Abstract: A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

Abstract: A self-addressing memory device is provided that can provide blocks of data starting from more than one initial location in the device, and may have the option of reading in either direction. This memory device can efficiently store multiple bitstreams, which may be of different sizes, that are used to configure one or more configurable logic devices. Each stored bitstream can be accessed in any order. In one embodiment, the configurable logic device is a Field Programmable Gate Array ("FPGA"). In one embodiment, the memory device is a Read-Only Memory ("ROM") that is either read up from all zeros or down from all ones. In one embodiment, the ROM includes a bidirectional chip enable chain that permits cascading multiple ROMs.

Abstract: An antifuse is described that can be formed without masks or mask steps beyond those required for a conventional CMOS process. The antifuse includes adjacent p-type and n-type diffusion regions that together form a P-N junction. The diffusion regions are tapered toward one another such that the P-N junction is located at a necked-down region of the antifuse. The diffusion regions are connected to respective terminals of a programming-voltage source via first and second metal electrical contacts, typically of aluminum metal. Each of the first and second electrical contacts includes a point directed toward the other of the first and second electrical contacts. The antifuse is programmed by providing a reverse-bias programming voltage across the electrical contacts. This programming voltage exceeds the breakdown voltage of the P-N junction so that current flows through the necked-down region of the antifuse between the points on the respective first and second electrical contacts.

Abstract: A input/output circuit (IOB) within an integrated circuit (IC) device, the output signal driving circuitry of the input/output device contains a dedicated multiplexer on the output path wherein a first and second output signal can be time multiplexed on a single output pad. The multiplexer can also be configured to perform as a high speed gate to realize AND, OR, XOR, and XNOR functions. Within an input/output circuit of a programmable integrated circuit, the system provides a dedicated multiplexer that can select between one of two output signals for sending over the single output pad of the IC device. In lieu of using a programmable memory cell as the select control for the dedicated multiplexer, the system allows a number of lines, including an output clock signal, to be the select control. By using the output clock as the select control, the data signals can be effectively time multiplexed over a single output pad and referenced by the output clock.

Abstract: A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

Abstract: A reference ring oscillator circuit (RROC) is used to determine timing characteristics of a test interconnect structure in an integrated circuit. The RROC includes an odd number of inverters coupled together in a ring manner and has defined test segments at which a test interconnect can be loaded. Reference timing characteristics of the unloaded RROC are determined according to a calibration method including the steps of: (a) directly measuring signal propagation delay through each segment of the RROC; (b) modeling each test segment using an RC tree type reference circuit model having reference elements; (c) simulating the reference circuit model to provide a functional relationship between two reference capacitors; (d) defining upper and lower bounds for propagation delay through the test segment in terms of the reference elements; (e) determining values for the reference capacitor elements; and (f) measuring a reference frequency of oscillation of the unloaded RROC.

Abstract: A self-addressing memory device is provided that can provide blocks of data starting from more than one initial location in the device, and may have the option of reading in either direction. This memory device can efficiently store multiple bitstreams, which may be of different sizes, that are used to configure one or more configurable logic devices. Each stored bitstream can be accessed in any order. In one embodiment, the configurable logic device is a Field Programmable Gate Array ("FPGA"). In one embodiment, the memory device is a Read-Only Memory ("ROM") that is either read up from all zeros or down from all ones. In one embodiment, the ROM includes a bidirectional chip enable chain that permits cascading multiple ROMs.

Abstract: A clock distribution network and mechanisms therein for an integrated circuit (IC) including an edge clock and distribution system for same. The invention includes a deskewed clock distribution network for circuits situated in columns wherein buffering is done in columns less than half of the IC length. The mechanism allows each of at least eight vertical column distribution lines to couple with any horizontal clock supply line of at least eight lines. The horizontal clock supply lines include local interconnect inputs. To increase clock source signals, special lines, Kx lines, are provided that are buffered and traverse directionally in 1/4 IC lengths from the top down, bottom up, and midsection both up and down. Kx lines can be sourced from carry signals, IOBs, interconnects, or from an edge clock and supply to clock lines, longlines, or interconnect lines. Kx lines allow vertical signal displacement, e.g., for clock signals, etc., within the chip.

Abstract: A input/output circuit (IOB) within an integrated circuit (IC) device, the output signal driving circuitry of the input/output device contains a dedicated multiplexer on the output path wherein a first and second output signal can be time multiplexed on a single output pad. The multiplexer can also be configured to perform as a high speed gate to realize AND, OR, XOR, and XNOR functions. Within an input/output circuit of a programmable integrated circuit, the system provides a dedicated multiplexer that can select between one of two output signals for sending over the single output pad of the IC device. In lieu of using a programmable memory cell as the select control for the dedicated multiplexer, the system allows a number of lines, including an output clock signal, to be the select control. By using the output clock as the select control, the data signals can be effectively time multiplexed over a single output pad and referenced by the output clock.