Abstract: A method for the configuration of a multi-static measuring device with an antenna arrangement, which is formed from several antenna clusters, each of which comprises several transmitting antennas and several receiving antennas, is characterized by the formation of configuration groups and associated group apertures. A configuration group is configured through the allocation of a subset of the antenna clusters of the antenna arrangement to a configuration group. At least one subset of the antenna clusters of this configuration group is configured as a receiving cluster in which exclusively the receiving antennas are activated. At least one subset of the antenna clusters of the configuration group are configured as transmitting clusters by activating the transmitting antennas. Microwave signals radiated from all transmitting antennas of all transmitting clusters of the configuration group and reflected on an object are measured in every receiving antenna of the receiving clusters of the configuration group.

Abstract: The present disclosure provides a method and a corresponding device for extending the illumination of an object under investigation. The object under investigation is illuminated with an electromagnetic microwave signal which is transmitted from a transmission antenna. The microwave signal reflected from the object under investigation is received by at least one reception antenna. An image of the object under investigation is reconstructed through synthetic focusing of the reflected microwave signal.

Abstract: An apparatus comprises: (1) measuring unit configured to transmit a signal towards the object and to determine a plurality of voxels, each comprising phase and magnitude of a reflected signal and spatial coordinates (comprising Z-axis, X-axis and Y-axis), and the voxels comprise a plurality of series of voxels along the Z-axis, each having a same X-coordinate and a same Y-coordinate; and (2) surface-determining unit comprising (a) magnitude unit configured to determine a maximum magnitude voxel for each series of voxels, (b) phase unit configured to determine, for each maximum magnitude voxel, phases of at least three voxels (maximum magnitude voxel and voxels adjacent thereto), (c) angle unit configured to determine, for each maximum magnitude voxel, a normal vector based on the respective phases, and (d) reconstructing unit configured to determine the object surface based on the spatial coordinates of the maximum magnitude voxels and the respective normal vectors.

Abstract: A method for the configuration of a multi-static measuring device with an antenna arrangement, which is formed from several antenna clusters, each of which comprises several transmitting antennas and several receiving antennas, is characterised by the formation of configuration groups and associated group apertures. A configuration group is configured through the allocation of a subset of the antenna clusters of the antenna arrangement to a configuration group. At least one subset of the antenna clusters of this configuration group is configured as a receiving cluster in which exclusively the receiving antennas are activated. At least one subset of the antenna clusters of the configuration group are configured as transmitting clusters by activating the transmitting antennas. Microwave signals radiated from all transmitting antennas of all transmitting clusters of the configuration group and reflected on an object are measured in every receiving antenna of the receiving clusters of the configuration group.

Abstract: The present disclosure provides a method and a corresponding device for extending the illumination of an object under investigation. The object under investigation is illuminated with an electromagnetic microwave signal which is transmitted from a transmission antenna. The microwave signal reflected from the object under investigation is received by at least one reception antenna. An image of the object under investigation is reconstructed through synthetic focusing of the reflected microwave signal.

Abstract: An analog retargeting system and method are disclosed for converting a circuit from a source technology to a target technology. Thus, an analog circuit in a source technology can be converted to another technology while maintaining substantially the same circuit behavior and specifications as the original design. The conversion includes analyzing and resizing the circuit at the device level. For example, the analysis may include determining a mode of operation for a transistor and resizing the transistor based on the mode of operation. In another example, the analysis may include determining node voltages coupled to a device and the resizing strategy may be adjusted based on the determined node voltages.

Abstract: An apparatus for testing integrated circuit devices includes a probe device having a plurality of probes, a first substrate including a product substrate having a first surface and an array of electrical contacts disposed on the first surface thereof, and a second substrate disposed between the probes and the first substrate for electrically coupling the probes to corresponding electrical contacts disposed on the first surface of the product substrate.

Abstract: An analog retargeting system and method are disclosed for converting a circuit from a source technology to a target technology. Thus, an analog circuit in a source technology can be converted to another technology while maintaining substantially the same circuit behavior and specifications as the original design. The conversion includes analyzing and resizing the circuit at the device level. For example, the analysis may include determining a mode of operation for a transistor and resizing the transistor based on the mode of operation. In another example, the analysis may include determining node voltages coupled to a device and the resizing strategy may be adjusted based on the determined node voltages.