Patents by Inventor Ramesh Kakkad

Ramesh Kakkad has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20010046788
    Abstract: The invention grows SiO2 and silicon nitride films over silicon at temperatures in a range of room temperature to 700° C. The lower temperature oxidation is made possible by creation of reactive oxygen species and by supplying photon energy, ion energy or electron energy to a gas mixture containing noble gas(es) and oxidizing gas(es). It is also possible to fabricate silicon nitride films by supplying energy through photons, ions or electrons to a gas mixture containing noble gas(es) and nitridizing gas(es).
    Type: Application
    Filed: February 28, 2001
    Publication date: November 29, 2001
    Applicant: Seiko Epson Corporation
    Inventor: Ramesh Kakkad
  • Patent number: 6239451
    Abstract: An ultra-thin highly electrically conductive material is prepared by depositing an amorphous material, substantially free of crystal growth-inducing nuclei and sites, onto a substrate. Deposition is preferably with a plasma deposition reactor, with semiconductor dopants introduced during deposition. Deposition time is preferably adjusted to create an amorphous film of a desired thickness, e.g., 200 Å. After deposition, the amorphous film is annealed preferably with a rapid thermal annealing process for four minutes at 700° C. The annealing triggers the creation of nuclei and subsequent large grain growth in the film, releases energy contained within the amorphous material, and helps drive crystallization and dopant activation. After annealing the material is completely crystallized, and contains large grains whose lateral dimensions can exceed the film thickness by a factor of fifty.
    Type: Grant
    Filed: November 23, 1999
    Date of Patent: May 29, 2001
    Assignee: The Pennsylvania Research Foundation
    Inventors: Stephen J. Fonash, Ramesh Kakkad
  • Patent number: 6013565
    Abstract: An ultra-thin highly electrically conductive material is prepared by depositing an amorphous material, substantially free of crystal growth-inducing nuclei and sites, onto a substrate. Deposition is preferably with a plasma deposition reactor, with semiconductor dopants introduced during deposition. Deposition time is preferably adjusted to create an amorphous film of a desired thickness, e.g., 200 .ANG.. After deposition, the amorphous film is annealed preferably with a rapid thermal annealing process for four minutes at 700.degree. C. The annealing triggers the creation of nuclei and subsequent large grain growth in the film, releases energy contained within the amorphous material, and helps drive crystallization and dopant activation. After annealing the material is completely crystallized, and contains large grains whose lateral dimensions can exceed the film thickness by a factor of fifty.
    Type: Grant
    Filed: August 15, 1994
    Date of Patent: January 11, 2000
    Assignee: Penn State Research Foundation
    Inventors: Stephen J. Fonash, Ramesh Kakkad