Patents by Inventor Robert Ewald
Robert Ewald has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8012000Abstract: A method and apparatus for extending a polishing article lifetime on a polishing tool with multiple platens is described. The apparatus includes an advanceable roll to roll platen with multiple embodiments of a polishing article to be used thereon. The polishing article is adapted to perform a polishing process by removing conductive and dielectric material from a substrate while minimizing downtime of the polishing tool. In some embodiments, the polishing article may be a dielectric material or a conductive material and is configured to include a longer usable lifetime to minimize replacement and downtime of the tool.Type: GrantFiled: April 2, 2007Date of Patent: September 6, 2011Assignee: Applied Materials, Inc.Inventors: Yuchun Wang, Robert A. Ewald, Wei-Yung Hsu, Liang-Yuh Chen
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Publication number: 20090264053Abstract: Methods and apparatus are provided for housing a polishing tape adapted to polish a substrate. The invention includes a cassette comprising a body portion; and a head portion, wherein the head portion includes: a pair of guide walls; one or more supply rollers positioned between the guide walls in the head portion; and wherein the guide walls are adapted to guide a polishing tape housed in the body over the one or more supply rollers. Numerous other aspects are provided.Type: ApplicationFiled: April 21, 2009Publication date: October 22, 2009Applicant: APPLIED MATERIALS, INC.Inventors: Antoine P. Manens, Gary C. Ettinger, Paul D. Butterfield, Shou-Sung Chang, Ricardo Martinez, Eashwer Kollata, Robert A. Ewald, Kuldip Sumbria
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Publication number: 20080242202Abstract: A method and apparatus for extending a polishing article lifetime on a polishing tool with multiple platens is described. The apparatus includes an advanceable roll to roll platen with multiple embodiments of a polishing article to be used thereon. The polishing article is adapted to perform a polishing process by removing conductive and dielectric material from a substrate while minimizing downtime of the polishing tool. In some embodiments, the polishing article may be a dielectric material or a conductive material and is configured to include a longer usable lifetime to minimize replacement and downtime of the tool.Type: ApplicationFiled: April 2, 2007Publication date: October 2, 2008Inventors: Yuchun Wang, Robert A. Ewald, Wei-Yung Hsu, Liang-Yuh Chen
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Publication number: 20080108288Abstract: Embodiments of a polishing article for processing a substrate are provided. In one embodiment, a polishing article for processing a substrate comprises a fabric layer having a conductive layer disposed thereover. The conductive layer has an exposed surface adapted to polish a substrate. The fabric layer may be woven or non-woven. The conductive layer may be comprised of a soft material and, in one embodiment, the exposed surface may be planar.Type: ApplicationFiled: November 5, 2007Publication date: May 8, 2008Inventors: Yongqi Hu, Yan Wang, Alain Duboust, Stan Tsai, Feng Liu, Liang-Yuh Chen, Robert Ewald
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Patent number: 7344432Abstract: An article of manufacture and apparatus are provided for processing a substrate surface. In one aspect, an article of manufacture is provided for polishing a substrate including polishing article comprising a body having at least a partially conductive polishing surface. An electrode is disposed below the polishing surface having a dielectric material therebetween. A plurality of apertures may be formed in the polishing surface and the dielectric material to at least partially expose the electrode to the polishing surface. A membrane may be disposed between the electrode and the polishing surface that is permeable to ions and current to promote continuity between the electrode and the polishing surface.Type: GrantFiled: October 31, 2006Date of Patent: March 18, 2008Assignee: Applied Materials, Inc.Inventors: Liang-Yun Chen, Yuchun Wang, Yan Wang, Alain Duboust, Daniel A. Carl, Ralph Wadensweiler, Manoocher Birang, Paul D. Butterfield, Rashid A. Mavliev, Stan D. Tsai, You Wang, Jie Diao, Renhe Jia, Lakshmanan Karuppiah, Robert Ewald
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Publication number: 20070218587Abstract: Embodiments of the invention generally provide a conductive processing pad and a method for fabricating the same. In one embodiment the conductive processing pad includes a grid of conductive material disposed in a polymer layer. A plurality of perforations is formed through the polymer in the open area defined by the grid such that the side walls of the perforations do not expose the conductive grid. In another embodiment, a method for forming a conductive pad is provided. In one embodiment, the method includes the steps of pressing a conductive grid into a polymer sheet at a temperature greater than the polymer's last transition temperature but lower than the melting point of the material comprising the conductive grid and perforating the polymer sheet through the open area defined by the grid without exposing the conductive grid.Type: ApplicationFiled: March 7, 2007Publication date: September 20, 2007Inventors: Yuchun Wang, Yuan A. Tian, Yongqi Hu, Rashid A. Mavliev, Robert A. Ewald
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Publication number: 20070144915Abstract: Compositions and methods for processing a substrate having a conductive material layer disposed thereon are provided. In one embodiment, a method of electrochemically processing a substrate using a conductive polishing article is provided. The method includes disposing a substrate having a conductive material layer formed thereon in a process apparatus comprising a cathode coupled to the conductive polishing article and an anode, wherein the substrate is in electrical contact with the anode, supplying a polishing composition comprising a cathodic inhibitor and an anodic inhibitor, forming a protective film on the cathode to prevent corrosion of the cathode, and polishing the substrate.Type: ApplicationFiled: December 20, 2006Publication date: June 28, 2007Inventors: Yuan Tian, Renhe Jia, Feng Liu, Yongqi Hu, Stan Tsai, Liang-Yuh Chen, Robert Ewald
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Publication number: 20070099552Abstract: An article of manufacture and apparatus are provided for processing a substrate surface. In one aspect, an article of manufacture is provided for polishing a substrate including polishing article comprising a body having at least a partially conductive polishing surface. An electrode is disposed below the polishing surface having a dielectric material therebetween. A plurality of apertures may be formed in the polishing surface and the dielectric material to at least partially expose the electrode to the polishing surface. A membrane may be disposed between the electrode and the polishing surface that is permeable to ions and current to promote continuity between the electrode and the polishing surface.Type: ApplicationFiled: October 31, 2006Publication date: May 3, 2007Inventors: Liang-Yuh Chen, Yuchun Wang, Yan Wang, Alain Duboust, Daniel Carl, Ralph Wadensweiler, Manoocher Birang, Paul Butterfield, Rashid Mavliev, Stan Tsai, You Wang, Jie Diao, Renhe Jia, Lakshmanan Karuppiah, Robert Ewald
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Publication number: 20060276111Abstract: Embodiments of a conditioning element for conditioning a processing pad are provided herein. In one embodiment, a conditioning element for conditioning a processing pad includes a body having a face. A plurality of diamond particles are disposed on the face and define a conditioning surface. The diamond particles are of a type selected from the group consisting of very blocky (4D), blocky (3D), and irregular (2D), and have a shape ratio less than or equal to 1.2. In one embodiment, the diamond particles have an average size of between about 85 and about 115 ?m. In one embodiment, the size of the diamond particles may have a standard of deviation that is less than about 5 ?m. In one embodiment, the diamond particles may have a spacing of greater than 400 ?m.Type: ApplicationFiled: June 2, 2005Publication date: December 7, 2006Inventors: Yuan Tian, Alpay Yilmaz, Gerald Alonzo, Martin Wohlert, Yongqi Hu, Stan Tsai, Robert Ewald, Shou-Sung Chang
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Publication number: 20060249395Abstract: Compositions and methods for processing a substrate having a conductive material layer disposed thereon are provided. In one embodiment, a composition for processing a substrate having a conductive material layer disposed thereon is provided which composition includes an acid based electrolyte, a chelating agent, a corrosion inhibitor, a passivating polymeric material, a pH adjusting agent, a leveler a solvent, and a pH between about 3 and about 10. The composition is used in a method to form a passivation layer on the conductive material layer, abrading the passivation layer to expose a portion of the conductive material layer, applying a bias to the substrate, and removing the conductive material layer.Type: ApplicationFiled: March 27, 2006Publication date: November 9, 2006Inventors: You Wang, Junzi Zhao, Jie Diao, Renhe Jia, Stan Tsai, Lakshmanan Karuppiah, Robert Ewald
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Publication number: 20060169597Abstract: Polishing compositions and methods for removing conductive materials from a substrate surface are provided. In one aspect, a composition includes an acid based electrolyte system, a corrosion inhibitor having an azole group, an organic acid salt, a pH adjusting agent to provide a pH between about 2 and about 10, and a solvent, and a solvent. The composition may be used in a conductive material removal process including disposing a substrate having a conductive material layer formed thereon in a process apparatus comprising an electrode, providing the composition between the electrode and substrate, applying a bias between the electrode and the substrate, and removing conductive material from the conductive material layer. The polishing compositions and methods described herein improve the effective removal rate of materials from the substrate surface, such as copper, with a reduction in planarization type defects and yielding a desirable surface finish.Type: ApplicationFiled: February 15, 2006Publication date: August 3, 2006Inventors: Feng Liu, Tianbao Du, Alain Duboust, Wei-Yung Hsu, Robert Ewald, Yuan Tian, You Wang, Stan Tsai
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Publication number: 20060079244Abstract: A wireless device and method for providing location updates to a wireless network includes determining a current location of the wireless device, comparing the current location to a second location and transmitting a location update, including presence information, to the wireless network when the current location differs from the second location by at least a predetermined geographical distance. The predetermined geographical distance is determined in accordance with at least one of subscription information associated with the subscriber unit, including a subscription fee paid, an enabled service and a network state. The current location may be determined via GPS, wireless network based position determination or other method.Type: ApplicationFiled: September 9, 2005Publication date: April 13, 2006Inventors: Jeffrey Posner, Robert Ewald
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Publication number: 20040020789Abstract: Embodiments of a polishing article for processing a substrate are provided. In one embodiment, a polishing article for processing a substrate comprises a fabric layer having a conductive layer disposed thereover. The conductive layer has an exposed surface adapted to polish a substrate. The fabric layer may be woven or non-woven. The conductive layer may be comprised of a soft material and, in one embodiment, the exposed surface may be planar.Type: ApplicationFiled: June 6, 2003Publication date: February 5, 2004Applicant: Applied Materials, Inc.Inventors: Yongqi Hu, Yan Wang, Alain Duboust, Stan D. Tsai, Feng Q. Liu, Liang-Yuh Chen, Robert A. Ewald
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Patent number: 6143080Abstract: A wafer processing system for delivering a processing gas and an inert gas to a chamber which includes a CVD processing region having a plurality of gas flow paths for conveying the gases to the chamber and exhausting them from the chamber. A flow control system is coupled to each of the exhaust gas flow paths and each of the process gas exhaust flow paths are separately controlled to maintain a constant rate of flow within each of the gas flow paths, independent of the accumulation of deposition byproducts. Utilization of a self-cleaning orifice allows a pressure differential measurement in a process exhaust line to measure flow. The wafer processing system is provided with load and unload regions surrounding the chamber(s), each having additional inert gas exhaust flow paths.Type: GrantFiled: January 28, 2000Date of Patent: November 7, 2000Assignee: Silicon Valley Group Thermal Systems LLCInventors: Lawrence D. Bartholomew, Robert J. Bailey, Robert A. Ewald, John T. Boland