Abstract: The drain electrodes of HNMOS transistors (2) and (3) are connected to the first ends of resistors (4) and (5), and to the inputs of inverter circuits (6) and (7) respectively. The outputs of the inverter circuits (6) and (7) are connected to the inputs of a protection circuit (27). The outputs of the protection circuit (27) are connected to the set and reset inputs of a flip-flop circuit (10A). The protection circuit (27) serves to prevent the malfunction of the flip-flop circuit (10A) from occurring and is formed by a logic gate. Having this configuration high potential side power device driving circuit is provided wherein the pulse widths of signals input to the gate electrodes of transistors for level shift can be set optionally, the lag time of the signal is not caused by a passage through a filter circuit, and the malfunction of a flip-flop circuit can be prevented from occurring due to a dv/dt current without lowering the response performance of a power device.