Patents by Inventor Shiro Kamohara
Shiro Kamohara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11676655Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: GrantFiled: June 10, 2022Date of Patent: June 13, 2023Assignee: RENESAS ELECTRONICS CORPORATIONInventors: Shiro Kamohara, Yasushi Yamagata, Takumi Hasegawa, Nobuyuki Sugii
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Patent number: 11665640Abstract: A microcomputer performs a power supply operation to a wireless communication module at a first time interval set based on a power generation amount at a lowest day power generation amount of a temperature differential power generation module. In addition, the microcomputer performs the power supply operation to a sensor at a second time interval set based on the power generation amount at the lowest day power generation amount of the temperature differential power generation module.Type: GrantFiled: February 17, 2021Date of Patent: May 30, 2023Assignee: RENESAS ELECTRONICS CORPORATIONInventors: Shiro Kamohara, Akira Tanabe, Kazuya Uejima, Jun Uehara, Kazuya Okuyama
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Publication number: 20220406936Abstract: In a semiconductor device according to an embodiment, a thickness of a semiconductor layer of an SOI substrate on which a field effect transistor constituting an analog circuit is formed is set to 2 nm or more and 24 nm or less.Type: ApplicationFiled: August 29, 2022Publication date: December 22, 2022Inventors: Kazuya UEJIMA, Michio ONDA, Takashi HASE, Tatsuo NISHINO, Shiro KAMOHARA
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Publication number: 20220301618Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: ApplicationFiled: June 10, 2022Publication date: September 22, 2022Inventors: Shiro KAMOHARA, Yasushi YAMAGATA, Takumi HASEGAWA, Nobuyuki SUGII
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Publication number: 20220264450Abstract: A microcomputer performs a power supply operation to a wireless communication module at a first time interval set based on a power generation amount at a lowest day power generation amount of a temperature differential power generation module. In addition, the microcomputer performs the power supply operation to a sensor at a second time interval set based on the power generation amount at the lowest day power generation amount of the temperature differential power generation module.Type: ApplicationFiled: February 17, 2021Publication date: August 18, 2022Inventors: Shiro KAMOHARA, Akira TANABE, Kazuya UEJIMA, Jun UEHARA, Kazuya OKUYAMA
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Patent number: 11391389Abstract: The semiconductor device controls the first circuit for supplying/stopping the current supplied by a DC power supply to the latching solenoid consisting of a coil and a movable iron core and a permanent magnet, the current is measured based on the input from the current detection circuit. The semiconductor device includes a control circuit having a low power dissipation mode in which the leakage current is reduced, and a normal operation mode. The control circuit maintains the low power consumption mode when no current is flowing through the coil, when a current is flowing through the coil maintains the normal operation mode, further, the movable iron core It comprises a control circuit configured to detect the inflection point of the current detected by the current detection circuit when leaving the permanent magnet.Type: GrantFiled: March 16, 2020Date of Patent: July 19, 2022Assignee: RENESAS ELECTRONICS CORPORATIONInventors: Shiro Kamohara, Kazuya Uejima
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Patent number: 11373700Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: GrantFiled: April 17, 2019Date of Patent: June 28, 2022Assignee: Renesas Electronics CorporationInventors: Shiro Kamohara, Yasushi Yamagata, Takumi Hasegawa, Nobuyuki Sugii
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Publication number: 20200309282Abstract: The semiconductor device controls the first circuit for supplying/stopping the current supplied by a DC power supply to the latching solenoid consisting of a coil and a movable iron core and a permanent magnet, the current is measured based on the input from the current detection circuit. The semiconductor device includes a control circuit having a low power dissipation mode in which the leakage current is reduced, and a normal operation mode. The control circuit maintains the low power consumption mode when no current is flowing through the coil, when a current is flowing through the coil maintains the normal operation mode, further, the movable iron core It comprises a control circuit configured to detect the inflection point of the current detected by the current detection circuit when leaving the permanent magnet.Type: ApplicationFiled: March 16, 2020Publication date: October 1, 2020Inventors: Shiro KAMOHARA, Kazuya UEJIMA
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Publication number: 20200313000Abstract: In a semiconductor device according to an embodiment, a thickness of a semiconductor layer of an SOI substrate on which a field effect transistor constituting an analog circuit is formed is set to 2 nm or more and 24 nm or less.Type: ApplicationFiled: November 14, 2017Publication date: October 1, 2020Inventors: Kazuya UEJIMA, Shiro KAMOHARA, Michio ONDA, Takashi HASE, Tatsuo NISHINO
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Publication number: 20190244659Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: ApplicationFiled: April 17, 2019Publication date: August 8, 2019Inventors: Shiro KAMOHARA, Yasushi YAMAGATA, Takumi HASEGAWA, Nobuyuki SUGII
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Patent number: 10311943Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: GrantFiled: February 5, 2018Date of Patent: June 4, 2019Assignee: Renesas Electronics CorporationInventors: Shiro Kamohara, Yasushi Yamagata, Takumi Hasegawa, Nobuyuki Sugii
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Patent number: 10014067Abstract: To provide a semiconductor device equipped with anti-fuse memory cells, which is capable of improving read-out accuracy of information. There is provided a semiconductor device in which an N channel type memory transistor, a selection core transistor, and a selection bulk transistor are respectively electrically coupled in series. The memory transistor and the selection core transistor are formed in a silicon layer of an SOI substrate, and the selection bulk transistor is formed in a semiconductor substrate. A word line is coupled to a memory gate electrode of the memory transistor, and a bit line is coupled to the selection bulk transistor. A write-in operation is performed while applying a counter voltage opposite in polarity to a voltage applied from the word line to the memory gate electrode to the bit line.Type: GrantFiled: December 17, 2016Date of Patent: July 3, 2018Assignee: RENESAS ELECTRONICS CORPORATIONInventors: Keiichi Maekawa, Shiro Kamohara, Yasushi Yamagata, Yoshiki Yamamoto
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Publication number: 20180158512Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: ApplicationFiled: February 5, 2018Publication date: June 7, 2018Inventors: Shiro KAMOHARA, Yasushi YAMAGATA, Takumi HASEGAWA, Nobuyuki SUGII
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Patent number: 9959924Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: GrantFiled: March 3, 2017Date of Patent: May 1, 2018Assignee: Renesas Electronics CorporationInventors: Shiro Kamohara, Yasushi Yamagata, Takumi Hasegawa, Nobuyuki Sugii
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Publication number: 20170263328Abstract: To provide a semiconductor device equipped with anti-fuse memory cells, which is capable of improving read-out accuracy of information. There is provided a semiconductor device in which an N channel type memory transistor, a selection core transistor, and a selection bulk transistor are respectively electrically coupled in series. The memory transistor and the selection core transistor are formed in a silicon layer of an SOI substrate, and the selection bulk transistor is formed in a semiconductor substrate. A word line is coupled to a memory gate electrode of the memory transistor, and a bit line is coupled to the selection bulk transistor. A write-in operation is performed while applying a counter voltage opposite in polarity to a voltage applied from the word line to the memory gate electrode to the bit line.Type: ApplicationFiled: December 17, 2016Publication date: September 14, 2017Inventors: Keiichi MAEKAWA, Shiro KAMOHARA, Yasushi YAMAGATA, Yoshiki YAMAMOTO
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Publication number: 20170178717Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: ApplicationFiled: March 3, 2017Publication date: June 22, 2017Inventors: Shiro KAMOHARA, Yasushi YAMAGATA, Takumi HASEGAWA, Nobuyuki SUGII
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Patent number: 9646679Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: GrantFiled: November 25, 2015Date of Patent: May 9, 2017Assignee: Renesas Electronics CorporationInventors: Shiro Kamohara, Yasushi Yamagata, Takumi Hasegawa, Nobuyuki Sugii
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Publication number: 20160180923Abstract: To provide a semiconductor device which can be stably operated while achieving a reduction of the power consumption. A semiconductor device includes a CPU, a system controller which designates an operation speed of the CPU, P-type SOTB transistors, and N-type SOTB transistors. The semiconductor device is provided with an SRAM which is connected to the CPU, and a substrate bias circuit which is connected to the system controller and is capable of supplying substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors. Here, when the system controller designates a low speed mode to operate the CPU at a low speed, the substrate bias circuit supplies the substrate bias voltages to the P-type SOTB transistors and the N-type SOTB transistors.Type: ApplicationFiled: November 25, 2015Publication date: June 23, 2016Inventors: Shiro KAMOHARA, Yasushi YAMAGATA, Takumi HASEGAWA, Nobuyuki SUGII
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Patent number: 8482058Abstract: In a high frequency amplifying MOSFET having a drain offset region, the size is reduced and the on-resistance is decreased by providing conductor plugs 13 (P1) for leading out electrodes on a source region 10, a drain region 9 and leach-through layers 3 (4), to which a first layer wirings 11a, 11d (M1) are connected and, further, backing second layer wirings 12a to 12d are connected on the conductor plugs 13 (P1) to the first layer wirings 11s, 11d (M1).Type: GrantFiled: June 1, 2012Date of Patent: July 9, 2013Assignee: Renesas Electronics CorporationInventors: Yutaka Hoshino, Shuji Ikeda, Isao Yoshida, Shiro Kamohara, Megumi Kawakami, Tomoyuki Miyake, Masatoshi Morikawa
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Publication number: 20120235250Abstract: In a high frequency amplifying MOSFET having a drain offset region, the size is reduced and the on-resistance is decreased by providing conductor plugs 13 (P1) for leading out electrodes on a source region 10, a drain region 9 and leach-through layers 3 (4), to which a first layer wirings 11a, 11d (M1) are connected and, further, backing second layer wirings 12a to 12d are connected on the conductor plugs 13 (P1) to the first layer wirings 11s, 11d (M1).Type: ApplicationFiled: June 1, 2012Publication date: September 20, 2012Applicant: RENESAS ELECTRONICS CORPORATIONInventors: Yutaka Hoshino, Shuji Ikeda, Isao Yoshida, Shiro Kamohara, Megumi Kawakami, Tomoyuki Miyake, Masatoshi Morikawa