Abstract: The present invention relates in general to a method, apparatus, and article of manufacture for providing high-speed digital communications through a communications channel. In one aspect, the present invention employs a variable rate back channel, incorporated within an existing communication that does not increase or adversely impact the transmission rate of data on the communication channel.

Abstract: In one aspect, the present invention is a technique of, and a system and sensor for measuring, inspecting, characterizing and/or evaluating the performance of high-speed data communication systems, and components used therein. In one embodiment, the present invention measures, inspects, characterizes and/or evaluates the performance, for example the ER, of such systems and/or components in situ—that is, in the environment and/or in the configuration in which the system and/or components are used during normal or typical operation (for example, when the system and/or component is transmitting and receiving user data). In this way, a more accurate representation of the performance of the system (and components thereof) may be measured, detected, determined and/or obtained.

Abstract: In one aspect, the present invention is a technique of, and a system and sensor for measuring, inspecting, characterizing and/or evaluating the performance of high-speed data communication systems, and components used therein. In one embodiment, the present invention measures, inspects, characterizes and/or evaluates the performance, for example the ER, of such systems and/or components in situ—that is, in the environment and/or in the configuration in which the system and/or components are used during normal or typical operation (for example, when the system and/or component is transmitting and receiving user data). In this way, a more accurate representation of the performance of the system (and components thereof) may be measured, detected, determined and/or obtained.

Abstract: In one aspect, the present invention is a technique of, and a system and sensor for measuring, inspecting, characterizing and/or evaluating the performance of high-speed data communication systems, and components used therein. In one embodiment, the present invention measures, inspects, characterizes and/or evaluates the performance, for example the ER, of such systems and/or components in situ—that is, in the environment and/or in the configuration in which the system and/or components are used during normal or typical operation (for example, when the system and/or component is transmitting and receiving user data). In this way, a more accurate representation of the performance of the system (and components thereof) may be measured, detected, determined and/or obtained.

Abstract: The present invention relates in general to a method, apparatus, and article of manufacture for providing high-speed digital communications through a communications channel. In one aspect, the present invention employs a variable rate back channel, incorporated within an existing communication that does not increase or adversely impact the transmission rate of data on the communication channel.

Abstract: The present invention relates in general to a method, apparatus, and article of manufacture for providing high-speed digital communications through a communications channel. In one aspect, the present invention employs a variable rate back channel, incorporated within an existing communication that does not increase or adversely impact the transmission rate of data on the communication channel.

Abstract: A high voltage CMOS switch circuit having an arrangement of device connections such that the individual transistor devices are substantially the same size, improving performance while reducing size and providing breakdown protection. The circuit switches a high voltage to the output based on a low voltage input. The circuit is ratio-less and self-biased, capable of operating a very low supply voltage compared to the state of the art.

Abstract: An embodiment of a pumped substrate system includes an oscillator, capacitive pump, comparing circuit, and a level shifter. The level shifter is coupled between the substrate and the positive input lead of the comparator and shifts the voltage level present on the substrate by a voltage Vbg. The comparator compares ground potential to the shifted substrate voltage. The oscillator, capacitive pump and comparing circuit form a negative feedback loop which operates to maintain the substrate voltage substantially equal to -Vbg. In one embodiment, the level shifter includes a band gap reference.

Abstract: An alpha radiation immune integrated circuit memory cell has a pair of secondary transistors connected to cross-couple the primary transistors to form a flow, secondary storage node. The secondary transistors are biased to a standby current that, in combination with the parasitic capacitances in the new cell, establishes a time constant sufficient to maintain the state of the secondary nodes during an alpha hit on the primary nodes, so that alpha immunity is achieved without added capacitance. A write boost circuit increases the current in the secondary transistors during a write operation. A memory array is formed of rows of such cells with all of the secondary emitters of each row coupled to a common emitter standby current source.