Abstract: An application specific integrated circuit having an embedded microprocessor and core including a memory array, self tests at full operational speed utilizing the computational power of the embedded microprocessor for deterministic testing performed by core specific test algorithms implemented in the assembly code of the embedded microprocessor.

Abstract: Hybrid CMOS circuit configurations that include both static CMOS logic and Domino CMOS logic include two registers that surround the Domino logic to allow that logic to be tested. One register receives an input test vector, loaded directly through a primary set of inputs or by a serial scan chain if the register inputs are not directly accessible. The second register latches the results of the test vector application. The register contents can either be read directly through a primary set of outputs if there is no static CMOS logic between the register outputs and a primary set of circuit outputs, or scanned out of the second register using a serial scan chain. Domino scan flip-flops, which reduce transistor count over conventional static scan flip-flops, can be used in the Domino logic as sequential elements to implement multiple logic functions.

Abstract: An integrated circuit includes a plurality of signal lines, a plurality of pull transistors connected between the signal lines respectively and an electrical potential, and an IDDQ test control for turning on the pull transistors for normal operation, and for turning off the pull transistors for IDDQ testing. The IDDQ test control includes a test signal generator for generating an IDDQ test control signal that turns off the pull transistors, and an IDDQ test signal line that is connected to the test signal generator and to the pull transistors. The pull transistors are designed within a periphery of the circuit, and the IDDQ test signal line forms a ring. The test signal generator includes an external pin, a special buffer, or a boundary scan system including a chain of boundary scan cells and a test access port controller. The test control signal can be generated by one of the boundary scan cells, or by the test access port controller.

Abstract: An integrated circuit includes a plurality of signal lines, a plurality of pull transistors connected between the signal lines respectively and an electrical potential, and an IDDQ test control for turning on the pull transistors for normal operation, and for turning off the pull transistors for IDDQ testing. The IDDQ test control includes a test signal generator for generating an IDDQ test control signal that turns off the pull transistors, and an IDDQ test signal line that is connected to the test signal generator and to the pull transistors. The pull transistors are designed within a periphery of the circuit, and the IDDQ test signal line forms a ring. The test signal generator includes an external pin, a special buffer, or a boundary scan system including a chain of boundary scan cells and a test access port controller. The test control signal can be generated by one of the boundary scan cells, or by the test access port controller.

Abstract: The present invention provides a test method of the complexity of 7n to test RAM devices, where n is the number of bits. This method tests all cell stuck-at-1/0 faults, state transition 1-to-0 and 0-to-1 faults, state coupling faults between two cells and data retention faults in random access memories. A standardized testable design memory (STD architecture) is presented which keeps the time required to test a RAM constant irrespective of the memory size. The design is shown through four examples to cover both bit and byte oriented memories. The memory address decoder is implemented in two or more levels. The decoder decoding the most significant addressed is modified by addition of an external control signal line. Memory of the RAM (memory cell array) is partitioned into blocks. The size of these blocks is defined by the last level (least significant address) of the memory address decoder. The design is highly structured and requires a very small amount of extra hardware.