Abstract: A memory device including a parity check circuit and a mask circuit may be provided. The parity check circuit may perform parity check on data sampled according to a data strobe signal, which does not include a post-amble. The mask circuit may generate a parity error signal based on results of the parity check, and output the parity error signal during a time period determined according to a burst length of the data.

Abstract: An input-output circuit includes a reception circuit and a register circuit. The reception circuit operates in accordance with a normal write protocol commonly in a normal write mode and a test write mode. The reception circuit receives a plurality of input signals to generate a plurality of latch signals. The register circuit generates a plurality of test result signals based on the latch signals in the test write mode. The input-output circuit may perform the multiple-input shift register (MISR) function in accordance with the normal write path and the normal write protocol. The MISR function may be performed efficiently without consideration of additional timing adjustment for the test write operation because the MISR function is performed under the same timing condition as the normal write operation.

Abstract: Disclosed are a method and a device for detecting a short circuit between adjacent micro-bumps. The method includes setting outputs of a pull-up driver and a pull-down driver of a data output circuit connected with a micro-bump to be suitable for a test type and determining whether a short circuit is generated.

Abstract: Provided is a memory device configured to perform a calibration operation without having a ZQ pin. The memory device includes a calibration circuit configured to generate a pull-up calibration code and a pull-down calibration code which termination of a data input/output pad for impedance matching in the data input/output pad is controlled. The calibration circuit performs a first calibration operation for trimming first and second reference resistors based on an external resistor to be connected to a pad, and a second calibration operation for generating the pull-up calibration code and the pull-down calibration code based on the trimmed second reference resistor.

Abstract: A method and apparatus are provided to generate tomography images that performs the method. The apparatus and method are configured to determine a basis pattern from modulated phases of incident rays from a spatial light modulator according to a pattern of arranged pixels. The apparatus and method are further configured to perform spatial shift modulation shifting an arrangement of the pixels vertically or horizontally with respect to the basis pattern to obtain shift patterns of the basis pattern. The apparatus and method are configured to generate tomography images for the basis pattern and the shift patterns using spectrum signals of rays obtained from the incident rays passing through the spatial light modulator and entering a subject. The apparatus and method are configured to select a pattern that generates a clearest tomography image of the subject based on the generated tomography images.

Abstract: A self bias buffer circuit includes a buffer and bias controller. The buffer provides a self bias voltage based on a reference voltage and to be driven based on the self bias voltage. The buffer also generates an output signal based on a comparison of an input signal and the reference voltage. The bias controller adjusts the self bias voltage based on the reference voltage.

Abstract: A method for forming a three-dimensional holographic image includes identifying a transmission matrix of a scattering material, calculating an incident wave-front corresponding to wave-front information for forming a three-dimensional holographic image, using the identified transmission matrix, and forming the calculated incident wave-front by controlling a wave-front control to modulate a light projected from a light source and forming a three-dimensional holographic image.

Abstract: A compensation circuit for use with an input buffer includes an input buffer configured to amplify an input signal and output a compensated signal. A process detector includes a replica of the input buffer. The process detector is configured to output at least one comparison signal indicating a variation in the input buffer. The input buffer controls an output signal based on the at least one comparison signal.

Abstract: Provided is a database management system (DBMS). The DBMS synchronizes an active node with a standby node and detects a point of time when last synchronization is performed between the active node and the standby node. Then, after the DBMS performs page synchronization from the detected point of time of the last synchronization to a point at which a failover occurs in the active node, the DBMS performs partial log synchronization by receiving a log from the standby node after the point of time of the last synchronization until the active node is recovered.

Abstract: A tomographic image generation apparatus includes a light source unit configured to emit light to be used for scanning an object; an optical control unit configured to control a direction of propagation of light; an optical coupler configured to divide and combine incident light; a plurality of optical systems optically connected to the optical coupler; and a modulation and correction device configured to modulate and correct the light to be used for scanning the object. The modulation and correction device may be disposed between the optical control unit and the optical coupler, or may be included in an optical system that irradiates light onto the object among the plurality of optical systems. The modulation and correction device may only modulate light that is reflected to the object.

Abstract: A method for forming a three-dimensional holographic image includes identifying a transmission matrix of a scattering material, calculating an incident wave-front corresponding to wave-front information for forming a three-dimensional holographic image, using the identified transmission matrix, and forming the calculated incident wave-front by controlling a wave-front control to modulate a light projected from a light source and forming a three-dimensional holographic image.

Abstract: A self bias buffer circuit includes a buffer and bias controller. The buffer provides a self bias voltage based on a reference voltage and to be driven based on the self bias voltage. The buffer also generates an output signal based on a comparison of an input signal and the reference voltage. The bias controller adjusts the self bias voltage based on the reference voltage.

Abstract: Techniques are provided for sensing memory cells in a 3D stacked non-volatile memory device in a way which reduces read disturb, by using read pass voltages which are adjusted based on variations in a memory hole diameter. The memory cells are in NAND strings which extend in the memory holes. A larger read pass voltage is used for memory cells which are adjacent to wider portions of the memory holes, and a smaller read pass voltage is used for memory cells which are adjacent to narrower portions of the memory holes. This approach reduces the worst-case read disturb. Further, an overall resistance in the NAND string channel may be substantially unchanged so that a reference current used during sensing may be unchanged. The read pass voltage may be set based on a program voltage trim value, which is indicative of programming speed and memory hole diameter.

Abstract: Techniques are provided for sensing memory cells in a 3D stacked non-volatile memory device in a way which reduces read disturb, by using read pass voltages which are adjusted based on variations in a memory hole diameter. The memory cells are in NAND strings which extend in the memory holes. A larger read pass voltage is used for memory cells which are adjacent to wider portions of the memory holes, and a smaller read pass voltage is used for memory cells which are adjacent to narrower portions of the memory holes. This approach reduces the worst-case read disturb. Further, an overall resistance in the NAND string channel may be substantially unchanged so that a reference current used during sensing may be unchanged. The read pass voltage may be set based on a program voltage trim value, which is indicative of programming speed and memory hole diameter.

Abstract: There is provided a semiconductor light emitting device including a conductive substrate, a first electrode layer, an insulating layer, a second electrode layer, a second semiconductor layer, an active layer, and a first semiconductor layer that are sequentially stacked. The contact area between the first electrode layer and the first semiconductor layer is 3% to 13% of the total area of the semiconductor light emitting device, and thus high luminous efficiency is achieved.

Abstract: A compensation circuit for use with an input buffer includes an input buffer configured to amplify an input signal and output a compensated signal. A process detector includes a replica of the input buffer. The process detector is configured to output at least one comparison signal indicating a variation in the input buffer. The input buffer controls an output signal based on the at least one comparison signal.

Abstract: An erase operation for a 3D stacked memory device adjusts a start time of an erase period and/or a duration of the erase period for each storage element based on a position of the storage element. A voltage is applied to one or both drive ends of a NAND string to pre-charge a channel to a level which is sufficient to create gate-induced drain leakage at the select gate transistors. With timing based on a storage element's distance from the driven end, the control gate voltage is lowered to encourage tunneling of holes into a charge trapping layer in the erase period. The lowered control gate voltage results in a channel-to-control gate voltage which is sufficiently high to encourage tunneling. The duration of the erase period is also increased when the distance from the driven end is greater. As a result, a narrow erase distribution can be achieved.

Abstract: An erase operation for a 3D stacked memory device adjusts a start time of an erase period and/or a duration of the erase period for each storage element based on a position of the storage element. A voltage is applied to one or both drive ends of a NAND string to pre-charge a channel to a level which is sufficient to create gate-induced drain leakage at the select gate transistors. With timing based on a storage element's distance from the driven end, the control gate voltage is lowered to encourage tunneling of holes into a charge trapping layer in the erase period. The lowered control gate voltage results in a channel-to-control gate voltage which is sufficiently high to encourage tunneling. The duration of the erase period is also increased when the distance from the driven end is greater. As a result, a narrow erase distribution can be achieved.

Abstract: An erase operation for a 3D stacked memory device adjusts a start time of an erase period and/or a duration of the erase period for each storage element based on a position of the storage element. A voltage is applied to one or both drive ends of a NAND string to pre-charge a channel to a level which is sufficient to create gate-induced drain leakage at the select gate transistors. With timing based on a storage element's distance from the driven end, the control gate voltage is lowered to encourage tunneling of holes into a charge trapping layer in the erase period. The lowered control gate voltage results in a channel-to-control gate voltage which is sufficiently high to encourage tunneling. The duration of the erase period is also increased when the distance from the driven end is greater. As a result, a narrow erase distribution can be achieved.

Abstract: Provided is a shaft supporting structure, an optical pickup moving structure including the shaft supporting structure, and an optical disc drive. The shaft supporting structure includes a base chassis, a shaft installed on the base chassis, an axis support that supports an end of the shaft, and a rotatable locker for preventing the shaft from being separated from the axis support.