Abstract: A controller for a memory device has a power control section to control power to a memory element in an operation mode and in a retention mode. A monitoring section receives and monitors error information and a storage section stores a retention parameter. In the operation mode, the power control section causes an operation voltage to be applied to the memory element, and in the retention mode, the power control section causes a time-varying voltage to be applied to the memory. The power control section also causes the voltage across the memory element to change in the retention mode between a first retention voltage and a second retention voltage based on the retention parameter.

Abstract: A low power State Retention Power Gating (SRPG) cell has a retention component and a non-retention component, and is operable in a run state, a first retention state, and a second retention state. In the run state, the retention and non-retention components are powered with a supply voltage. In the first retention state, the retention component is powered at the same supply voltage as in the run state, and the non-retention component is powered down. In the second retention state, the retention component is powered at a lower supply voltage than in the run state, and the non-retention component is powered down.

Abstract: A state retention power gated (SRPG) cell includes a retention circuit coupled to a power gated circuit. The retention circuit stores state information of the power gated circuit before a low power period is started. A gated power supply coupled to the power gated circuit and to a first end of a power supply switch supplies a gated supply voltage to the power gated circuit during a non-low power period. A local power supply coupled to the retention circuit and to a second end of the power supply switch is coupled to the gated power supply in the non-low power period, and a non-gated power supply is coupled to the local power supply via an isolation element to isolate the non-gated power supply from the local power supply during the non-low power period, and to couple the non-gated power supply to the local power supply during the low power period.

Abstract: A digital decoder, used in a reconfigurable circuit, for decoding digital pulses includes a phase indicator module having inputs coupled to a reference pulse input and a data pulse input. The phase indicator module has timing information outputs that provide logic values indicative of rising and falling edges of pulses occurring on the reference pulse input and the data pulse input. A phase decoder module has inputs coupled to the timing information outputs, and outputs decoded binary data values. In operation, the phase decoder module compares at least two of the logic values at the timing information outputs with a signal representative leading and trailing edges of a pulse applied to one of the phase inputs to determine a pulse arrival order sequence on the phase inputs and thereby provide the decoded binary data values.

Abstract: A configurable flip-flop can be operated in a normal mode and a buffer mode. In the normal mode, the flip-flop latches data at the flip-flop input based on a clock signal. In the buffer mode, the flip-flop provides data at the flip-flop input to the flip-flop output, independent of the clock signal.

Abstract: A system for performing a scan test on an integrated circuit such as a System on a Chip (SoC) that may be packaged in different package types and with different features enabled includes a bypass-signal generator and a first scan-bypass circuit. The bypass-signal generator generates a first bypass signal based on chip package information. The first bypass signal indicates whether a first scan chain associated with a first non-common circuit block of the SoC is to be bypassed. The first scan chain is bypassed in response to the first bypass signal. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.

Abstract: A system for prototyping an integrated circuit (IC) that has a mixed signal intellectual property (IP) core includes implementing the IP core using discrete programmable digital ICs and discrete analog ICs by partitioning the IP core into a digital IP portion and an analog IP portion.

Abstract: A low power scan flip-flop cell includes a multiplexer, a master latch, a scan slave latch and a data slave latch. The master latch is connected to the multiplexer, and used for generating a first latch signal. The scan slave latch is connected to the master latch, and generates a scan output (SO) signal. The data slave latch is connected to the master latch, and generates a Q output depending on a scan enable (SE) input signal and the first latch signal. The Q output is maintained at a predetermined level during scan mode, which eliminates unnecessary switching of combinational logic connected to the scan flip-flop cell and thus reduces power consumption.

Abstract: A low power State Retention Power Gating (SRPG) cell has a retention component and a non-retention component, and is operable in a run state, a first retention state, and a second retention state. In the run state, the retention and non-retention components are powered with a supply voltage. In the first retention state, the retention component is powered at the same supply voltage as in the run state, and the non-retention component is powered down. In the second retention state, the retention component is powered at a lower supply voltage than in the run state, and the non-retention component is powered down.

Abstract: An electronic device such as a circuit board has a contact pad for connection to a contact of a component, and a pad portion interconnection. The contact pad has physically separate pad portions. The pad portion interconnection electrically connects the pad portions of the contact pad, independently of any mounted connection on the pad portions. Providing multiple pad portions for a single contact pad allows the contact pad to function even if one of the pad portions is damaged such as by peeling off. An example application is an EMC (Electromagnetic Compatibility) and/or ESD (Electro-Static Discharge) test circuit board.

Abstract: An amplifier applies a self-adapting voltage to an output terminal. A bias circuit provides a greater bias current in a first external connection condition, in the absence of a pull-up resistance connected to the output terminal, than when such a pull-up resistance is present. The amplifier applies a different voltage to the output terminal in the absence of a pull-up resistance than when such a pull-up resistance is present. The circuit can be used in a portable device for receiving charging current from a battery charger through a connector having a D+ pin for connection to the battery charger and connected to the amplifier output terminal for battery charger detection. The portable device can meet the USB battery charger specification rev. 1.2.

Abstract: A reconfigurable integrated circuit (IC) has IC interface terminals including circuit input terminals and circuit output terminals. A bypass controller and bypass circuitry are coupled to each other, and to at least one of the circuit input terminals and at least one of the circuit output terminals. A processing circuit has multiple circuit modules coupled to the bypass circuitry. The processing circuit is coupled to at least one of the circuit input terminals and at least one of the circuit output terminals. In operation the bypass controller controls the bypass circuitry to selectively couple at least one pair of the IC interface terminals together, the pair including one of the circuit input terminals and one of the circuit output terminals. When the pair of IC interface terminals are coupled together, at least one of the circuit modules is selectively de-coupled from the pair of the IC terminals.

Abstract: A System on a Chip (SoC) has a first set of switches, each having first terminals for routing SoC signals and a second terminal, and a second set of switches. Each switch of the second set of switches has third terminals for routing signals with the first set of switches, and a fourth terminal. A SoC control module defines a switching configuration, and includes a first memory portion for storing a first switching protocol for the first set of switches. This defines, for a switch of the first set of switches, an electrical path between one of the first terminals and the second terminal. A second memory portion stores a second switching protocol for the second set of switches, and defines, for a switch of the second set of switches, an electrical path between one of the third terminals and the fourth terminal.

Abstract: An electronic circuit includes a plurality of circuit blocks, a plurality of bias circuits, a switching circuit, and plurality of transistors. The plurality of circuit blocks each includes a high power terminal and a low power terminal. The switching circuit includes a plurality of switches for selectively coupling a bias circuit of the plurality of bias circuits to the low power terminal of a circuit block of the plurality of circuit blocks. Each bias circuit of the plurality of bias circuits is selectively couplable to the low power terminal of each of the plurality of circuit blocks. Each transistor of the plurality of transistors has a first current terminal coupled to a circuit ground terminal, and each transistor of the plurality of transistors has a control terminal for controlling the conductivity of the plurality of the transistors by a bias circuit of the plurality of bias circuits.

Abstract: A system for prototyping an integrated circuit (IC) that has a mixed signal intellectual property (IP) core includes implementing the IP core using discrete programmable digital ICs and discrete analog ICs by partitioning the IP core into a digital IP portion and an analog IP portion.

Abstract: A low power scan flip-flop cell includes a multiplexer, a master latch, a scan slave latch and a data slave latch. The master latch is connected to the multiplexer, and used for generating a first latch signal. The scan slave latch is connected to the master latch, and generates a scan output (SO) signal. The data slave latch is connected to the master latch, and generates a Q output depending on a scan enable (SE) input signal and the first latch signal. The Q output is maintained at a predetermined level during scan mode, which eliminates unnecessary switching of combinational logic connected to the scan flip-flop cell and thus reduces power consumption.

Abstract: A voltage level shifter has an input circuit with an inverter coupled to an input node, a pull-down control transistor with a gate coupled to a first node of the inverter, and a pull-up control transistor with a gate coupled to a second node of the inverter. Sources of the pull-down and pull-up control transistors are coupled to a low voltage reference. A transient connectivity limiter (TCL) has pull-down and pull-up transistors. Two control inputs are coupled to respective first and second nodes of the inverter and path inputs are coupled to respective drains of the pull-down and pull-up control transistors. An output circuit has inputs coupled to pull-up and pull-down nodes of the TCL. During a voltage level transition at the input node, the TCL connects the pull-up node to the low voltage reference through the TCL pull-up transistor transitioning from a saturation to a sub-threshold region of operation.

Abstract: A system for performing a scan test on an integrated circuit such as a System on a Chip (SoC) that may be packaged in different package types and with different features enabled includes a bypass-signal generator and a first scan-bypass circuit. The bypass-signal generator generates a first bypass signal based on chip package information. The first bypass signal indicates whether a first scan chain associated with a first non-common circuit block of the SoC is to be bypassed. The first scan chain is bypassed in response to the first bypass signal. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.

Abstract: A storage unit on an integrated circuit stores information that identifies a circuit on the integrated circuit, a selected operating condition, and a required operating configuration for the circuit for the selected operating condition. The manner of operating the circuit is changed to the required operating configuration in response to an operating condition of the circuit changing to the selected operating condition. This allows for efficiently identifying the few circuits that do not meet specified requirements based on a reduction in, for example, operating voltage, and altering their operation in order to meet the specified requirements relative to the reduced operating voltage without having to do so for the vast majority of the circuits that are able to meet the requirements at the lowered operating voltage.

Abstract: A system, electronic circuit, and method are disclosed. A method embodiment comprises receiving a control signal associated with a power gating operation mode of an electronic circuit, applying a reference voltage to the electronic circuit based upon the power gating operation mode, and maintaining data representing a state of a logic stage of the electronic circuit based upon the power gating operation mode. Maintaining comprises, in the described embodiment, storing data of a state of a first logic stage of the electronic circuit within a first storage element in a first power gating operation mode, and recovering data of a state of a second logic stage of the electronic circuit utilizing the data of the state of the first logic stage of the electronic circuit within the first storage element in a second power gating operation mode.