Abstract: A method for controlling an artificial orthotic or prosthetic knee joint, on which a lower-leg component is arranged and with which a resistance device is associated, the bending resistance (R) of which resistance device is changed in dependence on sensor data that are determined by at least one sensor during the use of the orthotic or prosthetic knee joint, wherein a linear acceleration (aF) of the lower-leg component is determined, the determined linear acceleration (aF) is compared with at least one threshold value, and, if a threshold value of the linear acceleration (aF) of the lower-leg component is reached, the bending resistance (R) is changed.

Abstract: An adjustable mechanical holder for finely adjusting a position of an element attachable or attached to the mechanical holder includes a stationary fastening region configured to fasten the mechanical holder to a holding structure and a holding region configured as a mounting for the element. At least a first parallelogram linkage is disposed between the holding region and the fastening region. The first parallelogram linkage connects the holding region movably to the fastening region. The mechanical holder further includes a first movable actuator, by which the holding region is movable by the first parallelogram linkage along a first spatial direction.

Abstract: A microscopy arrangement includes a holding apparatus having an instrument platform, a holding element which is rigidly connected thereto and to a microscope and a support element configured to support the instrument platform on a main platform at a distance therefrom. In a vertical projection, the holding apparatus at least does not completely overlap with the microscope supported by the holding element. The support element has a changeable height such that the instrument platform is positionable at a changeable vertical distance from the main platform and/or a height-changeable microscope stage places an object plane that is defined by the microscope stage at a changeable vertical distance such that a vertical extent of an object region is changeable. The laser beams remain in a fixed relationship with one another in time and/or space, even in the case of a change in the vertical extent of the object region.

Abstract: A detector device is designed to capture light and to generate electrical signals. The detector device includes a housing and a detector disposed in the housing so as to be moveable at least partially in the housing and with respect to the housing. The detector device is useable in a detection system and/or in a microscope.

Abstract: An adjustable mechanical holder for finely adjusting a position of an element attachable or attached to the mechanical holder includes a stationary fastening region configured to fasten the mechanical holder to a holding structure and a holding region configured as a mounting for the element. At least a first parallelogram linkage is disposed between the holding region and the fastening region. The first parallelogram linkage connects the holding region movably to the fastening region. The mechanical holder further includes a first movable actuator, by which the holding region is movable by the first parallelogram linkage along a first spatial direction.

Abstract: A detector device is designed to capture light and to generate electrical signals. The detector device includes a housing and a detector disposed in the housing so as to be moveable at least partially in the housing and with respect to the housing. The detector device is useable in a detection system and/or in a microscope.

Abstract: An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.

Abstract: A device and method for adjusting mounting of a microscope stage (14), to which an objective (38) is mounted, to a microscope stand (12), including at least one first connecting element (56) arranged on the microscope stand (12), at least one second connecting element (62) arranged on the microscope stage (14) for mounting the microscope stage (14) to the microscope stand (12), at least one first mating part (76) arranged on the microscope stand (12), at least one positioning base (66) supporting a second mating part (74), wherein the positioning base (66) adjusts the platform (16) on the microscope stand (12) and is mounted movably in a plane of adjustment that is parallel to the platform (16) with the mating parts (74, 76) being engaged, and at least one locking device (80) for locking the positioning base (66) to the platform (16).

Abstract: A microscope stage (14) comprising a platform (16) and a holder (42) for a microscope objective (38), which holder is mounted on the platform (16) pivotally about a bearing axis (46) and movably along the bearing axis (46) and holds the objective (38), an operating element (50) which is coupled to the holder (42) and with which the holder (42) is pivotable about the bearing axis (46) and is movable along the bearing axis (46) for its positioning in an operating position, and a locking mechanism (60) which is actuatable by the operating element (50) and with which the holder (42) positioned in the operating position can be fixed to the platform (16).

Abstract: A microscope stage (14) comprising a platform (16), a specimen holder (18) resting on the platform (16) and a positioning device (20) for moving the specimen holder (18) in a plane of displacement parallel to the platform (16) is described. The microscope stage (14) includes a positioning device (20) having two displacing devices (34, 36) which are mechanically decoupled from each other and of which a first displacing device (34) is designed to move the specimen holder (18) along a first axis in the plane of displacement, and a second displacing device (36) is designed to move the specimen holder (18) along a second axis in the plane of displacement, which second axis runs transversely to the first axis.

Abstract: An objective changer for a microscope includes a changing device configured to pendulously swing each of a plurality of objectives into a respective operating position near a focal position.

Abstract: An apparatus for adjusting a microscope stage. The microscope stage of the apparatus defines a plane on which an object to be examined can be placed. The apparatus further includes a first shaft and a second shaft rotationally coupled to the first shaft. The microscope stage is guided between the first and second shafts such that a rotational movement of at least one of the first and second shafts has a direct effect on the microscope stage.

Abstract: The invention relates to a system for building automation, made up of a portable or handheld apparatus for situation-related information configuration and of at least one stationary unit, in which system the apparatus comprises a proximity sensor, a communication unit for wireless communication with at least one of the stationary units, an evaluation and control unit having at least one processor or logic unit and a memory, an information output unit, and an energy reservoir, the system being designed to create a wireless communication connection between the apparatus and at least one of the stationary units via the communication unit as a consequence of an approach by the apparatus, as ascertained by the proximity sensor, to at least one stationary unit, and to display a state of the at least one stationary unit via the information output unit.

Abstract: The aim of the invention is an optical device for a scanning microscope, said device enabling the focusing of a light beam largely independent of wavelengths; and thus high-resolution microscopy, in particular STED microscopy, in a wider wavelength spectrum is facilitated. At least two phase filters lie on a support. Advantageously, the support is a filter wheel or a filter slider which can be introduced into the beam path of the light beam, said beam path preferably being the beam path of the stimulating light beam in an STED microscope. Several phase filters preferablylie on the support in the shape of a matrix. The support is designed as a glass substrate on which each phase filter is applied. To achieve said aim, another position is additionally found on the support for adjustment purposes, wherein the wavefront of the light is not influenced when it passes through said position, that is, the position is an empty position on which no phase filter is found.

Abstract: A microscope stage (14) comprising a platform (16), a specimen holder (18) resting on the platform (16) and a positioning device (20) for moving the specimen holder (18) in a plane of displacement parallel to the platform (16) is described. The microscope stage (14) includes a positioning device (20) having two displacing devices (34, 36) which are mechanically decoupled from each other and of which a first displacing device (34) is designed to move the specimen holder (18) along a first axis in the plane of displacement, and a second displacing device (36) is designed to move the specimen holder (18) along a second axis in the plane of displacement, which second axis runs transversely to the first axis.

Abstract: A device and method for adjusting mounting of a microscope stage (14), to which an objective (38) is mounted, to a microscope stand (12), including at least one first connecting element (56) arranged on the microscope stand (12), at least one second connecting element (62) arranged on the microscope stage (14) for mounting the microscope stage (14) to the microscope stand (12), at least one first mating part (76) arranged on the microscope stand (12), at least one positioning base (66) supporting a second mating part (74), wherein the positioning base (66) adjusts the platform (16) on the microscope stand (12) and is mounted movably in a plane of adjustment that is parallel to the platform (16) with the mating parts (74, 76) being engaged, and at least one locking device (80) for locking the positioning base (66) to the platform (16).

Abstract: A microscope stage (14) comprising a platform (16) and a holder (42) for a microscope objective (38), which holder is mounted on the platform (16) pivotally about a bearing axis (46) and movably along the bearing axis (46) and holds the objective (38), an operating element (50) which is coupled to the holder (42) and with which the holder (42) is pivotable about the bearing axis (46) and is movable along the bearing axis (46) for its positioning in an operating position, and a locking mechanism (60) which is actuatable by the operating element (50) and with which the holder (42) positioned in the operating position can be fixed to the platform (16).

Abstract: An objective changer for a microscope includes a changing device configured to pendulously swing each of a plurality of objectives into a respective operating position near a focal position.

Abstract: Various embodiments include a latch having a node to receive input information, and a first pseudo-inverter with a first input node, a second input node, and an output node to generate output information based on information at the first and second input nodes. The latch may have a feedback circuit to generate feedback information based on at least the output information. The latch may also have a select circuit to selectively transfer the input information and the feedback information to the first and second input nodes. Other embodiments including additional apparatus, systems, and methods are disclosed.

Abstract: An apparatus for adjusting a microscope stage. The microscope stage of the apparatus defines a plane on which an object to be examined can be placed. The apparatus further includes a first shaft and a second shaft rotationally coupled to the first shaft. The microscope stage is guided between the first and second shafts such that a rotational movement of at least one of the first and second shafts has a direct effect on the microscope stage.