Abstract: An imaging analysis device according to the present invention includes: an analysis execution unit (1) configured to perform analysis by a predetermined analysis method for each of a plurality of measurement points set in a measurement area on a sample and collect imaging data; a reference image acquiring unit (2) configured to acquire a reference image for the measurement area; a regression analysis executer (36) configured to, with respect to the imaging data and the reference image obtained for the same sample, perform predetermined regression analysis calculation with the imaging data as an explanatory variable and data constituting the reference image as a target variable and acquire a regression model; and a predicted image creator (37) configured to apply, to the regression model, imaging data obtained by the analysis execution unit using a sample different from the sample used in the regression analysis executer, and create a predicted image based on a pseudo regression analysis result.

Abstract: An air-conditioning apparatus includes a heat source side unit including a compressor, a load side unit including a load side heat exchanger, a fan provided in the load side unit, an air direction adjuster that is provided in the load side unit and that adjusts an air direction, and a controller that controls the compressor, the fan, and the air direction adjuster. The controller determines whether an air-conditioned space is being ventilated and executes, in a case where the air-conditioned space is being ventilated, a fixed-swing mode in which a swing operation in which the air direction is changed over time by controlling the air direction adjuster is forcefully performed. At a time when the fixed-swing mode is to be entered, the controller activates the compressor when the compressor is stopped and continues operation of the compressor when the compressor is operating.

Abstract: A semiconductor device includes first and second processor cores configured to perform a lock step operation and including first and second scan chains. The semiconductor device further includes a scan test control unit that controls a scan test of the first and second processor cores using the first and second scan chains, and a start-up control unit that outputs a reset signal for bringing the first and second processor cores into a reset state. The start-up control unit outputs an initialization scan request before the start of a lock step operation, and the scan test control unit performs an initialization scan test operation on the first and second processor cores by using an initialization pattern.

Abstract: According to one embodiment, in response to receiving, from a host, one or more second type commands, a controller of the storage device maintains the received one or more second type commands in a memory region in the storage device without completing processing of the received one or more second type commands. In response to receiving the first type command from the host, the controller completes processing of a second type command, and transmits a command completion response for the first type command to the host as a first preceding response for the first type command. In response to completion of processing of the first type command, the controller transmits a command completion response for the first type command to the host.

Abstract: An air-sending device includes a fan configured to blow air into a space, an airflow direction adjusting unit configured to adjust an airflow direction of the air blown out from the fan, and a controller configured to control the fan and the airflow direction adjusting unit. The controller is configured to, when a predetermined condition is met, execute a forced swing mode regardless of a setting made by a user for the airflow direction. In the forced swing mode, a swing operation is forcibly performed in which the airflow direction adjusting unit is controlled to change the airflow direction over time.

Abstract: This hot-dip Zn—Al—Mg-based plated steel includes: a steel; and a plating layer formed on a surface of the steel, in which the plating layer contains, as an average composition, Mg: 1 to 10 mass %, Al: 4 to 22 mass %, and a remainder consisting of Zn and impurities, the plating layer includes an (Al—Zn mixed structure) in an area ratio of 10% to 70% in a cross section of the plating layer in a matrix of an (Al/Zn/MgZn2 ternary eutectic structure), the (Al—Zn mixed structure) includes a first region that has a Zn concentration in a range of 75 mass % or more and less than 85 mass % and a second region that is present inside the first region and has a Zn concentration in a range of 67 mass % or more and less than 75 mass %, and an area ratio of the second region in the (Al—Zn mixed structure) in the cross section of the plating layer is more than 0% and 40% or less.

Abstract: Provided is an Al-plated hot stamped steel material comprising a steel base material, an Al-plating layer formed on at least one surface of the steel base material, and a chemical conversion coating formed on the Al-plating layer and containing zinc phosphate-based crystals and Ce-based compounds deposited on the surfaces of the zinc phosphate-based crystals, wherein an amount of deposition of the zinc phosphate-based crystals in the chemical conversion coating is, converted to metal Zn, 0.3 to 4.0 g/m2 and an area ratio of the Ce-based compounds in the chemical conversion coating is 0.5 to 25%.

Abstract: This surface-treated steel includes surface-treated steel comprising: a steel sheet; a plated layer including zinc formed on the steel sheet; and a film formed on the plated layer, wherein the film has a thickness of 100 nm or more and 1000 nm or less, wherein the film includes: an amorphous phase A containing Si, C, O, P, Zn, and V, and one or two or more kinds selected from the group consisting of Ti, Zr, and Al as constituent elements, wherein Zn/Si, which is a peak intensity ratio between Zn and Si, is 1.0 or more, and V/P, which is a mass ratio between V and P, is 0.050 to 1.000 when analysis is performed by EDS; and an amorphous phase B containing Si, O, and Zn, wherein the amorphous phase B has a Zn/Si ratio of less than 1.

Abstract: An imaging mass spectrometer according to one aspect of the present invention includes an analysis executing section (1) configured to collect data by executing predetermined analysis on each of a plurality of micro regions set in a two-dimensional measurement region (50) on a sample (50) or a three-dimensional measurement region in the sample; a first image creating section (21) that uses the data obtained by the analysis executing section (1) to create one or a plurality of first distribution images each reflecting a distribution of one or a plurality of specific components included in the sample (50); a formula storage section (23) that stores, as a formula, a chemical reaction formula including at least the one or a plurality of specific components as elements, or a calculation formula including an amount of the specific component as element; a signal value calculating section (25) that calculates different signal values from the signal values in the micro regions constituting the one or the plurality of

Abstract: A mass spectrometer including: a reaction chamber into which a precursor ion derived from a sample molecule is introduced; a collision gas supply part configured to supply collision gas to the reaction chamber; a radical supply part configured to supply hydrogen radicals, oxygen radicals, nitrogen radicals, or hydroxyl radicals to the reaction chamber; a dissociation operation control part configured to control operations of the collision gas supply part and the radical supply part to generate the product ions by collision-induced dissociation and radical attachment dissociation of the precursor ion inside the reaction chamber, an ion detection part configured to mass-separate and detect ions ejected from the reaction chamber, and a spectrum data generation part configured to generate spectrum data based on a detection result by the ion detection part.

Abstract: A multilayer ceramic capacitor includes a multilayer body and an outer electrode. The multilayer body includes dielectric layers and inner electrode layers alternately stacked with the dielectric layers. Ni in one of first and second inner electrode layers forms a solid solution with Pt, and Ni in the other of the first and second inner electrode layers forms no solid solution with Pt. The one of the first and second inner electrode layers in which Ni forms a solid solution with Pt are coupled to a cathode when the multilayer ceramic capacitor is mounted.

Abstract: An imaging mass spectrometer includes: a storage configured to acquire and store data constituting a first imaging graphic indicating an ion intensity distribution in a specific one or plurality of m/z or m/z ranges based on data obtained by mass spectrometry for a sample; a Raman imaging data acquisition unit configured to acquire and store data constituting one or plurality of second imaging graphics obtained by Raman analysis that is a type different from mass spectrometry for the sample; a signal intensity normalization processor configured to perform data conversion processing of normalizing signal intensity in one or plurality of first and second imaging graphics; an adjustment processor configured to perform data processing of aligning spatial resolutions of the one or plurality of first and second imaging graphics; and a statistical analysis processor configured to execute statistical analysis processing on images and to classify the first and second imaging graphics.

Abstract: At the time of superimposing and aligning a stained image and a mass spectrometric (MS) image obtained for the same sample, an image display processor displays, on the superimposed images, grid lines (62) at the spacing corresponding to an operation of a grid spacing adjustment slider (63). When an operator depresses an image deformation range “SET” button (64), specifies an arbitrary area on the superimposed images with a mouse, and then depresses a “SELECT” button (65), an image deformation range specification receiving section determines an image deformation range. When the operator selects an intersection (grid point) of the grid lines (62) within the image deformation range and performs an operation of moving the intersection point to an arbitrary position, an image deformation processor deforms an image included in the image deformation range in accordance with the operation.

Abstract: An electronic device of the present invention is an electronic device used around a neutralization target object, the electronic device includes: an electric part; an interconnection portion that transmits electric power of a high voltage power supply to the electric part; and a housing that accommodates the electric part and the interconnection portion, in which the electronic device includes at least one of a cover portion, which covers at least a part of the electric part and has a surface resistivity of equal to or higher than 104 ?/? and equal to or lower than 1011 ?/?, and the housing, which has a surface resistivity of equal to or higher than 104 ?/? and equal to or lower than 1011 ?/?.

Abstract: In a data-analyzing method in which an analysis based on a plurality of data groups each obtained by an instrumental analysis on each of a plurality of samples, with each data group including signal values having an n-dimensional array structure (where n?2), is performed by using a computer, to obtain desired information concerning a difference between the samples, the method includes: a computational processing step for performing, in each data group, a persistent-homology processing on data including signal values having an m-dimensional array structure (where 2?m?n) obtained from one data group, to create a persistence diagram (PD); and an analytical processing step for comparing PDs respectively obtained from the data groups, to obtain the desired information based on a difference in the dispersion state of plots across the entire PDs being compared and/or based on information concerning a plot having no positional correspondence determined on the PDs being compared.

Abstract: An analysis operator checks an optical microscopic image obtained with an imaging mass microscope and indicates a color characteristic of an area which the analysis operator is focusing on. An optical microscopic image feature extractor calculates luminance distribution data in the indicated color. An image position adjustment processor performs a position adjustment process on a luminance distribution image derived from the optical microscopic image and an MS imaging graphic, while a resolution adjuster equalizes their spatial resolutions. A statistical analysis processor calculates a coefficient of spatial correlation between the luminance distribution image and the MS imaging graphic for each mass-to-charge ratio. Based on the calculated correlation coefficients, an analysis result display processor extracts a mass-to-charge ratio which shows an ion intensity distribution similar to the luminance distribution image. and displays it on a display unit.

Abstract: This hot-dip Zn—Al—Mg-based plated steel includes: a steel; and a plating layer formed on a surface of the steel, in which the plating layer contains, as an average composition, Mg: 1 to 10 mass %, Al: 4 to 22 mass %, and a remainder consisting of Zn and impurities, the plating layer includes an (Al—Zn mixed structure) in an area ratio of 10% to 70% in a cross section of the plating layer in a matrix of an (Al/Zn/MgZn2 ternary eutectic structure), the (Al—Zn mixed structure) includes a first region that has a Zn concentration in a range of 75 mass % or more and less than 85 mass % and a second region that is present inside the first region and has a Zn concentration in a range of 67 mass % or more and less than 75 mass %, and an area ratio of the second region in the (Al—Zn mixed structure) in the cross section of the plating layer is more than 0% and 40% or less.

Abstract: When a user designates a region of interest for a plurality of groups targeted for difference analysis in a microscopic observation image of a sample, an m/z candidate search unit searches for candidates for m/z presumed to differ, based on collected mass spectral data. An intensity histogram creation unit processing unit creates and displays a graph showing a frequency distribution of peak intensities at measurement points included in the ROI of the groups for each of the m/z candidates. If this graph exhibits multimodality, the data distribution is not suitable for a statistical hypothesis test. An intensity range determination unit limits an intensity range in accordance with a user's instruction. Then, ROI correction unit corrects the ROI so as to include only measurement points with peak intensities within the limited intensity range. A test processing unit performs a statistical hypothesis test using the data corresponding to the corrected ROI.

Abstract: Provided is an Al-plated hot stamped steel material comprising a steel base material, an Al-plating layer formed on at least one surface of the steel base material, and a chemical conversion coating formed on the Al-plating layer and containing zinc phosphate-based crystals and Ce-based compounds deposited on the surfaces of the zinc phosphate-based crystals, wherein an amount of deposition of the zinc phosphate-based crystals in the chemical conversion coating is, converted to metal Zn, 0.3 to 4.0 g/m2 and an area ratio of the Ce-based compounds in the chemical conversion coating is 0.5 to 25%.

Abstract: Provided is a hot stamped body comprising a steel base material, an Al-plating layer formed on at least one surface of the steel base material, a coating formed on the Al-plating layer and containing ZnO particles and CeO2 particles having an average particle size smaller than an average particle size of the ZnO particles, and a Zn- and Al-containing complex oxide layer formed between the Al-plating layer and the coating. Further, provided is a method for producing a hot stamped body comprising forming an Al-plating layer on at least one side of a steel sheet, coating a surface of the Al-plating layer with an aqueous solution containing ZnO particles and CeO2 particles, then heating it to form a coating containing ZnO particles and CeO2 particles on the Al-plating layer, and hot pressing the steel sheet.