Abstract: Various embodiments of the present disclosure disclose improved BIST systems and methods for testing digital devices. A method for testing a digital device includes receiving, based at least in part on an input signal, an output signal from a device under testing (DUT). The output signal is processed to generate a noise signal and a recovered signal for the DUT. The controller may generate a signal to noise power ratio based at least in part on the noise and recovered signals and compare the signal to noise power ratio to a predetermined power threshold to generate a performance metric.

Abstract: An integrated circuit includes a first subsystem including a first clock generator configured to generate a first clock signal. The integrated circuit also includes a second subsystem including a second clock generator configured to generate a second clock signal. The first subsystem includes an edge detector configured to detect an edge of the second clock signal. The first clock generator generates the first clock signal with a selected phase relative to the second clock signal based on the edge of the second clock signal.

Abstract: An online system manages presentation of content items in various presentation contexts such as when the users are browsing pages or when the users have entered a search query. The online system trains a single unified machine learning model that predicts one or more likelihoods of a target event associated with presentation of a content item in the different presentation contexts. The learned model is applied to a set of candidate content items associated with a presentation opportunity in a specific context. Features that are inapplicable to the specific context may be masked when applying the model. The online system may select between the candidate content items based on the predicted likelihoods using the model trained across the multiple different contexts, such that the prediction for one context may be based in part on learned outcomes in other related contexts.

Abstract: An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multibit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digital-to-analog converter (FIR DAC). The FIR DAC converts the single-bit digital stream to an analog test signal. The analog test signal is then passed to the CTDS ADC. The CTDS ADC converts the analog test signal to digital test data. The test circuit analyzes the digital test data to determine the accuracy of the CTDS ADC.

Abstract: A data weighted averaging (DWA) data word in a standard or normal form unary code format is first converted to a thermometer control word in an alternative or spatial form unary code format. The thermometer control word is then converted from the alternative or spatial form unary code format to output a corresponding binary word.

Abstract: A method and apparatus for performing an on-system built-in self-test of a converter are provided. In the method, a controller generates a test signal and outputs the test signal to the converter. The controller receives a response signal from the converter and determines a plurality of bin powers of a plurality of bins, respectively, of a frequency domain signal representative of the response signal. The controller determines a figure of merit for the converter based on a first bin power of a first bin of the plurality of bin powers, where the first bin corresponds to a frequency of the test signal.

Abstract: An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.

Abstract: An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multi-bit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digital-to-analog converter (FIR DAC). The FIR DAC converts the single-bit digital stream to an analog test signal. The analog test signal is then passed to the CTDS ADC. The CTDS ADC converts the analog test signal to digital test data. The test circuit analyzes the digital test data to determine the accuracy of the CTDS ADC.

Abstract: An integrated circuit includes a first subsystem including a first clock generator configured to generate a first clock signal. The integrated circuit also includes a second subsystem including a second clock generator configured to generate a second clock signal. The first subsystem includes an edge detector configured to detect an edge of the second clock signal. The first clock generator generates the first clock signal with a selected phase relative to the second clock signal based on the edge of the second clock signal.

Abstract: A data weighted averaging (DWA) data word in a standard or normal form unary code format is first converted to a thermometer control word in an alternative or spatial form unary code format. The thermometer control word is then converted from the alternative or spatial form unary code format to output a corresponding binary word.

Abstract: An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.

Abstract: A method and apparatus for performing an on-system built-in self-test of a converter are provided. In the method, a controller generates a test signal and outputs the test signal to the converter. The controller receives a response signal from the converter and determines a plurality of bin powers of a plurality of bins, respectively, of a frequency domain signal representative of the response signal. The controller determines a figure of merit for the converter based on a first bin power of a first bin of the plurality of bin powers, where the first bin corresponds to a frequency of the test signal.

Abstract: An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.

Abstract: An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multi-bit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digital-to-analog converter (FIR DAC). The FIR DAC converts the single-bit digital stream to an analog test signal. The analog test signal is then passed to the CTDS ADC. The CTDS ADC converts the analog test signal to digital test data. The test circuit analyzes the digital test data to determine the accuracy of the CTDS ADC.

Abstract: An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for hybrid dual write. An apparatus includes a memory device comprising a plurality of single level cell blocks and a plurality of multi level cell blocks. An apparatus includes a hybrid writing component. A hybrid writing component includes a single level writing circuit that writes data to a plurality of single level cell blocks. A hybrid writing component includes a multi level writing circuit that copies data from a plurality of single level cell blocks to a plurality of multi level cell blocks. A hybrid writing component includes a control circuit that controls data to be copied from a single level cell block of a plurality of single level cell blocks to at least two multi level cell blocks of a plurality of multi level cell blocks.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for hybrid dual write. An apparatus includes a memory device comprising a plurality of single level cell blocks and a plurality of multi level cell blocks. An apparatus includes a hybrid writing component. A hybrid writing component includes a single level writing circuit that writes data to a plurality of single level cell blocks. A hybrid writing component includes a multi level writing circuit that copies data from a plurality of single level cell blocks to a plurality of multi level cell blocks. A hybrid writing component includes an allocation circuit that allocates a single level cell block of a plurality of single level cell blocks to a first stream in response to a multi level cell block of a plurality of multi level cell block being allocated to the first stream.

Abstract: Apparatuses, systems, methods, and computer program products are disclosed for hybrid dual write. An apparatus includes a memory device comprising a plurality of single level cell blocks and a plurality of multi level cell blocks. An apparatus includes a hybrid writing component. A hybrid writing component includes a single level writing circuit that writes data to a plurality of single level cell blocks. A hybrid writing component includes a multi level writing circuit that copies data from a plurality of single level cell blocks to a plurality of multi level cell blocks. A hybrid writing component includes a grouping circuit that directs a single level writing circuit to write data corresponding to a first logical group to a set of single level cell blocks of a plurality of single level cell blocks.

Abstract: A graphics server and method for streaming rendered content via a remote graphics rendering service is provided. In one embodiment, the server includes a memory, a graphics renderer, a frame capturer, an encoder, and a processor. The memory is configured to store a pre-computed skip-frame message indicative to a client to re-use a previously transmitted frame of the video stream. The graphics renderer is configured to identify when rendered content has not changed. When the graphics renderer identifies that the rendered content has not changed, the processor is configured to cause: (1) the frame capturer to not capture the frames of the rendered content; (2) the encoder to not encode the frames of the rendered content; and (3) the pre-encoded skip-frame message to be transmitted without requiring any pixel processing.