging is carried out under different phase positions, and a high-resolution sample image is calculated from the recorded images. The grid structure or light distribution is generated by using at least two phase grids arranged one in front of the other, and different orientations of the light distribution perpendicular to the illumination direction are generated by displacing the phase grids relative to one another, with displacement, imaging and calculation being carried out for different orientations.Type: GrantFiled: March 21, 2014Date of Patent: November 29, 2016Assignee: Carl Zeiss Microscopy GmbHInventors: Thomas Kalkbrenner, Ingo Kleppe, Ralf Netz
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Patent number: 9470883Abstract: A microscope for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot over the sample and of imaging the point or linear spot into a diffraction-limited, static single image below am imaging scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions, with a spatial resolution which, taking into account the imaging scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image. The amplitude and/or phase of a wavefront influenced by the sample is detected with spatial resolution by means for wavefront detection, and wherein the influence of the sample on the phase is determined by means of a wavefront sensor.Type: GrantFiled: September 19, 2014Date of Patent: October 18, 2016Assignee: Carl Zeiss Microscopy GmbHInventors: Thomas Kalkbrenner, Ingo Kleppe, Helmut Lippert, Ralf Netz
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Publication number: 20160267658Abstract: A method for operating a scanning microscope and for determining point spread functions, with which sample images are recorded with the scanning microscope. The method includes scanning a sample with at least one illuminating light beam; recording at least one sample image with a detector device during a scan by the illuminating light beam; and comprising the point spread function, with which a sample image is recorded, from the at least one sample image. A detector device having receiving elements is used, where the distance between the receiving elements is smaller than a diffraction disk that generates a sample point on the detector device. Detector signals, generated by means of the receiving elements, are read out for each of the different positions of the illuminating light beam on the sample, as a result of which the scanning of the sample allows the detector signals, which are read out, to generate a plurality of sample images.Type: ApplicationFiled: October 10, 2014Publication date: September 15, 2016Applicant: Carl Zeiss Microscopy GMBHInventors: Ingo KLEPPE, Yauheni NOVIKAU, Ralf NETZ, Michael KIEWEG, Christoph NIETEN
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Patent number: 9404867Abstract: A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.Type: GrantFiled: October 22, 2010Date of Patent: August 2, 2016Assignee: Carl Zeiss Microscopy GmbHInventors: Michael Kempe, Ralf Netz, Gerhard Krampert
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Publication number: 20160131883Abstract: A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.Type: ApplicationFiled: August 12, 2014Publication date: May 12, 2016Inventors: Ingo KLEPPE, Yauheni Novikau, Christoph Nieten, Ralf Netz
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Patent number: 9304307Abstract: A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.Type: GrantFiled: May 24, 2013Date of Patent: April 5, 2016Assignee: Carl Zeiss Microscopy GmbHInventors: Wibke Hellmich, Gerhard Krampert, Matthias Langhorst, Ralf Netz
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Publication number: 20150378141Abstract: A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.Type: ApplicationFiled: January 23, 2014Publication date: December 31, 2015Inventors: Wolfgang BATHE, Ralf NETZ
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Publication number: 20150301325Abstract: An optical arrangement for positioning in a beam path of a light microscope, has an optical carrier, on which a first set of optical assemblies for generating structured illumination light of different orientations is arranged. The optical arrangement includes an adjustable deflection device provided for selectably deflecting a light beam to one of the optical assemblies and for deflecting one light beam coming from said optical assembly into the direction of a sample that is to be examined. The invention further relates to a light microscope having an optical arrangement according to the invention.Type: ApplicationFiled: August 2, 2013Publication date: October 22, 2015Inventors: Dr. Thomas KALKBRENNER, Ralf NETZ, Ingo KLEPPE