Abstract: An integrated circuit includes a horizontal routing track in a first metal layer, and a backside routing track in a backside metal layer. The backside metal layer and the first metal layer are formed at opposite sides of a semiconductor substrate. The horizontal routing track is conductively connected to a first terminal of a first transistor without passing through a routing track in another metal layer. The backside routing track is conductively connected to a second terminal of the first transistor without passing through a routing track in another metal layer. One of the first terminal and the second terminal is a gate terminal of the first transistor while another one the first terminal and the second terminal is either a source terminal or a drain terminal of the first transistor.

Abstract: A method of forming a semiconductor arrangement includes forming a first source pad over a semiconductor layer. A first nanosheet is formed contacting the first source pad. A gate pad is formed adjacent the first nanosheet. A first drain pad is formed over the gate pad and contacting the first nanosheet. A backside interconnect line is formed under the gate pad and the first source pad. A first backside contact is formed contacting at least one of the backside interconnect line, the first source pad, or the gate pad.

Abstract: A method of manufacturing a semiconductor device, including: providing a substrate including a first cell and a second cell; forming a plurality of first metal strips on a first plane; forming a first trench over a boundary between the first cell and the second cell, wherein a bottom surface of the first trench is located on a second plane over the first plane; filling the first trench with a non-conductive material, resulting in a separating wall; and forming a plurality of second metal strips on a third plane over the second plane, wherein the plurality of second metal strips comprise a first second metal strip and a second second metal strip separated from each other by the separating wall.

Abstract: An integrated circuit includes a strip structure having a front side and a back side. The integrated circuit includes a gate structure on the front side of the strip structure. The integrated circuit includes an isolation structure surrounding the strip structure. The integrated circuit includes a backside via in the isolation structure. The integrated circuit includes a contact over the strip structure, wherein a first portion of the contact extends into the isolation structure and contacts the backside via. The integrated circuit includes a backside power rail on the back side of the strip structure and in contact with the backside via.

Abstract: A semiconductor device includes a first transistor and a second transistor. The first transistor is of a first type in a first layer and includes a gate extending in a first direction and a first active region extending in a second direction perpendicular to the first direction. The second transistor is of a second type arranged in a second layer over the first layer and includes the gate and a second active region extending in the second direction. The semiconductor device further includes a first conductive line in a third layer between the first and second layers. The first conductive line electrically connects a first source/drain region of the first active region to a second source/drain region of the second active region. The gate comprises an intermediate portion disposed between the first active region and the second active region, wherein the first conductive line crosses the gate at the intermediate portion.

Abstract: A method of forming an integrated circuit (IC) package includes constructing a first power distribution structure on a first die included in the IC package, thereby electrically connecting the first power distribution structure to a second power distribution structure positioned on a back side of the first die, and bonding a third power distribution structure to the first power distribution structure, the third power distribution structure being positioned on a back side of a second die.

Abstract: An integrated circuit (IC) device includes a first plurality of active areas extending in a first direction and having a first pitch in a second direction perpendicular to the first direction, and a second plurality of active areas extending in the first direction, offset from the first plurality of active areas in the first direction, and having a second pitch in the second direction. A ratio of the second pitch to the first pitch is 3:2.

Abstract: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a first conductive pattern disposed within a first region from a top view perspective and extending along a first direction, a first phase shift circuit disposed within the first region, a first transmission circuit disposed within a second region from the top view perspective, and a first gate conductor extending from the first region to the second region along a second direction perpendicular to the first direction. The first phase shift circuit and the first transmission circuit are electrically connected with the first conductive pattern through the first gate conductor.

Abstract: A semiconductor device includes a first cell. The first cell includes: a first source/drain region and a second source/drain region in a first layer; a plurality of gate electrodes in a second layer, the plurality of gate electrodes defining at least one odd-numbered track and at least one even-numbered track; a first power rail extending in a second direction perpendicular to the first direction in a third layer; a first conductive via arranged in a fourth layer, the first conductive via being within a first odd-numbered track and non-overlapped with any of the plurality of gate electrodes from a top-view perspective; a second power rail extending in the second direction in a fifth layer; and a second conductive via arranged in a sixth layer, the second conductive via being within a first even-numbered track and non-overlapped with any of the plurality of gate electrodes from a top-view perspective.

Abstract: In some embodiments, an integrated circuit device includes a substrate having a frontside and a backside; one or more active semiconductor devices formed on the frontside of the substrate; conductive paths formed on the frontside of the substrate; and conductive paths formed on the backside of the substrate. At least some of the conductive paths formed on the backside of the substrate, and as least some of the conductive paths formed on the front side of the substrate, are signal paths among the active semiconductor devices. In in some embodiments, other conductive paths formed on the backside of the substrate are power grid lines for powering at least some of the active semiconductor devices.

Abstract: An integrated circuit includes a set of power rails, a set of active regions, a first set of conductive lines and a first and a second set of vias. The set of power rails is configured to supply a first or second supply voltage, and is on a first level of a back-side of a substrate. The set of active regions is a second level of a front-side of the substrate. The first set of conductive lines extend in a second direction and overlap the set of active regions. The first set of vias is between and electrically couples the set of active regions and the first set of conductive lines together. The second set of vias is between and electrically couples the first set of conductive lines and the set of power rails together.

Abstract: An IC package includes a first die including a front side and a back side, the front side including a first signal routing structure, the back side including a first power distribution structure, and a second die including a front side and a back side, the front side including a second signal routing structure, the back side including a second power distribution structure. The IC package includes a third power distribution structure positioned between the first and second power distribution structures and electrically connected to each of the first and second power distribution structures.

Abstract: A monolithic three dimensional integrated circuit is provided. The monolithic three dimensional integrated circuit includes a first cell layer having a first cell having a first active component of the monolithic three dimensional integrated circuit. A second layer having a second cell including a second active component. The second cell layer is formed vertically above the first cell layer. The first cell layer having the first active component and the second cell layer having the second active component are formed in a single die. The first cell has a smaller metal pitch than the second cell. A buried via electrically couples the first active component of the first cell of the first cell layer with the second active component of the second cell of the second cell layer.

Abstract: A semiconductor structure includes a plurality of cells. Each cell has a plurality of transistors, a plurality of inner metal lines, two first backside power lines and one second backside power line. The inner metal lines, the first backside power lines and the second backside power line are disposed on a back side of the transistors. The inner metal lines, the first backside power lines and the second backside power line extend along a first axis. The second backside power line is disposed between the two first backside power lines. The inner metal lines are electrically connected to the first backside power lines and the transistors, and electrically connected to the second backside power line and the transistors. The cells are arranged along a second axis, the second axis being vertical to the first axis.

Abstract: A method of making an integrated circuit includes steps of etching an opening in an insulating mask to expose a first dummy contact on a backside of the integrated circuit, depositing a conductive material into the opening, the conductive material contacting a sidewall of the first dummy contact, and recessing the conductive material to expose an end of the first dummy contact. The method also includes steps of depositing an insulating material over the conductive material in the opening, removing the first dummy contact from the insulating mask to form a first contact opening, and forming a first conductive contact in the first contact opening, the first conductive contact being electrically connected to the conductive material.

Abstract: An integrated circuit is provided, including a first transistor of a first conductivity type comprising first and second active regions, a second transistor of a second conductivity type comprising third and fourth active regions and arranged under the first transistor along a first direction, a first gate structure extending in the first direction and shared by the first and second transistors, an isolation layer sandwiched between the first and second transistors and extending along a second direction to pass through the first gate structure, and a connection layer surrounded by the isolation layer and extending along the second direction to pass through the first gate structure. The isolation layer has a first surface contacting the first and second active regions and a second surface contacting the third and fourth active regions. The connection layer comprises first and second portions are electrically coupled to the first and fourth active regions.

Abstract: A method of fabricating an integrated circuit includes fabricating a set of transistors and a dummy via in a front-side of a substrate, performing thinning on a back-side of the substrate opposite from the front-side, fabricating a first set of vias and a first set of conductors on the back-side of a thinned substrate on a first level, the first set of conductors being electrically coupled to the set of transistors by the first set of vias, fabricating a second set of vias on the back-side of the thinned substrate, and depositing a conductive material on the back-side of the thinned substrate on a second level thereby forming a second set of conductors, the second set of conductors being electrically coupled to the first set of conductors by the second set of vias.

Abstract: A layout method includes: providing a library comprising a first cell and a second cell, wherein each of the first and second cells includes: a first active region and a second active region extending in a first direction; a first cell-edge gate structure and a second cell-edge gate structure extending in a second direction; and a third cell-edge gate structure and a fourth cell-edge gate structure extending in the second direction, wherein each of the first and second cell further includes one of a tie-off conductive line or a tie-off marker layer on each of the first and second cell-edge gate structures. The layout method further includes: generating a design layout by placing and abutting the first cell and the second cell; updating the design layout by performing a post-processing step on the tie-off conductive line and the tie-off marker layer of each of the first and second cells.

Abstract: An integrated circuit includes a first and second power rail extending in a first direction and being on a first level of a back-side of a substrate, a first and second active region and a first conductive line. The first power rail is configured to supply a first supply voltage. The second power rail is configured to supply a second supply voltage. The first and second active region extend in the first direction, and are on a second level of a front-side of the substrate opposite from the back-side. The first active region is overlapped by the first power rail. The second active region is overlapped by the second power rail. The first conductive line extends in the second direction, is on a third level of the back-side of the substrate, and overlaps the first and second active region.

Abstract: A method of forming a semiconductor arrangement includes forming a first source pad over a semiconductor layer. A first nanosheet is formed contacting the first source pad. A gate pad is formed adjacent the first nanosheet. A first drain pad is formed over the gate pad and contacting the first nanosheet. A backside interconnect line is formed under the gate pad and the first source pad. A first backside contact is formed contacting at least one of the backside interconnect line, the first source pad, or the gate pad.