Abstract: A motor and a fan device are provided. The motor includes a motor bracket; a conductive shaft fixed to a front surface side of the motor bracket; a rotor rotatably supported on the shaft; a stator fixed to the front surface side of the motor bracket inside the rotor and wound with a plurality of coils for generating a magnetic field to rotate the rotor; a substrate, a front surface thereof mounted with a driver circuit for controlling magnetic field generation by the coils; and a driver case fixed to a rear surface side of the motor bracket and forming an accommodation space accommodating the substrate between itself and the motor bracket. A positive wiring of the driver circuit is mounted outside a region on the substrate overlapping the shaft when the motor is viewed from an axial direction of the shaft.

Abstract: As a technology for an observation device and an inspection device, a technology capable of reducing a work effort related to generation of a recipe including alignment information is provided. An observation device 1 includes an observation unit 103 that obtains an image for observing a sample 101 on a stage 102. A computer system 2 of the observation device 1 acquires the image from the observation unit 103, specifies a period of a pattern-formed unit region repeatedly formed on a surface of the sample 101 from the image, and generates a recipe including observation or inspection alignment positions of the sample 101 using the specified period.

Abstract: An information processing apparatus includes a controller, the controller being configured to select a first mobile body to deliver baggage to a delivery destination existing in a predetermined facility from among a plurality of types of delivery mobile bodies, wherein the controller selects the first mobile body, based on required time necessary to deliver the baggage to the delivery destination in a site of the predetermined facility, for each delivery mobile body.

Abstract: A semiconductor inspection device 1 having a first measurement mode and a second measurement mode includes: an electron optical system configured to irradiate a sample with an electron beam; an optical system configured to irradiate the sample with light; an electron detector configured to detect a signal electron; a photodetector 29 configured to detect signal light; a control unit 11 configured to control the electron optical system and the optical system such that an electron beam and light are emitted under a first irradiation condition in the first measurement mode, and to control the electron optical system and the optical system such that an electron beam and light are emitted under a second irradiation condition in the second measurement mode; and a computer configured to process a detection signal from the electron detector or the photodetector.

Abstract: A control device controls a contact probe in synchronization with a pulse-controlled light having a predetermined wavelength, a measurement instrument measures a characteristic of a sample to be inspected or an analysis sample, and a circuit constant or a defect structure of the sample to be inspected is estimated based on a circuit model created by an electric characteristic analysis device configured to generate the circuit model based on a value measured by the measurement instrument and a detection signal of secondary electrons detected by the charged particle beam device.

Abstract: A battery module includes: a stacked body in which a plurality of secondary batteries are stacked; and a side restraint member which faces a first surface of the stacked body, and which extends in a stacked direction of the stacked body. The first surface is a surface in a vertical direction with respect to a lower surface of the stacked body, and is a surface along the stacked direction, and the first surface and the side restraint member are joined with each other by a joining member.

Abstract: A battery pack includes a case, a battery module disposed in the case, and a cover which covers an upper side of the battery module. The battery module includes: a stacked body in which a plurality of secondary batteries are stacked; and a side restraint member which faces a first surface of the stacked body, and which extends in a stacked direction of the stacked body. The first surface is a surface in a vertical direction with respect to a lower surface of the stacked body, and is a surface along the stacked direction, and a first distance between an upper end of the side restraint member and the cover is shorter than a second distance between an upper surface of the stacked body and the cover.

Abstract: A battery pack includes a stacked body in which a plurality of secondary batteries are stacked, a restraint member that extends in a stacked direction of the stacked body along a first surface of the stacked body, and that restrains the plurality of secondary batteries, and a plurality of extrusion materials that are disposed along a second surface of the stacked body in the stacked direction, and that support the stacked body, and each of the plurality of extrusion materials is disposed such that an extrusion direction intersects the stacked direction.

Abstract: A battery monitoring system includes a monitoring unit that monitors a battery and a higher device that is provided with monitoring data obtained by monitoring of the battery by the monitoring unit and saves, by using a blockchain, at least part of specific information included in the monitoring data. The higher device includes a block generation unit that generates a new block including a hash value based on the at least part of the specific information and a last block linked at an end of the blockchain, and an external communication device configured to save, in a distributed manner in a plurality of external devices, the new block generated by the block generation unit. At least one of the monitoring unit or the higher device is provided with a data protection unit configured to ensure reliability of the monitoring data.

Abstract: An imaging device includes a control unit configured to, before starting processing of reading a pixel signal forming a still image to be recorded from an imaging element in a case where an operation for still image imaging and recording is performed, calculates displayable timing in a display unit for the still image, and performs display setting processing according to the calculated displayable timing.

Abstract: Provided is an inspection system capable of estimating electric characteristics of a sample with high accuracy regardless of an initial charging state of a wafer. The inspection system includes a charged particle beam device and a computer system, and inspects the electric characteristics of the sample. The inspection system evaluates initial charging of an inspection region including inspection patterns based on reference data indicating a secondary charged particle signal from a reference pattern corresponding to a plurality of pulse conditions. The reference pattern has the same electric characteristics as the inspection pattern and initial charging therein caused by electric charges that are not emitted according to a discharge time constant of the sample is negligible. The reference pattern is obtained by irradiating the reference pattern with a pulse charged particle beam under a plurality of pulse conditions.

Abstract: An object of the present disclosure is to provide a defect classification device capable of easily grasping an appropriate recipe update timing of an imaging device when classification accuracy for classifying defects existing on a semiconductor wafer is decreased. The defect classification device according to the present disclosure calculates classification accuracy by further acquiring a result of a manual classification for defects spanning a plurality of classification spaces as a result of an automatic classification, and comparing the result of the automatic classification with the result of the manual classification (see FIG. 5).

Abstract: The present disclosure proposes a system for detecting a foreign material adhering to or a scratch formed on a bevel at an edge of a semiconductor wafer in order to detect the foreign material or defect on the bevel without using a reference image and including a learning device (905) that outputs information on the foreign material adhering to or the scratch formed on the bevel as a learning result, in which the learning device performs learning in advance by using image data acquired by an image acquisition tool and the information on the foreign material or the scratch on the bevel included in the image data, and the foreign material or the scratch is detected by inputting the image data obtained by the image acquisition tool to the learning device (refer to FIG. 9).

Abstract: This inspection system 100 comprises: an electron source 102 which irradiates a sample 200 with an inspection beam; a detector 105 which detects secondary electrons obtained by irradiating the sample 200 with the inspection beam and outputs a detection signal; a laser device 107 which emits an action laser that changes the amount of secondary electrons; an electron gun 106 which emits an action electron beam that changes the amount of secondary electrons; and a computer system 140 which generates an image of the sample 200 on the basis of the detection signal.

Abstract: Provided is a technique and the like capable of specifying irradiation areas or irradiation positions of a beam and a light as clearly as possible. A charged particle beam apparatus 1 includes: a position adjustment mark 10 provided on a stage 6 and irradiated with a beam b1 and a light a1; and a mechanism setting an irradiation position of the beam b1 and an irradiation position of the light a1 with respect to the stage 6 and changing a relative positional relationship including a distance between the irradiation position of the light a1 and the stage 6.

Abstract: A semiconductor inspection device 1 having a first measurement mode and a second measurement mode includes: an electron optical system configured to irradiate a sample with an electron beam; an optical system configured to irradiate the sample with light; an electron detector configured to detect a signal electron; a photodetector 29 configured to detect signal light; a control unit 11 configured to control the electron optical system and the optical system such that an electron beam and light are emitted under a first irradiation condition in the first measurement mode, and to control the electron optical system and the optical system such that an electron beam and light are emitted under a second irradiation condition in the second measurement mode; and a computer configured to process a detection signal from the electron detector or the photodetector.

Abstract: A control device controls a contact probe in synchronization with a pulse-controlled light having a predetermined wavelength, a measurement instrument measures a characteristic of a sample to be inspected or an analysis sample, and a circuit constant or a defect structure of the sample to be inspected is estimated based on a circuit model created by an electric characteristic analysis device configured to generate the circuit model based on a value measured by the measurement instrument and a detection signal of secondary electrons detected by the charged particle beam device.

Abstract: A battery device is provided with: an exterior body having two outer side walls; at least one battery cell group that is arranged between the two outer side walls of the exterior body and that is composed of a plurality of laminated battery cells; a first temperature-adjusting medium flow path that is provided in at least one of the two outer side walls of the exterior body and in which a temperature-adjusting medium capable of exchanging heat with the battery cells via the outer side wall flows; and a holding mechanism that brings the battery cell group into contact with the outer side wall so that heat can be exchanged and that holds the battery cell group in the exterior body by applying, to the battery cell group in the exterior body, a pressing force in a direction towards the outer side wall having the first temperature-adjusting medium flow path.

Abstract: A charged particle optical system scans a sample with a pulsed charged particle beam and detects secondary charged particles; and a scan image is formed. Control is carried out so that a deflection signal for deflecting the charged particle beam in a first direction, a first timing for pulsed irradiation, a second timing for pulsed irradiation, and a third timing for detection of the secondary charged particles are synchronized. When the deflection amount of the charged particle beam in the time period of the first timing corresponds to the coordinates of n pixels in the scan image, the same line is scanned m times (m < n) while shifting the first timing with respect to the deflection signal so that a location irradiated with the charged particle beam by each scanning has different pixel coordinates. The pixel values at pixel coordinates where a signal is defective are restored.

Abstract: A configuration is provided so as to enable efficient fixing of cell groups to a housing of a battery pack. A housing of a battery pack has inside thereof a partition wall which extends in an extending direction and projects in a projecting direction. A cell group has a plurality of battery cells side-by-side in the extending direction one a side of the partition wall. Paste is filled into a gap between the partition wall and the cell group. The partition wall has an injection channel. The injection channel has an injection port for injecting the paste, and an inlet which communicates with the injection port and opens to the gap.