Abstract: A circuit according to embodiments includes: a plurality of bit-string comparators each of which includes a plurality of single-bit comparators each of which includes first and second input terminals, first and second match-determination terminals, and a memory storing data and inverted data in a pair, the first input terminal being connected to a respective search line, the second input terminal being connected to an inverted search line being paired with the respective search line, and a matching line connecting the first and second match-determination terminals of the single-bit comparators; a pre-charge transistor of which source is connected to a supply voltage line; a common matching line connected to a drain of the pre-charge transistor and the matching lines of the bit-string comparators; and an output inverter of which input is connected to the common matching line.

Abstract: According to one embodiment, a non-volatile programmable switch according to this embodiment includes first and second non-volatile memory transistors, and a common node that is connected to the output side terminals of the first and second non-volatile memory transistors, and a logic transistor unit that is connected to the common node. A length of a gate electrode of the first and second non-volatile memory transistors in a channel longitudinal direction is shorter than a length of the charge storage film in the channel longitudinal direction.

Abstract: An automatic search and transfer apparatus that automatically searches for and transfers data one or more computers connected via a network, that includes a keyword input section that inputs at least one keyword, a search section that searches for data including the at least one keyword and acquires attribute data of concerned data from the one or more computers connected via the network, a reporting section that reports information relating to the concerned data to a user, a reception section that receives the concerned data from one or more computers, and a data storage section that stores the data. The reporting section reports acquisition of the attribute data to the user when the attribute data is acquired, and the reception section starts reception of the concerned data after the reporting section has reported the acquisition of the attribute data of the concerned data to the user.

Abstract: One embodiment provides a semiconductor integrated circuit, including: a substrate; a plurality of nonvolatile memory portions formed in the substrate, each including a first nonvolatile memory and a second nonvolatile memory; and a plurality of logic transistor portions formed in the substrate, each including at least one of logic transistor, wherein the logic transistors include: a first transistor which is directly connected to drains of the first and second nonvolatile memories at its gate; and a second transistor which is not directly connected to the drains of the first and second nonvolatile memories, and wherein a bottom surface of the gate of each of the logic transistors sandwiching the first and second nonvolatile memories is lower in height from a top surface of the substrate than a bottom surface of the control gate of each of the first and second nonvolatile memories.

Abstract: In one embodiment, a method for implementing a circuit design for an integrated circuit includes: (a) obtaining a first wiring to satisfy a given operating frequency; (b) calculating a maximum bypass wiring length based on the given operating frequency and a critical path of the first wiring; (c) obtaining a second wiring by bypassing the first wiring using wires other than wires of the first wiring in a first wiring group, wherein wiring of the integrated circuit is categorized into a plurality of wiring groups, and the first wiring is included in the first wiring group of the categorized wiring groups; and (d) replacing the first wiring with the second wiring, if a difference between the second wiring and the first wiring is not larger than the maximum bypass wiring length, and not replacing the first wiring if said difference is larger than the maximum bypass wiring length.

Abstract: An aspect of the present embodiment, there is provided a nonvolatile programmable logic switch including a first memory cell transistor, a second memory cell transistor, a pass transistor and a first substrate electrode applying a substrate voltage to the pass transistor, wherein a writing voltage is applied to the first wiring, a first voltage is applied to one of a second wiring and a third wiring and a second voltage which is lower than the first voltage is applied to the other of the second wiring and the third wiring, and the first substrate voltage which is higher than the second voltage and lower than the first voltage is applied to a well of the pass transistor, when data is written into the first memory cell transistor or the second memory cell transistor.

Abstract: According to one embodiment, a configuration memory includes first and second data lines, a first memory string which comprises at least first and second nonvolatile memory transistors which are connected in series between a common node and the first data line, a second memory string which comprises at least third and fourth nonvolatile memory transistors which are connected in series between the common node and the second data line, and a flip-flop circuit which comprises a first data holding node connected to the common node and a second data holding node connected to a configuration data output node.

Abstract: One embodiment provides a semiconductor integrated circuit, including: a first input wire; a second input wire; a first look-up table (LUT) comprising: a plurality of first memories; a first number of first switches connected to the first input wire; and a second number of second switches connected to the second input wire, the second number being less than the first number, the first LUT being configured to output information which is stored in one of the first memories; and a second LUT including: a plurality of second memories; a third number of third switches connected to the second input wire; and a fourth number of fourth switches connected to the first input wire, the fourth number being less than the third number, the second LUT being configured to output information which is stored in one of the second memories.

Abstract: According to one embodiment, a programmable logic switch includes first and second word lines above a first path transistor, a first pillar passing through the first and second word lines and connected to the first path transistor, a second pillar passing through the first and second word lines and connected to the first path transistor, a first memory device between the first pillar and the first word line, a second memory device between the first pillar and the second word line, a third memory device between the second pillar and the first word line, and a fourth memory device between the second pillar and the second word line.

Abstract: One embodiment provides a look-up table circuit, including: 2i memories, a half of which constituting a first memory group, the other half of which constituting a second memory group; first to i-th input terminals to which first to i-th input signals are input, respectively; a first output terminal; a switch group that selectively connects one of the memories to the first output terminal according to the first to i-th input signals; a first power-off switch that shuts off power supply to the first memory group in response to one of the first to i-th input signals; and a second power-off switch that shuts off power supply to the second memory group in response to the one of the first to i-th input signals.

Abstract: A memory circuit according to an embodiment includes: a plurality of memory cells each having one pair of first and second nonvolatile memory circuits, each of the first and second nonvolatile memory circuits in each memory cell being capable of making a transition between a high resistance state and a low resistance state, and in a state in which one memory cell in the plurality of memory cells has information stored therein, one of the first and second nonvolatile memory circuits in the one memory cell being in a high resistance state whereas the other being in a low resistance state.

Abstract: According to one embodiment, a three-dimensional semiconductor integrated circuit includes first, second and third chips which are stacked, and a common conductor which connects the first, second and third chips from one another. The first chip includes a first multi-leveling circuit, the second chip includes a second multi-leveling circuit, and the third chip includes a decoding circuit. The first multi-leveling circuit includes a first inverter to which binary first data is input and which outputs one of first and second potentials and a first capacitor which is connected between an output terminal of the first inverter and the common conductor. The second multi-leveling circuit includes a second inverter to which binary second data is input and which outputs one of third and fourth potentials and a second capacitor which is connected between an output terminal of the second inverter and the common conductor.

Abstract: According to one embodiment, a semiconductor integrated circuit includes first and second resistance change type memory element and first and second switches. The first resistance change type memory element includes a first terminal connected to a first power supply and a second terminal connected to a first node. The second resistance change type memory element includes a third terminal connected to the first node and a fourth terminal connected to a second power supply. The first switch includes one end of a first current path connected to a first program power supply and the other end of the first current path connected to the first node. The second switch includes one end of a second current path connected to the first node and the other end of the second current path connected to a second program power supply.

Abstract: In one embodiment, a semiconductor integrated circuit has memory cells. Each of the memory cells has non-volatile memories and switching elements. The non-volatile memories and switching elements are connected in series between a first power source and a second power source. Output wirings of at least two of the memory cells are connected to each other. Input wirings are connected with control gates of the switching elements included in each of the at least two memory cells. A plurality of the switching elements included in one of the at least two of the memory cells is turned off, when an input signal or an inverted signal is inputted. Further, another plurality of the switching elements included in another one of the at least two of memory cells other than the one of the memory cells is turned on, when the input signal or the inverted signal is inputted.

Abstract: One embodiment provides a programmable logic switch in which a first nonvolatile memory and a second nonvolatile memory are formed in the same well, and in which to change the first nonvolatile memory from an erased state to a written state and leave the second nonvolatile memory being in the erased state, a first write voltage is applied to a first line connected with gate electrodes of the first and second nonvolatile memories, a second write voltage is applied to a second line connected to a source in the first nonvolatile memory, and a third write voltage lower than the second write voltage is applied to a fourth line connected to a source of the second nonvolatile memory.

Abstract: A semiconductor integrated circuit in an embodiment includes a first circuit group that includes at least one first logic block and a second circuit group that includes second logic blocks. The number of the second logic blocks is greater than the number of the first logic blocks. The first circuit group includes a first switching block and a first power control circuit. The first power control circuit commonly controls a start of power supply and a stop of the power supply for the first logic block and the first switching block. The second circuit group includes second switching blocks and a second power control circuit. The second power control circuit commonly controls a start of power supply and a stop of the power supply for the second logic blocks and the second switching blocks.

Abstract: In one embodiment, a method for implementing a circuit design for an integrated circuit includes: (a) obtaining a first wiring to satisfy a given operating frequency; (b) calculating a maximum bypass wiring length based on the given operating frequency and a critical path of the first wiring; (c) obtaining a second wiring by bypassing the first wiring using wires other than wires of the first wiring in a first wiring group, wherein wiring of the integrated circuit is categorized into a plurality of wiring groups, and the first wiring is included in the first wiring group of the categorized wiring groups; and (d) replacing the first wiring with the second wiring, if a difference between the second wiring and the first wiring is not larger than the maximum bypass wiring length, and not replacing the first wiring if said difference is larger than the maximum bypass wiring length.

Abstract: One embodiment provides a phase-locked loop (PLL), in which a sequencer controls a loop filter such that, when a signal indicating turning-off of a power supply of the PLL is input thereto, or when a signal indicating turning-on of the power supply of the PLL is input thereto, a resistance value of a first resistance change device in the loop filter is a first resistance value, and that, after the PLL is stabilized, the resistance value of the first resistance change device is a second resistance value which is higher than the first resistance value.

Abstract: In one embodiment, a semiconductor integrated circuit includes a first resistive-change element, a second resistive-change element and a first switching element. The first resistive-change element includes one end having a first polarity connected to a first power source. The first resistive-change element includes another end having a second polarity connected to an output node. The second resistive-change element includes one end having the second polarity connected to the output node. The first switching element includes a first terminal connected to another end of the second resistive-change element. The first switching element includes a second terminal connected to a second power source.

Abstract: A random number generating device includes: a pulse voltage generator configured to generate a pulse voltage having an amplitude of 26 mV or more; a random noise generating element including source and drain regions formed at a distance from each other on a semiconductor substrate, a tunnel insulating film formed on a portion of the semiconductor substrate located between the source region and the drain region, and a gate electrode formed above the tunnel insulating film and to which the pulse voltage is applied, the random noise generating element configured to generate a random noise contained in a current flowing between the source region and the drain region; and a random number generating unit configured to generate a random number signal based on the random noise.