Patents by Inventor Ryuichi Kosuge
Ryuichi Kosuge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11839948Abstract: A polishing apparatus capable of increasing an added value is disclosed. The polishing apparatus includes a polishing table configured to support a polishing pad, a top ring configured to press a substrate against the polishing pad, and a liquid supply mechanism configured to supply a liquid onto the polishing pad. The liquid supply mechanism includes a nozzle arm configured to be movable in a radial direction of the polishing table, and a liquid ejection nozzle attached to the nozzle arm. The liquid ejection nozzle is a fan-shaped nozzle having a liquid throttle surface having a tapered shape.Type: GrantFiled: November 22, 2019Date of Patent: December 12, 2023Assignee: EBARA CORPORATIONInventors: Takashi Yamazaki, Itsuki Kobata, Ryuichi Kosuge, Tadakazu Sone
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Publication number: 20230230863Abstract: A substrate conveyance method, a substrate processing device, and a recording medium are provided. The substrate conveyance method includes: conveying a substrate into a receiving unit and confirming that the substrate is present in the receiving unit by detecting that light irradiated from an optical sensor is blocked by the substrate conveyed to the receiving unit; and stopping light irradiation from the optical sensor before the substrate is conveyed out from the receiving unit.Type: ApplicationFiled: December 13, 2022Publication date: July 20, 2023Applicant: EBARA CORPORATIONInventors: MATSUTARO MIYAMOTO, RYUICHI KOSUGE, MASUMI NISHIJIMA
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Patent number: 11433502Abstract: An object of the present invention is to provide a polishing table capable of preventing peeling or detachment of a coating of the polishing table, thereby to enable an operation for replacement of a polishing pad to be easily conducted. One embodiment of the present invention provides a polishing table having a support surface configured to support a polishing pad, the polishing pad being adapted to be used for polishing a substrate, the polishing table comprising: a stacked body comprising a stack of a porous layer and a non-porous layer, the porous layer including open pores formed in a surface thereof disposed to face a polishing pad; and a resin-based coating material disposed in the open pores so as to form at least a part of the support surface of the polishing table.Type: GrantFiled: June 4, 2018Date of Patent: September 6, 2022Assignee: EBARA CORPORATIONInventors: Kenichiro Saito, Ryuichi Kosuge
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Patent number: 10926374Abstract: The present disclosure provides a substrate processing apparatus including: a substrate holding unit that holds a substrate; a pressure regulator that regulates a pressure of a gas supplied into an elastic membrane; and a controller that controls the pressure regulator to make the pressure of the gas supplied into the elastic membrane variable in order to separate the substrate from the elastic membrane.Type: GrantFiled: March 31, 2017Date of Patent: February 23, 2021Assignee: EBARA CORPORATIONInventors: Hiroyuki Shinozaki, Shuichi Kamata, Koichi Takeda, Ryuichi Kosuge
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Patent number: 10816259Abstract: A substrate transport apparatus includes a substrate holding unit configured to hold a substrate; a casing; and a drive mechanism at least partially provided within the casing and configured to drive the substrate holding unit using air. The drive mechanism is capable of supplying air into the casing.Type: GrantFiled: March 30, 2017Date of Patent: October 27, 2020Assignee: EBARA CORPORATIONInventors: Kenichi Suzuki, Ryuichi Kosuge, Kenichiro Saito
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Publication number: 20200269385Abstract: An operation control unit includes a storage device storing a program which includes commands of: obtaining a correlation between a supply position of the polishing liquid in the radial direction of the polishing pad using the liquid injection nozzle and an average polishing rate of the substrate and an distribution of the polishing rate within the substrate; determining a movable range of the liquid injection nozzle according to a predetermined range of an allowable average polishing rate and the correlation between the supply position of the polishing liquid and the average polishing rate; determining an optimal supply position of the polishing liquid from the correlation between the supply position of the polishing liquid and the distribution of the polishing rate within the substrate within the determined movable range of the liquid injection nozzle; and moving the liquid injection nozzle to the determined supply position to polish the substrate.Type: ApplicationFiled: February 20, 2020Publication date: August 27, 2020Applicant: EBARA CORPORATIONInventors: ITSUKI KOBATA, TAKASHI YAMAZAKI, RYUICHI KOSUGE, TADAKAZU SONE
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Publication number: 20200171621Abstract: A polishing apparatus capable of increasing an added value is disclosed. The polishing apparatus includes a polishing table configured to support a polishing pad, a top ring configured to press a substrate against the polishing pad, and a liquid supply mechanism configured to supply a liquid onto the polishing pad. The liquid supply mechanism includes a nozzle arm configured to be movable in a radial direction of the polishing table, and a liquid ejection nozzle attached to the nozzle arm. The liquid ejection nozzle is a fan-shaped nozzle having a liquid throttle surface having a tapered shape.Type: ApplicationFiled: November 22, 2019Publication date: June 4, 2020Inventors: Takashi Yamazaki, Itsuki Kobata, Ryuichi Kosuge, Tadakazu Sone
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Patent number: 10661411Abstract: There is disclosed a polishing-surface cleaning apparatus to which a polishing liquid, such as slurry, is less likely to be attached. The polishing-surface cleaning apparatus includes an arm having a fluid passage, a nozzle communicating with the fluid passage, and a weld material securing the nozzle to the arm. The weld material fills a gap between a bottom surface of the arm and an edge of a front-end surface of the nozzle.Type: GrantFiled: November 17, 2015Date of Patent: May 26, 2020Assignee: EBARA CORPORATIONInventors: Ryuichi Kosuge, Hiroshi Sotozaki, Takeshi Kodera, Ryo Hasegawa
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Publication number: 20190351526Abstract: A method capable of accurately detecting a polishing surface of a polishing pad using a polishing head without being influenced by passage of time is disclosed. The includes: moving a polishing head in a direction perpendicular to a polishing surface of a polishing pad while applying thrust from the polishing head to the polishing pad; during the movement of the polishing head, detecting deflection of a head arm with a strain sensor, the head arm supporting the polishing head; and determining a position of the polishing head corresponding to a point in time at which an output signal from the strain sensor reaches a preset threshold value.Type: ApplicationFiled: May 10, 2019Publication date: November 21, 2019Applicant: Ebara CorporationInventors: Masao UMEMOTO, Ryuichi KOSUGE, Shuichi KAMATA, Kento YOSHIDA
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Publication number: 20190299360Abstract: A polishing apparatus includes a polishing table supplied with liquid on a upper surface and rotating around a central axis, a liquid receiver having an annular shape and disposed below a peripheral portion of the polishing table, and a drain member having a tubular shape, attached to a peripheral portion of the polishing table, and including a lower end portion extending toward the liquid receiver.Type: ApplicationFiled: March 27, 2019Publication date: October 3, 2019Inventors: Tadakazu SONE, Ryuichi KOSUGE, Kenji SHINKAI, Hiroshi AONO, Hideo AIZAWA
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Patent number: 10157762Abstract: A substrate processing apparatus includes transport mechanisms 121a to 127a, a sensor 40 for detecting whether a wafer W is held by the transport mechanisms 121a to 127a, a sensor controller 82 for controlling the sensor 40, a position information acquiring part 81 for acquiring position information of the substrate W in the transport passage, a detection result acquiring part 83 for acquiring a detection result from the sensor 40, and a determination processor 84 for determining whether the detection result of the sensor and the position information are consistent with each other. When it is determined that the detection result of the sensor 40 is inconsistent with the position information, the sensor controller 82 makes the sensor 40 retry to detect whether the substrate W is held.Type: GrantFiled: March 31, 2017Date of Patent: December 18, 2018Assignee: EBARA CORPORATIONInventors: Tomohiro Tanaka, Kenichiro Saito, Koichi Takeda, Masumi Nishijima, Ryuichi Kosuge
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Publication number: 20180345447Abstract: An object of the present invention is to provide a polishing table capable of preventing peeling or detachment of a coating of the polishing table, thereby to enable an operation for replacement of a polishing pad to be easily conducted. One embodiment of the present invention provides a polishing table having a support surface configured to support a polishing pad, the polishing pad being adapted to be used for polishing a substrate, the polishing table comprising: a stacked body comprising a stack of a porous layer and a non-porous layer, the porous layer including open pores formed in a surface thereof disposed to face a polishing pad; and a resin-based coating material disposed in the open pores so as to form at least a part of the support surface of the polishing table.Type: ApplicationFiled: June 4, 2018Publication date: December 6, 2018Inventors: Kenichiro SAITO, Ryuichi KOSUGE
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Publication number: 20170291274Abstract: The present disclosure provides a substrate processing apparatus including: a substrate holding unit that holds a substrate; a pressure regulator that regulates a pressure of a gas supplied into an elastic membrane; and a controller that controls the pressure regulator to make the pressure of the gas supplied into the elastic membrane variable in order to separate the substrate from the elastic membrane.Type: ApplicationFiled: March 31, 2017Publication date: October 12, 2017Inventors: Hiroyuki Shinozaki, Shuichi Kamata, Koichi Takeda, Ryuichi Kosuge
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Publication number: 20170284727Abstract: A substrate transport apparatus includes a substrate holding unit configured to hold a substrate; a casing; and a drive mechanism at least partially provided within the casing and configured to drive the substrate holding unit using air. The drive mechanism is capable of supplying air into the casing.Type: ApplicationFiled: March 30, 2017Publication date: October 5, 2017Inventors: Kenichi Suzuki, Ryuichi Kosuge, Kenichiro Saito
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Publication number: 20170287755Abstract: A substrate processing apparatus includes transport mechanisms 121a to 127a, a sensor 40 for detecting whether a wafer W is held by the transport mechanisms 121a to 127a, a sensor controller 82 for controlling the sensor 40, a position information acquiring part 81 for acquiring position information of the substrate W in the transport passage, a detection result acquiring part 83 for acquiring a detection result from the sensor 40, and a determination processor 84 for determining whether the detection result of the sensor and the position information are consistent with each other. When it is determined that the detection result of the sensor 40 is inconsistent with the position information, the sensor controller 82 makes the sensor 40 retry to detect whether the substrate W is held.Type: ApplicationFiled: March 31, 2017Publication date: October 5, 2017Inventors: Tomohiro TANAKA, Kenichiro SAITO, Koichi TAKEDA, Masumi NISHIJIMA, Ryuichi KOSUGE
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Patent number: 9764446Abstract: The invention suppresses generation of noises attributable to rotation of a rotary joint. A rotary joint includes a rotating body that rotates on a rotating axis A, a housing disposed so as to surround the rotating body, and at least one bearing disposed between the rotating body and the housing and adapted to support rotation of the rotating body. The rotary joint supplies fluids through fluid connection ports formed in the housing and fluid passages formed inside the rotating body to a polishing table having attached thereto a polishing pad for polishing a substrate or a holding portion that is adapted to hold the substrate while pressing the substrate against the polishing pad. At least one elastic member is interposed at least either between the rotating body and the at least one bearing or between the housing and the at least one bearing.Type: GrantFiled: April 9, 2015Date of Patent: September 19, 2017Assignee: EBARA CORPORATIONInventors: Hideo Aizawa, Tadakazu Sone, Masao Umemoto, Ryuichi Kosuge
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Patent number: 9530704Abstract: There is provided a polishing apparatus capable of detecting uneven wear occurring on a polishing pad and detecting an appropriate replacement timing of the polishing pad. The polishing apparatus detects, every predetermined time, a value of rotation speed or a value of rotation torque of a table drive shaft for rotationally driving a polishing table or a dresser drive shaft for driving a dresser, or a value of swing torque of a dresser swing shaft for driving the dresser; calculates a change quantity thereof based on the value of the detected rotation speed, the value of the detected rotation torque, or the value of the detected swing torque; determines whether or not the change quantity exceeds a predetermined value; and notifies a user of a warning when a determination is made that the change quantity exceeds the predetermined value.Type: GrantFiled: August 26, 2015Date of Patent: December 27, 2016Assignee: Ebara CorporationInventors: Ryuichi Kosuge, Tadakazu Sone
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Patent number: 9522453Abstract: A polishing apparatus which can continue stable operation of the apparatus without generating torsional vibration in a rotary joint and without generating an abnormal sound at an engagement part between a cooling water pipe and a polishing table is disclosed. The polishing apparatus includes a rotary joint fixed to a rotating part of the polishing table or a rotating part of the top ring to supply a fluid into the polishing table or the top ring and discharge the fluid from the polishing table or the top ring, and a rotation-prevention mechanism which connects the rotary joint with an apparatus frame to prevent the rotary joint from being rotated. The rotation-prevention mechanism includes a link mechanism having at least one spherical plain bearing.Type: GrantFiled: July 6, 2015Date of Patent: December 20, 2016Assignee: EBARA CORPORATIONInventors: Hideo Aizawa, Masao Umemoto, Tadakazu Sone, Ryuichi Kosuge
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Patent number: 9434044Abstract: A polishing apparatus which can reduce scratches that are generated on a surface of a substrate during polishing by detecting a foreign matter such as a fragment of the substrate on an inner circumferential surface of a retaining ring for holding an edge portion (peripheral portion) of the substrate is disclosed. The polishing apparatus includes a polishing table having a polishing surface, and a top ring having a substrate holding surface to hold a beck surface of a substrate and a retaining ring to retain the substrate on the substrate holding surface. The top ring holds the substrate and presses the substrate against the polishing surface. The polishing apparatus includes an imaging device configured to image an inner circumferential surface of the retaining ring, and an image processor configured to process an image obtained by the imaging device to judge whether there is a foreign matter on the inner circumferential surface of the retaining ring.Type: GrantFiled: March 25, 2015Date of Patent: September 6, 2016Assignee: Ebara CorporationInventors: Ryuichi Kosuge, Hiroshi Sotozaki, Takahiro Kawano, Akihiro Mochida
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Publication number: 20160233118Abstract: A workpiece transport device for transporting a workpiece having a substrate layer and a layer to be processed on a portion of the substrate layer is provided. This workpiece transport device has a workpiece holding mechanism arranged to operate so as to hold and release the workpiece. The workpiece holding mechanism has at least one tapered workpiece holding surface on which the substrate layer of the workpiece is held in a state where the layer to be processed is positioned below the substrate layer. The tapered workpiece holding surface is formed so that a clearance equal to or larger than a predetermined distance R exists between the workpiece holding surface and the layer to be processed of the workpiece when the workpiece is held by the workpiece holding mechanism.Type: ApplicationFiled: April 19, 2016Publication date: August 11, 2016Inventors: Ryuichi KOSUGE, Hiroaki NISHIDA, Tadakazu SONE, Hideo AIZAWA, Tomohiro TANAKA