Abstract: A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1?0.1?n2?n1+0.1 holds where n2 denotes a refractive index of the enclosure portion, and n1 denotes a refractive index of the device under test. Further, the first flat surface portion intersects at the right angle with a travel direction of the terahertz wave.

Abstract: According to the electromagnetic wave measurement device of the present invention, an electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changing unit changes a relative position of an intersection across which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. A characteristic value deriving unit derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector while the characteristic value is associated with an assumed relative position which is the relative position if it is assumed that the electromagnetic wave is not refracted by the device under test.

Abstract: The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A container 10 contains at least part of a device under test 1 to be measured by a terahertz wave measurement device. The container 10 includes a gap portion 11 that internally arranges at least a part of the device under test 1, and an enclosure portion 12 that includes a first curved surface portion S1, and a second curved surface portion S2, and arranges the gap portion 11 between the first curved surface portion S1 and the second curved surface portion S2, thereby enclosing the gap portion 11. Moreover, a relationship n1<n2 holds where n2 is the refractive index of the enclosure portion, and n1 is the refractive index of the device under test. Further, both the first curved surface portion S1 and the second curved surface portion S2 are convex surfaces.

Abstract: According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equal to or more than 0.

Abstract: Provided is an optical sampling apparatus that samples light to be measured having a pulse waveform, including a sampling light output section that outputs a first sampling light and a second sampling light, both having pulse waveforms of a spectrum different from that of the light to be measured; a first sampling section that includes a first nonlinear optical medium, which causes a nonlinear optical effect by causing at least a portion of the light to be measured and the first sampling light to pass therethrough and outputs light generated by the nonlinear optical effect, and that outputs at least a portion of the light generated by the nonlinear optical effect as a first output light; and a second sampling section that includes a second nonlinear optical medium, which causes a nonlinear optical effect by causing at least a portion of the first output light and the second sampling light to pass therethrough with a temporal overlap in order to output light generated by the nonlinear optical effect, and that

Abstract: Provided is an optical sampling apparatus that samples light to be measured having a pulse waveform, including a sampling light output section that outputs a first sampling light and a second sampling light, both having pulse waveforms of a spectrum different from that of the light to be measured; a first sampling section that includes a first nonlinear optical medium, which causes a nonlinear optical effect by causing at least a portion of the light to be measured and the first sampling light to pass therethrough and outputs light generated by the nonlinear optical effect, and that outputs at least a portion of the light generated by the nonlinear optical effect as a first output light; and a second sampling section that includes a second nonlinear optical medium, which causes a nonlinear optical effect by causing at least a portion of the first output light and the second sampling light to pass therethrough with a temporal overlap in order to output light generated by the nonlinear optical effect, and that

Abstract: The monochromator and the spectrometric method are disclosed wherein the measured beam converted into a parallel beam by a first collimator is diffracted by a plane diffraction grating, then the diffracted beam is returned so that the diffracted beam after the return is separated from that before the return along rulings of the plane diffraction grating, the diffracted beam is diffracted again by the plane diffraction grating, then the beam condensed by a second collimator is allowed to pass through an exit slit.

Abstract: A light-measuring device is disclosed for continuously and accurately measuring the intensity of light beams of from low intensity to high intensity. The intensity of a light beam to be measured is measured by a photodiode. A bias voltage is applied to the photodiode by a bias power source to improve the saturation characteristic. When the measured light beam is of high intensity, an analog switch and a photo MOS relay are switched on. When measuring a light beam with medium intensity, only the analog switch is turned off and a bias voltage is not applied to the photodiode. When measuring a light beam with low intensity, the bias voltage is not applied to the photodiode by switching off the photo MOS relay.

Abstract: A light power spectrum is accurately measured, in spite of the polarized light-dependency of the non-polarizing beam splitter 12. Incident light 11 is separated by a polarizing/separating element 31 into orthogonal polarized light components 11a and 11b. The orthogonal polarized light components have their polarizing directions rotated by 45 degrees in opposite directions with respect to their P wave components and S wave components at the reflecting/transmitting face of the non-polarizing beam splitter. The reflected and transmitted from the non-polarizing beam splitter 12 are reflected by a stationary reflector 16 and a moving reflector 17 back to the non-polarizing beam splitter 12 and are recombined to interfere with each other at the reflecting/transmitting face of the non-polarizing beam splitter. The resulting interference lights are received by a common light-receiver.

Abstract: A spectrum measuring device for measuring optical spectrum of input light includes first and second double-image elements which separate input light to be measured into two polarized wave components having respective planes of polarization perpendicularly intersecting each other and having different optical axes, a third double-image element which separates the two polarized wave components from the first and second double-image elements into four polarized wave components each two of which having respective planes of polarization perpendicularly intersecting each other and having different optical axes, a dispersing element which is irradiated by the four polarized wave components from the third double-image element in which the dispersing element separates optical components of each wavelength contained in the four polarized wave components at the same angle of separation, and a photodetector for measuring an overall intensity of the four polarized wave components of the same wavelength separated by the dis