Abstract: Integrated circuit packages include an integrated circuit mounting substrate having a hole that defines an inner wall of the integrated circuit mounting substrate. An integrated circuit is provided in the hole. A sinuous lead frame extends from the integrated circuit and is connected to the inner wall. The sinuous lead frame extends back and forth along a given direction, and may include a U- and/or V-shape, and round and/or jagged portions. Related packaging methods are also disclosed.

Abstract: Example embodiments of a semiconductor package are provided. In accordance with an example embodiment, a semiconductor package may include an external terminal connected to a concave surface of a bottom pad, wherein the bottom pad is recessed into a substrate. In accordance with another example embodiment, a semiconductor package may include at least one external terminal, a flexible substrate having a first surface with a plurality of convex portions and a second surface opposite the first surface having a plurality of concave portions, wherein the at least one terminal is recessed into the substrate and at least one of the concave portions surrounds a portion of the at least one external terminal.

Abstract: Provided are a semiconductor package having molded balls on a bottom surface of a PCB and a method of manufacturing the semiconductor package. The semiconductor package includes: a semiconductor chip mounting member comprising circuit patterns on a first surface, an insulating layer defining openings exposing at least portions of the circuit patterns, and external contact terminals arranged on the portions of circuit patterns exposed by the openings; a semiconductor chip formed on a second surface of the semiconductor chip mounting member and electrically connected to the semiconductor chip mounting member; a first sealing portion coating the second surface of the semiconductor chip mounting member and the semiconductor chip; and a second sealing portion arranged on the insulating layer and the external contact terminals such that at least portions of the external contact terminals are exposed.

Abstract: Provided are a rotation joint capable of compensating for a mismatch due to thermal expansion and a semiconductor device having the same. The rotation joint can include a support member and a first contact member coupled to a first portion of the support member such that a surface of the first contact member is moveable relative to a surface of the support member adjacent to the first contact member. The first contact member can include solder material.

Abstract: Provided are a semiconductor package and a method of manufacturing the same. The semiconductor package includes a circuit substrate having a slit inside the circuit substrate, a semiconductor chip formed on an upper surface of the circuit substrate, a wire connecting the semiconductor chip and the circuit substrate through the slit, and a sealant partially covering the wire. According to the semiconductor package, by forming the sealant covering only a part of the wire, wire severing and warping of the semiconductor package can be prevented. In addition, the thickness of a stacked type semiconductor package can be reduced.

Abstract: Provided are a semiconductor package and a manufacturing method thereof. The semiconductor package includes a flexible film with a film wire region formed of a film substrate region on which a semiconductor chip is mounted, and a plurality of sub film wires branching and extending from the film substrate region and electrically connected to the semiconductor chip. A plurality of external contact terminals arranged on the outer surface of the flexible film and electrically connected to the semiconductor chip is further included. Also included is a plurality of conductive patterns having first pads disposed in the flexible film, arranged on the film substrate region, and electrically connected to one of the plurality of external contact terminals; and second pads arranged on the film wire region and electrically connected to the semiconductor chip.

Abstract: Provided is a wafer level chip scale package that reduces the parasitic capacitance generated between ball pads and the solder balls, and enhances the joint reliability between the ball pads and the solder balls. The wafer level chip scale package provides a conductive pattern in each ball pad section, on which a solder ball is mounted, so as to have a spiral or mesh shape, provides a space defined by the conductive pattern such that a first dielectric layer under the conductive pattern is exposed, and provides the solder ball on a top surface of each ball pad section such that part of the solder ball is inserted into the space defined by the conductive pattern. When viewed from the top, the dielectric layer is exposed from each ball pad section by an area of about 50% or less.

Abstract: Provided are a method of dicing a wafer, which reduces sectional cracking and chipping, and a die. According to the method, a DAF (die attach film) may be attached on a grinded backside of a wafer, and the DAF and the backside of the wafer may be sawed to a depth. The backside of the wafer may be attached to a ring mount blocked by a tape, and the wafer may be separated into a plurality of dies by applying stress on the wafer through the tape of the ring mount. Each of the dies may include a die adhesive dam formed naturally and may be used together with the DAF when a die is bonded.

Abstract: Provided is a board-on-chip package and stack package using the same to reduce the likelihood that bonding wires in an encapsulant may be damaged due to mechanical stresses applied during a package stacking process. A semiconductor package may have a spacer provided along the opposing sides of an encapsulant. The spacer may be spaced away from bonding wires embedded in the encapsulant. The height of the spacer may be greater than the height of the encapsulated bonding wire from the bottom surface of the semiconductor package. The spacer may be formed of a bar or a protrusion. In a stack package using the semiconductor package, the spacer may be provided between a semiconductor chip of a lower semiconductor package and an encapsulant of an upper semiconductor package.