Abstract: A testable, prechargeable circuit has a driving circuit for producing a driving circuit output signal. A timing circuit receives a clock signal and the driving circuit output signal to cause an output of the testable, prechargeable circuit to be in a low state when the clock signal is low. The timing circuit also causes the output of the circuit to be timed with a state change in the clock signal to provide a domino logic output signal. Either a data signal or a test signal are multiplexed to the input of the driving circuit to produce respectively the domino logic output signal or a test output signal. A static logic circuit receives the test output signal to produce a test signal output.

Abstract: A method for synthesizing a domino logic circuit design from a source circuit definition using a static logic circuit synthesis tool includes generating a preliminary domino logic circuit design using the circuit synthesis tool and optimizing an attribute of the preliminary domino logic circuit design by substituting a static cell design for a domino cell design having a same function in the preliminary domino logic circuit design.

Abstract: A method for synthesizing a domino logic circuit design (18) from a source circuit definition (14) using a static logic circuit synthesis tool (12) includes generating a preliminary domino logic circuit (26) design using the circuit synthesis tool (12) and optimizing an attribute of the preliminary domino logic circuit design by substituting a static cell design for a domino cell design having a same function in the preliminary domino logic circuit design (30).

Abstract: A testable, pulse-triggered static flip-flop. A pulse generator produces a data enable trigger pulse only when a test enable input is low, and a scan test enable trigger pulse only when a test enable input is high. The data enable trigger pulse controls the data input to the flip-flop, while the scan test enable trigger pulse controls the scan test input to the flip-flop. The flip-flop consists of a selection circuit comprised of two latches, each including an inverter and a transmission gate. One latch receives the data input and the other latch receives the scan test input. The data enable trigger pulse controls the transmission gate receiving the data input, and the scan test trigger pulse controls the transmission gate receiving the scan test input. The flip-flop also includes a keeper circuit consisting of a feedback inverter and a static latch.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: A computing system includes a plurality of full adders that each receives a bit-wise inversion of a bit of a first data, a bit of a second data, and a bit of a third data, respectively, and provides a sum output and a carry output. An exclusive-OR logic module receives the sum output of a first of the plurality of full adders and a carry output of a second of the plurality of full adders and provides an exclusive-OR output. An AND logic module has a plurality of inputs and an AND output, wherein the exclusive-OR output is electrically connected to one of the plurality of inputs of the AND logic module, and the AND output provides a signal that indicates whether the first data equals the sum of the second data and third data.

Abstract: A testable, pulse-triggered static flip-flop. A pulse generator produces a data enable trigger pulse only when a test enable input is low, and a scan test enable trigger pulse only when a test enable input is high. The data enable trigger pulse controls the data input to the flip-flop, while the scan test enable trigger pulse controls the scan test input to the flip-flop. The flip-flop consists of a selection circuit comprised of two latches, each including an inverter and a transmission gate. One latch receives the data input and the other latch receives the scan test input. The data enable trigger pulse controls the transmission gate receiving the data input, and the scan test trigger pulse controls the transmission gate receiving the scan test input. The flip-flop also includes a keeper circuit consisting of a feedback inverter and a static latch.

Abstract: A testable, prechargeable circuit has a driving circuit for producing a driving circuit output signal. A timing circuit receives a clock signal and the driving circuit output signal to cause an output of the testable, prechargeable circuit to be in a low state when the clock signal is low. The timing circuit also causes the output of the circuit to be timed with a state change in the clock signal to provide a domino logic output signal. Either a data signal or a test signal are multiplexed to the input of the driving circuit to produce respectively the domino logic output signal or a test output signal. A static logic circuit receives the test output signal to produce a test signal output.

Abstract: A method for synthesizing a domino logic circuit design (18) from a source circuit definition (14) using a static logic circuit synthesis tool (12) includes generating a preliminary domino logic circuit (26) design using the circuit synthesis tool (12) and optimizing an attribute of the preliminary domino logic circuit design by substituting a static cell design for a domino cell design having a same function in the preliminary domino logic circuit design (30).

Abstract: There is disclosed a circuit for determining the number of Logic 1 bits in a group of N data bits.

Abstract: There is disclosed a circuit for determining if an N-bit number is equal to a power of two. The circuit comprises: 1) a first stage of detection gates, each of the first stage detection gates capable of receiving a first data bit and a second data bit from the N-bit number and generating a first output bit and a second output bit, wherein the first and second output bits are 01 if the first and second data bits are different and are one of 00 and 11 if the first and second data bits are the same; and 2) a second stage of detection gates coupled to the outputs of the first stage of detection gates, each of the second stage detection gates receiving three of the first stage output bits and generating a first output bit and a second output bit, wherein the first and second output bits of the second stage detection gates are 01 if only one of the three first stage output bits is equal to Logic 1 and are one of 00 and 11 otherwise.

Abstract: A computing system includes a plurality of full adders that each receives a bit-wise inversion of a bit of a first data, a bit of a second data, and a bit of a third data, respectively, and provides a sum output and a carry output. An exclusive-OR logic module receives the sum output of a first of the plurality of full adders and a carry output of a second of the plurality of full adders and provides an exclusive-OR output. An AND logic module has a plurality of inputs and an AND output, wherein the exclusive-OR output is electrically connected to one of the plurality of inputs of the AND logic module, and the AND output provides a signal that indicates whether the first data equals the sum of the second data and third data.

Abstract: There is disclosed a circuit for determining if an N-bit number is equal to a power of two. The circuit comprises: 1) a first stage of detection gates, each of the first stage detection gates capable of receiving a first data bit and a second data bit from the N-bit number and generating a first output bit and a second output bit, wherein the first and second output bits are 01 if the first and second data bits are different and are one of 00 and 11 if the first and second data bits are the same; and 2) a second stage of detection gates coupled to the outputs of the first stage of detection gates, each of the second stage detection gates receiving three of the first stage output bits and generating a first output bit and a second output bit, wherein the first and second output bits of the second stage detection gates are 01 if only one of the three first stage output bits is equal to Logic 1 and are one of 00 and 11 otherwise.

Abstract: There is disclosed a circuit for determining the number of Logic 1 bits in a group of N data bits.

Abstract: An apparatus for performing signed and unsigned multiplication is presented comprising a computation cell to generate a plurality of product terms, a compressor, coupled to the computation cell, and a selector coupled to each of the computation cell and the compressor. As disclosed, the selector selects and passes either a standard partial product term or an inverse thereof to the compressor, based on whether signed or unsigned multiplication is being performed, respectively, while the compressor compresses the received partial product terms into a pair of partial product terms.

Abstract: An improved method and apparatus for saturation detection in floating point to integer conversions is described. A floating point number is tested for saturation conditions based on an integer field size. From testing the saturation conditions on the floating point number, the present invention predicts whether a floating point number can be converted into an integer value having the given integer field size, or whether the integer field would be saturated. In one embodiment, the saturation conditions are tested on the floating point number in parallel with a floating point to integer conversion.

Abstract: An improved floating point unit (FPU), equipped to perform floating point to integer conversion and integer addition in addition to floating point addition, is described. In one embodiment, the FPU includes a shifter, a bypass datapath, and a bypass multiplexer. The shifter receives an operand input and a control input, and shifts the operand input in accordance with the control input. The bypass datapath bypasses the operand input around the shifter. The bypass multiplexer is coupled to the shifter and the bypass datapath. The bypass multiplexer selects the bypass datapath to enable an integer addition if the operand is an integer operand, and selects the shifter to enable a floating point addition or floating point to integer conversion if the operand is a floating point operand. In an alternate embodiment, the FPU includes an alignment unit, an arithmetic logic unit (ALU), a bypass datapath, and a bypass multiplexer. The alignment unit receives a first input and a second input, and aligns them.

Abstract: An improved floating point unit is disclosed. The floating point unit includes a combined adder-shifter that operates to shift a mantissa portion of at least one floating point operand to align the floating point operand with another floating point operand. The combined adder-shifter includes an adder portion that operates to generate a number of sum bits for exponent difference between the two floating point operands. The adder portion favors generation time performance of lower order ones of the sum bits over generation time performance of higher order ones of the sum bits. The combined adder-shifter also includes a shifter portion that operates to shift the mantissa portion of the at least one floating point operand in accordance with the sum bits.

Abstract: A parallel adder is disclosed. The parallel adder includes a number of computational cells that operate to generate odd sum bits based on generate and propagate terms recursively computed and a plurality of carry-in bits. The parallel adder further includes a number of selection cells that are independent of the computational cells and operate to select and output even sum bits from a number of candidate sum bits, the selection being made in accordance with predetermined ones of said recursively computed generate and propagate terms.