Abstract: Aspects described herein include devices and methods for phase tracking and correction using sampling. One aspect includes a wireless communication apparatus having an analog 1-bit sampler configured to sample a phase locked loop (PLL) output signal using a PLL reference clock to generate 1-bit samples and a digital phase computation and control circuit configured to receive the 1-bit samples from the analog 1-bit sampler and apply phase corrections to the PLL based on a phase error derived from the 1-bit samples.

Abstract: Aspects of the present disclosure provide techniques and apparatus for synchronizing phase-locked loop (PLL) circuits. An example method of operating PLL circuits includes obtaining an indication to perform a synchronizing action at a first PLL circuit and a second PLL circuit; and performing the synchronizing action at the first PLL circuit and the second PLL circuit in response to obtaining the indication.

Abstract: An apparatus can implement a frequency doubler with duty cycle correction in conjunction with, for instance, a phase-locked loop (PLL) to decrease phase noise. In an example aspect, an apparatus has a frequency doubler including a signal combiner, a first signal pathway, and a second signal pathway. The frequency doubler also includes a doubler input node and a doubler output node. The signal combiner is coupled to the doubler output node. The first signal pathway is coupled between the doubler input node and the signal combiner and includes a first adjustable delay cell. The second signal pathway is also coupled between the doubler input node and the signal combiner and includes a second adjustable delay cell.

Abstract: An apparatus implements a multiplying delay-locked loop (MDLL) including a sampler to be calibrated. In an example aspect, an apparatus includes an MDLL and a sampler calibrator. The MDLL includes a locked-loop feedforward path with a sampler, a control output, a feedback input, and a reference input coupled to a reference signal source. The MDLL also includes a VCO, a multiplexer, and a divider. The VCO includes a VCO input, a VCO output, and a control input coupled to the control output. The multiplexer includes a first input coupled to the reference signal source, a second input coupled to the VCO output, and an output coupled to the VCO input. The divider is coupled between the VCO output and the feedback input. The sampler calibrator includes a first input coupled to the reference signal source, a second input coupled to the VCO output, and an output coupled to the sampler.

Abstract: An apparatus implements a multiplying delay-locked loop (MDLL) including a sampler to be calibrated. In an example aspect, an apparatus includes an MDLL and a sampler calibrator. The MDLL includes a locked-loop feedforward path with a sampler, a control output, a feedback input, and a reference input coupled to a reference signal source. The MDLL also includes a VCO, a multiplexer, and a divider. The VCO includes a VCO input, a VCO output, and a control input coupled to the control output. The multiplexer includes a first input coupled to the reference signal source, a second input coupled to the VCO output, and an output coupled to the VCO input. The divider is coupled between the VCO output and the feedback input. The sampler calibrator includes a first input coupled to the reference signal source, a second input coupled to the VCO output, and an output coupled to the sampler.

Abstract: An apparatus can implement a frequency doubler with duty cycle correction in conjunction with, for instance, a phase-locked loop (PLL) to decrease phase noise. In an example aspect, an apparatus has a frequency doubler including a signal combiner, a first signal pathway, and a second signal pathway. The frequency doubler also includes a doubler input node and a doubler output node. The signal combiner is coupled to the doubler output node. The first signal pathway is coupled between the doubler input node and the signal combiner and includes a first adjustable delay cell. The second signal pathway is also coupled between the doubler input node and the signal combiner and includes a second adjustable delay cell.

Abstract: Certain aspects provide a circuit for generating an oscillating signal. The circuit generally includes a voltage-controlled oscillator (VCO) having cross-coupled transistors, a first capacitive element and a second capacitive element coupled to the cross-coupled transistors, and a first inductive element and a second inductive element coupled to the cross-coupled transistors. First terminals of the first inductive element and the second inductive element are coupled to first terminals of the first capacitive element and the second capacitive element, respectively. The circuit also includes a control circuit having an output coupled to a supply voltage node at second terminals of the first inductive element and the second inductive element, and a feedback path coupled between the VCO and an input of the control circuit.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: A parallel, multi-stage noise shaping (MASH) delta-sigma (??) modulator reduces the required operating frequency by predicting the inputs to later stages of a serial MASH modulator to be multiples of the MASH input. An Nth order parallel MASH ?? modulator generates N outputs (one from each stage) in a single modulator cycle. Accordingly, the Nth order parallel MASH ?? modulator may be operated at 1/N the frequency of a corresponding prior art Nth order serial MASH ?? modulator.

Abstract: A parallel, multi-stage noise shaping (MASH) delta-sigma (??) modulator reduces the required operating frequency by predicting the inputs to later stages of a serial MASH modulator to be multiples of the MASH input. An Nth order parallel MASH ?? modulator generates N outputs (one from each stage) in a single modulator cycle. Accordingly, the Nth order parallel MASH ?? modulator may be operated at 1/N the frequency of a corresponding prior art Nth order serial MASH ?? modulator.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: In a semiconductor device, a method for reducing the effect of crosstalk from an aggressor line to a victim line begins with sensing the occurrence of a voltage change on the aggressor line that can induce a voltage pulse having a pulse magnitude that exceeds a pulse threshold on the victim line. The induced voltage pulse is counteracted by coupling the victim line to a counteracting voltage source. After a predetermined delay period, the coupling of the counteracting voltage source is removed from the victim line. The voltage change on the aggressor line my be sensed from a node connected to either the aggressor line or the victim line. A rising induced pulse is counteracted by coupling the victim line to a more negative voltage source, and a falling induced pulse is counteracted by coupling the victim line to a more positive voltage source.

Abstract: In a semiconductor device, a method for reducing the effect of crosstalk from an aggressor line to a victim line begins with sensing the occurrence of a voltage change on the aggressor line that can induce a voltage pulse having a pulse magnitude that exceeds a pulse threshold on the victim line. The induced voltage pulse is counteracted by coupling the victim line to a counteracting voltage source. After a predetermined delay period, the coupling of the counteracting voltage source is removed from the victim line. The voltage change on the aggressor line my be sensed from a node connected to either the aggressor line or the victim line. A rising induced pulse is counteracted by coupling the victim line to a more negative voltage source, and a falling induced pulse is counteracted by coupling the victim line to a more positive voltage source.

Abstract: A testable, prechargeable circuit has a driving circuit for producing a driving circuit output signal. A timing circuit receives a clock signal and the driving circuit output signal to cause an output of the testable, prechargeable circuit to be in a low state when the clock signal is low. The timing circuit also causes the output of the circuit to be timed with a state change in the clock signal to provide a domino logic output signal. Either a data signal or a test signal are multiplexed to the input of the driving circuit to produce respectively the domino logic output signal or a test output signal. A static logic circuit receives the test output signal to produce a test signal output.

Abstract: A method for synthesizing a domino logic circuit design from a source circuit definition using a static logic circuit synthesis tool includes generating a preliminary domino logic circuit design using the circuit synthesis tool and optimizing an attribute of the preliminary domino logic circuit design by substituting a static cell design for a domino cell design having a same function in the preliminary domino logic circuit design.

Abstract: A testable, prechargeable circuit has a driving circuit for producing a driving circuit output signal. A timing circuit receives a clock signal and the driving circuit output signal to cause an output of the testable, prechargeable circuit to be in a low state when the clock signal is low. The timing circuit also causes the output of the circuit to be timed with a state change in the clock signal to provide a domino logic output signal. Either a data signal or a test signal are multiplexed to the input of the driving circuit to produce respectively the domino logic output signal or a test output signal. A static logic circuit receives the test output signal to produce a test signal output.

Abstract: In a semiconductor device, a method for reducing the effect of crosstalk from an aggressor line to a victim line begins with sensing the occurrence of a voltage change on the aggressor line that can induce a voltage pulse having a pulse magnitude that exceeds a pulse threshold on the victim line. The induced voltage pulse is counteracted by coupling the victim line to a counteracting voltage source. After a predetermined delay period, the coupling of the counteracting voltage source is removed from the victim line. The voltage change on the aggressor line my be sensed from a node connected to either the aggressor line or the victim line. A rising induced pulse is counteracted by coupling the victim line to a more negative voltage source, and a falling induced pulse is counteracted by coupling the victim line to a more positive voltage source.