Patents by Inventor Shooji Kubono

Shooji Kubono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8004905
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: March 18, 2010
    Date of Patent: August 23, 2011
    Assignee: Renesas Electronics Corporation
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20100182847
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: March 18, 2010
    Publication date: July 22, 2010
    Applicant: RENESAS TECHNOLOGY CORP.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 7697345
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: June 25, 2008
    Date of Patent: April 13, 2010
    Assignee: Renesas Technology Corp.
    Inventors: Tetsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20090003085
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: June 25, 2008
    Publication date: January 1, 2009
    Inventors: Tatsuya ISHII, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 7405979
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: September 7, 2007
    Date of Patent: July 29, 2008
    Assignee: Renesas Technology Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20080008009
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: September 7, 2007
    Publication date: January 10, 2008
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 7283399
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: August 3, 2006
    Date of Patent: October 16, 2007
    Assignee: Renesas Technology Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 7145805
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: January 31, 2006
    Date of Patent: December 5, 2006
    Assignees: Renesas Technology Corp., Hitachi ULSI Engineering Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20060268610
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: August 3, 2006
    Publication date: November 30, 2006
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 7072222
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: March 10, 2005
    Date of Patent: July 4, 2006
    Assignees: Renesas Technology Corp., Hitachi ULSI Engineering Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20060120164
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: January 31, 2006
    Publication date: June 8, 2006
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20050157550
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: March 10, 2005
    Publication date: July 21, 2005
    Inventors: Tatsuya Ishii, Hitoshi Nina, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 6906952
    Abstract: In a nonvolatile semiconductor memory device wherein a plurality of threshold voltages are set so as to store multivalued information in one memory cell, data is first written into the memory cell whose threshold voltage is the lowest as a written state from the erase level, and data is successively written into memory cells whose threshold voltages are higher.
    Type: Grant
    Filed: March 24, 2003
    Date of Patent: June 14, 2005
    Assignees: Renesas Technology Corp., Hitachi ULSI Engineering Corp.
    Inventors: Keiichi Yoshida, Shooji Kubono
  • Patent number: 6873552
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: October 9, 2003
    Date of Patent: March 29, 2005
    Assignees: Renesas Technology Corp., Hitachi ULSI Engineering Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20040114434
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: October 9, 2003
    Publication date: June 17, 2004
    Applicants: Hitachi, Ltd., Hitachi ULSI Engineering Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 6683811
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: March 17, 2003
    Date of Patent: January 27, 2004
    Assignees: Hitachi, Ltd., Hitachi ULSI Engineering Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Publication number: 20030185056
    Abstract: In a nonvolatile semiconductor memory device wherein a plurality of threshold voltages are set so as to store multivalued information in one memory cell, data is first written into the memory cell whose threshold voltage is the lowest as a written state from the erase level, and data is successively written into memory cells whose threshold voltages are higher.
    Type: Application
    Filed: March 24, 2003
    Publication date: October 2, 2003
    Inventors: Keiichi Yoshida, Shooji Kubono
  • Publication number: 20030156459
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Application
    Filed: March 17, 2003
    Publication date: August 21, 2003
    Applicant: Hitachi, Ltd.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: 6567311
    Abstract: A nonvolatile semiconductor memory recovers variation in the threshold of a memory cell due to disturbance related to a word line. The nonvolatile memory continuously performs many writing operations without carrying out single-sector erasing after each writing operation, performing the additional writing operations quicker than the usual writing operation, and lightening the burden imposed on software for use in additional writing. The data stored in a designated sector is read out before being saved in a register, and the selected sector is subjected to single-sector erasing when a predetermined command is given. Then write expected value data is formed from the saved data and data to be additionally written, completing the writing operation.
    Type: Grant
    Filed: March 13, 2002
    Date of Patent: May 20, 2003
    Assignees: Hitachi, Ltd., Hitachi ULSI Engineering Corp.
    Inventors: Tatsuya Ishii, Hitoshi Miwa, Osamu Tsuchiya, Shooji Kubono
  • Patent number: RE44350
    Abstract: In a nonvolatile semiconductor memory device wherein a plurality of threshold voltages are set so as to store multi-valued information in one memory cell, data is first written into the memory cell whose threshold voltage is the lowest as a written state from the erase level, and data is successively written into memory cells whose threshold voltages are higher.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: July 9, 2013
    Assignee: Renesas Electronics Corporation
    Inventors: Keiichi Yoshida, Shooji Kubono