Patents by Inventor Ryu Makabe

Ryu Makabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device with test mode
    Publication number: 20020149013
    Abstract: A semiconductor memory includes a first decoder selecting any of modes 1-n of a test mode B according to first to fourth data signals, and a second decoder selecting any of modes 1-n of the test mode B according to fifth to eighth data signals. When a predetermined mode m+1 is not set in a test mode A, the mode selected by both the first and second decoders is set. When the predetermined mode m+1 is set, the mode selected by the first decoder is set. Therefore, the test mode B can be set at the manufacturer side by connecting only four data input/output terminals to the tester.
    Type: Application
    Filed: October 11, 2001
    Publication date: October 17, 2002
    Applicant: MITSUBISHI DENKI KABUSHIKI KAISHA
    Inventors: Hirotoshi Sato, Masaki Tsukude, Ryu Makabe