Patents by Inventor Robert K. Lowry

Robert K. Lowry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and means for measuring moisture content of hermetic semiconductor devices
    Patent number: 4272986
    Abstract: The moisture content of a hermetically sealed semiconductor device is a function of the dew point of the cavity atmosphere which is the temperature of maximum surface conductivity. A pattern of interdigitated thin film aluminum conductors is provided on an impurity free, non-porous silicon oxide insulative substrate. The surface conductivity of this structure rises as moisture condenses onto and between the conductors as the temperature is reduced at a slow controlled rate to the dew point temperature. The amplitude of the maximum surface conductivity is proportional to ionic impurity concentration.
    Type: Grant
    Filed: April 16, 1979
    Date of Patent: June 16, 1981
    Assignee: Harris Corporation
    Inventors: Robert K. Lowry, Larry A. Miller