Abstract: Examples described relate to identifying a potentially erroneous device in an IoT network. In an example, data from a device in an IoT network. The data may be analyzed against a classification of previous data from the plurality of devices, wherein the classification classifies the previous data as one of an erroneous data, a potentially erroneous data, or a normal data. If the data from the device represents the erroneous data, the device may be included in a set of potentially erroneous devices. A cluster of the device may be determined in a cluster classification. If the device belongs to the erroneous cluster in the cluster classification, associated devices in the erroneous cluster may be added to the set of potentially erroneous devices. If a threshold amount of devices in the set of potentially erroneous devices is higher than a pre-defined value, a notification may be generated.

Abstract: Provided is a method of automatically discovering topology of an information technology (IT) infrastructure. Topology relationships amongst configuration items (CI) present in a semi-structured data generated by an information technology component of the IT infrastructure are determined. Topology relationships amongst configuration items (CI) present in a structured data generated by the information technology component of the IT infrastructure are determined. The topology relationships amongst the configuration items (CI) present in the semi-structured data are reconciled with the topology relationships amongst the configuration items (CI) present in the structured data.

Abstract: Provided is a method of identifying a virtual machine for placement in a cloud computing environment, wherein the cloud computing environment comprises multiple cloud computing systems. Workload requests of the virtual machine are segregated into fixed workload request and flexible workload request. An optimal cloud computing system is selected in the cloud computing environment to perform fixed workload request and/or flexible workload request of the virtual machine.

Abstract: A proximity table is generated for a first of a group of hosts for one or more computer workloads. Workloads are assigned to the host by applying proximity rules to the proximity table. The generating of proximity tables and the assignment of workloads is iterated for other hosts until all workloads have been assigned. Once all workloads have been assigned, an opportunity estimate is calculated.

Abstract: There is provided an anode for an organic electronic device. The anode is a conducting inorganic material having an oxidized surface layer. The surface layer is non-conductive and hole-transporting.

Abstract: Methods, apparatus, and computer readable media with executable instructions stored thereon for virtual machine placement are provided. A user's demands on execution of a number of tasks, each task including a demand trace, can be defined as Service Level Agreement (SLA) information, including one or more Class of Service (CoS) levels defined by a Base Resource Entitlement (BRE) criteria and a Reserved Resource Entitlement (RRE) criteria (222). A highest CoS level of the one or more CoS levels can be selected (224) and the tasks within the Cos level can be load-balanced across a pool of servers (226). At least a portion of the RRE criteria can be removed from the demand trace of the selected CoS level (228). The selecting, load-balancing, and removing steps can be repeated until there are no more CoS levels (230).

Abstract: Methods, systems, and computer-readable media with executable instructions stored thereon for a virtual machine (VM) placement plan are provided. Seasonality of a measured aggregated resource usage of a group of VMs can be identified. A VM placement plan for the identified seasonality can be generated by a computing device.

Abstract: An electronic device includes a backplane having a layer of an organic hole injection material disposed thereon. Some areas of the hole injection material having a first predetermined surface energy while selected other areas of the layer of hole injection material have a second, lower, predetermined surface energy associated therewith. The selected other areas of lower surface energy are produced by heating of these areas by exposure of the selected other areas to radiation, such as from a laser. A layer of a composition including an organic hole transport material disposed directly on at least some of the areas of the layer of the hole injection material having the first, higher, predetermined surface energy.

Abstract: Methods, systems, and computer-readable media with executable instructions stored thereon for a virtual machine (VM) placement plan are provided. Seasonality of a measured aggregated resource usage of a group of VMs can be identified. A VM placement plan for the identified seasonality can be generated by a computing device.

Abstract: The present invention relates to buffer bilayers, and their use in electronic devices. The bilayer has a first layer including (a) at least one electrically conductive polymer doped with at least one non-highly-fluorinated acid polymer and (b) at least one highly-fluorinated acid polymer, and a second layer including inorganic nanoparticles which are oxides or sulfides.

Abstract: An electronic device can include an organic active layer and an electrode. In one aspect, the electrode can further include a first layer that is conductive, and a second layer that is conductive. The second layer can include a defect extending at least partly through a thickness of the second conductive layer. The electrode can also include a third layer lying within and substantially filling the defect, wherein each of the second and third layers includes a same metallic element. In another aspect, a process for forming an electronic device can include forming an organic active layer and forming a first layer that is conductive and is part of an electrode. The process can also include forming a second layer and exposing the second layer to a first plasma to form a first compound from the second layer.

Abstract: In one embodiment, a method for creating a pattern in a layer of an organic electronic device that includes selectively irradiating a portion of the layer is provided, and devices and sub-assemblies made by the same.

Abstract: Provided are organic n-doped electron transport layers comprising at least one electron transport material and at least one electron rich dopant material and organic p-doped hole transport layers comprising at least one hole transport material and at least one electron deficient dopant material.

Abstract: There is provided an anode for an organic electronic device. The anode is a conducting inorganic material having an oxidized surface layer. The surface layer is non-conductive and hole-transporting.

Abstract: There is provided an anode for an organic electronic device. The anode is a conducting inorganic material having an oxidized surface layer. The surface layer is non-conductive and hole-transporting.

Abstract: An electronic device can include an organic active layer and an electrode. In one aspect, the electrode can further include a first layer that is conductive, and a second layer that is conductive. The second layer can include a defect extending at least partly through a thickness of the second conductive layer. The electrode can also include a third layer lying within and substantially filling the defect, wherein each of the second and third layers includes a same metallic element. In another aspect, a process for forming an electronic device can include forming an organic active layer and forming a first layer that is conductive and is part of an electrode. The process can also include forming a second layer and exposing the second layer to a first plasma to form a first compound from the second layer.

Abstract: A proximity table is generated for a first of a group of hosts for one or more computer workloads. Workloads are assigned to the host by applying proximity rules to the proximity table. The generating of proximity tables and the assignment of workloads is iterated for other hosts until all workloads have been assigned.

Abstract: An electronic device can include an organic active layer and an electrode. In one aspect, the electrode can further include a first layer that is conductive, and a second layer that is conductive. The second layer can include a defect extending at least partly through a thickness of the second conductive layer. The electrode can also include a third layer lying within and substantially filling the defect, wherein each of the second and third layers includes a same metallic element. In another aspect, a process for forming an electronic device can include forming an organic active layer and forming a first layer that is conductive and is part of an electrode. The process can also include forming a second layer and exposing the second layer to a first plasma to form a first compound from the second layer.

Abstract: An electronic device can include an electrode and an organic active region. In one aspect, the electronic device can include the electrode having a corresponding pitch and an organic active region adjacent to the electrode, wherein the organic active region has a width greater than the corresponding pitch. In another aspect, an electronic device can include a first set of electrodes oriented substantially along a direction and a second set of electrodes oriented substantially along the direction. The electronic device can also include a space between the first and second sets of the electrodes. The electronic device can still further include an organic active region overlying or underlying the first and second sets of electrodes and the space. In other aspects, processes of forming the electronic devices are also disclosed.