Abstract: In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Abstract: In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Abstract: An integrated circuit such as, for example a graphics processing unit (GPU), includes a dynamic power controller for adjusting operating voltage and/or frequency. The controller may receive current power used by the integrated circuit and a predicted power determined based on instructions pending in a plurality of processors. The controller determines adjustments that need to be made to the operating voltage and/or frequency to minimize the difference between the current power and the predicted power. An in-system reinforced learning mechanism is included to self-tune parameters of the controller.

Abstract: In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Abstract: In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Abstract: In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Abstract: A hierarchy of interconnected memory retention (MR) circuits detect a clock gating mode being entered at any level of an integrated circuit. In response, the hierarchy automatically transitions memory at the clock gated level and all levels below the clock-gated level from a normal operating state to a memory retention state. When a memory transitions from a normal operating state to a memory retention state, the memory transitions from a higher power state (corresponding to the normal operating state) to a lower power state (corresponding to the memory retention state). Thus, in addition to the dynamic power savings caused by the clock gating mode, the hierarchy of MR circuits automatically transitions the memory modules at the clock gated level and all levels below the clock gated level to a lower power state. As a result, the leakage power consumption of the corresponding memory modules is reduced relative to prior approaches.

Abstract: Introduced herein is an improved technique of recovering system frequency margin via distributed CPMs. The introduced technique creates and distributes multiple sets of always sensitized critical path replicas across a chip and monitors them for timing failure. The introduced technique takes feedback from these critical path replicas and dynamically boosts the clock frequency of the chip to remove the margin. The introduced technique provides more accurate and more comprehensive coverage of a chip performance.

Abstract: An integrated circuit such as, for example a graphics processing unit (GPU), having an on-chip analog to digital converter (ADC) for use in overcurrent protection of the chip is described, where the overcurrent protection response times are substantially faster than techniques with external ADC. A system-on-chip (SoC) includes the integrated circuit and a multiplexer arranged externally to the chip having the ADC, where the multiplexer provides the ADC with a data stream of sampling information from a plurality of power sources. Methods for overcurrent protection using an on-chip ADC are also described.

Abstract: A periphery circuit of a memory array is formed in a first power domain, and an output latch of the periphery circuit domain is formed in a second power domain different than the first power domain. During power state transitions the state integrity of the output latch is maintained.

Abstract: An integrated circuit such as, for example a graphics processing unit (GPU), includes a dynamic power controller for adjusting operating voltage and/or frequency. The controller may receive current power used by the integrated circuit and a predicted power determined based on instructions pending in a plurality of processors. The controller determines adjustments that need to be made to the operating voltage and/or frequency to minimize the difference between the current power and the predicted power. An in-system reinforced learning mechanism is included to self-tune parameters of the controller.

Abstract: An integrated circuit such as, for example a graphics processing unit (GPU), having an on-chip analog to digital converter (ADC) for use in overcurrent protection of the chip is described, where the overcurrent protection response times are substantially faster than techniques with external ADC. A system-on-chip (SoC) includes the integrated circuit and a multiplexer arranged externally to the chip having the ADC, where the multiplexer provides the ADC with a data stream of sampling information from a plurality of power sources. Methods for overcurrent protection using an on-chip ADC are also described.

Abstract: An optimized power saving technique is described for a processor, such as, for example, a graphic processing unit (GPU), which includes one or more processing cores and at least one data link interface. According to the technique, the processor is operable in a low power mode in which power to the at least one processing core is off and power to the at least one data link interface is on. This technique provides reduced exit latencies compared to currently available approaches in which the core power is turned off.

Abstract: An optimized power saving technique is described for a processor, such as, for example, a graphic processing unit (GPU), which includes one or more processing cores and at least one data link interface. According to the technique, the processor is operable in a low power mode in which power to the at least one processing core is off and power to the at least one data link interface is on. This technique provides reduced exit latencies compared to currently available approaches in which the core power is turned off.

Abstract: A hierarchy of interconnected memory retention (MR) circuits detect a clock gating mode being entered at any level of an integrated circuit. In response, the hierarchy automatically transitions memory at the clock gated level and all levels below the clock-gated level from a normal operating state to a memory retention state. When a memory transitions from a normal operating state to a memory retention state, the memory transitions from a higher power state (corresponding to the normal operating state) to a lower power state (corresponding to the memory retention state). Thus, in addition to the dynamic power savings caused by the clock gating mode, the hierarchy of MR circuits automatically transitions the memory modules at the clock gated level and all levels below the clock gated level to a lower power state. As a result, the leakage power consumption of the corresponding memory modules is reduced relative to prior approaches.

Abstract: A power-gating array configured to power gate a logic block includes multiple zones of sleep field-effect transistors (FETs). A zone controller coupled to the power-gating array selectively enables a certain number of zones within the array depending on the voltage drawn by the logic block. When the logic block draws a lower voltage, the zone controller enables a lower number of zones. When the logic block draws a higher voltage, the zone controller enables a greater number of zones. One advantage of the disclosed technique is that sleep FET usage is reduced, thereby countering the effects of FET deterioration due to BTI and TDDB. Accordingly, the lifetime of sleep FETs configured to perform power gating for logic blocks may be extended.

Abstract: A true random number generator, a method of generating a true random number and a system incorporating the generator or the method. In one embodiment, the generator includes: (1) a ring oscillator including inverting gates having power inputs and (2) a time-varying power supply coupled to the power inputs to provide power thereto and including power perturbation circuitry operable to perturb the power provided to at least one of the power inputs.

Abstract: A power-gating array configured to power gate a logic block includes multiple zones of sleep field-effect transistors (FETs). A zone controller coupled to the power-gating array selectively enables a certain number of zones within the array depending on the voltage drawn by the logic block. When the logic block draws a lower voltage, the zone controller enables a lower number of zones. When the logic block draws a higher voltage, the zone controller enables a greater number of zones. One advantage of the disclosed technique is that sleep FET usage is reduced, thereby countering the effects of FET deterioration due to BTI and TDDB. Accordingly, the lifetime of sleep FETs configured to perform power gating for logic blocks may be extended.

Abstract: A true random number generator, a method of generating a true random number and a system incorporating the generator or the method. In one embodiment, the generator includes: (1) a ring oscillator including inverting gates having power inputs and (2) a time-varying power supply coupled to the power inputs to provide power thereto and including power perturbation circuitry operable to perturb the power provided to at least one of the power inputs.

Abstract: A true random number generator, a method of generating a true random number and a system incorporating the generator or the method. In one embodiment, the generator includes: (1) a ring oscillator including inverting gates having power inputs and (2) a time-varying power supply coupled to the power inputs to provide power thereto and including power perturbation circuitry operable to perturb the power provided to at least one of the power inputs.