Abstract: A charged particle emission device includes a pre-emission state detector configured to detect a pre-emission charged state which is a charged state of a charged object before the charged particles are emitted, a learned model configured to receive a charged state of a charged object and a control parameter related to a control amount used for control of the charged particles to be emitted to the charged object to generate an estimated charged state which is a charged state of the charged object after the charged particles are controlled under the control parameter and emitted, an estimated charged state generator configured to input the pre-emission charged state and a plurality of control parameters to the learned model to generate a plurality of estimated charged states corresponding to the pre-emission charged state and the plurality of control parameters.

Abstract: An imaging mass spectrometer according to the present invention includes: a measurement unit to acquire data by performing mass spectrometry for each micro regions in a measurement region; an analysis region determination unit to determine analysis regions each including the micro regions by dividing the measurement region or in accordance with user designation; a spectrum operation unit to acquire, in each analysis regions, an individual integrated mass spectrum by averaging or summing profile spectra based on data obtained by the measurement unit; a peak information integration unit to detect a peak on each individual integrated mass spectrum, to collect peak information including at least an m z value of the peak, to gather peak information, to integrate peaks that can be estimated to have substantially the same m/z value to obtain integrated peak information; and a display processing unit to create a peak list or a mass spectrum.

Abstract: An encoder includes: a rotary plate including a pattern for detecting rotational displacement; a light source that emits light onto the pattern; a light-receiving part including a light-receiving region that receives the light that is emitted from the light source and travels via the rotary plate; a fixed body in which the light-receiving part is provided; and an opposing component that opposes the pattern. The opposing component is disposed between the rotary plate and the fixed body.

Abstract: A laser device includes at least one light source; a delivery fiber that is configured to propagate of laser light emitted from the light source; and a first light detection unit and a second light detection unit configured to detect a part of light propagating in a direction opposite to a propagation direction of the laser light through the delivery fiber. The first light detection unit detects first light included in a wavelength band of visible light. The second light detection unit detects second light included in a wavelength band of near-infrared light.

Abstract: Surface-treated steel including a steel sheet; a plated layer including zinc formed on the steel sheet; and a film formed on the plated layer, the film having a thickness of 100 nm or more and 1000 nm or less, and including an amorphous phase A containing Si, C, O, P, Zn, and V, and one or more selected from the group consisting of Ti, Zr, and Al as constituent elements, with a Zn/Si ratio of peak intensity between Zn and Si, is 1.0 or more, and a mass ratio between V and P, V/P is 0.050 to 1.000 when analyzed by EDS; and an amorphous phase B containing Si, O, and Zn, having a Zn/Si ratio of less than 1.0, and Zn content of the amorphous phase A is 10 mass % or less, when analyzed by EDS.

Abstract: A coating material and a surface coating method for an in-furnace structure, and an in-furnace structure that are excellent in resistance to corrosion by the sulfur group. The coating material for an in-furnace structure used in a high-temperature corrosive environment including a sulfur group element includes as component composition, by mass, Co: 45% to 72%, both inclusive, Mo: 20% to 35%, both inclusive, Cr: 8% to 25%, both inclusive, and Si: 0.1% to 5%, both inclusive, and substantially without Ni. In the surface coating method used in a high-temperature corrosive environment including a sulfur group element, a coating is formed on a surface of the in-furnace structure by overlay welding or thermal spraying of the above-described coating material. In the in-furnace structure used in a high-temperature corrosive environment including a sulfur group element, a coating using the above-described coating material is formed on a surface of the in-furnace structure.

Abstract: An electronic component includes first and second inner electrode layers respectively including first and second facing portions and first and second extended portions coupling the first and second facing portions to an outer electrode, the first and second extended portions include a curved portion curving toward a center in a stacking direction with increasing proximity to an end surface from a first or second facing portion side, a solid solution layer includes a first metal component of the inner electrode layers and defines a solid solution with a second metal component at an interface between the curved portion and a dielectric layer, and a mole ratio of the second metal component in the solid solution is about 0.001 or more and about 0.1 or less relative to a total amount of moles of the first and second metal components.

Abstract: An electronic component includes a multilayer body in which a dielectric layer having a thickness of about 0.8 ?m or more and about 4.1 ?m or less and an inner electrode layer having a thickness of about 0.5 ?m or more and about 1.2 ?m or less are alternately stacked, the number of each of the dielectric layer and the inner electrode layer being 200 or more and 650 or less. A solid solution layer in which a first metal component defines a solid solution with a second metal component is at an interface between the inner electrode layer and the dielectric layer, and including a central solid solution layer located about 10 ?m or more from an end portion in a facing portion in a length direction and a width direction, where the adjacent inner electrode layers oppose each other.

Abstract: An imaging mass spectrometer according to the present invention includes: a measurement unit to acquire data by performing mass spectrometry on each of a plurality of micro regions in a measurement region on a sample; a narrowing unit to perform a process of narrowing a peak width with respect to each peak detected in each of a plurality of profile spectra based on the data individually obtained in the plurality of micro regions to be averaged or summed; a spectrum calculation unit to obtain an overall mass spectrum by averaging or summing the plurality of mass spectra processed by the narrowing unit; a peak selection reception unit to display the overall mass spectrum and receive an instruction from a user to select a peak on the mass spectrum; and an image creation unit to create a mass spectrometry image corresponding to the peak received by the peak selection reception unit.

Abstract: According to one embodiment, in response to receiving, from a host, one or more second type commands, a controller of the storage device maintains the received one or more second type commands in a memory region in the storage device without completing processing of the received one or more second type commands. In response to receiving the first type command from the host, the controller completes processing of a second type command, and transmits a command completion response for the first type command to the host as a first preceding response for the first type command. In response to completion of processing of the first type command, the controller transmits a command completion response for the first type command to the host.

Abstract: An imaging mass spectrometry unit (1) executes predetermined analysis on each of a plurality of micro areas set in a two-dimensional measurement region on a sample or a three-dimensional measurement region in a sample to acquire spectrum data. A clustering execution section (21) classifies spectrum data for a plurality of measurement points obtained for a reference sample into any of a plurality of clusters. A clustering model information storage section (22) stores a clustering model obtained by clustering processing. A segmentation execution section (23) classifies respective spectral data for a plurality of measurement points obtained for a sample other than a reference sample using a clustering model, and a spatial distribution image creation section (24) creates a segmentation image obtained by partitioning a two-dimensional or three-dimensional image into a plurality of small regions on the basis of a result of the classification.

Abstract: An imaging analysis device according to the present invention includes: an analysis execution unit (1) configured to perform analysis by a predetermined analysis method for each of a plurality of measurement points set in a measurement area on a sample and collect imaging data; a reference image acquiring unit (2) configured to acquire a reference image for the measurement area; a regression analysis executer (36) configured to, with respect to the imaging data and the reference image obtained for the same sample, perform predetermined regression analysis calculation with the imaging data as an explanatory variable and data constituting the reference image as a target variable and acquire a regression model; and a predicted image creator (37) configured to apply, to the regression model, imaging data obtained by the analysis execution unit using a sample different from the sample used in the regression analysis executer, and create a predicted image based on a pseudo regression analysis result.

Abstract: This hot-dip Zn—Al—Mg-based plated steel includes: a steel; and a plating layer formed on a surface of the steel, in which the plating layer contains, as an average composition, Mg: 1 to 10 mass %, Al: 4 to 22 mass %, and a remainder consisting of Zn and impurities, the plating layer includes an (Al—Zn mixed structure) in an area ratio of 10% to 70% in a cross section of the plating layer in a matrix of an (Al/Zn/MgZn2 ternary eutectic structure), the (Al—Zn mixed structure) includes a first region that has a Zn concentration in a range of 75 mass % or more and less than 85 mass % and a second region that is present inside the first region and has a Zn concentration in a range of 67 mass % or more and less than 75 mass %, and an area ratio of the second region in the (Al—Zn mixed structure) in the cross section of the plating layer is more than 0% and 40% or less.

Abstract: Provided is an Al-plated hot stamped steel material comprising a steel base material, an Al-plating layer formed on at least one surface of the steel base material, and a chemical conversion coating formed on the Al-plating layer and containing zinc phosphate-based crystals and Ce-based compounds deposited on the surfaces of the zinc phosphate-based crystals, wherein an amount of deposition of the zinc phosphate-based crystals in the chemical conversion coating is, converted to metal Zn, 0.3 to 4.0 g/m2 and an area ratio of the Ce-based compounds in the chemical conversion coating is 0.5 to 25%.

Abstract: This surface-treated steel includes surface-treated steel comprising: a steel sheet; a plated layer including zinc formed on the steel sheet; and a film formed on the plated layer, wherein the film has a thickness of 100 nm or more and 1000 nm or less, wherein the film includes: an amorphous phase A containing Si, C, O, P, Zn, and V, and one or two or more kinds selected from the group consisting of Ti, Zr, and Al as constituent elements, wherein Zn/Si, which is a peak intensity ratio between Zn and Si, is 1.0 or more, and V/P, which is a mass ratio between V and P, is 0.050 to 1.000 when analysis is performed by EDS; and an amorphous phase B containing Si, O, and Zn, wherein the amorphous phase B has a Zn/Si ratio of less than 1.

Abstract: An imaging mass spectrometer according to one aspect of the present invention includes an analysis executing section (1) configured to collect data by executing predetermined analysis on each of a plurality of micro regions set in a two-dimensional measurement region (50) on a sample (50) or a three-dimensional measurement region in the sample; a first image creating section (21) that uses the data obtained by the analysis executing section (1) to create one or a plurality of first distribution images each reflecting a distribution of one or a plurality of specific components included in the sample (50); a formula storage section (23) that stores, as a formula, a chemical reaction formula including at least the one or a plurality of specific components as elements, or a calculation formula including an amount of the specific component as element; a signal value calculating section (25) that calculates different signal values from the signal values in the micro regions constituting the one or the plurality of

Abstract: A mass spectrometer including: a reaction chamber into which a precursor ion derived from a sample molecule is introduced; a collision gas supply part configured to supply collision gas to the reaction chamber; a radical supply part configured to supply hydrogen radicals, oxygen radicals, nitrogen radicals, or hydroxyl radicals to the reaction chamber; a dissociation operation control part configured to control operations of the collision gas supply part and the radical supply part to generate the product ions by collision-induced dissociation and radical attachment dissociation of the precursor ion inside the reaction chamber, an ion detection part configured to mass-separate and detect ions ejected from the reaction chamber, and a spectrum data generation part configured to generate spectrum data based on a detection result by the ion detection part.

Abstract: A multilayer ceramic capacitor includes a multilayer body and an outer electrode. The multilayer body includes dielectric layers and inner electrode layers alternately stacked with the dielectric layers. Ni in one of first and second inner electrode layers forms a solid solution with Pt, and Ni in the other of the first and second inner electrode layers forms no solid solution with Pt. The one of the first and second inner electrode layers in which Ni forms a solid solution with Pt are coupled to a cathode when the multilayer ceramic capacitor is mounted.

Abstract: An imaging mass spectrometer includes: a storage configured to acquire and store data constituting a first imaging graphic indicating an ion intensity distribution in a specific one or plurality of m/z or m/z ranges based on data obtained by mass spectrometry for a sample; a Raman imaging data acquisition unit configured to acquire and store data constituting one or plurality of second imaging graphics obtained by Raman analysis that is a type different from mass spectrometry for the sample; a signal intensity normalization processor configured to perform data conversion processing of normalizing signal intensity in one or plurality of first and second imaging graphics; an adjustment processor configured to perform data processing of aligning spatial resolutions of the one or plurality of first and second imaging graphics; and a statistical analysis processor configured to execute statistical analysis processing on images and to classify the first and second imaging graphics.

Abstract: At the time of superimposing and aligning a stained image and a mass spectrometric (MS) image obtained for the same sample, an image display processor displays, on the superimposed images, grid lines (62) at the spacing corresponding to an operation of a grid spacing adjustment slider (63). When an operator depresses an image deformation range “SET” button (64), specifies an arbitrary area on the superimposed images with a mouse, and then depresses a “SELECT” button (65), an image deformation range specification receiving section determines an image deformation range. When the operator selects an intersection (grid point) of the grid lines (62) within the image deformation range and performs an operation of moving the intersection point to an arbitrary position, an image deformation processor deforms an image included in the image deformation range in accordance with the operation.