Patents by Inventor Shinichi Chikaki

Shinichi Chikaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5844304
    Abstract: A process for manufacturing a semiconductor device includes defining chip sections on a wafer by scribe lines with each chip section having chip electrodes formed thereon. The wafer is covered with a passivating film except for on the chip electrodes. Aluminum interconnection layers are provided such that each layer is connected to the chip electrode at one end thereof and the other end of the layer is extended towards the central portion of the chip section. A cover coating film is applied on the passivating film and the layers. A number of apertures are formed in the coating film passing therethrough, and bump electrodes are formed at the position corresponding to the apertures. The chip sections are then separated from each other along the scribe lines into semiconductor devices.
    Type: Grant
    Filed: September 25, 1995
    Date of Patent: December 1, 1998
    Assignee: NEC Corporation
    Inventors: Keiichiro Kata, Shinichi Chikaki
  • Patent number: 5649855
    Abstract: In a wafer polishing device, a resin sheet polishes a wafer with a polishing liquid fed thereto, while sliding on the wafer. Tension mechanisms apply an adequate degree of tension to the sheet in order to provide it with a desired elastic strength. Even if the wafer has a deformation or roughness ascribable to its uneven thickness, the sheet corrects some degree of deformation and then polishes the wafer, following the corrected configuration of the wafer. At this instant, the pressure acting on the wafer is even over the entire surface of the wafer. The sheet is formed of a material which is hydrophilic and resistant to fluoric acid. With this construction, the device corrects irregularities ascribable to the formation of a device from the wafer even if the wafer itself has any deformation or irregularity.
    Type: Grant
    Filed: January 23, 1996
    Date of Patent: July 22, 1997
    Assignee: NEC Corporation
    Inventor: Shinichi Chikaki
  • Patent number: 5542874
    Abstract: A wafer polishing apparatus has a wafer chuck for holding a wafer with a surface to be polished directed upward, the wafer chuck being rotatable by a wafer chuck rotation motor; a pair of nozzles for supplying slurries used as polishing solutions to the wafer; and a polishing head for holding a polishing cloth pad which is smaller in diameter than the wafer. The polishing head is rotated in the same direction as the wafer chuck by a polishing head rotation motor and is also reciprocally moved along the surface of the wafer to be polished by an arm driving motor. The wafer polishing apparatus also has a polishing head load adjusting air cylinder for pressing the polishing cloth pad against the wafer by way of the polishing head.
    Type: Grant
    Filed: September 16, 1994
    Date of Patent: August 6, 1996
    Assignee: NEC Corporation
    Inventor: Shinichi Chikaki
  • Patent number: 5483717
    Abstract: A cleaning apparatus has a roller unit coated with an adhesive layer formed from acrylic emulsion for eliminating contaminants from a surface of a semiconductor wafer and a washing unit for washing away a piece of adhesive substance left on the surface of the semiconductor wafer, and the adhesive layer formed from acrylic emulsion is so large in tackiness and hydrophilic that the cleaning apparatus removes not only large but also micro particles without residue of the adhesive substance on the surface of the semiconductor wafer.
    Type: Grant
    Filed: October 3, 1994
    Date of Patent: January 16, 1996
    Assignee: NEC Corporation
    Inventor: Shinichi Chikaki
  • Patent number: 4907039
    Abstract: A semiconductor device in which a polyimide film is used as an inter-ply insulating film is disclosed. Bonding pads are formed on the polyimide film and an insulating film such as a silicon nitride film is formed on the polyimide film and on the bonding pads except bonding areas thereof. At least one small aperture is formed in the insulating film and a metal layer having an island shape is provided on the polyimide film within the small aperture.
    Type: Grant
    Filed: June 24, 1988
    Date of Patent: March 6, 1990
    Assignee: NEC Corporation
    Inventor: Shinichi Chikaki
  • Patent number: RE39603
    Abstract: A process for manufacturing a semiconductor device includes defining chip sections on a wafer by scribe lines with each chip section having chip electrodes formed thereon. The wafer is covered with a passivating film except for on the chip electrodes. Aluminum interconnection layers are provided such that each layer is connected to the chip electrode at one end thereof and the other end of the layer is extended towards the central portion of the chip section. A cover coating film is applied on the passivating film and the layers. A number of apertures are formed in the coating film passing therethrough, and bump electrodes are formed at the position corresponding to the apertures. The chip sections are then separated from each other along the scribe lines into semiconductor devices.
    Type: Grant
    Filed: August 22, 2003
    Date of Patent: May 1, 2007
    Assignee: NEC Corporation
    Inventors: Keiichiro Kata, Shinichi Chikaki