Patents by Inventor Scott Van De Graaff

Scott Van De Graaff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030123312
    Abstract: A sense amplifier circuit includes first and second amplifier circuits. The first amplifier circuit includes a pair of cross-coupled transistors of a first channel type (e.g., N-channel FETs), and the second amplifier circuit includes a pair of cross-coupled transistors of a second channel type (e.g., P-channel FETs). The sense amplifier circuit also includes a third transistor of the second channel type coupled between first nodes of the first and second amplifier circuits, and a fourth transistor of the second channel type coupled between second nodes of the first and second amplifier circuits. The sense amplifier circuit reduces access device leakage of a DRAM cell during LRL refresh access, and improves refresh margin on a DRAM cell with a one written thereto. A method of reducing access device leakage and improving refresh margin using such an improved sense amplifier is also described.
    Type: Application
    Filed: February 18, 2003
    Publication date: July 3, 2003
    Applicant: Micron Technology, Inc.
    Inventor: Scott Van De Graaff
  • Patent number: 6570813
    Abstract: A synchronous mirror delay (SMD) clock recovery and skew adjustment circuit for an integrated circuit is described, having a reduced circuit implementation. The SMD clock recovery and skew adjustment circuit incorporates a delay segment into the forward delay line (FDL) and backward delay line (BDL) that accounts for all or some of the non-variable portion of the asserted clock signal time period. This delay segment allows reduction of the FDL and BDL lines to only those portions necessary to sense and adjust for the portion of the asserted clock signal time period that is variable and that must be adjusted for. The invention allows SMD clock recovery and skew adjustment circuits to be implemented in an optimized manner that exhibits a reduced overall circuit size.
    Type: Grant
    Filed: May 25, 2001
    Date of Patent: May 27, 2003
    Assignee: Micron Technology, Inc.
    Inventor: Scott Van De Graaff
  • Publication number: 20030053341
    Abstract: A voltage reference circuit is provided in the periphery of a memory array. Each subarray of the memory array is associated with a respective voltage driver circuit responsible for generating the cell plate and equilibrate reference voltage for the memory cells in the subarray. The voltage reference circuit is connected to and controls each voltage driver so that each driver generates the proper reference voltage. The distributed circuitry substantially reduces the amount of space used within the memory array while mitigating the problems of prior art voltage generator circuits.
    Type: Application
    Filed: October 30, 2002
    Publication date: March 20, 2003
    Inventors: Scott Van De Graaff, Steve Porter
  • Publication number: 20030043649
    Abstract: An apparatus and associated method are provided to improve the programming of anti-fuse devices in an integrated circuit. A programming circuit capable of programming a plurality of anti-fuse devices in parallel permits a state-changing voltage to be applied to multiple anti-fuses substantially simultaneously using a common control signal.
    Type: Application
    Filed: July 30, 2002
    Publication date: March 6, 2003
    Inventor: Scott Van De Graaff
  • Publication number: 20030043676
    Abstract: An apparatus and associated method are provided to improve the programming of anti-fuse devices in an integrated circuit. A programming circuit capable of programming a plurality of anti-fuse devices in parallel permits a state-changing voltage to be applied to multiple anti-fuses substantially simultaneously using a common control signal.
    Type: Application
    Filed: August 30, 2001
    Publication date: March 6, 2003
    Inventor: Scott Van De Graaff
  • Patent number: 6522592
    Abstract: A sense amplifier circuit includes first and second amplifier circuits. The first amplifier circuit includes a pair of cross-coupled transistors of a first channel type (e.g., N-channel FETs), and the second amplifier circuit includes a pair of cross-coupled transistors of a second channel type (e.g., P-channel FETs). The sense amplifier circuit also includes a third transistor of the second channel type coupled between first nodes of the first and second amplifier circuits, and a fourth transistor of the second channel type coupled between second nodes of the first and second amplifier circuits. The sense amplifier circuit reduces access device leakage of a DRAM cell during LRL refresh access, and improves refresh margin on a DRAM cell with a one written thereto. A method of reducing access device leakage and improving refresh margin using such an improved sense amplifier is also described.
    Type: Grant
    Filed: April 19, 2001
    Date of Patent: February 18, 2003
    Assignee: Micron Technology, Inc.
    Inventor: Scott Van De Graaff
  • Patent number: 6496421
    Abstract: A voltage reference circuit is provided in the periphery of a memory array. Each subarray of the memory array is associated with a respective voltage driver circuit responsible for generating the cell plate and equilibrate reference voltage for the memory cells in the subarray. The voltage reference circuit is connected to and controls each voltage driver so that each driver generates the proper reference voltage. The distributed circuitry substantially reduces the amount of space used within the memory array while mitigating the problems of prior art voltage generator circuits.
    Type: Grant
    Filed: August 31, 2000
    Date of Patent: December 17, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Scott Van De Graaff, Steve Porter
  • Publication number: 20020176315
    Abstract: A synchronous mirror delay (SMD) clock recovery and skew adjustment circuit for an integrated circuit is described, having a reduced circuit implementation. The SMD clock recovery and skew adjustment circuit incorporates a delay segment into the forward delay line (FDL) and backward delay line (BDL) that accounts for all or some of the non-variable portion of the asserted clock signal time period. This delay segment allows reduction of the FDL and BDL lines to only those portions necessary to sense and adjust for the portion of the asserted clock signal time period that is variable and that must be adjusted for. The invention allows SMD clock recovery and skew adjustment circuits to be implemented in an optimized manner that exhibits a reduced overall circuit size.
    Type: Application
    Filed: May 25, 2001
    Publication date: November 28, 2002
    Applicant: Micron Technology, Inc.
    Inventor: Scott Van De Graaff
  • Publication number: 20020154561
    Abstract: A sense amplifier circuit includes first and second amplifier circuits. The first amplifier circuit includes a pair of cross-coupled transistors of a first channel type (e.g., N-channel FETs), and the second amplifier circuit includes a pair of cross-coupled transistors of a second channel type (e.g., P-channel FETs). The sense amplifier circuit also includes a third transistor of the second channel type coupled between first nodes of the first and second amplifier circuits, and a fourth transistor of the second channel type coupled between second nodes of the first and second amplifier circuits. The sense amplifier circuit reduces access device leakage of a DRAM cell during LRL refresh access, and improves refresh margin on a DRAM cell with a one written thereto. A method of reducing access device leakage and improving refresh margin using such an improved sense amplifier is also described.
    Type: Application
    Filed: April 19, 2001
    Publication date: October 24, 2002
    Applicant: Micron Technology, Inc.
    Inventor: Scott Van De Graaff