Abstract: Provided are a field mounting-type test apparatus and method, which can enhance competitiveness of a product by simulating various test conditions including a mounting environment so as to improve quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment so as to reduce testing time and cost. In accordance with example embodiments, the field mounting-type test apparatus may include a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT by using the logic data.

Abstract: An RF receiver and a method by which the RF receiver removes interference signals are provided. The RF receiver includes a first signal processor which detects an undesired signal from RF signals received through a channel, to convert the phase of the detected signal; and a second signal processor which combines the signal output from the first signal processor with the received RF signals, to detect a desired signal. Therefore, it is possible to remove undesired signals existing on channels in which there is no overlap in frequency between desired signals and undesired signals, and accordingly an RF receiver having enhanced performance and a method by which the RF receiver removes interference signals may be provided.

Abstract: Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA.

Abstract: A display device capable of reducing afterimage, and an afterimage reduction method used by the display device. One or more afterimage reduction patterns having one or more opaque areas, and/or one or more semi-transparent areas and one or more non-opaque areas are stored in a storage unit. A composition unit outputs a final image composed of a displayed main image and afterimage reduction patterns output from the storage unit. A control unit causes afterimage reduction patterns selected by a user from the storage unit to be input to the composition unit, and a final image in which only pixels corresponding to opaque areas and/or semi-transparent areas in the main image are replaced by color of the opaque areas and/or semi-transparent areas in the afterimage reduction patterns to be output from the composition unit. Accordingly, it is possible to view a received main image while reducing afterimage using images of various patterns for afterimage reduction.

Abstract: Disclosed herein is a method of preparing a 188Re-tricarbonyl complex for radiopharmaceutical use and of preparing a precursor thereof, and a contrast agent using the same. Particularly, this invention provides a method of preparing a 188Re-tricarbonyl precursor by reacting perrhenate with borane-ammonia (BH3.NH3), potassium boranocarbonate (K2[H3BCO2]) and phosphate in the presence of borohydride exchange resin as a reducing agent, and a method of preparing a 188Re-tricarbonyl complex by reacting the 188Re-tricarbonyl precursor with a ligand. According to the method of this invention, the borohydride exchange resin is used as a reducing agent and as an anion scavenger, thereby obtaining the 188Re-tricarbonyl precursor and complex having high radiolabeling yield and high purity. In addition, the 188Re-tricarbonyl complex can be used as a contrast agent having excellent plasma stability.

Abstract: A calibration method and a semiconductor testing apparatus, including N drivers, N being a natural number no less than two, at least one transmission path coupled to at least one of the N drivers, at least one calibration board coupled to the at least one transmission path, N comparators, and N delay paths, such that each delay path of the N delay paths has a skew value and is coupled between the calibration board and one of the N comparators.

Abstract: A calibration jig for adjusting timing and an apparatus equipped with such a calibration jig, including calibration block, at least one calibration board attached to the calibration block to form a securing platform for at least one test component, and a plurality of calibration terminals integral to the calibration board to provide improved calibration accuracy and timing.

Abstract: A control method of a display apparatus having a video signal processing unit to process input first and second video signals in a PIP mode, and a display unit on which the first and second video signals processed by the video signal processing unit are displayed, includes processing the first and the second video signals in the PIP mode when a PIP function is selected, and displaying the first video signal as a main screen and the second video signal as a sub screen on the display unit, and adjusting transparency of the sub screen when predetermined conditions are satisfied. Adjustment of the transparency of the sub screen improves user's convenience in viewing the main screen in the PIP mode.

Abstract: A display apparatus having a display includes a user input part including a function-adjusting selector to transmit a function-adjusting signal and a locking selector to select a locking function, and a controller to perform a function according to the function-adjusting signal received from the function-adjusting selector, and to disable the function according to the function-adjusting signal if the locking function is selected through the locking selector. The display apparatus and a control method thereof prevent unauthorized users from using the display apparatus since a function according to a function-adjusting signal input to the display apparatus is not performed if the locking function is active.