Abstract: A photoelectric conversion apparatus includes a plurality of pixels, a plurality of signal lines, and a scanning unit configured to scan the plurality of pixels. The scanning unit performs scanning to connect two or more pixels arranged in a predetermined number of pixel rows, the predetermined number of which is two or more, to one of the plurality of signal lines during a scanning period. The scanning unit performs reading a first pixel row group having a first number of rows during a first period. The scanning unit performs reading a second pixel row group having a second number of rows less than the first number of rows and reading a third pixel row group having a third number of rows less than the first number of rows during a second period in which a first or last scan is performed in the scanning period.

Abstract: A ranging device including: a control unit controlling a light emission timing in a light emitting device divided into emitting regions and a start timing of time counting; a receiving unit divided into receiving regions corresponding one-to-one to the emitting regions; a latch unit generating a light reception time value indicating an elapsed time from the start of the time counting to incidence of light based on the time count value and light reception signals; and a calculation unit calculating a flight time of light based on the light reception time value. Light emission timings of the emitting regions are different from each other, and a time difference between two light emission timings is shorter than a measurement period in each receiving region. The calculation unit calculates the flight time based on the light reception time value and the time difference.

Abstract: A light emitting device includes pixel circuits arranged to form rows and columns and each including a light emitting element, signal lines each extending in a column direction and configured to supply a pixel signal to the pixel circuits, row selection lines each extending in a row direction and configured to supply a row selection signal to the pixel circuits, and column selection lines each extending in the column direction and configured to supply a column selection signal to the pixel circuits. At least one of the pixel circuits includes a light emission control circuit configured to allow the light emitting element of a pixel circuit indicated by the row selection signal and the column selection signal to emit light in a brightness according to the pixel signal that is being supplied to the pixel circuit.

Abstract: A light emitting apparatus includes a light emitting element, a temperature measurement device, a driving control unit, a calculation unit configured to calculate a correction value of a driving control parameter based on a measured temperature; and a change unit configured to change a coefficient of a function based on the measured temperature. The calculation unit calculates the correction value with respect to the measured temperature based on a function obtained by expressing a first function, which expresses a relationship between the measured temperature and the correction value, by a combined function of a plurality of third functions each generated by changing a coefficient of a second function, and the change unit changes, based on the measured temperature, the coefficient of the second function to generate the plurality of third functions.

Abstract: A light-emitting apparatus comprising pixels that each includes a light-emitting element and a drive transistor for supplying a current according to a luminance signal to the light-emitting element and a signal supply circuit supplying the luminance signal to the drive transistor. The apparatus operates display modes including a first display mode and a second display mode in which a maximum luminance is higher than in the first display mode. The signal supply circuit, in a case where the display data has a maximum luminance value, supplies to the drive transistor, as the luminance signal, different voltages in the first and second display modes, and in a case where the display data has a minimum luminance value, supplies to the drive transistor, as the luminance signal, different voltages in the first and second display modes.

Abstract: Provided is a photoelectric conversion device including: a plurality of pixel circuits each including a photoelectric conversion unit configured to generate charges by photoelectric conversion and a transistor configured to transfer the charges from the photoelectric conversion unit; and a plurality of exposure control circuits each including a capacitor configured to hold a signal corresponding to an exposure period in the photoelectric conversion unit and a comparator circuit configured to compare a potential of a first terminal of two terminals of the capacitor with a threshold potential. Each of the plurality of exposure control circuits controls an exposure period of the photoelectric conversion unit by outputting a signal based on a comparison result caused by the comparator circuit to a control terminal of the transistor and driving the transistor.

Abstract: A device includes a pixel unit, a selection unit, and a first generation unit. The pixel unit has a plurality of pixels arranged in a plurality of rows. Each pixel includes a quenching circuit configured to receive a signal for determining start and end of an exposure period and a photodiode coupled to the quenching circuit. The selection unit is configured to simultaneously receive a plurality of clock signals of different periods and select a clock signal to be outputted from the plurality of clock signals. The first generation unit is configured to generate the signal by using the outputted clock.

Abstract: A photoelectric conversion device includes a pixel unit having pixels arranged to form rows and columns, each including a transfer transistor that transfers charge in a photoelectric converter to an output unit, and a pixel control unit that controls the pixels. The pixel control unit is configured to supply a control signal in accordance with an exposure period individually defined for pixel blocks of the pixel unit to pixels of each pixel block and read out, from each pixel, a first signal obtained when the photoelectric converter is in a reset state and a second signal based on charge accumulated in the photoelectric converter during the exposure period. A period excluding both the exposure period and a readout period of the second signal corresponds to a reset period of the photoelectric converter. The transfer transistor is off in a readout period of the first and second signals.

Abstract: A light emitting device has a structure in which a first substrate and a second substrate are stacked. The device includes a plurality of light emitting elements, and a driving circuit configured to drive the plurality of light emitting elements. Part of the driving circuit is arranged in the first substrate, and another part of the driving circuit is arranged in the second substrate.

Abstract: A light emitting device includes pixel circuits arranged to form rows and columns and each including a light emitting element, signal lines each extending in a column direction and configured to supply a pixel signal to the pixel circuits, row selection lines each extending in a row direction and configured to supply a row selection signal to the pixel circuits, and column selection lines each extending in the column direction and configured to supply a column selection signal to the pixel circuits. At least one of the pixel circuits includes a light emission control circuit configured to allow the light emitting element of a pixel circuit indicated by the row selection signal and the column selection signal to emit light in a brightness according to the pixel signal that is being supplied to the pixel circuit.

Abstract: A light emitting apparatus includes a light emitting element, a temperature measurement device, a driving control unit, a calculation unit configured to calculate a correction value of a driving control parameter based on a measured temperature; and a change unit configured to change a coefficient of a function based on the measured temperature. The calculation unit calculates the correction value with respect to the measured temperature based on a function obtained by expressing a first function, which expresses a relationship between the measured temperature and the correction value, by a combined function of a plurality of third functions each generated by changing a coefficient of a second function, and the change unit changes, based on the measured temperature, the coefficient of the second function to generate the plurality of third functions.

Abstract: A light-emitting apparatus comprising pixels that each includes a light-emitting element and a drive transistor for supplying a current according to a luminance signal to the light-emitting element and a signal supply circuit supplying the luminance signal to the drive transistor is provided. The apparatus operates display modes including a first display mode and a second display mode in which a maximum luminance is higher than in the first display mode. The signal supply circuit, in a case where the display data has a maximum luminance value, supplies to the drive transistor, as the luminance signal, different voltages in the first and second display modes, and in a case where the display data has a minimum luminance value, supplies to the drive transistor, as the luminance signal, different voltages in the first and second display modes.

Abstract: Provided is a photoelectric conversion device including: a plurality of pixel circuits each including a photoelectric conversion unit configured to generate charges by photoelectric conversion and a transistor configured to transfer the charges from the photoelectric conversion unit; and a plurality of exposure control circuits each including a capacitor configured to hold a signal corresponding to an exposure period in the photoelectric conversion unit and a comparator circuit configured to compare a potential of a first terminal of two terminals of the capacitor with a threshold potential. Each of the plurality of exposure control circuits controls an exposure period of the photoelectric conversion unit by outputting a signal based on a comparison result caused by the comparator circuit to a control terminal of the transistor and driving the transistor.

Abstract: An imaging device comprising a plurality of pixels and a processing unit. The plurality of pixels includes (i) a light-receiving pixel arranged to receive incident light and output a light signal based on the incident light, and (ii) a reference pixel arranged to output a pixel signal for configuring a failure detection signal. The processing unit is arranged to determine whether or not the failure detection signal is correct based on abnormality information indicating the abnormality of the reference pixel.

Abstract: A photoelectric conversion device includes a pixel unit having pixels arranged to form rows and columns, each including a transfer transistor that transfers charge in a photoelectric converter to an output unit, and a pixel control unit that controls the pixels. The pixel control unit is configured to supply a control signal in accordance with an exposure period individually defined for pixel blocks of the pixel unit to pixels of each pixel block and read out, from each pixel, a first signal obtained when the photoelectric converter is in a reset state and a second signal based on charge accumulated in the photoelectric converter during the exposure period. A period excluding both the exposure period and a readout period of the second signal corresponds to a reset period of the photoelectric converter. The transfer transistor is off in a readout period of the first and second signals.

Abstract: The purpose of the present invention is to provide a flow sensor that makes it possible to detect temperature abnormalities that the flow sensor has been exposed to and the time history of the flow sensor in a high-temperature environment from an externally visible cover material and that uses a cover material for which the laser welding quality can be guaranteed through visual inspection when the sensor is delivered as a product and even if the sensor is used in an abnormal state. A flow sensor provided with a housing, a cover, a circuit chamber that houses a wiring portion sealed between the housing and the cover, and an auxiliary passage through which the liquid to be sensed flows, wherein: a joint portion formed on the housing and a joint portion formed on the inner surface of the cover are joined together through the laser welding; the main material of the cover is a crystalline resin; the cover includes an amorphous alloy; and the cover is made to have a natural color.

Abstract: An imaging device comprising a plurality of pixels and a processing unit. The plurality of pixels includes (i) a light-receiving pixel arranged to receive incident light and output a light signal based on the incident light, and (ii) a reference pixel arranged to output a pixel signal for configuring a failure detection signal. The processing unit is arranged to determine whether or not the failure detection signal is correct based on abnormality information indicating the abnormality of the reference pixel.

Abstract: A pressure detecting device is mounted in a measurement target and instrument includes a strain inducer to which pressure of a pressure medium is applied and which generates strain in accordance with the pressure and a strain detecting element that is bonded onto a surface opposite to a pressure receiving surface of the strain inducer, in which the strain detecting element includes one or multiple central strain resistant bridges which are arranged at a central portion of the strain detecting element in a bonded surface direction, and one or multiple outer peripheral strain resistant bridges which are arranged at an outer periphery, and in which, for example, deformation of the strain detecting element caused by an external force when being screw-fixed to the measurement target instrument is obtained through the multiple strain resistant bridges. An error of detection pressure caused by the deformation in a pressure value detected through the central strain resistant bridge is corrected.

Abstract: The purpose of the present invention is to provide a flow sensor that makes it possible to detect temperature abnormalities that the flow sensor has been exposed to and the time history of the flow sensor in a high-temperature environment from an externally visible cover material and that uses a cover material for which the laser welding quality can be guaranteed through visual inspection when the sensor is delivered as a product and even if the sensor is used in an abnormal state. A flow sensor provided with a housing, a cover, a circuit chamber that houses a wiring portion sealed between the housing and the cover, and an auxiliary passage through which the liquid to be sensed flows, wherein: a joint portion formed on the housing and a joint portion formed on the inner surface of the cover are joined together through the laser welding; the main material of the cover is a crystalline resin; the cover includes an amorphous alloy; and the cover is made to have a natural color.

Abstract: A pressure detecting device is mounted in a measurement target and instrument includes a strain inducer to which pressure of a pressure medium is applied and which generates strain in accordance with the pressure and a strain detecting element that is bonded onto a surface opposite to a pressure receiving surface of the strain inducer, in which the strain detecting element includes one or multiple central strain resistant bridges which are arranged at a central portion of the strain detecting element in a bonded surface direction, and one or multiple outer peripheral strain resistant bridges which are arranged at an outer periphery, and in which, for example, deformation of the strain detecting element caused by an external force when being screw-fixed to the measurement target instrument is obtained through the multiple strain resistant bridges. An error of detection pressure caused by the deformation in a pressure value detected through the central strain resistant bridge is corrected.