Patents by Inventor Ronald Kakoschke

Ronald Kakoschke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120068149
    Abstract: In one or more embodiments, a semiconductor device a FinFET device and a second device. In one or more embodiments, the semiconductor device has a contact element coupled between a surface of the fin and the second device.
    Type: Application
    Filed: November 16, 2011
    Publication date: March 22, 2012
    Inventors: Ronald Kakoschke, Klaus Schruefer
  • Patent number: 8105874
    Abstract: A memory circuit arrangement and fabrication method thereof are presented in which the parts of the memory circuit arrangement are situated on two different substrates. An integrated memory cell array is situated on one substrate. An integrated control circuit that controls access to the memory cells is situated on the other (logic circuit) substrate. The control circuit controls sequences when reading, writing or erasing content of a memory cell. The logic circuit substrate also contains a CPU and encryption coprocessor. The memory circuit contains a sense amplifier, with the aid of which the memory state of a memory cell can be determined, and a decoding circuit that selects a word or bit line.
    Type: Grant
    Filed: October 27, 2008
    Date of Patent: January 31, 2012
    Assignee: Infineon Technologies AG
    Inventors: Wolfgang Gruber, Ronald Kakoschke, Thomas Schweizer, Dominik Wegertseder
  • Patent number: 8067808
    Abstract: A memory cell includes a FinFET select device and a memory element. In some embodiments a memory cell has a contact element coupled between a surface of the fin and the memory element.
    Type: Grant
    Filed: May 21, 2010
    Date of Patent: November 29, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Klaus Schruefer
  • Patent number: 8039904
    Abstract: A memory cell includes a FinFET select device and a memory element. In some embodiments a memory cell has a contact element coupled between a surface of the fin and the memory element.
    Type: Grant
    Filed: May 21, 2010
    Date of Patent: October 18, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Klaus Schruefer
  • Publication number: 20110233642
    Abstract: One or more embodiments relate to a memory device, comprising: a substrate; a gate stack disposed over the substrate, the gate stack comprising a control gate disposed over a charge storage layer; and a spacer select gate disposed over the substrate and laterally disposed from the gate stack, the select gate comprising a carbon allotrope.
    Type: Application
    Filed: June 9, 2011
    Publication date: September 29, 2011
    Inventors: Ronald KAKOSCHKE, Harald SEIDL
  • Publication number: 20110207282
    Abstract: A method for producing a tunnel field-effect transistor is disclosed. Connection regions of different doping types are produced by means of self-aligning implantation methods.
    Type: Application
    Filed: April 6, 2011
    Publication date: August 25, 2011
    Inventors: Ronald Kakoschke, Helmut Tews
  • Patent number: 8004869
    Abstract: A memory circuit arrangement and fabrication method thereof are presented in which the parts of the memory circuit arrangement are situated on two different substrates. An integrated memory cell array is situated on one substrate. An integrated control circuit that controls access to the memory cells is situated on the other (logic circuit) substrate. The control circuit controls sequences when reading, writing or erasing content of a memory cell. The logic circuit substrate also contains a CPU and encryption coprocessor. The memory circuit contains a sense amplifier, with the aid of which the memory state of a memory cell can be determined, and a decoding circuit that selects a word or bit line.
    Type: Grant
    Filed: May 3, 2010
    Date of Patent: August 23, 2011
    Assignee: Infineon Technologies AG
    Inventors: Wolfgang Gruber, Ronald Kakoschke, Thomas Schweizer, Dominik Wegertseder
  • Patent number: 7989294
    Abstract: A method produces a vertical field-effect transistor having a semiconductor layer, in which a doped channel region is arranged along a depression. A “buried” terminal region leads as far as a surface of the semiconductor layer. The field-effect transistor also has a doped terminal region near an opening of the depression as well as the doped terminal region remote from the opening, a control region arranged in the depression, and an electrical insulating region between the control region and the channel region. The terminal region remote from the opening leads as far as a surface containing the opening or is electrically conductively connected to an electrically conductive connection leading to the surface. The control region is arranged in only one depression. The field-effect transistor is a drive transistor at a word line or at a bit line of a memory cell array.
    Type: Grant
    Filed: February 11, 2010
    Date of Patent: August 2, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Helmut Tews
  • Patent number: 7982488
    Abstract: A semiconductor chip having a subcircuit formed in a substrate; and a phase-change memory cell located on the subcircuit, and configured to directly detect an attack on the subcircuit, or to form a shield to prevent physical access to the subcircuit.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: July 19, 2011
    Assignee: Infineon Technologies AG
    Inventors: Thomas Nirschl, Berndt Gammel, Stefan Rueping, Ronald Kakoschke, Gerd Dirscherl, Philip Schlazer
  • Publication number: 20110171803
    Abstract: A memory device using tunneling field effect transistors (TFET) and buried bit lines is presented. The memory device includes a matrix containing rows and columns of storage cells. Each storage cell contains at least one cell transistor, which in turn contains first doped regions and second doped regions, one of which is a source and the other a drain. The memory device includes word lines, each of which is connected to storage cells of one row and bit lines, each of which is connected to storage cells of one column. The first doped regions are of a different doping type than the second doped regions.
    Type: Application
    Filed: March 21, 2011
    Publication date: July 14, 2011
    Inventors: Ronald Kakoschke, Thomas Nirschl, Danny Shum, Klaus Schrüfer
  • Patent number: 7978504
    Abstract: One or more embodiments relate to a memory device, comprising: a substrate; a charge storage layer disposed over the substrate; and a control gate disposed over the charge storage layer, wherein the charge storage layer or the control gate layer comprises a carbon allotrope.
    Type: Grant
    Filed: June 3, 2008
    Date of Patent: July 12, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Harald Seidl
  • Patent number: 7960789
    Abstract: An integrated field-effect transistor is described in which a substrate region is surrounded by: two terminal regions (a source region and a drain region), two electrically insulating layers, two electrically insulating regions, and an electrically conductive connecting region. The insulating layers are arranged at mutually opposite sides of the substrate region and are adjoined by control regions. The insulating regions are arranged at mutually opposite sides of the substrate region. The electrically conductive connecting region produces an electrically conductive connection between one terminal region and the substrate region. The connecting region includes a metal-semiconductor compound. Part of a covering area of the substrate region is covered by the connecting region, which extends further over a covering area of the source region. The part of the covering area of the substrate region covers the substrate region between the two insulating layers and between the two control regions.
    Type: Grant
    Filed: September 19, 2003
    Date of Patent: June 14, 2011
    Assignee: Infineon Technologies AG
    Inventor: Ronald Kakoschke
  • Patent number: 7943973
    Abstract: A method for producing a tunnel field-effect transistor is disclosed. Connection regions of different doping types are produced by means of self-aligning implantation methods.
    Type: Grant
    Filed: December 9, 2005
    Date of Patent: May 17, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Helmut Tews
  • Patent number: 7915662
    Abstract: A memory device using tunneling field effect transistors (TFET) and buried bit lines is presented. The memory device includes a matrix containing rows and columns of storage cells. Each storage cell contains at least one cell transistor, which in turn contains first doped regions and second doped regions, one of which is a source and the other a drain. The memory device includes word lines, each of which is connected to storage cells of one row and bit lines, each of which is connected to storage cells of one column. The first doped regions are of a different doping type than the second doped regions.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: March 29, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Thomas Nirschl, Danny Shum, Klaus Schrüfer
  • Publication number: 20110053331
    Abstract: This document discusses, among other things, apparatus having at least one CMOS transistor overlying a substrate; and at least one finned bipolar transistor overlying the substrate and methods for making the apparatus.
    Type: Application
    Filed: November 10, 2010
    Publication date: March 3, 2011
    Inventors: Ronald KAKOSCHKE, Klaus SCHRÜFER
  • Publication number: 20110053341
    Abstract: A memory circuit arrangement and a fabrication method are disclosed. The memory circuit arrangement has a memory cell area. The memory cell area contains memory cell transistors, one column of which are selected using a triple gate area selection transistor. The transistor has gate area that extends into isolating trenches. The isolating trenches isolate the memory cell in different columns of the memory cell array.
    Type: Application
    Filed: November 8, 2010
    Publication date: March 3, 2011
    Inventors: Ronald Kakoschke, Franz Schuler
  • Patent number: 7880264
    Abstract: A memory circuit arrangement and a fabrication method are disclosed. The memory circuit arrangement has a memory cell area. The memory cell area contains memory cell transistors, one column of which are selected using a triple gate area selection transistor. The transistor has gate area that extends into isolating trenches. The isolating trenches isolate the memory cell in different columns of the memory cell array.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: February 1, 2011
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Franz Schuler
  • Publication number: 20100317162
    Abstract: A method for fabricating a field-effect transistor is provided. The method includes forming a substrate region, forming two terminal regions at the substrate region, one terminal region being a source region and the other terminal region being a drain region, forming two electrically insulating insulating layers, which are arranged at mutually opposite sides of the substrate region and are adjoined by control regions, forming an electrically conductive connecting region, which electrically conductively connects one of the terminal regions and the substrate region the conductive connecting region comprising a metal-semiconductor compound, leveling a surface by chemical mechanical polishing after forming the control regions, etching-back the control regions after polishing, and performing a self-aligning method for forming the metal-semiconductor compound in the etched-back regions, on the substrate region, and on a terminal region.
    Type: Application
    Filed: August 2, 2010
    Publication date: December 16, 2010
    Applicant: Infineon Technologies AG
    Inventor: Ronald Kakoschke
  • Publication number: 20100301896
    Abstract: A semiconductor chip having a subcircuit formed in a substrate; and a phase-change memory cell located on the subcircuit, and configured to directly detect an attack on the subcircuit, or to form a shield to prevent physical access to the subcircuit.
    Type: Application
    Filed: May 29, 2009
    Publication date: December 2, 2010
    Applicant: INFINEON TECHNOLOGIES AG
    Inventors: Thomas Nirschl, Berndt Gammel, Stefan Rueping, Ronald Kakoschke, Gerd Dirscherl, Philip Schlazer
  • Patent number: 7834403
    Abstract: This document discusses, among other things, apparatus having at least one CMOS transistor overlying a substrate; and at least one finned bipolar transistor overlying the substrate and methods for making the apparatus.
    Type: Grant
    Filed: August 13, 2007
    Date of Patent: November 16, 2010
    Assignee: Infineon Technologies AG
    Inventors: Ronald Kakoschke, Klaus Schrüfer