Patents by Inventor Selvaraj Palanisamy Chinnathambi
Selvaraj Palanisamy Chinnathambi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20190367774Abstract: The invention provides a chemical-mechanical polishing composition comprising (a) an abrasive comprising colloidal silica and fused silica, (b) a compound of formula (I) or a combination of a compound of formula (II) and a hydrophobic organic compound, (c) an amino acid, (d) hydrogen peroxide, and (e) water, wherein the polishing composition has a pH of about 1 to about 5. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting the substrate with the inventive chemical-mechanical polishing composition.Type: ApplicationFiled: June 5, 2018Publication date: December 5, 2019Inventor: Selvaraj PALANISAMY CHINNATHAMBI
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Patent number: 10479911Abstract: The invention provides a chemical-mechanical polishing composition comprising (a) an abrasive comprising colloidal silica and fused silica, (b) a compound of formula (I) or a combination of a compound of formula (II) and a hydrophobic organic compound, (c) an amino acid, (d) hydrogen peroxide, and (e) water, wherein the polishing composition has a pH of about 1 to about 5. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting the substrate with the inventive chemical-mechanical polishing composition.Type: GrantFiled: June 5, 2018Date of Patent: November 19, 2019Assignee: Cabot Microelectronics CorporationInventor: Selvaraj Palanisamy Chinnathambi
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Patent number: 10315285Abstract: The invention provides a chemical-mechanical polishing composition and a method of chemically-mechanically polishing a substrate, such as a nickel-phosphorous substrate. The composition contains water, silica particles, a first alcohol comprising one or more of monohydric alcohol, polyhydric alcohol, and diglycol, a second alcohol in the form of polyvinyl alcohol, a nickel complexing agent, and optionally hydrogen peroxide, pH adjuster, and/or biocide. The method involves contacting the substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: April 5, 2016Date of Patent: June 11, 2019Assignee: Cabot Microelectronics CorporationInventors: Tong Li, Michael White, Selvaraj Palanisamy Chinnathambi, Ke Zhang
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Patent number: 9909032Abstract: The invention provides a chemical-mechanical polishing composition containing aluminate-modified silica particles, a polyacrylamide, a heterocyclic film-forming agent, and water. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: January 15, 2014Date of Patent: March 6, 2018Assignee: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Michael White
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Patent number: 9534147Abstract: The invention provides a polishing composition that contains (a) ?-alumina particles that have an average particle size of about 250 nm to about 300 nm, (b) a per-type oxidizing agent, (c) a complexing agent, wherein the complexing agent is an amino acid or an organic acid, and (d) water. The invention also provides a method of polishing a substrate, especially a nickel-phosphorous substrate, with the polishing composition.Type: GrantFiled: October 16, 2014Date of Patent: January 3, 2017Assignee: Cabot Microelectronics CorporationInventors: Hon Wu Lau, Selvaraj Palanisamy Chinnathambi, Ke Zhang
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Patent number: 9469787Abstract: A chemical mechanical polishing (CMP) composition for planarizing a nickel phosphorus (NiP) substrate comprises a suspension of colloidal silica particles and fused silica particles in an acidic aqueous carrier containing hydrogen peroxide, in which the concentration of the fused silica particles is less than or equal to the concentration of the colloidal silica particles. In some embodiments, the CMP composition includes a primary complexing agent, a secondary complexing agent, and a metal ion such as ferric ion, which is capable of reversible oxidation and reduction in the presence of hydrogen peroxide and NiP.Type: GrantFiled: October 13, 2015Date of Patent: October 18, 2016Assignee: Cabot Microelectronics CorporationInventors: Ke Zhang, Selvaraj Palanisamy Chinnathambi
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Publication number: 20160288290Abstract: The invention provides a chemical-mechanical polishing composition and a method of chemically-mechanically polishing a substrate, such as a nickel-phosphorous substrate. The composition contains water, silica particles, a first alcohol comprising one or more of monohydric alcohol, polyhydric alcohol, and diglycol, a second alcohol in the form of polyvinyl alcohol, a nickel complexing agent, and optionally hydrogen peroxide, pH adjuster, and/or biocide. The method involves contacting the substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: ApplicationFiled: April 5, 2016Publication date: October 6, 2016Inventors: Tong LI, Michael WHITE, Selvaraj PALANISAMY CHINNATHAMBI, Ke ZHANG
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Patent number: 9330703Abstract: The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, a complexing agent, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: June 4, 2009Date of Patent: May 3, 2016Assignee: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Publication number: 20160102227Abstract: A chemical mechanical polishing (CMP) composition for planarizing a nickel phosphorus (NiP) substrate comprises a suspension of colloidal silica particles and fused silica particles in an acidic aqueous carrier containing hydrogen peroxide, in which the concentration of the fused silica particles is less than or equal to the concentration of the colloidal silica particles. In some embodiments, the CMP composition includes a primary complexing agent, a secondary complexing agent, and a metal ion such as ferric ion, which is capable of reversible oxidation and reduction in the presence of hydrogen peroxide and NiP.Type: ApplicationFiled: October 13, 2015Publication date: April 14, 2016Inventors: Ke ZHANG, Selvaraj PALANISAMY CHINNATHAMBI
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Publication number: 20150197669Abstract: The invention provides a chemical-mechanical polishing composition containing aluminate-modified silica particles, a polyacrylamide, a heterocyclic film-forming agent, and water. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: ApplicationFiled: January 15, 2014Publication date: July 16, 2015Inventors: Selvaraj PALANISAMY CHINNATHAMBI, Michael WHITE
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Patent number: 9039914Abstract: The invention provides a chemical-mechanical polishing composition containing wet-process silica, an oxidizing agent that oxidizes nickel-phosphorous, a chelating agent, polyvinyl alcohol, and water. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: May 23, 2012Date of Patent: May 26, 2015Assignee: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Publication number: 20150114929Abstract: The invention provides a polishing composition that contains (a) ?-alumina particles that have an average particle size of about 250 nm to about 300 nm, (b) a per-type oxidizing agent, (c) a complexing agent, wherein the complexing agent is an amino acid or an organic acid, and (d) water. The invention also provides a method of polishing a substrate, especially a nickel-phosphorous substrate, with the polishing composition.Type: ApplicationFiled: October 16, 2014Publication date: April 30, 2015Inventors: Hon Wu LAU, Selvaraj Palanisamy Chinnathambi, Ke Zhang
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Publication number: 20130313226Abstract: The invention provides a chemical-mechanical polishing composition containing wet-process silica, an oxidizing agent that oxidizes nickel-phosphorous, a chelating agent, polyvinyl alcohol, and water. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: ApplicationFiled: May 23, 2012Publication date: November 28, 2013Applicant: CABOT MICROELECTRONICS CORPORATIONInventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Patent number: 8557137Abstract: The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, oxalic acid, optionally, tartaric acid, optionally, a nonionic surfactant, optionally, a biocide, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: July 11, 2012Date of Patent: October 15, 2013Assignee: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Patent number: 8518135Abstract: The invention provides a polishing composition that contains (a) an abrasive comprising (i) first alpha alumina particles that have an average aspect ratio of 0.8:1 to 1.2:1, (ii) second alpha alumina that have an average aspect ratio of greater than 1.2:1, (iii) fumed alumina particles, and (iv) wet-process silica particles, and (b) water. The invention also provides a method of polishing a substrate, especially a nickel-phosphorous substrate, with the polishing composition.Type: GrantFiled: August 27, 2012Date of Patent: August 27, 2013Assignee: Cabot Microelectronics CorporationInventors: Rujee Lorpitthaya, Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Publication number: 20120273715Abstract: The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, oxalic acid, optionally, tartaric acid, optionally, a nonionic surfactant, optionally, a biocide, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: ApplicationFiled: July 11, 2012Publication date: November 1, 2012Inventors: Selvaraj PALANISAMY CHINNATHAMBI, Haresh SIRIWARDANE
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Patent number: 8226841Abstract: The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, oxalic acid, optionally, tartaric acid, optionally, a nonionic surfactant, optionally, a biocide, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: February 3, 2009Date of Patent: July 24, 2012Assignee: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Patent number: 7922926Abstract: The invention provides a chemical-mechanical polishing composition consisting essentially of flumed alumina, alpha alumina, silica, a nonionic surfactant, an additive compound selected from the group consisting of glycine, alanine, iminodiacetic acid, and maleic acid, hydrogen peroxide, and water. The invention further provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: GrantFiled: January 8, 2008Date of Patent: April 12, 2011Assignee: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Ping-Ha Yeung, Brian Reiss
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Publication number: 20100308016Abstract: The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, a complexing agent, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: ApplicationFiled: June 4, 2009Publication date: December 9, 2010Inventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane
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Publication number: 20100193470Abstract: The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, oxalic acid, optionally, tartaric acid, optionally, a nonionic surfactant, optionally, a biocide, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.Type: ApplicationFiled: February 3, 2009Publication date: August 5, 2010Applicant: Cabot Microelectronics CorporationInventors: Selvaraj Palanisamy Chinnathambi, Haresh Siriwardane