Abstract: The present invention discloses a pipelined analog-to-digital converter (ADC) including a sub-ADC, a multiplying digital-to-analog converter (MDAC) and a decoder. The decoder provides a ground signal for the MDAC. The sub-ADC is electrically connected to a ground pad via a first metal trace, and the decoder is electrically connected to the ground pad via a second metal trace.

Abstract: A correction method and a correction circuit for a sigma-delta modulator (SDM) are disclosed. The SDM includes a loop filter, a quantizer, and a digital-to-analog converter (DAC), and the loop filter includes a resonator. The correction circuit includes a memory and a control circuit. The memory stores multiple program instructions. The control circuit executes the program instructions to correct the SDM. The correction procedure of the SDM includes the following steps: inputting a test signal to the SDM; obtaining a signal characteristic value of an output signal of the SDM; and adjusting the resonator according to the signal characteristic value.

Abstract: This invention discloses a successive approximation register analog-to-digital converter (SAR ADC) and a control circuit thereof. The SAR ADC includes a comparator, a switched-capacitor digital-to-analog converter (DAC), and a control circuit. The switched-capacitor DAC includes a capacitor and a driving circuit that is electrically connected to the capacitor. The driving circuit comprises a P-type MOSFET and an N-type MOSFET, and the gates of the two MOSFETs are not electrically connected. The P-type MOSFET is controlled by a first control signal, and the N-type MOSFET is controlled by a second control signal. The control circuit controls the voltage at one end of the capacitor to switch from a high voltage level to a low voltage level by controlling the rising edge of the first control signal to lead the rising edge of the second control signal.

Abstract: This invention discloses a control circuit and a control method of a successive approximation register analog-to-digital converter (SAR ADC). The SAR ADC includes a comparator and a switched-capacitor digital-to-analog converter (DAC). The control circuit includes a memory, an inverter and a data path. The memory is configured to store an output value of the comparator. The inverter has an output coupled to a first end of a capacitor of the switched-capacitor DAC. A second end of the capacitor is coupled to an input of the comparator. The data path, coupled between an output of the comparator and an input of the inverter, temporarily causes a voltage at the first end of the capacitor to be controlled by the output value of the comparator. The data path does not contain any memory.

Abstract: A front-end receiving circuit includes a first input terminal receiving a first signal, a second input terminal receiving a second signal, a comparator, a first sampling switch, a first sampling shifting circuit and a control circuit. The first sampling switch is coupled between the first input terminal and the first comparator input terminal. The first sample shifting circuit includes a first capacitor, a first reference voltage source, and a second reference voltage source. In a sampling mode, the control circuit is configured to control the first sampling switch and the second sampling switch to be turned on, and control the first shifting switch to be turned off. In a shifting mode, the control circuit is configured to control the first sampling switch and the second sampling to be turned off, and control the first shifting switch to be turned on.

Abstract: A digital-to-analog converter (DAC) device includes a DAC circuitry, a calibration circuitry, and a randomization circuitry. The DAC circuitry includes a first DAC circuit and a second DAC circuit. The first DAC circuit is configured to generate a first signal according to least significant bits of an input signal. The second DAC circuit is configured to output a second signal. The calibration circuitry is configured to compare the first signal with the second signal, in order to calibrate the second DAC circuit. The randomization circuitry is configured to randomize most significant bits of the input signal, in order to generate first control signals, in which the second DAC circuit is further configured to generate the second signal according to the most significant bits or the first control signals.

Abstract: A digital-to-analog converter (DAC) device includes a DAC circuitry and a calibration circuitry. The DAC circuitry generates a first signal according to least significant bits of an input signal, and generates a second signal according to most significant bits of the input signal. The calibration circuitry compares the first signal with the second signal to generate a calibration signal, and calibrates the DAC circuitry according to the calibration signal. The calibration signal has bits. The calibration circuitry further repeatedly compares the first signal and the second signal to generate a plurality of comparison results when determining at least one bit of the bits, and performs a statistic operation according to the comparison results, in order to adjust the at least one bit, and a number of the at least one bit is less than a number of the bits.

Abstract: The present invention discloses an analog-to-digital converter (ADC) including an analog circuit, a first switch, a second switch, a first capacitor, and a second capacitor. The analog circuit has a first input terminal and a second input terminal and is configured to amplify and/or compare signals on the first input terminal and the second input terminal. One end of the first capacitor is coupled to the first input terminal, and the other end receives an input voltage via the first switch. One end of the second capacitor is coupled to the first input terminal, and the other end receives a reference voltage via the second switch.

Abstract: A pipelined analog-to-digital converter includes: a first switched capacitor network, a first digital-to-analog converter, a second switched capacitor network, a second digital-to-analog converter, and an operational amplifier. The outputs from the first switched capacitor network and the first digital-to-analog converter form a first subtraction signal. The outputs from the second switched capacitor network and the second digital-to-analog converter form a second subtraction signal. The operational amplifier is arranged to operably generate an output signal based on the first subtraction signal or the second subtraction signal, and to operably switch coupling relationship of multiple candidate capacitors of the operational amplifier based on the magnitude of an input signal of a prior stage circuit, so that only a portion of the multiple candidate capacitors could be participated in the generation of the output signal at a time.

Abstract: A front-end receiving circuit includes a first input terminal receiving a first signal, a second input terminal receiving a second signal, a comparator, a first sampling switch, a first sampling shifting circuit and a control circuit. The first sampling switch is coupled between the first input terminal and the first comparator input terminal. The first sample shifting circuit includes a first capacitor, a first reference voltage source, and a second reference voltage source. In a sampling mode, the control circuit is configured to control the first sampling switch and the second sampling switch to be turned on, and control the first shifting switch to be turned off. In a shifting mode, the control circuit is configured to control the first sampling switch and the second sampling to be turned off, and control the first shifting switch to be turned on.

Abstract: An operational amplifier includes: a first gain stage for generating a second signal based on a first signal transmitted from a prior stage circuit; a second gain stage for generating an output signal based on the second signal; multiple candidate capacitors; and a capacitor selection circuit for switching the coupling relationship of the multiple candidate capacitors based on the magnitude of an input signal of the prior stage circuit, so that only a portion of the multiple candidate capacitors could be coupled to the second gain stage at a time.

Abstract: Disclosed is a bit error rate (BER) forecast circuit for successive approximation register analog-to-digital conversion. The BER forecast circuit includes an N bits successive approximation register analog-to-digital converter (N bits SAR ADC) and an estimation circuit. The N bits SAR ADC is configured to carry out a regular operation at least N times and an additional operation at least X time(s) in one cycle of conversion time, in which the N is an integer greater than 1 and the X is an integer not less than zero. The estimation circuit is configured to generate a test value according to total times the N bits SAR ADC carrying out the additional operation in Y cycles of the conversion time, in which the Y is a positive integer and the test value is related to the bit error rate of the N bits SAR ADC.

Abstract: A data converter and an impedance matching control method are provided. The data converter includes a comparator, a capacitor array as well as a switch and impedance matching circuit. The comparator includes a first input terminal and a second input terminal. The capacitor array includes a plurality of capacitors, and a first end of each capacitor is coupled to the first input terminal or the second input terminal. The switch and impedance matching circuit is coupled to a second end of a target capacitor among the capacitors and configured to couple the second end to a first reference voltage or a second reference voltage according to a control signal and adjust an impedance according to an impedance adjusting signal, in which the impedance is the impedance of the switch and impedance matching circuit. The first reference voltage is different from the second reference voltage.

Abstract: A sample-and-hold amplifier includes: a switched capacitor network for conducting a sample-and-hold operation on an input signal to generate a first signal; and an operational amplifier coupled with the switched capacitor network and including multiple candidate capacitors; wherein the operational amplifier is arranged to operably generate an output signal based on the first signal, and to operably switch coupling relationship of the multiple candidate capacitors based on the magnitude of the input signal, so that only a portion of the multiple candidate capacitors could be participated in the generation of the output signal at a time.

Abstract: An amplifier includes an output stage circuit and a compensation circuit. The output stage circuit includes a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The compensation circuit includes a first capacitor, a second capacitor, a third capacitor, and a fourth capacitor. The first capacitor is coupled between the first input terminal and the second output terminal, and is configured to operate as a first Miller capacitor. The second capacitor is coupled between the second input terminal and the first output terminal, and is configured to operate as a second Miller capacitor. The third capacitor and the fourth capacitor are configured to alternately operate as the first Miller capacitor and the second Miller capacitor according to at least one clock signal.

Abstract: A Successive Approximation Register (SAR) Analog-to-digital converter (ADC) includes: a digital-to-analog converter (DAC), a comparison circuit and a logic circuit. The DAC is configured to generate a transformed voltage according to a digital signal and a reference voltage, and the digital signal is generated by a digital signal generating circuit. The comparison circuit is coupled to the DAC and configured to compare the transformed voltage and an input voltage to generate a comparison result, and further configured to receive a control signal. The logic circuit is coupled to the comparison circuit, and configured to perform a logic transform operation upon the comparison result to generate an output signal to the digital signal generating circuit and the comparison circuit. The control signal controls the comparison circuit to enable or disable the SAR ADC.

Abstract: The present invention discloses a capacitor layout of a digital-to-analog conversion integrated circuit (DAC IC), comprising a first capacitor group, a second capacitor group and a third capacitor group. The first capacitor group, located within an interior layout area of the capacitor layout, determines a most significant bit (MSB) of the DAC IC and includes a plurality of capacitor units coupled between a first upper circuit and a first lower circuit. The second capacitor group, located within the interior layout area, determines a non-MSB bit of the DAC IC and includes at least one capacitor unit(s) coupled between a second upper circuit and a second lower circuit. The third capacitor group includes a plurality of capacitor units coupled between a third upper circuit and a third lower circuit which are not short-circuited; the capacitor units of the third capacitor group are disposed around the interior layout area.

Abstract: An analog to digital conversion apparatus that includes an analog to digital converter (ADC), a linearity calculating module and a calibration module is provided. The ADC includes a capacitor array, a comparator and a control circuit. The capacitor array receives an input signal to perform a capacitor-switching to generate a capacitor array output signal. The comparator compares the capacitor array output signal and a comparing signal to generate a digital code output result. The control circuit controls the capacitor-switching according to the digital code output result. The linearity calculating module generates a linearity related parameter according to the digital code output result. The calibration module generates a weighting parameter according to the linearity related parameter when the linearity related parameter is not within a predetermined range to adjust the digital code output result based on the weighting parameter to generate an adjusted digital code output result.

Abstract: A digital-to-analog converter (DAC) device includes a DAC circuitry, a calibration circuitry, and a randomization circuitry. The DAC circuitry includes a first DAC circuit and a second DAC circuit. The first DAC circuit is configured to generate a first signal according to least significant bits of an input signal. The second DAC circuit is configured to output a second signal. The calibration circuitry is configured to compare the first signal with the second signal, in order to calibrate the second DAC circuit. The randomization circuitry is configured to randomize most significant bits of the input signal, in order to generate first control signals, in which the second DAC circuit is further configured to generate the second signal according to the most significant bits or the first control signals.

Abstract: A self-test circuit and a self-test method for a comparator are provided. A first output terminal of the comparator is coupled to an input terminal of a first inverter, and a second output terminal of the comparator is coupled to an input terminal of a second inverter. The comparator operates in a reset phase or a comparison phase according to a clock. The self-test method includes steps of: coupling the first output terminal and the second output terminal so that the comparator enters a test mode; and in the test mode, controlling the comparator to operate in the reset phase or the comparison phase according to the clock. In the test mode, the first output terminal and the second output terminal have substantially the same voltage.