Patents by Inventor Remco Schoenmakers
Remco Schoenmakers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20200111219Abstract: Object tracking using image segmentation is disclosed. A captured image of a specimen is obtained. A segmented image is generated based on the captured image. The segmented image indicates segments corresponding to objects of interest. One or more target objects are identified from the objects of interest in the segmented image. Objects of interest most similar, in position and/or shape, to target objects shown in a previous image may be identified. Alternatively, objects of interest that are associated with connecting vectors most similar to the connecting vectors that connect the target objects in a previous image may be identified. A movement vector is drawn from a target object position in the previous image to a target object position in the segmented image. A field of view of the microscope is moved, with respect to the specimen, according to the movement vector to capture another image of the specimen.Type: ApplicationFiled: September 30, 2019Publication date: April 9, 2020Applicant: FEI CompanyInventors: Pavel Potocek, Emine Korkmaz, Remco Schoenmakers
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Patent number: 10593068Abstract: Methods of investigating a specimen using tomographic imaging include directing a beam of radiation through a specimen and onto a detector, thereby generating an image of the specimen. The directing is repeated for different specimen orientations relative to the beam, thereby generating a corresponding set of images. An iterative mathematical reconstruction technique is used to convert the images into a tomogram. The reconstruction is mathematically constrained to curtail a solution space using three-dimensional SEM imagery of at least a part of the specimen that overlaps the tomogram by requiring iterative results of the reconstruction to be consistent with pixel values derived from the SEM imagery.Type: GrantFiled: August 28, 2017Date of Patent: March 17, 2020Assignee: FEI CompanyInventors: Remco Schoenmakers, Pavel Poto{hacek over (c)}ek
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Patent number: 10481378Abstract: Systems and methods for controlling an imaging device are disclosed. In one aspect, a method determines a set of control parameters for the imaging device, and acquires an image based on the set of control parameters. The method determines a plurality of image quality measurements of the first image. A polygon may be displayed on an electronic display based on a plurality of image quality measurements. For example, positions of polygon vertices may be determined relative to an origin point based on corresponding image quality measurements. In some aspects, input may be received from a user interface indicating a change in position of one or more of the vertices and the corresponding image quality measurements. In some aspects, a new set of control parameters may then be determined to achieve the changed image quality measurement(s). In some aspects a composite measure of the image quality measurements may also be displayed.Type: GrantFiled: August 9, 2016Date of Patent: November 19, 2019Assignee: FEI CompanyInventors: Pavel Poto{hacek over (c)}ek, Remco Schoenmakers
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Publication number: 20190287761Abstract: The present invention relates to a method of training a network for reconstructing and/or segmenting microscopic images comprising the step of training the network in the cloud. Further, for training the network in the cloud training data comprising microscopic images can be uploaded into the cloud and a network is trained by the microscopic images. Moreover, for training the network the network can be benchmarked after the reconstructing and/or segmenting of the microscopic images. Wherein for benchmarking the network the quality of the image(s) having undergone the reconstructing and/or segmenting by the network can be compared with the quality of the image(s) having undergone reconstructing and/or segmenting by already known algorithm and/or a second network.Type: ApplicationFiled: December 14, 2018Publication date: September 19, 2019Inventors: Remco SCHOENMAKERS, Maurice PEEMAN, Faysal BOUGHORBEL, Pavel POTOCEK
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Patent number: 9934936Abstract: A Charged Particle Microscope includes A specimen holder, for holding a specimen; A source, for producing a beam of charged particles; An illuminator, for directing said beam so as to irradiate the specimen; and A detector, for detecting a flux of radiation emanating from the specimen in response to said irradiation. The illuminator includes: An aperture plate comprising an aperture region in a path of said beam, for defining a geometry of the beam prior to its impingement upon said specimen. The aperture region includes a distribution of multiple holes, each of which is smaller than a diameter of the beam incident on the aperture plate.Type: GrantFiled: October 15, 2015Date of Patent: April 3, 2018Assignee: FEI CompanyInventors: Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Remco Schoenmakers, Peter Christiaan Tiemeijer
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Publication number: 20180082444Abstract: Methods of investigating a specimen using tomographic imaging include the following steps. A specimen is provided on a specimen holder and a beam of radiation is directed through the specimen and onto a detector, thereby generating an image of the specimen. The directing is repeated for a set of different specimen orientations relative to the beam, thereby generating a corresponding set of images. An iterative mathematical reconstruction technique is used to convert the set of images into a tomogram of at least a portion of the specimen. The reconstruction is mathematically constrained so as to curtail a solution space resulting therefrom. In addition, three-dimensional SEM imagery of at least a part of the specimen that overlaps at least partially with the portion is obtained.Type: ApplicationFiled: August 28, 2017Publication date: March 22, 2018Applicant: FEI CompanyInventors: Remco Schoenmakers, Pavel Potocek
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Publication number: 20170131536Abstract: Systems and methods for controlling an imaging device are disclosed. In one aspect, a method determines a set of control parameters for the imaging device, and acquires an image based on the set of control parameters. The method determines a plurality of image quality measurements of the first image. A polygon may be displayed on an electronic display based on a plurality of image quality measurements. For example, positions of polygon vertices may be determined relative to an origin point based on corresponding image quality measurements. In some aspects, input may be received from a user interface indicating a change in position of one or more of the vertices and the corresponding image quality measurements. In some aspects, a new set of control parameters may then be determined to achieve the changed image quality measurement(s). In some aspects a composite measure of the image quality measurements may also be displayed.Type: ApplicationFiled: August 9, 2016Publication date: May 11, 2017Inventors: Pavel Potocek, Remco Schoenmakers
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Patent number: 9618460Abstract: The invention relates to a method of performing tomographic imaging involving repeatedly directing a charged particle beam through a sample for a series of sample tilts to acquire a corresponding set of images and mathematically combining the images to construct a composite image. The latter of which consists of, at each of a second series of sample tilts, using a spectral detector to accrue a spectral map of said sample, thus acquiring a collection of spectral maps; analyzing said spectral maps to derive compositional data of the sample; and employing said compositional data in constructing said composite image.Type: GrantFiled: September 9, 2013Date of Patent: April 11, 2017Assignee: FEI CompanyInventors: Remco Schoenmakers, David Foord
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Publication number: 20160253297Abstract: Methods and systems for management of processing step versions within a processing chain are disclosed. In one aspect, a method of processing data in a computing circuit includes displaying first and second version indicators corresponding to first and second versions of a first process on an electronic display, wherein the first and second versions of the first process are configured to receive the data as input, receiving input selecting the first or second version; and processing the data based on the selected version of the process.Type: ApplicationFiled: January 28, 2016Publication date: September 1, 2016Inventor: Remco Schoenmakers
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Publication number: 20160111247Abstract: A Charged Particle Microscope, comprising: includes A specimen holder, for holding a specimen; A source, for producing a beam of charged particles; An illuminator, for directing said beam so as to irradiate the specimen; and A detector, for detecting a flux of radiation emanating from the specimen in response to said irradiation. The illuminator includes: An aperture plate comprising an aperture region in a path of said beam, for defining a geometry of the beam prior to its impingement upon said specimen. The aperture region includes a distribution of multiple holes, each of which is smaller than a diameter of the beam incident on the aperture plate.Type: ApplicationFiled: October 15, 2015Publication date: April 21, 2016Applicant: FEI CompanyInventors: Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Remco Schoenmakers, Peter Christiaan Tiemeijer
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Patent number: 9147551Abstract: The invention relates to an improved method of electron tomography. Electron tomography is a time consuming process, as a large number of images, typically between 50-100 images, must be acquired to form one tomogram. The invention teaches a method to shorten the time needed to acquire this amount images much more quickly by tilting the sample continuously, instead of step-by-step. Hereby the time needed to reduce vibrations between steps is eliminated.Type: GrantFiled: June 7, 2014Date of Patent: September 29, 2015Assignee: FEI CompanyInventors: Uwe Luecken, Remco Schoenmakers, Johannes Antonius Maria van den Oetelaar
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Publication number: 20150069231Abstract: The invention relates to an improved method of electron tomography. Electron tomography is a time consuming process, as a large number of images, typically between 50-100 images, must be acquired to form one tomogram. The invention teaches a method to shorten the time needed to acquire this amount images much more quickly by tilting the sample continuously, instead of step-by-step. Hereby the time needed to reduce vibrations between steps is eliminated.Type: ApplicationFiled: June 7, 2014Publication date: March 12, 2015Applicant: FEI CompanyInventors: Uwe Luecken, Remco Schoenmakers, Johannes Antonius Maria van den Oetelaar
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Patent number: 8912491Abstract: The invention relates to a method of performing tomographic imaging of a sample comprising providing a beam of charged particles; providing the sample on a sample holder that can be tilted; in an imaging step, directing the beam through the sample to image the sample; repeating this procedure at each of a series of sample tilts to acquire a set of images; in a reconstruction step, mathematically processing images from said set to construct a composite image, whereby in said imaging step, for a given sample tilt, a sequence of component images is captured at a corresponding sequence of focus settings; and in said reconstruction step, for at least one member of said series of sample tilts, multiple members of said sequence of component images are used in said mathematical image processing. This renders a 3D imaging cube rather than a 2D imaging sheet at a given sample tilt.Type: GrantFiled: November 26, 2013Date of Patent: December 16, 2014Assignee: FEI CompanyInventors: Remco Schoenmakers, Uwe Luecken, Erik Michiel Franken
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Publication number: 20140145077Abstract: The invention relates to a method of performing tomographic imaging of a sample comprising providing a beam of charged particles; providing the sample on a sample holder that can be tilted; in an imaging step, directing the beam through the sample to image the sample; repeating this procedure at each of a series of sample tilts to acquire a set of images; in a reconstruction step, mathematically processing images from said set to construct a composite image, whereby in said imaging step, for a given sample tilt, a sequence of component images is captured at a corresponding sequence of focus settings; and in said reconstruction step, for at least one member of said series of sample tilts, multiple members of said sequence of component images are used in said mathematical image processing. This renders a 3D imaging cube rather than a 2D imaging sheet at a given sample tilt.Type: ApplicationFiled: November 26, 2013Publication date: May 29, 2014Applicant: FEI CompanyInventors: Remco Schoenmakers, Uwe Luecken, Erik Michiel Franken
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Publication number: 20140070095Abstract: The invention relates to a method of performing tomographic imaging involving repeatedly directing a charged particle beam through a sample for a series of sample tilts to acquire a corresponding set of images and mathematically combining the images to construct a composite image. The latter of which consists of, at each of a second series of sample tilts, using a spectral detector to accrue a spectral map of said sample, thus acquiring a collection of spectral maps; analyzing said spectral maps to derive compositional data of the sample; and employing said compositional data in constructing said composite image.Type: ApplicationFiled: September 9, 2013Publication date: March 13, 2014Applicant: FEI CompanyInventors: Remco Schoenmakers, David Foord
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Patent number: 8338782Abstract: In a transmission electron microscope detector system, image data is read out from the pixels and analyzed during an image acquisition period. The image acquisition process is modified depending on the results of the analysis. For example, the analyses may indicate the inclusion in the data of an image artifact, such as charging or bubbling, and data including the artifact may be eliminated form the final image. CMOS detectors provide for selective read out of pixels at high data rates, allowing for real-time adaptive imaging.Type: GrantFiled: August 24, 2011Date of Patent: December 25, 2012Assignee: FBI CompanyInventors: Uwe Luecken, Remco Schoenmakers, Frank Jeroen Pieter Schuurmans
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Publication number: 20120049061Abstract: In a transmission electron microscope detector system, image data is read out from the pixels and analyzed during an image acquisition period. The image acquisition process is modified depending on the results of the analysis. For example, the analyses may indicate the inclusion in the data of an image artifact, such as charging or bubbling, and data including the artifact may be eliminated form the final image. CMOS detectors provide for selective read out of pixels at high data rates, allowing for real-time adaptive imaging.Type: ApplicationFiled: August 24, 2011Publication date: March 1, 2012Applicant: FEI CompanyInventors: Uwe Luecken, Remco Schoenmakers, Frank Jeroen Pieter Schuurmans