Abstract: A method for examining a negative electrode of a non-aqueous electrolyte secondary battery includes irradiating an active material layer including silicon or a silicon compound having a known composition, which is capable of electrochemically absorbing and releasing lithium ions on a current collector made of a metal including at least any one of copper, nickel, titanium and iron, with an X-ray; and measuring an attenuation amount of any one of a CuK? ray, a NiK? ray, a TiK? ray, and a FeK? ray, which is a fluorescent X-ray of the metal included in the current collector in fluorescent X-rays generated from the active material layer.

Abstract: A method for manufacturing a negative electrode of a battery includes forming an active material layer and a active material layer for measuring both including a material having a characteristic absorption in an infrared region on a surface of a sent current collector and a surface of a measuring current collector that is being sent faster than the current collector, respectively; and irradiating the active material layer for measuring with an infrared ray and measuring a wave number of a reflected infrared ray in order to estimate a composition of at least the active material layer for measuring.

Abstract: In a method for testing a negative electrode of a secondary battery, light is irradiate to an active material layer formed on a current collector having a plurality of projections at least on one side thereof, the active material layer including first columnar bodies of active material grown obliquely from the projections. The angle is measured between the reflected light from the active material layer and a normal line parallel to the thickness direction of the current collector.

Abstract: In a method for manufacturing a negative electrode for a battery, an active material layer including a metallic element M and an element A that is at least any one of oxygen, nitrogen, and carbon is formed on a current collector. This active material layer is irradiated with an X-ray and at least one of intensity of a K? ray of the element A and intensity of a K? ray of the metallic element M in fluorescent X-rays generated from the active material layer is measured.